CN101503125B - Automatic test packing machine for electronic component - Google Patents

Automatic test packing machine for electronic component Download PDF

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Publication number
CN101503125B
CN101503125B CN2008100298693A CN200810029869A CN101503125B CN 101503125 B CN101503125 B CN 101503125B CN 2008100298693 A CN2008100298693 A CN 2008100298693A CN 200810029869 A CN200810029869 A CN 200810029869A CN 101503125 B CN101503125 B CN 101503125B
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test
guide rail
column
packing
bad product
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CN2008100298693A
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CN101503125A (en
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吴启权
曹勇祥
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Intelligent Automation Equipment Zhuhai Co Ltd
Intelligent Automation Zhuhai Co Ltd
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Intelligent Automation Zhuhai Co Ltd
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Abstract

The invention discloses a machine for automatic testing and packing of electronic devices and components, which features high degree of automation and efficiency as well as compact structure. The machine comprises a protective cabinet (1) and an electric cabinet (2), wherein, the upper end surface of the protective cabinet (1) is provided with an automatic testing device and a finished product packing device which are used for carrying out the work procedures such as testing, processing unqualified products, packing finished products and the like on the electronic devices and components; the work procedures are tight and ordered, and have the advantages of high degree of automation and efficiency as well as rapid package. The machine can be widely applied to the field of testing and packing of the electronic devices and components.

