CN1889802A - Detection repairing system - Google Patents

Detection repairing system Download PDF

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Publication number
CN1889802A
CN1889802A CN 200510081049 CN200510081049A CN1889802A CN 1889802 A CN1889802 A CN 1889802A CN 200510081049 CN200510081049 CN 200510081049 CN 200510081049 A CN200510081049 A CN 200510081049A CN 1889802 A CN1889802 A CN 1889802A
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CN
China
Prior art keywords
light emitting
organic light
emitting apparatus
micro
energy beam
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Pending
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CN 200510081049
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Chinese (zh)
Inventor
廖孟傑
陈济中
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RiTdisplay Corp
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RiTdisplay Corp
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Priority to CN 200510081049 priority Critical patent/CN1889802A/en
Publication of CN1889802A publication Critical patent/CN1889802A/en
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Abstract

A detecting and repairing unit is featured as exerting a bias on region to be detected at organic luminous unit when defect position is detected by detecting and repairing unit and utilizing a current detector to defect out defective position with current being distributed abnormally, using an energy beam generator to generate an energy beam being used to isolate defective position.

Description

Detect repair system
Technical field
The present invention relates to a kind of detection repair system, particularly a kind of in order to detect the detection repair system of the defective of repairing an organic light emitting apparatus.
Background technology
The various communications that the information communication industry has become now main flow industry, particularly portable show the emphasis that product develops especially.And because flat-panel screens is communication interface between people and the information, so its development particular importance that seems.The technology that is applied in flat-panel screens at present includes plasma display panel (Plasma Display Panel, PDP), LCD (LiquidCrystal Display, LCD), inorganic electroluminescence display (InorganicElectroluminescence Display, ELD), light-emitting diode (Light Emitting Diode, LED) display, vacuum fluorescent display (Vacuum Fluorescence Display, VFD), field-emitter display (Field Emission Display, FED) and electrochromics display (Electro-Chromic Display) or the like.
Compared to other flat-panel screens, organic luminous panel or organic illuminating element (below be generically and collectively referred to as organic light emitting apparatus) with its self-luminous, no visual angle, power saving, processing procedure is simple and easy, low-cost, operating temperature is extensive, the advantage of high answer speed and full-colorization or the like, make it have great potentiality, therefore be expected to become the main flow of flat-panel screens of future generation.
Organic light emitting apparatus is the product that a kind of self luminous characteristic of utilizing organic functional material (organic functionalmaterials) reaches display effect, it can be divided into micromolecule organic light emitting apparatus (small molecule OLED according to the molecular weight difference of organic functional material, SM-OLED) with macromolecule organic light emitting apparatus (polymer light-emitting device, PLED) two big classes.Its ray structure is made of pair of electrodes and at least one organic functional layer between electrode.When electric current by between two electrodes, electronics and electric hole can be in the organic functional layer again in conjunction with and produce exciton, make the organic functional layer according to its material behavior, and produce the mechanism of giving out light of different colours.
When making organic light emitting apparatus, if when having a little particulate to be attached to substrate to be coated surperficial, it is unusual to make behind the plated film picture element surface of formed organic light emitting apparatus produce the rete storehouse, even cause two interelectrode short circuit phenomenon of the picture element of organic light emitting apparatus, cause the brightness variation of device integral body and make the quality of organic light emitting apparatus and reliability influenced, therefore, for guaranteeing product quality, the detection of organic light emitting apparatus and reparation are very important important topic.
For addressing the above problem, the reparation board that the dealer can utilize a detection board and with light microscope to have the energy beam generator usually carries out the detection and the reparation of organic light emitting apparatus.
From the above, whether the existing detection mode picture element that utilizes a detection board with light microscope to inspect an organic light emitting apparatus in the mode of scanning exists defective and the defective position of being inspected out is located.Defective organic light emitting apparatus is moved to the reparation board with energy beam generator afterwards again and make defect repair, it repairs principle is to utilize the energy beam generator that the defective that is detected is shone with energy beam, so that defective is done contactless completely cutting off.
