Embodiment
Fig. 1 is the structural representation of LCD (Liquid Crystal Display) array substrate first embodiment of the present invention, and as shown in Figure 1, in the present embodiment, LCD (Liquid Crystal Display) array substrate comprises viewing area 1 and surveyed area 2, and surveyed area 2 is positioned at the periphery of viewing area 1.Be provided with M bar grid line 11 and N bar data line 12 in the viewing area 1, M, N are natural number, M bar grid line 11 and N bar data line 12 define M * N sub-pix zone, be formed with pixel electrode and thin film transistor (TFT) in each sub-pix zone, said structure is identical with the array structure of prior art, repeats no more.Be provided with a grid p-wire 21 and a grid displacement selector switch device 22 in the surveyed area 2, grid p-wire 21 is arranged on a side of viewing area 1, be connected with an end of all M bar grid line 11, be used for to M bar grid line 11 input load signal, grid displacement selector switch device 22 is arranged on the opposite side of viewing area 1, be connected with the other end of all M bar grid line 11, be used for gathering the grid line signals from M bar grid line 11 successively, and the grid line signal of gathering is sent to grid checkout equipment 31; Grid checkout equipment 31 is connected with grid displacement selector switch device 22, is used for judging according to the grid line signal of each grid line whether grid line breaks.
In the above-mentioned technical solutions of this embodiment, grid displacement selector switch device 22 comprises control end 221, input end 222 and output terminal 223, and its effect is under the control of control end 221, and input end 222 is delivered to output terminal 223 successively with M grid line signal on the M bar grid line.Particularly, input end 222 is connected with all M bar grid lines 11, be used for gathering the grid line signal from M bar grid line 11 successively, output terminal 223 is connected with grid checkout equipment 31, the grid line signal that is used for gathering sends to grid checkout equipment 31, and control end 221 is connected with grid timing sequencer 41, is used for receiving timing control signal from grid timing sequencer 41, and, make input end 222 gather the grid line signal from M bar grid line 11 successively according to timing control signal gating M bar grid line 11 successively.Array base palte with 17 inches SXGA is an example, M=1024, and therefore 1024 input ends 222 are connected with 1024 grid lines 11 respectively.
In actual use, the basic structure of present embodiment grid displacements selector switch device is suitable with the function of lining by line scan in the gate drivers, and the function of lining by line scan in the gate drivers can be under the timing control signal effect be sent to the grid start signal each bar grid line successively.Because gate drivers can adopt GOA (Gate On Array) technology, on array base palte, directly form by composition technology, therefore present embodiment grid displacement selector switch device also can be formed directly into the surveyed area of array base palte, its inner basic structure repeats no more here for those skilled in the art know.In addition, also be provided with between the viewing area 1 of present embodiment LCD (Liquid Crystal Display) array substrate and the surveyed area 2 and cut off line 5, after detection is finished in the box cutting technique, will cut off getting in touch of grid p-wire and grid displacement selector switch device and viewing area according to cutting off line 5 cutting array base paltes.
Testing process below by present embodiment LCD (Liquid Crystal Display) array substrate grid line broken string further specifies technical scheme of the present invention.
Fig. 2 is a kind of signal schematic representation of first embodiment of the invention testing process.The grid p-wire is to M bar grid line input load signal Z, load signal Z is a high level signal, if it is bad that breaking does not appear in grid line, then the grid line signal of grid displacement selector switch device output is a high level, if it is bad that broken string has appearred in grid line, the high level signal that loads can't transmit, and then the grid line signal of grid displacement selector switch device output is a low level.As shown in Figure 2, the timing control signal T that the grid timing sequencer sends is from the control end input of grid displacement selector switch device, timing control signal T is the one-period signal, the high level of each periodic signal is corresponding to the gating time of a grid line, and therefore the high level in K cycle is corresponding to the gating time of K bar grid line.Grid displacement selector switch device is according to this timing control signal T each grid line of gating successively, the signal of each grid line (as the signal L1 of article one grid line, the signal L2...... of second grid line) enters grid displacement selector switch device successively from each input end, and exports successively from output terminal.Because the grid line signal of each grid line is a high level when broken string not occurring, so output terminal will continue to export high level.It is bad to suppose that broken string has appearred in K bar grid line, and therefore when grid displacement selector switch device gating K bar grid line, the grid line signal G of output terminal output is a low level.After the grid line signal G of grid displacement selector switch device output enters the grid checkout equipment, the grid checkout equipment can judge whether to exist the grid line broken string according to grid line signal G, further, the grid checkout equipment also receives timing control signal, and can judge that according to timing control signal T broken string appears in which bar grid line.