Description

A kind of automatic test packing machine for electronic component
Technical field
The present invention relates to a kind of automatic test packing machine for electronic component.
Background technology
The progress of science and technology promotes the raising of productive force, is also promoting the development of society; Electronic industry is one of the most powerful industry of growth momentum, and electronic product is seen everywhere in daily life and work, so vast market, has bred infinite commercial opportunities, and huge demand is that opportunity also is challenge; What seize market dependence is strength, and the core of competitive power is science and technology, so technology innovation is the key of industry development.The production of electronic devices and components occupies very big component in electron trade, and the production technology of electronic devices and components is day by day ripe, yet the electronic product of producing need guarantee its quality and market is rendered in its properly pack again through comprehensive test, test and packaging process also are the important steps of product promotion, product is tested and packing is to check on for product design better, and test and packaging process should not held back to production efficiency, if test and packing institute's time spent are oversize, then dragged slowly rhythm of production, therefore, for improving the quality of products and satisfying the demand that improves day by day, must improve testing efficiency and packaging efficiency under the prerequisite of ensuring the quality of products, its effective way is improved technology exactly.In the prior art, mostly be test and the manner of packing that adopts " point-to-point ", promptly be that the test point that a product of producing is placed on appointment is tested, putting it to the packing point after test finishes again packs, and then put another product and test and pack to this test point and packing, this test and manner of packing speed are slow, degree of automation is lower, the test duration is long, and the test step of prior art is more loaded down with trivial details, therefore efficient is lower, the unfavorable shortening production cycle, fettered productive force to a certain extent.
For addressing the above problem, a lot of manufacturers are all attempting technical renewal and breakthrough, test efficiently to reach, pack production effect efficiently, thereby shorten the production cycle of product, improve its economic benefit.
Summary of the invention
Technical matters to be solved by this invention is to overcome the deficiencies in the prior art, and the automatic test packing machine for electronic component of a kind of efficient height, degree of automation height, compact conformation is provided.
The technical solution adopted in the present invention is: the present invention includes protection cupboard, regulator cubicle, described protection cupboard is provided with side cupboard door, back cupboard door, described regulator cubicle is provided with front cabinet door, rear cabinet door, side cabinet door, described front cabinet door and rear cabinet door are provided with breather port, the upper surface of described regulator cubicle is provided with automatic checkout test equipment, finished product packing device, described automatic checkout test equipment is in described protection cupboard, and described finished product packing device is outside described protection cupboard; Described automatic checkout test equipment comprises base, the column I, the column II, the column III, the column IV, the blanking adapter plate, the fixed transverse rod I, the fixed transverse rod II, described column I, described column II, described column III, described column IV and described blanking adapter plate are fixedly installed in respectively on the described base, described fixed transverse rod II crossbearer is also fixing between described column I and described column II, described fixed transverse rod I crossbearer is also fixing between described column IV and described fixed transverse rod II, described base also is provided with the XY mobile station, automatic testing turnplate, described XY moves and comprises glidepath, last slide rail, described glidepath is fixedly installed on the described base, the described slide rail of going up matches with described glidepath, the described slide rail of going up is provided with the product to be tested dish, described product to be tested dish can be done the slippage action along the described slide rail of going up, described automatic testing turnplate circumference is provided with at least two test fixtures, described fixed transverse rod I is provided with the material level guide rail, the described material level guide rail of going up is combined with material level, described fixed transverse rod I also is provided with test position I, last test position II, described base also is provided with down test position I, following test position II, described test position I and the last test position II correspondence position above described test fixture gone up, the described position I of test down and following test position II correspondence position below described test fixture, the described test position I that goes up is considered as first group of test position with following test position I, the described test position II that goes up is considered as second group of test position with following test position II, many group tests position can be set at the correspondence position of other test fixtures as required, make many group tests position carry out the test of different content, can also close wherein certain group or a few groups of test positions on request electronic devices and components; The top of described vertical columns III is equipped with bad product and handles position guide rail I, described bad product is handled position guide rail I and is combined with a bad product processing position I, described fixed transverse rod I also is provided with bad product and handles position guide rail II, described bad product is handled position guide rail II and is combined with a bad product processing position II, the upper end of described blanking adapter plate is installed with down the material level guide rail, described material level guide rail down is combined with down material level, and described material level is down done slippage transmission work back and forth along described material level guide rail down;