With regard to above-mentioned detection, repair mode, it utilizes light microscope to observe the magnified image of the picture element of organic light emitting apparatus one by one, and observes out the position of defective thus; Yet this kind view mode is labor intensive and time not only, and can't detect all defectives really because of artificial careless mistake easily.In addition, after there is defective in the picture element that detects organic light emitting apparatus, must again organic light emitting apparatus self-test board be moved to the reparation board, so that carry out repair action; Yet, on actual job, after organic light-emitting device self-test board moves on the reparation board, and can't make repair action at the defective of organic light emitting apparatus in real time, but must again defective locations be remake once search, locate after, the beginning can start and repairs one by one at the defective locations that is detected.
In addition; though being attached to the particulate of substrate surface to be coated, can to cause organic light emitting apparatus behind the plated film to produce the rete storehouse unusual; even cause two interelectrode short circuit phenomenon of the picture element of organic light emitting apparatus; but; when fine-grained particles is minimum, unusual slightly even organic light emitting apparatus produces the rete storehouse, still can not cause two interelectrode short circuits of the picture element of organic light emitting apparatus; this type of defective can be ignored it in actual utilization, must not repair.Yet in the existing detection mode, it is the defective of utilizing light microscope to inspect organic light emitting apparatus in the mode of scanning, the method also can't judge whether the defective of being inspected will cause two interelectrode short circuits, therefore when repairing phase, all detected defectives must be repaired one by one, in other words, if with prior art with all defectives that exist all through an one scan, location, the step that scans again, relocate, repair, then will cause expending of cost on the processing procedure.
From the above, the defective that how to detect efficiently, repair organic light emitting apparatus is one of important problem of current organic light emitting apparatus.
Summary of the invention
Because above-mentioned problem the objective of the invention is to overcome the deficiencies in the prior art and defective, provide a kind of and can detect, repair the detection repair system of the defective of organic light emitting apparatus efficiently.
For reaching above-mentioned purpose, the invention provides a kind of detection repair system, comprise a micro-device, a video capture device, a current sense device, a controller and an energy beam generator.In the present invention, micro-device amplifies the zone to be detected of an organic light emitting apparatus; Video capture device and micro-device link, and capture the area image that micro-device amplifies; Current sense device and micro-device link, and detect the unusual at least one defective locations of CURRENT DISTRIBUTION in micro-device institute amplified images; Controller links with video capture device and current sense device respectively, in order to storing the defective locations that magnified image that video capture device captured and current sense device are detected, and produce one first control signal according to its stored magnified image and defective locations data; Energy beam generator and controller and micro-device link, and the energy beam generator produces one in order to the energy beam that defective is isolated according to first control signal.
In addition, it is another kind of in order to detect, to repair the detection repair system of an organic light emitting apparatus that the present invention also provides, and comprises a micro-distancer, a controller, a current sense device and an energy beam generator.In the present invention, micro-distancer is in order to the position of detecting organic light emitting apparatus; Controller and micro-distancer link, and produce one the 3rd control signal in order to the detecting result of foundation micro-distancer, so that adjust the relative position of current sense device and organic light emitting apparatus automatically; The unusual at least one defective locations of current sense device detecting organic light emitting apparatus CURRENT DISTRIBUTION, this moment, controller produced one the 4th control signal according to the defective locations that is detected; Energy beam generator and controller link, and produce an energy beam in defective locations according to the 4th control signal, with isolated defective.
From the above, because of according to detection repair system of the present invention in detecting during defective locations, utilize micro-device and video capture device to amplify earlier and capture the area image to be detected of organic light emitting apparatus or utilize micro-distancer and controller to adjust the relative position and/or the distance of organic light emitting apparatus and current sense device automatically earlier, zone to be detected with organic light emitting apparatus applies bias voltage again, and utilizes the current sense device to detect the unusual defective locations of CURRENT DISTRIBUTION; Then utilize energy beam that defective is isolated, therefore needn't use two kinds of boards to finish detection, repair, and can locate organic light emitting apparatus automatically, to reduce issuable mistake of manual operation and waste of manpower resource; In addition, utilize to detect the unusual mode of CURRENT DISTRIBUTION and detect defective locations, can be fast and the position of correctly orienting defective.Therefore, the defective that can integrate detection efficiently, repair organic light emitting apparatus according to detection repair system of the present invention.
Description of drawings
Fig. 1 is a schematic diagram, shows the schematic diagram according to the detection repair system of preferred embodiment of the present invention;
Fig. 2 is a schematic diagram, shows the schematic diagram of detection repair system as shown in Figure 1, and it more comprises a carrying platform;