Fig. 3 is the another kind of signal schematic representation of first embodiment of the invention testing process.The grid p-wire is to M bar grid line input load signal Z, and load signal Z is the one-period signal, and the high level of each periodic signal is carried on the grid line.If it is bad that breaking does not appear in grid line, then the grid line signal of grid displacement selector switch device output is the high level of this periodic signal, if it is bad that breaking has appearred in grid line, the periodic signal of loading can't transmit, and then the grid line signal of grid displacement selector switch device output is a low level signal.As shown in Figure 3, the timing control signal T that the grid timing sequencer sends is from the control end input of grid displacement selector switch device, timing control signal T is the one-period signal, the high level of each periodic signal is corresponding to the gating time of a grid line, and therefore the high level in K cycle is corresponding to the gating time of K bar grid line.Grid displacement selector switch device is according to this timing control signal T each grid line of gating successively, the signal of each grid line (as the signal L1 of article one grid line, the signal L2...... of second grid line) enters grid displacement selector switch device successively from each input end, and exports successively from output terminal.Because the grid line signal of each grid line is a pulse signal when broken string not occurring, so output terminal will continue output pulse signal.It is bad to suppose that broken string has appearred in K bar grid line, and therefore when grid displacement selector switch device gating K bar grid line, the grid line signal G of output terminal output is a low level.After the grid line signal G of grid displacement selector switch device output enters the grid checkout equipment, the grid checkout equipment can judge whether to exist the grid line broken string according to grid line signal G, further, the grid checkout equipment also receives timing control signal, and can judge that according to timing control signal T broken string appears in which bar grid line.
Present embodiment provides a kind of LCD (Liquid Crystal Display) array substrate, by surveyed area grid p-wire and grid displacement selector switch device are set in the periphery, viewing area, import load signal by the grid p-wire to each grid line, gather the grid line signal of each grid line by grid displacement selector switch device, therefore make the present invention can detect the grid line broken string efficiently and accurately, for the analysis after the LCD (Liquid Crystal Display) array substrate detection provides reliable foundation.
Fig. 4 is the structural representation of LCD (Liquid Crystal Display) array substrate second embodiment of the present invention.As shown in Figure 4, present embodiment is on the basis of the aforementioned first embodiment technical scheme, is provided with two grid p-wires 21 and a grid displacement selector switch device 22 in the surveyed area 2.Article two, grid p-wire 21 is arranged on a side of viewing area 1, and wherein a grid p-wire 21 is connected with the grid line 11 of all odd-numbered lines, and another grid p-wire 21 is connected with the grid line 11 of all even number lines, all is used for to grid line input load signal.In the practical application, two grid p-wires 21 both can input high level, also can import periodic signal respectively, and the periodic signal of two grid p-wires is reverse each other.Grid displacements selector switch device 22 is arranged on the opposite side of viewing area 1, is connected with the other end of all grid line 11, be used for gathering the grid line signals from grid line 11 successively, and with the grid line signal gathered to 31 transmissions of grid checkout equipment; Grid checkout equipment 31 is connected with grid displacement selector switch device 22, is used for judging according to the grid line signal of each grid line whether grid line breaks.The version of present embodiment each several part, principle of work and testing process and aforementioned first embodiment are basic identical, not only can detect the grid line broken string efficiently and accurately, and make full use of prior art short circuit measurement structure, and form simplifies the structure.
