CN101784872B - 具有可调色彩的照明装置 - Google Patents
具有可调色彩的照明装置 Download PDFInfo
- Publication number
- CN101784872B CN101784872B CN2008801037631A CN200880103763A CN101784872B CN 101784872 B CN101784872 B CN 101784872B CN 2008801037631 A CN2008801037631 A CN 2008801037631A CN 200880103763 A CN200880103763 A CN 200880103763A CN 101784872 B CN101784872 B CN 101784872B
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- China
- Prior art keywords
- light
- window
- interference filter
- optics
- optical sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
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Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0204—Compact construction
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0437—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using masks, aperture plates, spatial light modulators, spatial filters, e.g. reflective filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0474—Diffusers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
- G01J1/28—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source
- G01J1/30—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors
- G01J1/32—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors adapted for automatic variation of the measured or reference value
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21K—NON-ELECTRIC LIGHT SOURCES USING LUMINESCENCE; LIGHT SOURCES USING ELECTROCHEMILUMINESCENCE; LIGHT SOURCES USING CHARGES OF COMBUSTIBLE MATERIAL; LIGHT SOURCES USING SEMICONDUCTOR DEVICES AS LIGHT-GENERATING ELEMENTS; LIGHT SOURCES NOT OTHERWISE PROVIDED FOR
- F21K9/00—Light sources using semiconductor devices as light-generating elements, e.g. using light-emitting diodes [LED] or lasers
- F21K9/60—Optical arrangements integrated in the light source, e.g. for improving the colour rendering index or the light extraction
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
- F21V23/00—Arrangement of electric circuit elements in or on lighting devices
- F21V23/04—Arrangement of electric circuit elements in or on lighting devices the elements being switches
- F21V23/0442—Arrangement of electric circuit elements in or on lighting devices the elements being switches activated by means of a sensor, e.g. motion or photodetectors
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES F21K, F21L, F21S and F21V, RELATING TO THE FORM OR THE KIND OF THE LIGHT SOURCES OR OF THE COLOUR OF THE LIGHT EMITTED
- F21Y2115/00—Light-generating elements of semiconductor light sources
- F21Y2115/10—Light-emitting diodes [LED]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
- G01J2001/4252—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
- G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
- G01J3/513—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters having fixed filter-detector pairs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
Abstract
Description
Claims (10)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP07114247 | 2007-08-13 | ||
EP07114247.5 | 2007-08-13 | ||
PCT/IB2008/053208 WO2009022282A2 (en) | 2007-08-13 | 2008-08-11 | Light sensor and lighting device with adaptable color |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101784872A CN101784872A (zh) | 2010-07-21 |
CN101784872B true CN101784872B (zh) | 2012-12-05 |
Family
ID=40107452
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008801037631A Expired - Fee Related CN101784872B (zh) | 2007-08-13 | 2008-08-11 | 具有可调色彩的照明装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8649004B2 (zh) |
EP (1) | EP2179258A2 (zh) |
JP (1) | JP5808910B2 (zh) |
CN (1) | CN101784872B (zh) |
WO (1) | WO2009022282A2 (zh) |
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US9217671B2 (en) | 2009-09-01 | 2015-12-22 | Koninklijke Philips N.V. | High spectral resolution color sensor using non-dispersive elements |
TW201122621A (en) * | 2009-12-30 | 2011-07-01 | Hon Hai Prec Ind Co Ltd | Liquid crystal display |
KR101476902B1 (ko) * | 2010-05-14 | 2014-12-26 | 코니카 미놀타 옵틱스, 인크. | 측정용 광학계 및 그것을 사용한 휘도계, 색채 휘도계 및 색채계 |
TWI524240B (zh) | 2010-11-01 | 2016-03-01 | 友達光電股份有限公司 | 光感測控制系統 |
CN102096522B (zh) * | 2010-11-05 | 2013-04-17 | 友达光电股份有限公司 | 光感测控制系统 |
