CN101345018B - Data driver for display device, test method and probe card for data driver - Google Patents
Data driver for display device, test method and probe card for data driver Download PDFInfo
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- CN101345018B CN101345018B CN2008101361181A CN200810136118A CN101345018B CN 101345018 B CN101345018 B CN 101345018B CN 2008101361181 A CN2008101361181 A CN 2008101361181A CN 200810136118 A CN200810136118 A CN 200810136118A CN 101345018 B CN101345018 B CN 101345018B
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3685—Details of drivers for data electrodes
- G09G3/3688—Details of drivers for data electrodes suitable for active matrices only
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2310/00—Command of the display device
- G09G2310/02—Addressing, scanning or driving the display screen or processing steps related thereto
- G09G2310/0264—Details of driving circuits
- G09G2310/027—Details of drivers for data electrodes, the drivers handling digital grey scale data, e.g. use of D/A converters
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2310/00—Command of the display device
- G09G2310/02—Addressing, scanning or driving the display screen or processing steps related thereto
- G09G2310/0264—Details of driving circuits
- G09G2310/0291—Details of output amplifiers or buffers arranged for use in a driving circuit
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/08—Fault-tolerant or redundant circuits, or circuits in which repair of defects is prepared
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof
Abstract
A data driver of a display device includes: a DAC (Digital Analog Converter) outputting a drive signal for driving a signal line of a displaying unit; an amplifier amplifying the drive signal outputted by the DAC and outputting the drive signal to the signal line; a repair amplifier having an input and an output, wherein the signal line is separated by a breakage point into a connected data line connected to the amplifier and a disconnected data line not connected to the amplifier, and the input of the repair amplifier is connected to the connected data line and the output of the repair amplifier is connected to the disconnected data line; and a switch supplying the drive signal to the input of the repair amplifier for testing the repair amplifier. An output delay test for the repair amplifier can be performed under a condition similar to that of the amplifier.
Description
Technical field
The present invention relates to a kind of data driver of display device, the method for testing that is used for this data driver and probe, more particularly, relate to the technology of the repair amplifier that is suitable for the test data driver.
Background technology
In recent years, flat-panel monitor has obtained using widely.Exist such as multiple flat-panel monitors such as TFT (abbreviation of " thin film transistor (TFT) ") type liquid crystal display, the driving liquid crystal display of simple matrix, electroluminescence (being abbreviated as " EL ") display device and plasma display panel devices at present.At the display (being on the screen) of display device, show video data.Below, TFT type LCD is explained as an example.
Fig. 1 shows the configuration of TFT type liquid crystal display 1.
TFT type liquid crystal display 1 is equipped with glass substrate 3, display part (being display panels) the 10, the 1st to mm bar gate lines G 1 to Gm and the 1st to nn bar data line D1 to Dn.Display panels 10 contains by matrix-style and is arranged in a plurality of pixels 11 on the glass substrate 3.For example, have that (the individual pixel 11 of m * n) is arranged in (, m and n are respectively the integers more than 2, respectively the line number and the columns of representing matrix) on the glass substrate 3 here.Each pixel in m * n pixel 11 all comprises 12 and pixel capacitors 15 of a thin film transistor (TFT) (being abbreviated as " TFT ").Pixel capacitor 15 comprises: pixel electrode and with this pixel electrode positioned opposite to electrode.TFT12 is equipped with drain electrode 13, is connected to the source electrode 14 and the gate electrode 16 of pixel electrode.M bar gate lines G 1 to Gm be connected to respectively m capable in the gate electrode 16 of TFT 12 in the pixel 11.N bar data line D1 to Dn is connected in the n row drain electrode 13 of TFT 12 in n the pixel 11 respectively.
TFT type liquid crystal display 1 also is equipped with gate drivers 20 and data driver 30.Gate drivers 20 is installed on the chip (not shown), and is connected to an end of every gate line in the m bar gate lines G 1 to Gm.Simultaneously, data driver 30 also is installed on the chip, and is connected to an end of every data line among the n bar data line D1 to Dn.
TFT type liquid crystal display 1 also is equipped with timing controller 2.Timing controller 2 provides gate clock signal GCLK to gate drivers 20, is used for such as in a horizontal cycle, selecting gate lines G 1.20 pairs of gate clock signals of gate drivers GCLK responds, and selects signal to gate lines G 1 output.At this moment, select signal to be sent to gate lines G 1 by the order that passes through, then, in response to the selection signal that offers gate electrode 16, will with TFT 12 conductings of gate lines G 1 corresponding (1 * n) pixel 11.
In addition, timing controller 2 provides clock signal clk and single file video data DATA to data driver 30.This single file video data DATA comprises respectively and the corresponding n piece of data line D1 to Dn video data.Data driver 30 is in response to clock signal clk, respectively to n bar data line D1 to Dn output n piece (piece) video data.At this moment, will with gate lines G 1 TFT 12 conductings with n bar data line D1 to Dn corresponding (1 * n) pixel 11.As a result, respectively n piece video data is write the pixel capacitor 15 of (1 * n) pixel 11, storage is until next write operation.So, just n piece video data has been shown as single file video data DATA.