Fig. 5 is the structural representation of LCD (Liquid Crystal Display) array substrate the 3rd embodiment of the present invention, and as shown in Figure 5, in the present embodiment, LCD (Liquid Crystal Display) array substrate comprises viewing area 1 and surveyed area 2, and surveyed area 2 is positioned at the periphery of viewing area 1.Be provided with M bar grid line 11 and N bar data line 12 in the viewing area 1, M, N are natural number, M bar grid line 11 and N bar data line 12 define M * N sub-pix zone, be formed with pixel electrode and thin film transistor (TFT) in each sub-pix zone, said structure is identical with the array structure of prior art, repeats no more.
Be provided with a data test line 23 and a data displacement selector switch device 24 in the surveyed area 2, data test line 23 is arranged on a side of viewing area 1, be connected with an end of all N bar data line 12, be used for to N bar data line 12 input load signal, data shift selector switch device 24 is arranged on the opposite side of viewing area 1, be connected with the other end of all N bar data line 12, be used for successively image data line signal from the N bar data line 12, and the data line signal of gathering is sent to data-detection apparatus 32; Whether data-detection apparatus 32 is connected with data shift selector switch device 24, be used for breaking according to the data line signal judgment data line of each data line.
In the above-mentioned technical solutions of this embodiment, data shift selector switch device 24 comprises control end 241, input end 242 and output terminal 243, its effect is under the control of control end 241, and input end 242 is delivered to output terminal 243 successively with N data line signal on the N bar data line.Particularly, input end 242 is connected with all N bar data lines 12, be used for successively image data line signal from the N bar data line 12, output terminal 243 is connected with data-detection apparatus 32, the data line signal that is used for gathering sends to data-detection apparatus 32, control end 241 is connected with data time sequence generator 42, be used for receiving timing control signal from data time sequence generator 42, and, make input end 242 image data line signal from the N bar data line 12 successively according to timing control signal gating N bar data line 12 successively.Array base palte with 17 inches SXGA is an example, N=3840, and therefore 3840 input ends 242 are connected with 3840 data lines 12 respectively.
Present embodiment data shift selector switch device is identical with the function and the version of first embodiment grid displacement selector switch device, repeats no more.Also be provided with between the viewing area 1 of present embodiment LCD (Liquid Crystal Display) array substrate and the surveyed area 2 and cut off line 5, after detection is finished in the box cutting technique, to cut off getting in touch of data test line and data shift selector switch device and viewing area according to cutting off line 5 cutting array base paltes.
Testing process below by present embodiment LCD (Liquid Crystal Display) array substrate broken data wire further specifies technical scheme of the present invention.
Fig. 6 is a kind of signal schematic representation of third embodiment of the invention testing process.Data test alignment N bar data line input load signal Z, load signal Z is a high level signal, if it is bad that breaking does not appear in data line, then the data line signal of data shift selector switch device output is a high level, if it is bad that broken string has appearred in data line, the high level signal that loads can't transmit, and then the data line signal of data shift selector switch device output is a low level.As shown in Figure 6, the timing control signal T that the data time sequence generator sends is from the control end input of data shift selector switch device, timing control signal T is the one-period signal, the high level of each periodic signal is corresponding to the gating time of a data line, and therefore the high level in K cycle is corresponding to the gating time of K bar data line.Data shift selector switch device is according to this timing control signal T each data line of gating successively, the signal of each data line (as the signal D1 of article one data line, the signal D2...... of second data line) enters data shift selector switch device successively from each input end, and exports successively from output terminal.Because the data line signal of each data line is a high level when broken string not occurring, so output terminal will continue to export high level.It is bad to suppose that broken string has appearred in K bar data line, and therefore when data shift selector switch device gating K bar data line, the data line signal D of output terminal output is a low level.After the data line signal D of data shift selector switch device output enters data-detection apparatus, data-detection apparatus can judge whether to exist broken data wire according to data line signal D, further, data-detection apparatus also receives timing control signal, and can judge that according to timing control signal T broken string appears in which bar data line.