Fig. 3 for utilize detection repair system of the present invention detect, when repairing, the view of specific region picture element;
Fig. 4 is a schematic diagram, shows the schematic diagram according to the detection repair system of another preferred embodiment of the present invention.
Symbol description among the figure
1 detects repair system
11 micro-devices
12 video capture devices
13 current sense devices
14 controllers
15 energy beam generators
16 carrying platforms
161 power suppling parts
163 power supply terminals
165 negative power source terminal
17 displays
2 detect repair system
21 micro-distancers
23 current sense devices
24 controllers
25 energy beam generators
26 carrying platforms
261 power suppling parts
263 positive power terminal
265 negative power source terminal
27 displays
28 optical amplifiers
3 organic light emitting apparatus
31 defective locations
P1 video capture device (image CCD) institute picked image
The unusual defective image of P2 current sense device institute current detected distribution
The image of P3 after energy beam completely cuts off processing
Embodiment
Hereinafter with reference to relevant drawings, the detection repair system according to preferred embodiment of the present invention is described, wherein components identical will be illustrated with identical reference marks.What this must illustrate once more is to comprise organic luminous panel and organic illuminating element in the organic light emitting apparatus described in the present embodiment.
As Fig. 1 and shown in Figure 2, detection repair system 1 of the present invention comprises a micro-device 11, a video capture device 12, a current sense device 13, a controller 14, reaches an energy beam generator 15.
Micro-device 11 is in order to amplify the zone to be detected of an organic light emitting apparatus 3.Video capture device 12 links with micro-device 11, and captures the area image (P1 as shown in Figure 3) that is amplified by micro-device 11, and in present embodiment, video capture device 12 can be image CCD.
Current sense device 13 links with micro-device 11, and detects the unusual defective locations of CURRENT DISTRIBUTION (P2 as shown in Figure 3) in 11 amplified images of micro-device.Controller 14 links with video capture device 12 and current sense device 13 respectively, the defective locations that it is detected in order to the magnified image that stores video capture device 12 and captured and current sense device 13, and produce one first control signal according to its stored magnified image and defective locations data.In present embodiment, controller 14 can be computer, current sense device 13 can be infrared light (IR) current sense device, and it can correctly detect the CURRENT DISTRIBUTION in the zone to be detected of organic light emitting apparatus 3, so that further detect the unusual position of CURRENT DISTRIBUTION in this zone.
Energy beam generator 15 links with controller 14, and links with micro-device 11, and it produces one in order to the energy beam that defective is isolated according to first control signal, and energy beam penetrates (not being shown among the figure) via micro-device 11.So can be with the defect repair in the zone to be detected of an organic light emitting apparatus (P3 as shown in Figure 3).
Again, as shown in Figure 2, more comprise a carrying platform 16 according to the detection repair system 1 of preferred embodiment of the present invention, organic light emitting apparatus 3 is arranged on the carrying platform 16.Carrying platform 16 is provided with a power suppling part 161, as shown in Figure 2, power suppling part 161 has a positive power terminal 163 and a negative power source terminal 165 respectively, when whether the detecting of current sense device 13 desires has CURRENT DISTRIBUTION unusual, organic light emitting apparatus 3 provides a bias voltage by power suppling part 161, for example be negative bias or micro-forward bias, it is unusual that this bias voltage will make the circuit defect place CURRENT DISTRIBUTION occur.At this moment, controller 14 more produces one second control signal according to its stored magnified image and defective locations data, carrying platform 16 and energy beam generator 15 are relatively moved, the defective locations of organic light emitting apparatus 3 and energy beam generator 15 align, and make energy beam act on defective locations.In present embodiment, carrying platform 16 can be three mobile position platforms.
In addition, more can comprise a display 17 according to the detection repair system of preferred embodiment of the present invention, itself and controller 14 link, the picture of being exported in order to display controller 14.
In addition, please refer to shown in Figure 4ly, comprise a micro-distancer 21, a current sense device 23, a controller 24, an energy beam generator 25, an optical amplifier 28 and a carrying platform 26 according to the detection repair system 2 of another preferred embodiment of the present invention.
Micro-distancer 21 is in order to the position of Auto-Sensing one organic light emitting apparatus 3; Current sense device 23 sees through the unusual at least one defective locations 31 (P2 as shown in Figure 3) of optical amplifier 28 detecting organic light emitting apparatus 3 CURRENT DISTRIBUTION; Controller 24 links with micro-distancer 21, current sense device 23, optical amplifier 28 and energy beam generator 25 respectively, controller 24 produces one the 3rd control signal according to the detecting result of micro-distancer 21, so that locate organic light emitting apparatus 3 and current sense device 23 automatically.In the present embodiment, micro-distancer 21 can be a laser and focuses device, its send a detection signal (as laser beam) so as to judge organic light emitting apparatus 3 and current sense device 23 between distance.Wherein, controller 24 can be a computer, and the detection repair system 2 shown in the present embodiment more comprises a display 27, and itself and controller 24 links, the picture of being exported in order to display controller 24.In addition, the energy beam that energy beam generator 25 is produced can or have high-octane light beam for laser (for example laser of wavelength 532nm), radiation beam, the electron beam of specific wavelength, is enough to the function that defective is completely cut off.