Fig. 2 shows the configuration of data driver 30.Data driver 30 is pressed from first concatenated in order to x along column (columnar) direction.Here, x is the integer more than 2.
Gray scale voltage generating circuit 37 comprises a plurality of gray correction resistive element (not shown) that are connected in series.
Gray scale voltage generating circuit 37 will be divided into a plurality of grayscale voltages by the reference voltage that power circuit provides through a plurality of gray correction resistive elements.For example; If in TFT type liquid crystal display 1 with 64 grades of gray scale display images; Gray scale voltage generating circuit 37 just is divided into the positive grayscale voltage with 64 grades of gray scales with 63 gray correction resistive element R0 to R62 with reference voltage V0 to V7, as a plurality of grayscale voltages.For negative grayscale voltage also is like this.
Below, will explain the operation of TFT type liquid crystal display 1.
For example, timing controller 2 provides clock signal clk and single file video data DATA to x data driver 30, and to first data driver 30 shift pulse signal STH is provided.Each data driver responds clock signal clk and shift pulse signal STH respectively in x the data driver 30, is contained in the n piece video data among the single file video data DATA to n bar data line D1 to Dn output.
At i (here; I=1,2 ... And x-1) in the individual data driver 30; N in the shift register 31 shift register is synchronized with clock signal clk and successively shift pulse signal STH is shifted, and then, exports it in the data register 32 n data register.N shift register in the shift register 31 exports shift pulse signal STH in the data register 32 n data register; And with its export to (i+1) (here i=1,2 ... And x-1) individual data driver 30 (that is cascade output).In x data driver 30, the shift register of the n in the shift register 31 is synchronized with clock signal clk and successively shift pulse signal STH is shifted, and then, exports it in the data register 32 n data register.
In each data driver in x data driver 30; N in the data register 32 data register is synchronized with the shift pulse signal STH that n shift register in the shift register 31 export respectively and obtains the n piece video data that is provided by timing controller 2, exports it to latch cicuit 33 then.N in the latch cicuit 33 latch cicuit latchs the n piece video data that n data register by data register 32 provides in identical timing respectively, and exports it to level shifter 34.N in the level shifter 34 level shifter carries out level to n piece video data respectively and moves, and exports it to DAC 35 then.In DAC 35, n DAC carries out D/A switch to the n piece video data that is provided by the level shifter of the n in the level shifter 34 respectively, and then, n switching device switches output.
As shown in Figure 3; For example; Odd number (first, the 3rd ... And (n-1)) PchDAC respectively according to odd number (first, the 3rd ... And (n-1)) the video data piece of level shifter output; From positive grayscale voltage, select output gray level voltage with 64 grades of gray scales, then via odd number (first, the 3rd ... And (n-1)) switching device, with its export to odd number amplifier 36-1 in the amplifying circuit 36,36-3 ... And 36-(n-1).In this case; Even number (second, the 4th ... And n) NchDAC respectively according to even number (second, the 4th ... And n) the video data piece of level shifter output; From negative grayscale voltage, select output gray level voltage with 64 grades of gray scales; Then via even number (second, the 4th ... And n) switching device, with its export to even number amplifier 36-2 in the amplifying circuit 36,36-4 ... And 36-n.
On the contrary; Under the situation of reverse drive; As shown in Figure 3, odd number (first, the 3rd ... And (n-1)) PchDAC respectively according to odd number (first, the 3rd ... And (n-1)) the video data piece of level shifter output, from positive grayscale voltage, select output gray level voltage with 64 grades of gray scales; Then via odd number (first, the 3rd ... And (n-1)) switching device, with its export to even number amplifier 36-2 in the amplifying circuit 36,36-4 ... And 36-n.In this case; Even number (second, the 4th ... And n) NchDAC respectively according to even number (second, the 4th ... And n) the video data piece of level shifter output; From negative grayscale voltage, select output gray level voltage with 64 grades of gray scales; Then via even number (second, the 4th ... And n) switching device, with its export to odd number amplifier 36-1 in the amplifying circuit 36,36-3 ... And 36-(n-1).
Therefore, DAC 35 is to n the output gray level voltage of amplifying circuit 36 outputs through D/A switch output gray level voltage and output switching.N in the amplifying circuit 36 amplifier 36-1 to 36-n imports n output gray level voltage respectively, exports it to n bar data line D1 to Dn then.
Because above-mentioned display panel (is example with the display panels) is had very high accuracy requirement, thereby, the width of signal wire such as gate lines G 1 to Gm and data line D1 to Dn is reduced.As a result, impurity in the process or the defective in the photoetching process very easily cause the signal wire fracture.If signal wire breaks off when driver output is used for the drive signal of drive signal line, just can't drive and be arranged in the preceding pixel of breaking part.For example; Suppose with above-mentioned data driver 30 expression drivers; With above-mentioned data line D1 to Dn expression signal line, with a said n output gray level voltage (being n piece video data) expression drive signal, if data line Dj (here; J is an integer that satisfies expression formula: 1≤j≤n) break off, then can't drive and be arranged in the preceding pixel 11 of breaking part.In this case, display device will become defect ware.Have only when in terminal stage, make display panel, and connect and during parts such as assembling driver, substrate, could find this defective, thereby when the discovery defective, pay huge cost.