GB201020024D0 (en) | 2010-11-25 | 2011-01-12 | St Microelectronics Ltd | Radiation sensor |
WO2012069851A1 (en) * | 2010-11-25 | 2012-05-31 | Stmicroelectronics (Research & Development) Limited | Radiation sensor |
GB201020023D0 (en) | 2010-11-25 | 2011-01-12 | St Microelectronics Ltd | Radiation sensor |
GB2486000A (en) | 2010-11-30 | 2012-06-06 | St Microelectronics Res & Dev | Optical proximity detectors with arrangements for reducing internal light propagation from emitter to detector |
GB2485996A (en) | 2010-11-30 | 2012-06-06 | St Microelectronics Res & Dev | A combined proximity and ambient light sensor |
GB2485998A (en) | 2010-11-30 | 2012-06-06 | St Microelectronics Res & Dev | A single-package optical proximity detector with an internal light baffle |
CN102620153A (zh) * | 2011-01-31 | 2012-08-01 | 旭丽电子(广州)有限公司 | 灯具 |
US9013467B2 (en) | 2013-07-19 | 2015-04-21 | Institut National D'optique | Controlled operation of a LED lighting system at a target output color |
US8928746B1 (en) * | 2013-10-18 | 2015-01-06 | Stevrin & Partners | Endoscope having disposable illumination and camera module |
JP6161522B2 (ja) * | 2013-11-20 | 2017-07-12 | オリンパス株式会社 | 撮像素子 |
WO2015088492A1 (en) | 2013-12-10 | 2015-06-18 | Apple Inc. | Input friction mechanism for rotary inputs of electronic devices |
US9338851B2 (en) | 2014-04-10 | 2016-05-10 | Institut National D'optique | Operation of a LED lighting system at a target output color using a color sensor |
US10145712B2 (en) * | 2014-09-09 | 2018-12-04 | Apple Inc. | Optical encoder including diffuser members |
WO2016073207A1 (en) * | 2014-11-07 | 2016-05-12 | 3M Innovative Properties Company | Lighting component including switchable diffuser |
US9651405B1 (en) | 2015-03-06 | 2017-05-16 | Apple Inc. | Dynamic adjustment of a sampling rate for an optical encoder |
JP6586161B2 (ja) * | 2015-04-10 | 2019-10-02 | シャープ株式会社 | 赤外線投光器および赤外線観察システム |
US10503271B2 (en) | 2015-09-30 | 2019-12-10 | Apple Inc. | Proximity detection for an input mechanism of an electronic device |
WO2017098340A1 (en) * | 2015-12-07 | 2017-06-15 | Papp Róbert | Method and system for accelerated reaction of the darkening of the optical element in a welding protective device |
EP3185179A1 (en) * | 2015-12-22 | 2017-06-28 | Delphi Technologies, Inc. | Multiple imager vehicle optical sensor system |
EP3494372A4 (en) * | 2016-08-04 | 2020-03-25 | Ophir Optronics Solutions Ltd. | PHOTOMETRIC TEST SYSTEM FOR LIGHT EMITTING DEVICES |
US10427595B2 (en) * | 2017-05-22 | 2019-10-01 | Ford Global Technologies, Llc | Illuminating vehicle assembly and illumination method |
US10203662B1 (en) | 2017-09-25 | 2019-02-12 | Apple Inc. | Optical position sensor for a crown |
CN113646891A (zh) * | 2019-04-08 | 2021-11-12 | ams有限公司 | 包括集成漫射器的光学传感器 |
DE102020202824A1 (de) | 2020-03-05 | 2021-09-09 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Sensorvorrichtung unter verwendung der winkelabhängigkeit eines dichroitischen filters |
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CN1514919A (zh) * | 2001-06-07 | 2004-07-21 | �ʼҷ����ֵ�������˾ | 具有用于光反馈的光学传感器结构的发光二极管光源 |
CN101238359A (zh) * | 2005-03-23 | 2008-08-06 | Tir技术有限公司 | 用于聚集和检测照明装置发出的光的装置和方法 |
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-
2008
- 2008-08-11 US US12/672,310 patent/US8649004B2/en not_active Expired - Fee Related
- 2008-08-11 EP EP08807281A patent/EP2179258A2/en not_active Withdrawn
- 2008-08-11 CN CN2008801037631A patent/CN101784872B/zh not_active Expired - Fee Related
- 2008-08-11 WO PCT/IB2008/053208 patent/WO2009022282A2/en active Application Filing
- 2008-08-11 JP JP2010520657A patent/JP5808910B2/ja not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1514919A (zh) * | 2001-06-07 | 2004-07-21 | �ʼҷ����ֵ�������˾ | 具有用于光反馈的光学传感器结构的发光二极管光源 |
CN101238359A (zh) * | 2005-03-23 | 2008-08-06 | Tir技术有限公司 | 用于聚集和检测照明装置发出的光的装置和方法 |
Also Published As
Publication number | Publication date |
---|---|
JP2010537363A (ja) | 2010-12-02 |
US8649004B2 (en) | 2014-02-11 |
EP2179258A2 (en) | 2010-04-28 |
WO2009022282A2 (en) | 2009-02-19 |
US20110109232A1 (en) | 2011-05-12 |
CN101784872A (zh) | 2010-07-21 |
JP5808910B2 (ja) | 2015-11-10 |
WO2009022282A3 (en) | 2009-05-28 |
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