From the above, micro-distancer 21 is a kind of instrument of detecting distance, its function is as the foundation of auxiliary correction organic light emitting apparatus 3 with the distance of current sense device 23 (or optical amplifier 28), can utilize laser, infrared ray, ultrasonic waves as the signal of detecting distance, and its signal can be by optical amplifier 28 or not via optical amplifier 28, and the micro-distancer 21 of present embodiment can be laser range finder, infrared ambulator or ultrasonic waves rangefinder relatively.
Moreover, optical amplifier 28 is optical facilities, purposes is image is amplified, to completely cut off the usefulness of defective as defective image detecting and conduction energy beam, the optical loupes group or the CCD optical coupling element that wherein can comprise different multiplying, the energy beam that mentioned energy beam generator 25 is produced among the present invention can be done the location to reach isolated effect by 28 pairs of defective locations of this optical amplifier.Be noted that the diameter of the energy beam that energy beam generator 25 is produced also can be controlled earlier, so that not via optical amplifier 28, directly energy beam is acted on defective locations, with isolated defective.
From the above, carrying platform 26 carrying organic light emitting apparatus 3, and also carrying platform 26 receives the 3rd control signal, organic light emitting apparatus 3 and current sense device 23 (or optical amplifier 28) so that foundation the 3rd control signal relatively moves.In the present embodiment, carrying platform 26 can independent mobile organic light emitting apparatus 3 or migration current detector 23 (or optical amplifier 28), or mobile simultaneously organic light emitting apparatus 3 and current sense device 23 (or optical amplifier 28), so that the distance between adjustment organic light emitting apparatus 3 and the current sense device 23 (or optical amplifier 28); In the present embodiment, carrying platform 26 can be one or three mobile position platforms.In addition, can also be in installing another three mobile controlling organizations on the optical amplifier 28 additional reaching the distance of adjusting between organic light emitting apparatus 3 and the optical amplifier 28, so defective locations of can Control current detector 23 being detected and optical amplifier 28 to direct action.
In addition, carrying platform 26 is provided with a power suppling part 261, power suppling part 261 has a positive power terminal 263 and a negative power source terminal 265 respectively, when whether the detecting of current sense device 23 desires has CURRENT DISTRIBUTION unusual, organic light emitting apparatus 3 provides negative bias or micro-forward bias by power suppling part 261, and it is unusual that this bias voltage will make the defective locations that forms short circuit CURRENT DISTRIBUTION occur.At this moment, controller 24 more produces one the 4th control signal and one the 5th control signal according to the defective locations 31 that is detected, the 5th control signal and the 4th control signal start that carrying platform 26 and energy beam generator 25 are produced according to controller 24 respectively, wherein carrying platform 26 is according to the 5th control signal relatively move energy beam generator 25 (and/or optical amplifier 28) and organic light emitting apparatus 3, so that allow energy beam generator 25 (seeing through optical amplifier 28) aim at the defective locations 31 of organic light emitting apparatus 3, then energy beam generator 25 produces an energy beam according to the 4th control signal, this energy beam focuses on defective locations 31 with isolated defective, so can be with the defect repair in the zone to be detected of an organic light emitting apparatus.
From the above, because of according to detection repair system of the present invention in detecting during defective locations, utilize micro-device and video capture device to amplify earlier and capture the area image to be detected of organic light emitting apparatus or utilize micro-distancer and controller to adjust the relative position and/or the distance of organic light emitting apparatus and current sense device automatically earlier, zone to be detected with organic light emitting apparatus applies bias voltage again, and utilizes the current sense device to detect the unusual defective locations of CURRENT DISTRIBUTION; Then utilize energy beam that defective is isolated, therefore needn't use two kinds of boards to finish detection, repair, and can locate organic light emitting apparatus automatically, to reduce issuable mistake of manual operation and waste of manpower resource; In addition, utilize to detect the unusual mode of CURRENT DISTRIBUTION and detect defective locations, can be fast and the position of correctly orienting defective.Therefore, the defective that can integrate detection efficiently, repair organic light emitting apparatus according to detection repair system of the present invention.
The above only is an illustrative, but not is restricted.Anyly do not break away from spirit of the present invention and category, and, all should be contained in the scope of claims its equivalent modifications of carrying out or change.