In order to address this problem; At japanese publication application JP-A-Heisei; Among the 8-171081 in the disclosed technology; Arrange in driver that is in advance repaired a circuit (also claiming the rescue circuit), thereby make when finding fracture, can be via the pixel of repairing before drives is arranged in breaking portion.Below, be example just with above-mentioned TFT type liquid crystal display, this technology is explained brief and concisely.
As shown in Figure 4, the data driver 30 in the TFT type liquid crystal display also is equipped with repair amplifier 40.For ease of explanation, repair amplifier 40 and data driver were opened explanation in 30 minutes.Repair amplifier 40 is installed on the chip, and comprises such as two repair amplifier 40-1 and 40-2.TFT type liquid crystal display 1 also is equipped with auxiliary the connecting that is installed on the glass substrate 3.
If on data line Dj, find fracture 43, just it is connected together at 41 the crossover location of connecting with a part and assisting Dj ' (be called and connect data line) expression, that still be connected to the data line Dj of amplifier 36-j.In addition, the input end of the 40-1 of repair amplifier and auxiliary 41 the crossover location 45 of connecting will assist connect 41 be connected to the 40-1 of repair amplifier input end.In addition, the output terminal of the 40-1 of repair amplifier is connected to auxiliary 41 the crossover location 46 of connecting at the output terminal of the 40-1 of repair amplifier and auxiliaryly connects 42.In addition, with Dj " connect 42 crossover location 47 of the part of (being called the turn-off data line) data line Dj expression, that be not connected to amplifier 36-j and auxiliary, with auxiliary connect 42 be connected to data line Dj this part.So, with regard to use by amplifier 36-j, connect data line Dj ', point of crossing 44, auxiliaryly connect 41, point of crossing 45, repair amplifier 40-1, point of crossing 46, auxiliaryly connect 42, point of crossing 47 and do not connect data line Dj " passage that constitutes made up the reparation circuit.Utilize to repair circuit, can drive the pixel 11 that is arranged in before the breaking portion 43.Here, repair amplifier 40-1 is used to compensate the decline by repairing the driveability that circuit caused.
To containing in the process that the display driver IC of repairing circuit carries out electrical specification inspection,, also to carry out electrical specification inspection to repair amplifier 40-1 and 40-2 except other electrical specifications inspections.
As shown in Figure 5, the data driver 30 in the TFT type liquid crystal display 1 also is equipped with the pad that is used to carry out the electrical specification inspection.Pad is installed on the chip.
Pad comprises: o pads 56-1 to 56-n, reparation input pad 51-1 and 51-2 and reparation o pads 52-1 and 52-2.O pads 56-1 to 56-n is connected to the output terminal of n amplifier 36-1 to 36-n in the amplifying circuit 36 respectively.Repair the input end that input pad 51-1 and 51-2 are connected to repair amplifier 40-1 and 40-2 respectively.Repair the output terminal that o pads 52-1 and 52-2 are connected to repair amplifier 40-1 and 40-2 respectively.
When carrying out the electrical specification inspection, measuring equipment 53 is connected to chip.Measuring equipment 53 comprises: probe 54 and tester 55.Can be with the LSI tester of producing in enormous quantities as tester 55.
For example, carrying out electrical specification when inspection, the output delay of each amplifier among n amplifier 36-1 to 36-n in the measuring equipment 53 test amplifying circuits 36.In this case, probe 54 inputs export this drive signal to tester 55 then through DAC 35, through the output switching, via the drive signal (being output gray level voltage) that n amplifier 36-1 to 36-n offers o pads 56-1 to 56-n.Tester 55 then, is made judgement according to the output delay time of expression output delay to quality according to the output delay of each amplifier among n amplifier 36-1 to 36-n of drive signal test.The basis of judging quality is whether output delay time has surpassed the predetermined upper limit.For example, if output delay time is lower than the upper limit, just show that this product is certified products; Otherwise,, just show that this product is a defect ware if output delay time is higher than the upper limit.
In addition, as one of content of electrical specification inspection, the output delay of each amplifier among measuring equipment 53 test repair amplifier 40-1 and the 40-2.In this case, tester 55 offers signal and repairs input pad 51-1 and 51-2.Probe 54 receives through repair amplifier 40-1 and 40-2 and offers the signal of repairing o pads 52-1 and 52-2, then, exports these two signals to tester 55.Tester 55 according to the output delay of above-mentioned signal testing repair amplifier 40-1 and 40-2, is made judgement according to the output delay time of expression output delay to quality respectively then.
Summary of the invention
Yet; When repair amplifier 40-1 and 40-2 being carried out the electrical specification inspection; There is such problem; That is: because the restriction of tester specification, when judging the output delay quality of repair amplifier 40-1,40-2, can not be with quality being judged with the similar mode of output delay of judging n amplifier 36-1 to 36-n in the amplifying circuit 36.
In other words, when the output delay of n amplifier 36-1 to 36-n of test, amplifier 36-1 to 36-n input is from the aanalogvoltage (output gray level voltage) of DAC 35.Therefore, the output terminal that is utilized among the inspection DAC 35 switches the characteristic when importing, and the quality of the output delay of each amplifier of pair amplifier 36-1 to 36-n is judged.Yet,, be difficult to switch with the output terminal among the input end reproduction DAC 35 of the LSI tester of producing in enormous quantities 55 because tester 55 abilities or cost are limited.