Fig. 7 is the another kind of signal schematic representation of third embodiment of the invention testing process.Data test alignment N bar data line input load signal Z, load signal Z is the one-period signal, the high level of each periodic signal is carried on the data line.If it is bad that breaking does not appear in data line, then the data line signal of data shift selector switch device output is the high level of this periodic signal, if it is bad that broken string has appearred in data line, the periodic signal that loads can't transmit, and then the data line signal of data shift selector switch device output is a low level signal.As shown in Figure 7, the timing control signal T that the data time sequence generator sends is from the control end input of data shift selector switch device, timing control signal T is the one-period signal, the high level of each periodic signal is corresponding to the gating time of a data line, and therefore the high level in K cycle is corresponding to the gating time of K bar data line.Data shift selector switch device is according to this timing control signal T each data line of gating successively, the signal of each data line (as the signal D1 of article one data line, the signal D2...... of second data line) enters data shift selector switch device successively from each input end, and exports successively from output terminal.Because the data line signal of each data line is a pulse signal when broken string not occurring, so output terminal will continue output pulse signal.It is bad to suppose that broken string has appearred in K bar data line, and therefore when data shift selector switch device gating K bar data line, the data line signal D of output terminal output is a low level.After the data line signal D of data shift selector switch device output enters data-detection apparatus, data-detection apparatus can judge whether to exist broken data wire according to data line signal D, further, data-detection apparatus also receives timing control signal, and can judge that according to timing control signal T broken string appears in which bar data line.
Present embodiment provides a kind of LCD (Liquid Crystal Display) array substrate, by surveyed area data test line and data shift selector switch device are set in the periphery, viewing area, by each data line input load signal of data test alignment, gather the data line signal of each data line by data shift selector switch device, therefore make the present invention can detect broken data wire efficiently and accurately, for the analysis after the LCD (Liquid Crystal Display) array substrate detection provides reliable foundation.
Fig. 8 is the structural representation of LCD (Liquid Crystal Display) array substrate the 4th embodiment of the present invention.As shown in Figure 8, present embodiment is on the basis of aforementioned the 3rd embodiment technical scheme, be provided with two data test lines 23 and a data displacement selector switch device 24 in the surveyed area 2, article two, data test line 23 is arranged on a side of viewing area 1, wherein a data test line 23 is connected with the data line 12 of all odd columns, another data test line 23 is connected with the data line 12 of all even columns, all be used for to data line input load signal, data shift selector switch device 24 is arranged on the opposite side of viewing area 1, be connected with the other end of all data line 12, be used for successively image data line signal from the data line 12, and the data line signal of gathering is sent to data-detection apparatus 32; Whether data-detection apparatus 32 is connected with data shift selector switch device 24, be used for breaking according to the data line signal judgment data line of each data line.The version of present embodiment each several part, principle of work and testing process and aforementioned the 3rd embodiment are basic identical, not only can detect broken data wire efficiently and accurately, and have made full use of prior art short circuit measurement structure, and form simplifies the structure.
Fig. 9 is the structural representation of LCD (Liquid Crystal Display) array substrate the 5th embodiment of the present invention.As shown in Figure 9, present embodiment is the assembled scheme of aforementioned first embodiment and the 3rd embodiment, be provided with a grid p-wire 21, grid displacement selector switch device 22, a data test line 23 and a data displacement selector switch device 24 in the surveyed area 2, grid p-wire 21 is identical with first embodiment with version, function and the detection method of grid displacement selector switch device 22, data test line 23 is identical with the 3rd embodiment with version, function and the detection method of data shift selector switch device 24, repeats no more here.In the practical application, grid checkout equipment and data-detection apparatus can be structure as a whole, and grid timing sequencer and data time sequence generator can be structure as a whole.
On the basis of the above embodiment of the present invention, also can form the assembled scheme of first embodiment and the 4th embodiment, be to be provided with a grid p-wire 21 and two data test lines 23 in the surveyed area 2, can also form the assembled scheme of second embodiment and the 3rd embodiment, be to be provided with two grid p-wires 21 and a data test line 23 in the surveyed area 2, can also further form the assembled scheme of second embodiment and the 4th embodiment, be to be provided with two grid p-wires 21 and two data test lines 23 in the surveyed area 2, expand technical scheme of the present invention to greatest extent.