The last slide rail of described XY mobile station and glidepath comprise end plate I, end plate II, base plate, stepping motor, screw mandrel, moving guide rail displacement platform, described end plate I and end plate II respectively with described base plate heavy keying fit, described stepping motor is installed on the described end plate I, match with end plate I, end plate II respectively in the two ends of described moving guide rail, described screw mandrel is installed on the described base plate, and described displacement platform matches with described screw mandrel and described moving guide rail;
Described automatic testing turnplate comprises rotary case, transmission shaft, beam barrel, servomotor, support, described test fixture is arranged on the described rotary case, the two axial ends of described transmission shaft matches with described servomotor and described rotary case respectively, described servomotor is controlled the rotation of described rotary case by described transmission shaft, described turning cylinder places described beam barrel inside, described beam barrel is fixed on the described support, described support is fixedly installed on the described base, described base also is provided with bad product and reclaims box, described bad product reclaims box and is positioned at the below that described bad product is handled position I and bad product processing position II, corresponding with described bad product processing position I and II position, bad product processing position, described finished product packing device comprises packing box, the packing bench board, described packing box is positioned on the described packing bench board, described packing bench board is installed in the upper surface of described regulator cubicle, and described rear cabinet door is provided with release knob.
The invention has the beneficial effects as follows: among the present invention, last material level is transferred to the product to be tested in the product to be tested dish on the test fixture of rotary case, the test rotating disk is made circular movement, product on test fixture forwards the correspondence position of test position to, accept the full test of test position, forward bad product again to and handle the correspondence position of position, as to test out this product be bad product, it is off-grade, then by bad product processing position I or bad product processing position II it is transferred to bad product and reclaim box, the acceptable product of process test go to down the correspondence position of material level, by following material level it are extracted, and transfer to packing device, on package post, pack; This working process is compact in order, degree of automation is high, testing efficiency is high, packing is quick, effectively ensures the product design of electronic devices and components, has shortened the production cycle of product, and the special quality product is put on market fast, satisfies users' demand.
Description of drawings
Fig. 1 is a structural representation of the present invention;
Fig. 2 is the structural representation at another visual angle of the present invention;
Fig. 3 is an automatic checkout test equipment structural representation of the present invention;
Fig. 4 is another visual angle structural representation of automatic checkout test equipment of the present invention;
Fig. 5 is an automatic testing turnplate structural representation of the present invention;
Fig. 6 is an XY mobile station structural representation of the present invention;
Fig. 7 is a rail structure scheme drawing of the present invention.
The specific embodiment
Shown in Fig. 1~7, the present invention includes protection cupboard 1, regulator cubicle 2, described protection cupboard 1 is provided with side cupboard door 3, back cupboard door 4, described regulator cubicle 2 is provided with front cabinet door 5, rear cabinet door 6, side cabinet door 7, described front cabinet door 5 and rear cabinet door 6 are provided with breather port 45, the upper surface of described regulator cubicle 2 is provided with automatic checkout test equipment, finished product packing device, and described automatic checkout test equipment is in described protection cupboard 1, and described finished product packing device is outside described protection cupboard 1; 1 pair of described automatic checkout test equipment of described protection cupboard plays a protective role, described side cupboard door 3 and back cupboard door 4 can conveniently be observed described proving installation and conveniently carry out and safeguard and maintenance work, described front cabinet door 5, rear cabinet door 6, side cabinet door 7 safeguard to the electrical equipment in the regulator cubicle conveniently and keep in repair that described breather port 45 plays the ventilation and heat effect; Described automatic checkout test equipment comprises base 8, column I 9, column II 10, column III 11, column IV 12, blanking adapter plate 13, fixed transverse rod I 14, fixed transverse rod II 15, described column I 16, described column II 10, described column III 11, described column IV 12, described blanking adapter plate 13 is fixedly installed in respectively on the described base 8, described fixed transverse rod II 15 crossbearers are also fixing between described column I 9 and described column II 10, described fixed transverse rod I 14 crossbearers are also fixing between described column IV 12 and described fixed transverse rod II 15, described base 8 also is provided with the XY mobile station, automatic testing turnplate, described XY mobile station comprises glidepath 16, last slide rail 