In addition, in some cases, from the angle of the cost of the LSI tester 55 produced in enormous quantities, there is a limit in the maximum input analog voltage of testing apparatus.If under the maximum input range that this maximal value less than the maximal value from the aanalogvoltage of DAC 35, just can't be considered in the delay of repair amplifier 40-1 and 40-2 reach maximum the quality of time delay is made judgement.
That is to say that existence can't use the product of batch process accurately to judge the problem of repair amplifier 40-1 and 40-2 quality.
In first scheme of the present invention, the data driver of display device comprises: DAC (digital to analog converter) is configured to comprise the output terminal that is used to export the drive signal that drives the display unit signal wire; Amplifier, configuration are used for the drive signal of being exported by DAC is amplified, and comprise the output terminal that is used for to the signal wire output drive signal; Repair amplifier; Be configured to comprise input end and output terminal, wherein, when fracture takes place in signal wire; Signal wire is divided into the connection data line that is connected to amplifier by breakpoint; And the turn-off data line that is not connected to amplifier, and the input end of repair amplifier is connected to the connection data line, and the output terminal of repair amplifier is connected to the turn-off data line; And switch, configuration is used for when carrying out test pattern repair amplifier is tested, and to the input end of repair amplifier drive signal is provided.
In another program of the present invention, in the method for testing of the data driver that is used for testing display device, display device comprises: DAC (digital to analog converter) is configured to comprise the output terminal that is used to export the drive signal that drives the display unit signal wire; Amplifier, configuration are used for the drive signal of being exported by DAC is amplified, and comprise the output terminal that is used for to the signal wire output drive signal; And repair amplifier; Be configured to comprise input end and output terminal, wherein, when fracture takes place in signal wire; Signal wire is divided into the connection data line that is connected to amplifier by breakpoint; And the turn-off data line that is not connected to amplifier, and the input end of repair amplifier is connected to the connection data line, and the output terminal of repair amplifier is connected to the turn-off data line.Method of testing comprises: before carrying out test pattern, according to the input of repair amplifier input end, the measuring equipment that will be used to test repair amplifier is connected to data driver; And when carrying out test pattern, drive signal is offered the input end of repair amplifier on the booster amplifier.
In another scheme of the present invention; In being designed for the probe that the data driver of display device is tested; Data driver comprises: DAC (digital to analog converter) is configured to comprise the output terminal that is used to export the drive signal that drives the display unit signal wire; Amplifier, configuration are used for the drive signal of being exported by DAC is amplified, and comprise the output terminal that is used for to the signal wire output drive signal; And repair amplifier; Be configured to comprise input end and output terminal, wherein, when fracture takes place in signal wire; Signal wire is divided into the connection data line that is connected to amplifier by breakpoint; And the turn-off data line that is not connected to amplifier, and the input end of repair amplifier is connected to the connection data line, and the output terminal of repair amplifier is connected to the turn-off data line.Probe comprises: normal wiring, test wire and switch.Under normal test pattern, switch with data driver and the tester that is used to carry out test link to each other, and the output terminal of amplifier is linked to each other with tester, so that amplifier output signal is offered tester.Under the test pattern of test, switch is the output terminal of amplifier and tester disconnection, the output terminal of amplifier linked to each other with the input end of repair amplifier, so that based on drive signal the signal of the output of repair amplifier is offered tester.
According to the data driver according to display device of the present invention, when carrying out test pattern, switch 60-1,60-2 offer drive signal (output gray level voltage) input end of repair amplifier 40-1,40-2.Thereby the range value that inputs to the aanalogvoltage (output gray level voltage) of the input end of repair amplifier 40-1 and 40-2 equals to test normal amplifier 36, the range value of the aanalogvoltage the during output delay of 36-1 to 36-n.Therefore, can carry out and pair amplifier 36 test of the output delay test equivalence of 36-1 to 36-n to the output terminal of repair amplifier 40-1 and 40-2.Thereby, can utilize the LSI tester 55 of production in enormous quantities, the output delay according to repair amplifier 40-1 and 40-2 accurately makes a determination to quality.
Description of drawings
Through the explanation below in conjunction with some preferred embodiment of accompanying drawing, above-mentioned and other purposes, advantage and characteristic of the present invention will be more obvious.In the accompanying drawing:
Fig. 1 shows the configuration of TFT type liquid crystal display in the correlation technique;
Fig. 2 shows the configuration of the data driver 30 in the TFT type liquid crystal display in the correlation technique;
Fig. 3 shows in the correlation technique configuration of DAC 35 and amplifying circuit 36 in the data driver 30;
Fig. 4 shows the inner reparation circuit of data driver in the configuration of TFT type liquid crystal display in the correlation technique 30;
Fig. 5 shows the data driver 30 in the correlation technique and is connected to data driver 30 and comprises probe 54 and the measuring equipment 53 of tester 55;
Fig. 6 shows according to the data driver 30 of first embodiment and is connected to data driver 30 and comprises probe 54 and the measuring equipment 53 of tester 55;
Fig. 7 shows according to the data driver 30 of second embodiment and is connected to data driver 30 and comprises probe 54 and the measuring equipment 53 of tester 55; And
Fig. 8 shows according to the data driver 30 of the 3rd embodiment and is connected to data driver 30 and comprises probe 54 and the measuring equipment 53 of tester 55.
