CN101542315A - 在敏感层上具有多个电极的辐射探测器 - Google Patents
在敏感层上具有多个电极的辐射探测器 Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
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Applications Claiming Priority (3)
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EP06124309.3 | 2006-11-17 | ||
EP06124309 | 2006-11-17 | ||
PCT/IB2007/054577 WO2008059425A2 (en) | 2006-11-17 | 2007-11-12 | Radiation detector with multiple electrodes on a sensitive layer |
Publications (2)
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CN101542315A true CN101542315A (zh) | 2009-09-23 |
CN101542315B CN101542315B (zh) | 2013-03-20 |
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CN200780042651.5A Active CN101542315B (zh) | 2006-11-17 | 2007-11-12 | 在敏感层上具有多个电极的辐射探测器 |
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US (1) | US8581200B2 (zh) |
EP (1) | EP2084558B1 (zh) |
JP (1) | JP5555491B2 (zh) |
CN (1) | CN101542315B (zh) |
RU (1) | RU2445647C2 (zh) |
WO (1) | WO2008059425A2 (zh) |
Cited By (13)
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CN103384915A (zh) * | 2011-02-11 | 2013-11-06 | 诺基亚公司 | 光子的感测 |
CN103917897A (zh) * | 2011-11-09 | 2014-07-09 | 皇家飞利浦有限公司 | 具有电荷排斥段间隙的辐射敏感探测器设备 |
CN105723243A (zh) * | 2013-11-15 | 2016-06-29 | 皇家飞利浦有限公司 | 柔性基底上的双面有机光探测器 |
CN106491148A (zh) * | 2016-09-18 | 2017-03-15 | 天津大学 | 一种多电极的能量积分型x射线能谱探测器 |
CN107247285A (zh) * | 2017-06-08 | 2017-10-13 | 中国电子科技集团公司第四十四研究所 | 基于硅基光电探测器的硬x射线探测器 |
CN107256906A (zh) * | 2017-06-08 | 2017-10-17 | 中国电子科技集团公司第四十四研究所 | 用于探测硬x射线的高灵敏探测器 |
CN108445525A (zh) * | 2018-01-31 | 2018-08-24 | 奕瑞新材料科技(太仓)有限公司 | 面阵列像素探测器、辐射探测系统及辐射场探测方法 |
CN108535770A (zh) * | 2018-05-09 | 2018-09-14 | 同方威视技术股份有限公司 | 余辉检测装置和余辉检测方法 |
CN113035900A (zh) * | 2021-02-26 | 2021-06-25 | 深圳先进技术研究院 | 一种直接型电磁辐射探测器及制备方法 |
CN113192991A (zh) * | 2021-04-28 | 2021-07-30 | 深圳先进技术研究院 | 柔性x射线探测器及其制备方法、三维柔性x射线探测器 |
CN115052116A (zh) * | 2022-06-14 | 2022-09-13 | 无锡华芯微探科技有限公司 | 像素单元非均匀分布的厚硅像素探测器及制备方法 |
WO2023087123A1 (en) * | 2021-11-16 | 2023-05-25 | Shenzhen Xpectvision Technology Co., Ltd. | Image sensors with shielded electronics layers |
WO2023186068A1 (zh) * | 2022-04-01 | 2023-10-05 | 上海科技大学 | 一种传感器、x射线探测器及其应用 |
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---|---|---|---|---|
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US8513617B2 (en) * | 2010-05-25 | 2013-08-20 | Dxray, Inc. | Edge-on two-dimensional detector arrays |
JP2014519026A (ja) * | 2011-05-11 | 2014-08-07 | コーニンクレッカ フィリップス エヌ ヴェ | 電離放射線の検出 |
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RU2553088C1 (ru) * | 2014-04-03 | 2015-06-10 | Федеральное государственное унитарное предприятие "Российский федеральный ядерный центр-Всероссийский научно-исследовательский институт технической физики имени академика Е.И. Забабахина" | Устройство для формирования импульсов тормозного излучения |
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US9700269B2 (en) * | 2015-04-07 | 2017-07-11 | Toshiba Medical Systems Corporation | Parallel transverse field (PTF) tilted and collimated detectors |
US10379230B2 (en) * | 2015-06-03 | 2019-08-13 | Northwestern University | Chalco-phosphate-based hard radiation detectors |