17, described glidepath 16 is fixedly installed on the described base 8, the described slide rail 17 of going up matches with described glidepath 16, the described slide rail 17 of going up can be done the slippage action along described glidepath 16, the described slide rail 17 of going up is provided with product to be tested dish 18, described product to be tested dish 18 can be done the slippage action along the described slide rail 17 of going up, by moving of described upward slide rail 17 and described product to be tested dish 18, realized product to be tested the moving on the XY direction of placement on the described product to be tested dish 18, make product to be tested fix on desired location, described automatic testing turnplate circumference is provided with at least two test fixtures 20, described fixed transverse rod I 14 is provided with material level guide rail 21, the described material level guide rail 21 of going up is combined with material level 22, the described material level 22 of going up is used to extract the product to be tested that is placed on the described product to be tested dish 18, and it is transferred on the described test fixture 20; Described fixed transverse rod I 14 also is provided with test position I 30a, last test position II 31a, described base 8 also is provided with down test position I 30b, following test position II 31b, described test position I 30a and the last test position II 31a correspondence position on described test fixture 20 gone up, the described position I 30b of test down and following test position II 31b correspondence position below described test fixture 20, a described upward test position I 30a and the described I 30b of test down are considered as first group of test position, a described upward test position II 31a and the described II 31b of test down are considered as second group of test position, many group tests position can be set at the correspondence position of other test fixtures as required, make many group tests position carry out the test of different content to electronic devices and components, can also close wherein certain group or a few groups of test positions on request, the top of described vertical columns III 11 is equipped with bad product and handles position guide rail I 23, described bad product is handled position guide rail I 23 and is combined with a bad product processing position I 24, described fixed transverse rod I 14 also is provided with bad product and handles position guide rail II 25, described bad product is handled position guide rail II 25 and is combined with a bad product processing position II 26, a plurality of bad products can be set as required handle the position, after testing through the test position, electronic devices and components find it is bad product, promptly be off-grade, then handle the position it is withdrawn by described bad product; The upper end of described blanking adapter plate 13 is installed with down material level guide rail 27, described material level guide rail 27 down is combined with down material level 28, described material level 28 is down done slippage transmission work back and forth along described material level guide rail 27 down, electronic devices and components are defined as acceptable product after testing through the test position, when these acceptable product go to the correspondence position of described material level down on automatic testing turnplate, by described 28 these acceptable product of extraction of material level down and with its transfer;
The last slide rail 17 of described XY mobile station is consistent with glidepath 16 structures, comprise end plate I 32, end plate II 33, base plate 34, stepping motor 19, screw mandrel 35, moving guide rail 36, displacement platform 37, described end plate I 32 and end plate II 33 respectively with described base plate 34 heavy keying fit, described stepping motor 19 is installed on the described end plate I 32, match with end plate I 32, end plate II 33 respectively in the two ends of described moving guide rail 36, described screw mandrel 35 is installed on the described base plate 34, and described displacement platform 37 matches with described screw mandrel 35 and described moving guide rail 36;
Described automatic testing turnplate comprises rotary case 38, transmission shaft 39, beam barrel 40, servomotor 41, support 42, described test fixture 20 is arranged on the described rotary case 38, the two axial ends of described transmission shaft 40 matches with described servomotor 41 and described rotary case 38 respectively, described servomotor 41 is by the rotation of the described rotary case 38 of described transmission shaft 39 controls, described turning cylinder places described beam barrel 40 inside, described beam barrel 40 is fixed on the described support 42, and described support 42 is fixedly installed on the described base 8;
Described base 8 also is provided with bad product and reclaims box 29, described bad product reclaims box 29 and is positioned at the below that described bad product is handled position I 24 and bad product processing position II 26, corresponding with described bad product processing position I 24 and II 26 positions, bad product processing position, when electronic devices and components are measured when being off-grade, handle position I 24 or bad product by described bad product and handle a position II 26 and it is mentioned and transfer to described bad product and reclaim in the box 29;
Described finished product packing device comprises packing box 43, packing bench board 44, described packing box 43 is positioned on the described packing bench board 44, described packing bench board is installed in the upper surface of described regulator cubicle 2, acceptable product through test are extracted it by following material level, and transfer to packing device, pack on package post, described regulator cubicle 2 is provided with release knob 36, with the working condition of control automatic test packing machine.
The present invention can be widely used in electronic devices and components test, packaging field.