Embodiment
Below, will be with reference to accompanying drawing, to explaining according to the data driver that is used for display device of the embodiment of the invention, the method for testing and the probe of data driver.Here, hereinafter to only doing simple the explanation with similar configuration noted earlier and operation (description in background technology and the summary of the invention).
(first embodiment)
[configuration]
Fig. 6 shows according to the data driver 30 of the TFT type liquid crystal display of the first embodiment of the present invention, is connected to data driver 30 and comprises probe 54 and the configuration of the measuring equipment 53 of tester 55.Data driver 30 is equipped with switch 60-1 and 60-2 and testing weld pad 61.Switch 60-1 and 60-2 and testing weld pad 61 are installed on the chip.When carrying out the electrical specification inspection that will explain after a while, the testing apparatus 53 that comprises probe 54 and tester 55 is connected with chip.
Testing weld pad 61 is connected to switch 60-1 and 60-2 through wiring.Repair amplifier 40-1 and 40-2 are arranged in respectively near the amplifier 36-1 and 36-n in the inner amplifying circuit 36 of data driver 30.Switch 60-1 and 60-2 insert respectively between the DAC 35 and amplifier 36-1 and amplifier 36-2 of data driver 30 inside.Each all comprises among switch 60-1 and the 60-2: be connected to the output terminal of DAC 35 terminal " a ", be connected to the terminal " b " of amplifier 36-1 and each amplifier input terminal of 36-n and be connected to repair amplifier 40-1 and the terminal of the input end of each repair amplifier of 40-2 " c ".
[operation]
Apply test mode signal TEST to testing weld pad 61.For example, when the signal level of test mode signal TEST is in unactivated state, carry out normal mode (first test pattern).On the contrary, when the signal level of test mode signal TEST is in state of activation, carry out test pattern (second test pattern), be used for repair amplifier 40-1 and 40-2 are tested.
Under normal mode, each switch place in switch 60-1 and 60-2, terminal a and b are connected to each other.In other words, each amplifier input terminal is connected with each other via each switch among switch 60-1 and the 60-2 among the output terminal of DAC 35 and amplifier 36-1 and the 36-n.
For example, under normal mode, measuring equipment 53 is carrying out electrical specification when inspection, the output delay of each amplifier among the test amplifier 36-1 to 36-n.In this case, probe 54 input drive signals (output gray level voltage), this drive signal is switched according to output by DAC 35, offers o pads 56-1 to 56-n through amplifier 36-1 to 36-n, exports tester 55 then to.Tester 55 then, is made judgement according to the output delay time of expression output delay to quality according to the output delay of this drive signal test amplifier 36-1 to 36-n.
Under test pattern, each switch place in switch 60-1 and 60-2, terminal a and c are connected with each other.In other words, the output terminal of DAC 35 is connected to the input end of each repair amplifier among repair amplifier 40-1 and the 40-2, and is not the input end that is connected to amplifier 36-1 and 36-n via each switch among switch 36-1 and the 36-n.
For example, under test pattern, the output delay of repair amplifier among measuring equipment 53 test repair amplifier 40-1 and the 40-2.In this case, probe 54 input drive signals (output gray level voltage), this drive signal is switched according to output by DAC 35, offers reparation o pads 52-1 and 52-2 through repair amplifier 40-1 and 40-2, exports tester 55 then to.Tester 55 then, is made judgement according to the output delay time of expression output delay to quality according to the output delay of this signal testing repair amplifier 40-1 and 40-2.
[effect]
As stated; According to the first embodiment of the present invention; When in the data driver 30 of TFT type liquid crystal display 1, carrying out test pattern (second test pattern), switch 60-1 and 60-2 put on drive signal (output gray level voltage) input end of repair amplifier 40-1 and 40-2.Thereby, the range value of the aanalogvoltage the when range value that inputs to the aanalogvoltage (output gray level voltage) of the input end of repair amplifier 40-1 and 40-2 equals to test in the normal amplifying circuit 36 output delay of each amplifier among n the amplifier 36-1 to 36-n.Therefore, can carry out and the equivalent test of output delay test that each amplifier among n the amplifier 36-1 to 36-n is carried out the output terminal of repair amplifier 40-1 and 40-2.Thereby, can utilize the LSI tester 55 of production in enormous quantities, the output delay according to repair amplifier 40-1 and 40-2 accurately makes a determination to quality.
(second embodiment)
[configuration]
Fig. 7 shows according to the data driver 30 of the TFT type liquid crystal display 1 of second embodiment of the invention, is connected to data driver 30 and comprises probe 54 and the configuration of the measuring equipment 53 of tester 55.Data driver 30 is equipped with switch 60-1 and 60-2, testing weld pad 61 and auxiliary DAC 70-1 and 70-2.Switch 60-1 and 60-2, testing weld pad 61 and auxiliary DAC 70-1 and 70-2 are installed on the chip.When carrying out the electrical specification inspection, the testing apparatus 53 that comprises probe 54 and tester 55 is connected with chip.