Figure 10 is the process flow diagram of LCD (Liquid Crystal Display) array substrate wire break detection method first embodiment of the present invention, specifically comprises:
Step 11, p-wire are to all grid line input load signal;
Step 12, displacement selector switch device be the described grid line of gating successively, to checkout equipment output grid line signal;
Step 13, checkout equipment judge according to described grid line signal whether described grid line breaks.
Wherein, described step 12 is specially: timing sequencer is to described displacement selector switch device input timing control signal, described displacement selector switch device is according to the described grid line of described timing control signal gating successively, gather the grid line signal from described grid line successively, and described timing control signal, described grid line signal are exported to checkout equipment.Described step 13 is specially: described checkout equipment judges according to described grid line signal whether described grid line breaks, and judges that according to described timing control signal broken string appears in which bar grid line.
Present embodiment is actually a kind of wire break detection method to Fig. 1 and LCD (Liquid Crystal Display) array substrate of the present invention shown in Figure 4, and the detailed process of burn out detection describes in detail in LCD (Liquid Crystal Display) array substrate first embodiment of the present invention and second embodiment.
Figure 11 is the process flow diagram of LCD (Liquid Crystal Display) array substrate wire break detection method second embodiment of the present invention, specifically comprises:
Step 21, p-wire are to all data line input load signal;
Step 22, displacement selector switch device be the described data line of gating successively, to checkout equipment output data line signal;
Step 23, checkout equipment judge according to described data line signal whether described data line breaks.
Wherein, described step 22 is specially: timing sequencer is to described displacement selector switch device input timing control signal, described displacement selector switch device is according to the described data line of described timing control signal gating successively, image data line signal from the described data line successively, and described timing control signal, described data line signal exported to checkout equipment.Described step 23 is specially: described checkout equipment judges according to described data line signal whether described data line breaks, and judges that according to described timing control signal broken string appears in which bar data line.
Present embodiment is actually a kind of wire break detection method to Fig. 5 and LCD (Liquid Crystal Display) array substrate of the present invention shown in Figure 8, and the detailed process of burn out detection describes in detail in LCD (Liquid Crystal Display) array substrate the 3rd embodiment of the present invention and the 4th embodiment.
Figure 12 is the process flow diagram of LCD (Liquid Crystal Display) array substrate wire break detection method the 3rd embodiment of the present invention, specifically comprises:
Step 31, p-wire are to all grid lines and data line input load signal;
Step 32, displacement selector switch device be the described grid line of gating successively, to checkout equipment output grid line signal; Displacement selector switch device is the described data line of gating successively, to checkout equipment output data line signal;
Step 33, checkout equipment judge according to described grid line signal whether described grid line breaks; Checkout equipment judges according to described data line signal whether described data line breaks.
Wherein, described step 32 is specially: timing sequencer is to described displacement selector switch device input timing control signal, described displacement selector switch device is according to the described grid line of described timing control signal gating successively, gather the grid line signal from described grid line successively, and described timing control signal and described grid line signal are exported to checkout equipment; Described displacement selector switch device is according to the described data line of described timing control signal gating successively, image data line signal from the described data line successively, and described timing control signal and described data line signal exported to checkout equipment.Described step 33 is specially: described checkout equipment judges according to described grid line signal whether described grid line breaks, and judges that according to described timing control signal and grid line signal broken string appears in which bar grid line; Described checkout equipment judges according to described data line signal whether described data line breaks, and judges that according to described timing control signal and data line signal broken string appears in which bar data line.
Present embodiment is actually the assembled scheme of LCD (Liquid Crystal Display) array substrate wire break detection method first embodiment of the present invention and second embodiment, can expand technical scheme of the present invention to greatest extent.
It should be noted last that, above embodiment is only unrestricted in order to technical scheme of the present invention to be described, although the present invention is had been described in detail with reference to preferred embodiment, those of ordinary skill in the art is to be understood that, can make amendment or be equal to replacement technical scheme of the present invention, and not break away from the spirit and scope of technical solution of the present invention.