US9841514B2 (en) * | 2015-09-24 | 2017-12-12 | Prismatic Sensors Ab | X-ray detector arrangement |
KR102624385B1 (ko) * | 2015-09-24 | 2024-01-11 | 프리스매틱 센서즈 에이비 | 모듈식 x선 검출기(modular x-ray detector) |
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JP6583855B2 (ja) * | 2015-11-25 | 2019-10-02 | 国立大学法人静岡大学 | 放射線検出装置 |
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US10126255B2 (en) * | 2015-12-15 | 2018-11-13 | Elwha Llc | High efficiency photon detection |
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JP6201095B1 (ja) * | 2016-04-27 | 2017-09-20 | 雫石 誠 | 撮像モジュール及び撮像装置 |
WO2018017909A2 (en) * | 2016-07-21 | 2018-01-25 | Northwestern University | Inorganic ternary halide semiconductors for hard radiation detection |
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Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4363969A (en) * | 1980-07-16 | 1982-12-14 | Ong Poen S | Light switched segmented tomography detector |
JPS6078376A (ja) * | 1983-10-05 | 1985-05-04 | Matsushita Electric Ind Co Ltd | 放射線検出器 |
JPH0816702B2 (ja) | 1983-12-26 | 1996-02-21 | 株式会社島津製作所 | 半導体放射線位置検出装置 |
JPS60187879A (ja) | 1984-03-07 | 1985-09-25 | Matsushita Electric Ind Co Ltd | 放射線検出器アレイ |
US4937453A (en) * | 1987-05-06 | 1990-06-26 | Nelson Robert S | X-ray detector for radiographic imaging |
FR2705791A1 (fr) * | 1993-05-28 | 1994-12-02 | Schlumberger Ind Sa | Détecteur de rayons X pour l'obtention de réponses sélectives en énergie. |
JP3309618B2 (ja) | 1995-01-11 | 2002-07-29 | 株式会社日立製作所 | X線ct装置 |
JPH09275223A (ja) * | 1995-04-12 | 1997-10-21 | Seiko Instr Kk | 半導体放射線検出装置 |
US5943388A (en) * | 1996-07-30 | 1999-08-24 | Nova R & D, Inc. | Radiation detector and non-destructive inspection |
US6236051B1 (en) * | 1998-03-27 | 2001-05-22 | Kabushiki Kaisha Toshiba | Semiconductor radiation detector |
DE69835240T2 (de) * | 1998-09-24 | 2007-06-06 | Elgems Ltd. | Photonendetektor in form einer pixel-matrix |
FR2792418B1 (fr) | 1999-04-15 | 2001-06-01 | Commissariat Energie Atomique | Detecteur bidimensionnel de rayonnements ionisants et procede de fabrication de ce detecteur |
JP2001051064A (ja) | 1999-08-09 | 2001-02-23 | Hitachi Medical Corp | マルチスライスx線検出器及びこれを用いたx線ct装置 |
JP2001194461A (ja) * | 2000-01-07 | 2001-07-19 | Shimadzu Corp | 2次元アレイ型放射線検出器 |
DE10143045B4 (de) * | 2001-09-03 | 2006-11-02 | Siemens Ag | Verfahren und zur Durchführung dieses Verfahrens ausgebildete medizinische Einrichtung |
IL145745A (en) * | 2001-10-03 | 2006-08-20 | Orbotech Medical Solutions Ltd | Two-dimensional radiation detector |
JP3820972B2 (ja) * | 2001-12-03 | 2006-09-13 | 株式会社日立製作所 | Pet装置 |
JP4582022B2 (ja) | 2002-10-07 | 2010-11-17 | 株式会社日立製作所 | 放射線検出器,放射線検出素子及び放射線撮像装置 |
JP4488725B2 (ja) | 2003-12-05 | 2010-06-23 | 株式会社東芝 | 光電変換装置及びx線ct用放射線検出器 |
US6953935B1 (en) * | 2004-05-11 | 2005-10-11 | General Electric Company | CT detector fabrication process |
RU2267992C1 (ru) * | 2004-07-27 | 2006-01-20 | Федеральное государственное унитарное предприятие "Научно-исследовательский институт импульсной техники" (ФГУП НИИИТ) | Устройство для медицинской диагностики |