Testing weld pad 61 is connected to switch 60-1 and 60-2 and auxiliary DAC 70-1 and 70-2 through wiring.Repair amplifier 40-1 and 40-2 are arranged in respectively near the amplifier 36-1 and 36-n in the inner amplifying circuit 36 of data driver 30.Switch 60-1 and 60-2 insert respectively between auxiliary DAC 70-1 and 70-2 and repair amplifier 40-1 and the 40-2.Each all comprises among switch 60-1 and the 60-2: the terminal " b " that is connected to the terminal " a " of each amplifier input terminal among repair amplifier 40-1 and the 40-2 and is connected to the output terminal of auxiliary DAC 70-1 and each auxiliary DAC of 70-2.
Each auxiliary DAC is single output circuit of DAC 35 among auxiliary DAC 70-1 and the 70-2.When carrying out test pattern (second test pattern) repair amplifier 40-1 and 40-2 are tested, auxiliary DAC 70-1 and 70-2 export the drive signal (output gray level voltage) identical with the output of DAC 35.
[operation]
Apply test mode signal TEST to testing weld pad 61.For example, when the signal level of test mode signal TEST is in unactivated state, carry out normal mode (first test pattern).On the contrary, when the signal level of test mode signal TEST is in state of activation, carry out test pattern (second test pattern).
Under normal mode, each switch place in switch 60-1 and 60-2, terminal a and b break off each other.In other words, via each switch among switch 60-1 and the 60-2, will assist the output terminal of DAC 70-1 and 70-2 and the input end of repair amplifier 40-1 and 40-2 to break off each other respectively.
For example, under normal mode, measuring equipment 53 is tested the output delay of each amplifier among the n in the amplifying circuit 36 the amplifier 36-1 to 36-n when carrying out the electrical specification inspection.In this case, probe 54 input drive signals (output gray level voltage), this drive signal is switched according to output by DAC 35, offers o pads 56-1 to 56-n through n amplifier 36-1 to 36-n, exports tester 55 then to.Tester 55 then, is made judgement according to the output delay time of expression output delay to quality according to the output delay of this drive signal test amplifier 36-1 to 36-n.
Under test pattern, each switch place in switch 60-1 and 60-2, terminal a and b are connected with each other.In other words, via each switch among switch 60-1 and the 60-2, auxiliary DAC 70-1 and the output terminal of 70-2 and the input end of repair amplifier 40-1 and 40-2 are connected with each other.
For example, under test pattern, the output delay of each repair amplifier among measuring equipment 53 test repair amplifier 40-1 and the 40-2.In this case; Probe 54 input drive signals (output gray level voltage); This drive signal is switched according to output by each auxiliary DAC among auxiliary DAC 70-1 and the 70-2, offers reparation o pads 52-1 and 52-2 through repair amplifier 40-1 and 40-2, exports tester 55 then to.Tester 55 then, is made judgement according to the output delay time of expression output delay to quality according to the output delay of this signal testing repair amplifier 40-1 and 40-2.
[effect]
As stated; According to the second embodiment of the present invention; In the data driver 30 of TFT type liquid crystal display 1; As such among first embodiment, when carrying out test pattern (second test pattern), switch 60-1 and 60-2 offer drive signal (output gray level voltage) input end of repair amplifier 40-1 and 40-2.Thereby, the range value of the aanalogvoltage the when range value that inputs to the aanalogvoltage (output gray level voltage) of the input end of repair amplifier 40-1 and 40-2 equals to test in the normal amplifying circuit 36 output delay of each amplifier among n the amplifier 36-1 to 36-n.Therefore, can carry out and the equivalent test of output delay test that each amplifier among n the amplifier 36-1 to 36-n is carried out the output terminal of repair amplifier 40-1 and 40-2.Thereby, can utilize the LSI tester 55 of production in enormous quantities, the output delay according to repair amplifier 40-1 and 40-2 accurately makes a determination to quality.
(the 3rd embodiment)
[configuration]
Fig. 8 shows according to data driver 30 in the TFT type liquid crystal display 1 of third embodiment of the invention, is connected to data driver 30 and comprises probe 54 and the configuration of the measuring equipment 53 of tester 55.When carrying out the electrical specification inspection, the testing apparatus 53 that comprises probe 54 and tester 55 is connected with chip.Probe 54 comprises: switch 60-1 and 60-2 and test wire 80-1 and 80-2.
Repair amplifier 40-1 and 40-2 are arranged in respectively near the amplifier 36-1 and 36-n in the inner amplifying circuit 36 of data driver 30.Switch 60-1 and 60-2 insert respectively between the o pads 56-1 and 56-2 and tester 55 on the probe 54.Each all comprises among switch 60-1 and the 60-2: be connected to the terminal " a " of the output terminal of each o pads among o pads 56-1 and the 56-n, the terminal " c " that is connected to the terminal " b " of tester 55 and is connected to each test wire among test wire 80-1 and the 80-2.
[operation]
Apply test mode signal TEST to switch 60-1 and 60-2 from tester 55.For example, when the signal level of test mode signal TEST is in unactivated state, carry out normal mode (first test pattern).On the contrary, when the signal level of test mode signal TEST is in state of activation, carry out test pattern (second test pattern).