Claims (10)

1. one kind is detected repair system, and it is characterized in that in order to detect, to repair an organic light emitting apparatus, comprising:
One micro-device, it is in order to amplify the zone to be detected of organic light emitting apparatus;
One video capture device, itself and micro-device link, and capture the area image that micro-device amplifies;
One current sense device, itself and micro-device link, and detect the unusual at least one defective locations of CURRENT DISTRIBUTION in micro-device institute amplified images;
One controller, it links with video capture device and current sense device respectively, in order to storing the defective locations that magnified image that video capture device captured and current sense device are detected, and produce one first control signal according to its stored magnified image and defective locations data; And
One energy beam generator, it links with controller and micro-device, and the energy beam generator produces one in order to the energy beam that defective is isolated according to this first control signal.
2. detection repair system as claimed in claim 1, wherein, the current sense device is an infrared light electric current detector.
3. detection repair system as claimed in claim 1, wherein, controller more produces one second control signal according to its stored magnified image and defective locations data.
4. detection repair system as claimed in claim 3 wherein, more comprises:
One carrying platform, it is provided with a power suppling part, to provide one to be biased into organic light emitting apparatus, carrying platform carrying organic light emitting apparatus and according to second control signal relatively move organic light emitting apparatus and energy beam generator, defective locations and energy beam generator are aligned, and make energy beam act on defective locations.
5. detection repair system as claimed in claim 4, wherein, bias voltage is a negative bias or a micro-forward bias.
6. detection repair system as claimed in claim 1, wherein, video capture device is a CCD video capture device.
7. detection repair system as claimed in claim 1, wherein, energy beam is radiation beam, laser beam or electron beam, it penetrates via micro-device.
8. one kind is detected repair system, and it is characterized in that in order to detect, to repair an organic light emitting apparatus, comprising:
One micro-distancer, it is in order to the position of Auto-Sensing organic light emitting apparatus;
One controller, itself and micro-distancer link, and produce one the 3rd control signal in order to the detecting result of foundation micro-distancer;
One current sense device, itself and controller link, to adjust the relative position and/or the distance of current sense device and organic light emitting apparatus according to the 3rd control signal, and the unusual at least one defective locations of detecting organic light emitting apparatus CURRENT DISTRIBUTION, controller produces one the 4th control signal according to the defective locations that is detected; And
One energy beam generator, itself and controller link, and act on the energy beam of defective locations according to the 4th control signal, with isolated defective.
9. detection repair system as claimed in claim 8 wherein, more comprises:
One optical amplifier, it is in order to amplify the zone to be detected of organic light emitting apparatus, wherein the current sense device more links with optical amplifier, and in the image of optical amplifier institute magnification region, detect defective locations, the energy beam generator more links with optical amplifier, so that penetrate energy beam via optical amplifier.
10. detection repair system as claimed in claim 8, wherein, micro-distancer is that a laser focuses device.
CN 200510081049 2005-06-28 2005-06-28 Detection repairing system Pending CN1889802A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 200510081049 CN1889802A (en) 2005-06-28 2005-06-28 Detection repairing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 200510081049 CN1889802A (en) 2005-06-28 2005-06-28 Detection repairing system

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CN1889802A true CN1889802A (en) 2007-01-03

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101345018B (en) * 2007-07-09 2012-08-08 瑞萨电子株式会社 Data driver for display device, test method and probe card for data driver
CN103100792A (en) * 2013-03-12 2013-05-15 合肥知常光电科技有限公司 Laser preprocessing and restoring method and device having on-line detection function and used for optical elements
CN104978916A (en) * 2014-04-03 2015-10-14 四川虹视显示技术有限公司 OLED (Organic Light Emitting Diode) panel display defect restoration method
CN108932922A (en) * 2018-07-03 2018-12-04 京东方科技集团股份有限公司 A kind of repair ability test device and method

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101345018B (en) * 2007-07-09 2012-08-08 瑞萨电子株式会社 Data driver for display device, test method and probe card for data driver
CN103100792A (en) * 2013-03-12 2013-05-15 合肥知常光电科技有限公司 Laser preprocessing and restoring method and device having on-line detection function and used for optical elements
CN103100792B (en) * 2013-03-12 2015-04-22 合肥知常光电科技有限公司 Laser preprocessing and restoring method and device having on-line detection function and used for optical elements
CN104978916A (en) * 2014-04-03 2015-10-14 四川虹视显示技术有限公司 OLED (Organic Light Emitting Diode) panel display defect restoration method
CN108932922A (en) * 2018-07-03 2018-12-04 京东方科技集团股份有限公司 A kind of repair ability test device and method

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