US20060033029A1 (en) | 2004-08-13 | 2006-02-16 | V-Target Technologies Ltd. | Low-voltage, solid-state, ionizing-radiation detector |
WO2006029475A1 (en) | 2004-09-16 | 2006-03-23 | Southern Innovation International Pty Ltd | Method and apparatus for resolving individual signals in detector output data. |
JP2006101926A (ja) * | 2004-09-30 | 2006-04-20 | M & C:Kk | 放射線検出装置、放射線画像診断装置、及び放射線画像の生成方法 |
US7671342B2 (en) * | 2005-01-11 | 2010-03-02 | Siemens Medical Solutions Usa, Inc. | Multi-layer detector and method for imaging |
-
2007
- 2007-11-12 US US12/514,595 patent/US8581200B2/en active Active
- 2007-11-12 WO PCT/IB2007/054577 patent/WO2008059425A2/en active Application Filing
- 2007-11-12 JP JP2009536839A patent/JP5555491B2/ja active Active
- 2007-11-12 CN CN200780042651.5A patent/CN101542315B/zh active Active
- 2007-11-12 EP EP07827055.0A patent/EP2084558B1/en active Active
- 2007-11-12 RU RU2009123014/28A patent/RU2445647C2/ru active
Cited By (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103384915B (zh) * | 2011-02-11 | 2016-01-20 | 诺基亚技术有限公司 | 光子的感测 |
CN103384915A (zh) * | 2011-02-11 | 2013-11-06 | 诺基亚公司 | 光子的感测 |
CN103917897A (zh) * | 2011-11-09 | 2014-07-09 | 皇家飞利浦有限公司 | 具有电荷排斥段间隙的辐射敏感探测器设备 |
CN103917897B (zh) * | 2011-11-09 | 2016-08-17 | 皇家飞利浦有限公司 | 具有电荷排斥段间隙的辐射敏感探测器设备 |
CN105723243B (zh) * | 2013-11-15 | 2019-07-09 | 皇家飞利浦有限公司 | 柔性基底上的双面有机光探测器 |
CN105723243A (zh) * | 2013-11-15 | 2016-06-29 | 皇家飞利浦有限公司 | 柔性基底上的双面有机光探测器 |
CN106491148A (zh) * | 2016-09-18 | 2017-03-15 | 天津大学 | 一种多电极的能量积分型x射线能谱探测器 |
CN107247285A (zh) * | 2017-06-08 | 2017-10-13 | 中国电子科技集团公司第四十四研究所 | 基于硅基光电探测器的硬x射线探测器 |
CN107256906A (zh) * | 2017-06-08 | 2017-10-17 | 中国电子科技集团公司第四十四研究所 | 用于探测硬x射线的高灵敏探测器 |
CN108445525A (zh) * | 2018-01-31 | 2018-08-24 | 奕瑞新材料科技(太仓)有限公司 | 面阵列像素探测器、辐射探测系统及辐射场探测方法 |
CN108445525B (zh) * | 2018-01-31 | 2024-03-19 | 张岚 | 面阵列像素探测器、辐射探测系统及辐射场探测方法 |
CN108535770B (zh) * | 2018-05-09 | 2024-01-02 | 同方威视技术股份有限公司 | 余辉检测装置和余辉检测方法 |
CN108535770A (zh) * | 2018-05-09 | 2018-09-14 | 同方威视技术股份有限公司 | 余辉检测装置和余辉检测方法 |
CN113035900A (zh) * | 2021-02-26 | 2021-06-25 | 深圳先进技术研究院 | 一种直接型电磁辐射探测器及制备方法 |
CN113192991A (zh) * | 2021-04-28 | 2021-07-30 | 深圳先进技术研究院 | 柔性x射线探测器及其制备方法、三维柔性x射线探测器 |
CN113192991B (zh) * | 2021-04-28 | 2022-11-01 | 深圳先进技术研究院 | 柔性x射线探测器及其制备方法、三维柔性x射线探测器 |
WO2023087123A1 (en) * | 2021-11-16 | 2023-05-25 | Shenzhen Xpectvision Technology Co., Ltd. | Image sensors with shielded electronics layers |
WO2023186068A1 (zh) * | 2022-04-01 | 2023-10-05 | 上海科技大学 | 一种传感器、x射线探测器及其应用 |
CN115052116A (zh) * | 2022-06-14 | 2022-09-13 | 无锡华芯微探科技有限公司 | 像素单元非均匀分布的厚硅像素探测器及制备方法 |
CN115052116B (zh) * | 2022-06-14 | 2023-09-19 | 无锡鉴微华芯科技有限公司 | 像素单元非均匀分布的厚硅像素探测器及制备方法 |
Also Published As
Publication number | Publication date |
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US20100187429A1 (en) | 2010-07-29 |
WO2008059425A2 (en) | 2008-05-22 |
EP2084558A2 (en) | 2009-08-05 |
WO2008059425A3 (en) | 2008-07-10 |
JP2010510484A (ja) | 2010-04-02 |
RU2009123014A (ru) | 2010-12-27 |
US8581200B2 (en) | 2013-11-12 |
CN101542315B (zh) | 2013-03-20 |
RU2445647C2 (ru) | 2012-03-20 |
EP2084558B1 (en) | 2013-10-23 |
JP5555491B2 (ja) | 2014-07-23 |
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