Under normal mode, each switch place in switch 60-1 and 60-2, terminal a and b are connected to each other.In other words, via each switch among switch 60-1 and the 60-2, on probe 54, o pads 56-1 and 56-n and tester 55 are connected with each other.
For example, under normal mode, measuring equipment 53 is carrying out electrical specification when inspection, the output delay of each amplifier among n the amplifier 36-1 to 36-n of test amplifying circuit 36.In this case, probe 54 input drive signals (output gray level voltage), this drive signal is switched according to output by DAC 35, offers o pads 56-1 to 56-n through n amplifier 36-1 to 36-n, exports tester 55 then to.Tester 55 then, is made judgement according to the output delay time of expression output delay to quality according to the output delay of this drive signal test amplifier 36-1 to 36-n.
Under test pattern, each switch place in switch 60-1 and 60-2, terminal a and c are connected with each other.In other words, via test wire 80-1 and 80-2 o pads 56-1 and 56-2 are connected to reparation input pad 51-1 and 51-2 respectively, and are not connected to tester 55.
For example, under test pattern, the output delay of each repair amplifier among measuring equipment 53 test repair amplifier 40-1 and the 40-2.In this case, probe 54 input drive signals (output gray level voltage), this drive signal is switched according to output by DAC 35, offers reparation o pads 52-1 and 52-2 through repair amplifier 40-1 and 40-2, exports tester 55 then to.Tester 55 then, is made judgement according to the output delay time of expression output delay to quality according to the output delay of this signal testing repair amplifier 40-1 and 40-2.
[effect]
As stated; According to the third embodiment of the present invention; As such in first and second embodiment, when in probe 54, carrying out test pattern (second test pattern), switch 60-1 and 60-2 offer drive signal (output gray level voltage) input end of repair amplifier 40-1 and 40-2.Thereby, the range value of the aanalogvoltage the when range value that inputs to the aanalogvoltage (output gray level voltage) of the input end of repair amplifier 40-1 and 40-2 equals to test in the normal amplifier 36 output delay of each amplifier among n the amplifier 36-1 to 36-n.Therefore, can carry out and the equivalent test of output delay test that each amplifier among n the amplifier 36-1 to 36-n is carried out the output terminal of repair amplifier 40-1 and 40-2.Thereby, can utilize the LSI tester 55 of production in enormous quantities, the output delay according to repair amplifier 40-1 and 40-2 accurately makes a determination to quality.
In addition, in the third embodiment of the present invention, need arrange neither that in data driver 30 switch does not need calibrating terminal yet.Thereby, compare with first and second embodiment, can reduce the chip layout area of data driver 30 chips.
Although above combination some embodiment of the present invention are illustrated it; Yet for one of ordinary skill in the art; Obviously, the exemplary embodiments that provides is not above explained accompanying claims and should not rely on it from limited significance just for the present invention is given example description.
Claims (5)
1. the data driver of a display device comprises:
DAC is configured to comprise the output terminal that is used to export the drive signal that drives the display unit signal wire;
Amplifier is configured to the drive signal of being exported by DAC is amplified, and comprises the output terminal that is used for to the signal wire output drive signal;
Repair amplifier; Be configured to comprise input end and output terminal, wherein, when fracture takes place in signal wire; Signal wire is divided into the connection data line that is connected to amplifier by breakpoint; And the turn-off data line that is not connected to amplifier, and the input end of repair amplifier is connected to the connection data line, and the output terminal of repair amplifier is connected to the turn-off data line; And
Switch is configured to when carrying out test pattern repair amplifier is tested, and to the input end of repair amplifier drive signal is provided.
2. the data driver of display device according to claim 1, wherein, under normal mode, switch links to each other the output terminal of DAC with amplifier input terminal, makes the drive signal of DAC output input to amplifier, and
Switch responds the test mode signal that is used to carry out test pattern, output terminal and the amp.in of DAC is broken off, and the output terminal of DAC is linked to each other with the input end of repair amplifier.
3. the data driver of display device according to claim 1 also comprises:
Auxiliary DAC is configured to the test mode signal that is used to carry out test pattern respond, the identical output signal of drive signal that output and DAC export,
Wherein, under normal mode, switch responds test mode signal, the output terminal of auxiliary DAC and the input end of repair amplifier is broken off, and will assist the output terminal of DAC to link to each other with the input end of repair amplifier.
4. method of testing that is used to test display device, wherein display device comprises:
DAC is configured to comprise the output terminal that is used to export the drive signal that drives the display unit signal wire;
Amplifier is configured to the drive signal of being exported by DAC is amplified, and comprises the output terminal that is used for to the signal wire output drive signal; And
Repair amplifier is configured to comprise input end and output terminal, wherein; When fracture takes place in signal wire; Signal wire is divided into the connection data line that is connected to amplifier by breakpoint, and the turn-off data line that is not connected to amplifier, and the input end of repair amplifier is connected to the connection data line; The output terminal of repair amplifier is connected to the turn-off data line, and
Said method comprises:
Before carrying out test pattern, according to the input of repair amplifier input end, the measuring equipment that will be used to test repair amplifier is connected to data driver; And
When carrying out test pattern, drive signal is offered the input end of repair amplifier on the booster amplifier.