Claims (5)

1. automatic test packing machine for electronic component, comprise protection cupboard (1), regulator cubicle (2), described protection cupboard (1) is provided with side cupboard door (3), back cupboard door (4), described regulator cubicle (2) is provided with front cabinet door (5), rear cabinet door (6), side cabinet door (7), described front cabinet door (5) and rear cabinet door (6) are provided with breather port (45), it is characterized in that: the upper surface of described regulator cubicle (2) is provided with automatic checkout test equipment, the finished product packing device, described automatic checkout test equipment is in described protection cupboard (1), described finished product packing device is outside described protection cupboard (1), described automatic checkout test equipment comprises base (8), column I (9), column II (10), column III (11), column IV (12), blanking adapter plate (13), fixed transverse rod I (14), fixed transverse rod II (15), described column I (9), described column II (10), described column III (11), described column IV (12), described blanking adapter plate (13) is fixedly installed in respectively on the described base (8), described fixed transverse rod II (15) crossbearer is also fixing between described column I (9) and described column II (10), described fixed transverse rod I (14) crossbearer is also fixing between described column IV (12) and described fixed transverse rod II (15), described base (8) also is provided with the XY mobile station, automatic testing turnplate, described XY mobile station comprises glidepath (16), last slide rail (17), described glidepath (16) is fixedly installed on the described base (8), the described slide rail (17) of going up matches with described glidepath (16), the described slide rail (17) of going up is provided with product to be tested dish (18), described product to be tested dish (19) can be done the slippage action along the described slide rail (17) of going up, described automatic testing turnplate circumference is provided with at least two test fixtures (20), described fixed transverse rod I (14) is provided with material level guide rail (21), the described material level guide rail (21) of going up is combined with material level (22), described fixed transverse rod I (14) also is provided with test position I (30a), last test position II (31a), described base (8) also is provided with down test position I (30b), following test position II (31b), described test position I (30a) and the last top correspondence position of testing position II (31a) at described test fixture (20) gone up, described position I (30b) of test down and following test position II (31b) are at the below correspondence position of described test fixture (20), the top of described vertical columns III (11) is equipped with bad product and handles position guide rail I (23), described bad product is handled position guide rail I (23) and is combined with a bad product processing position I (24), described fixed transverse rod I (14) also is provided with bad product and handles position guide rail II (25), described bad product is handled position guide rail II (25) and is combined with a bad product processing position II (26), the upper end of described blanking adapter plate (13) is installed with down material level guide rail (27), described material level guide rail (27) down is combined with down material level (28), and described material level (28) is down done slippage transmission work back and forth along described material level guide rail (27) down.
2. a kind of automatic test packing machine for electronic component according to claim 1, it is characterized in that: the last slide rail (17) and the glidepath (16) of described XY mobile station comprise end plate I (32), end plate II (33), base plate (34), stepping motor (19), screw mandrel (35), moving guide rail (36) displacement platform (37), described end plate I (32) and end plate II (33) respectively with described base plate (34) heavy keying fit, described stepping motor (19) is installed on the described end plate I (32), the two ends of described moving guide rail (36) respectively with end plate I (32), end plate II (33) matches, described screw mandrel (35) is installed on the described base plate (34), and described displacement platform (37) matches with described screw mandrel and described moving guide rail (36).
3. a kind of automatic test packing machine for electronic component according to claim 1 and 2, it is characterized in that: described automatic testing turnplate comprises rotary case (38), transmission shaft (39), beam barrel (40), servomotor (41), support (42), described test fixture (20) is arranged on the described rotary case (38), the two axial ends of described transmission shaft (39) matches with described servomotor (41) and described rotary case (38) respectively, described servomotor (41) is controlled the rotation of described rotary case (38) by described transmission shaft (39), described turning cylinder places described beam barrel (40) inside, described beam barrel (40) is fixed on the described support (42), described support (42) is fixedly installed on the described base (8), described base (8) also is provided with bad product and reclaims box (29), described bad product recovery box (29) is positioned at the below that described bad product is handled an I (24) and bad product processing position II (26), and is corresponding with a described bad product processing position I (24) and bad product processing II (a 26) position.
4. a kind of automatic test packing machine for electronic component according to claim 3, it is characterized in that: described finished product packing device comprises packing box (43), packing bench board (44), described packing box (43) is positioned on the described packing bench board (44), and described packing bench board is installed in the upper surface of described regulator cubicle (2).
5. a kind of automatic test packing machine for electronic component according to claim 4 is characterized in that: described regulator cubicle (2) also is provided with release knob (36).
CN2008100298693A 2008-07-30 2008-07-30 Automatic test packing machine for electronic component Active CN101503125B (en)

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CN101503125B true CN101503125B (en) 2011-03-30

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CN103072719B (en) * 2013-02-05 2014-11-26 珠海市科瑞思机械科技有限公司 Automatic test packing machine
CN103658056B (en) * 2013-12-25 2015-05-13 青岛乾程电子科技有限公司 Automatic miss detection method for an electric meter screw
CN103818596B (en) * 2014-02-19 2017-08-22 浙江田中精机股份有限公司 A kind of electronic coil test machine
CN103818707B (en) * 2014-02-19 2017-05-24 浙江田中精机股份有限公司 Feed unit of electronic coil tester
CN104191219B (en) * 2014-08-29 2016-12-07 珠海市运泰利自动化设备有限公司 A kind of fog lamp jump ring assembling device
CN106179983B (en) * 2016-07-06 2018-05-18 中山鑫辉精密技术股份有限公司 A kind of main button case ring automatic detecting machine of mobile phone
CN106238353B (en) * 2016-08-31 2019-02-22 厦门赛特勒磁电有限公司 A kind of high frequency transformer automatic testing equipment and disc loading apparatus

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Patent Citations (4)

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