5. one kind is designed for the probe that the data driver of display device is tested, and wherein data driver comprises:
DAC is configured to comprise the output terminal that is used to export the drive signal that drives the display unit signal wire;
Amplifier is configured to the drive signal of being exported by DAC is amplified, and comprises the output terminal that is used for to the signal wire output drive signal; And
Repair amplifier is configured to comprise input end and output terminal, wherein; When fracture takes place in signal wire; Signal wire is divided into the connection data line that is connected to amplifier by breakpoint, and the turn-off data line that is not connected to amplifier, and the input end of repair amplifier is connected to the connection data line; The output terminal of repair amplifier is connected to the turn-off data line, and
Probe comprises:
Normal wiring;
Test wire; And
Switch is configured to:
Under normal test pattern, with data driver and the tester that is used to carry out test link to each other, and the output terminal of amplifier is linked to each other with tester, so that amplifier output signal is offered tester; And
Under the test pattern of test, with the output terminal of amplifier and tester disconnection, the output terminal of amplifier is linked to each other with the input end of repair amplifier, so that the signal of the output of repair amplifier is offered tester based on drive signal.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007180083A JP4953948B2 (en) | 2007-07-09 | 2007-07-09 | Display device data driver, test method thereof, and probe card |
| JP2007-180083 | 2007-07-09 | ||
| JP2007180083 | 2007-07-09 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101345018A CN101345018A (en) | 2009-01-14 |
| CN101345018B true CN101345018B (en) | 2012-08-08 |
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ID=40247014
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2008101361181A Expired - Fee Related CN101345018B (en) | 2007-07-09 | 2008-07-09 | Data driver for display device, test method and probe card for data driver |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US8217923B2 (en) |
| JP (1) | JP4953948B2 (en) |
| CN (1) | CN101345018B (en) |
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| KR101499230B1 (en) * | 2008-12-19 | 2015-03-06 | 삼성디스플레이 주식회사 | Displayf device |
| CN102388415B (en) | 2009-04-13 | 2014-06-18 | 夏普株式会社 | Display apparatus, liquid crystal display apparatus, drive method for display apparatus, and television receiver |
| US8810268B2 (en) * | 2010-04-21 | 2014-08-19 | Taiwan Semiconductor Manufacturing Company, Ltd. | Built-in self-test circuit for liquid crystal display source driver |
| KR20110124039A (en) * | 2010-05-10 | 2011-11-16 | 삼성전자주식회사 | Data driver for driving a display panel and display device comprising the same |
| CN101996606A (en) * | 2010-11-30 | 2011-03-30 | 中国工程物理研究院流体物理研究所 | Liquid crystal driving circuit and liquid crystal display device |
| TW201234328A (en) * | 2011-02-11 | 2012-08-16 | Novatek Microelectronics Corp | Display driving circuit and operation method applicable thereto |
| CN102651185A (en) * | 2011-02-23 | 2012-08-29 | 联咏科技股份有限公司 | Display drive circuit and operation method thereof |
| US9164301B2 (en) * | 2011-04-08 | 2015-10-20 | Sharp Kabushiki Kaisha | Display device |
| US9430957B2 (en) * | 2011-09-28 | 2016-08-30 | Shenzhen China Star Optoelectronics Technology Co., Ltd. | Virtual load board and test system and test method for liquid crystal display control board |
| TWI463471B (en) * | 2012-08-13 | 2014-12-01 | Novatek Microelectronics Corp | Driving apparatus of liquid crystal display panel |
| TWI475539B (en) * | 2013-01-17 | 2015-03-01 | Raydium Semiconductor Corp | Driving circuit having built-in-self-test function |
| KR102041481B1 (en) * | 2013-02-27 | 2019-11-07 | 삼성디스플레이 주식회사 | Organic Light Emitting Display and Driving Method Thereof |
| KR102030632B1 (en) * | 2013-04-22 | 2019-10-14 | 삼성디스플레이 주식회사 | Organic Light Emitting Display and Driving Method Thereof |
| KR102103609B1 (en) * | 2014-09-23 | 2020-04-23 | 매그나칩 반도체 유한회사 | Liquid crystal display device with Repair function and Repair type Data format structrue |
| KR20160057553A (en) * | 2014-11-13 | 2016-05-24 | 삼성디스플레이 주식회사 | Display device |
| KR20160148829A (en) * | 2015-06-16 | 2016-12-27 | 삼성디스플레이 주식회사 | Display device and reparing method thereof |
| JP6706954B2 (en) * | 2016-04-01 | 2020-06-10 | 三菱電機株式会社 | Driver IC and liquid crystal display device |
| KR102566085B1 (en) * | 2016-07-07 | 2023-08-14 | 삼성디스플레이 주식회사 | Display panel and display device including the same |
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| CN112384969B (en) * | 2018-07-13 | 2023-09-12 | 堺显示器制品株式会社 | display device |
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Also Published As
| Publication number | Publication date |
|---|---|
| JP4953948B2 (en) | 2012-06-13 |
| US20090015572A1 (en) | 2009-01-15 |
| US8217923B2 (en) | 2012-07-10 |
| JP2009015247A (en) | 2009-01-22 |
| CN101345018A (en) | 2009-01-14 |
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