CN101469979B - Ultrasonic thickness gauge and monocrystal probe and double crystal probe recognition method - Google Patents
Ultrasonic thickness gauge and monocrystal probe and double crystal probe recognition method Download PDFInfo
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- CN101469979B CN101469979B CN2007103084653A CN200710308465A CN101469979B CN 101469979 B CN101469979 B CN 101469979B CN 2007103084653 A CN2007103084653 A CN 2007103084653A CN 200710308465 A CN200710308465 A CN 200710308465A CN 101469979 B CN101469979 B CN 101469979B
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Abstract
The invention provides a method for recognizing and applying the single crystal probe and double crystal probe of ultrasonic thickness gauges, comprising: communicating an emission circuit and a receiving circuit with a first probe socket, judging the first probe socket is connected with an ultrasonic probe wafer according to received signals; communicating the emission circuit and the receiving circuit with a second probe socket, judging if the second probe socket is connected with an ultrasonic probe wafer according to received signals; thereby judging the type of the connected probe as a single crystal probe or a double crystal probe, and switching the circuit to the application stage of the probe. The invention further provides an ultrasonic thickness gauge, comprising a circuit switch circuit among the emission circuit, the receiving circuit and the probe sockets. The invention realizes single crystal probe measurement or double crystal probe measurement on one ultrasonic thickness gauge, to improve test efficiency.
Description
Technical field
The present invention relates to ultrasonic pulse principle of reflection measurement mechanism, relate in particular to the single, double brilliant probe recognition method of audiogage and the audiogage of measuring the single, double brilliant probe of application process and identification and application.
Background technology
Audiogage is the instrument that carries out thickness measure according to the ultrasonic pulse principle of reflection, when the probe ultrasonic waves transmitted pulse of audiogage arrives two kinds of different materials interphases by testee, pulse is reflected back toward probe, and the time of propagating in material by accurate measurement ultrasound wave is determined the thickness of measured material.Probe for audiogage all has delay block, and the pulse that probe is returned in the ultrasonic waves transmitted pulse-echo comprises boundary reflection pulse and bottom reflection pulse.With reference to ultrasonic pulse thickness by reflection measuring principle shown in Figure 1, if the travel-time of transponder pulse and boundary reflection pulse is t1, the travel-time of transponder pulse and bottom reflection pulse is t2, then the flight time of ultrasound wave in measuring workpieces is t=t2-t1, according to ultrasound wave flying speed v in measuring workpieces, the one-tenth-value thickness 1/10 of measuring workpieces is h=t * v/2.
Be divided into single crystal probe metering system or double crystal probe metering system according to the measuring sonde type, the single crystal probe measurement is to transmit and receive to adopt same wafer, and the double crystal probe measurement is to transmit and receive to adopt a wafer respectively.With reference to Fig. 2, single crystal probe and double crystal probe mainly comprise delay block 21, ultrasonic crystal 22, electrode 23, lead-in wire 24, connector 25.Traditional single crystal probe metering system or double crystal probe metering system are respectively with realizing on two audiogages.
Figure 3 shows that a kind of audiogage that adopts the double crystal probe metering system, it includes fuselage 31, display screen 32, keyboard 33, double crystal probe 34, receiver socket 35, emission socket 36.Its ultimate principle probe 34 emission ultrasonic pulses of serving as reasons arrive testee by delay block and propagate in object, be reflected back toward probe by delay block when arriving material interface, determine the thickness of measured material by the accurate travel-time of measurement ultrasound wave in material.By keyboard 33 input instructions, transmit to visiting first by emission socket 36, feed back to processing unit by probe emission ultrasonic pulse and with the ultrasonic pulse reflected signal by receiver socket 35, signal is shown by display screen 32 through the data that processing obtains.
Figure 4 shows that the principle of work of double crystal probe measurement audiogage, wherein give processing unit 41 by keyboard 43 input instructions, extremely pop one's head in by processing unit control radiating circuit 44 output electric pulses, the excitation piezoelectric chip produces pulse ultrasonic wave, ultrasound wave forms repeatedly reflection between the testee upper and lower surface, reflection wave is transformed into electric signal through piezoelectric chip, after receiving circuit 46 amplifies integer, be sent to logical circuit 47, read and be sent to processing unit after the measurement data in the logical circuit 47 and handle, and export end product to LCDs 42.
Figure 5 shows that a kind of employing single crystal probe metering system audiogage, it includes fuselage 51, display screen 52, and keyboard 53, single crystal probe 54 receives and emission socket 55.Its ultimate principle probe 54 emission ultrasonic pulses of serving as reasons arrive testee by delay block and propagate in object, be reflected back toward probe by delay block when arriving material interface, determine the thickness of measured material by the accurate travel-time of measurement ultrasound wave in material.By keyboard 53 input instructions, transmit to visiting first by emission socket 56, feed back to processing unit by probe emission ultrasonic pulse and with the ultrasonic pulse reflected signal by receiver socket 55, signal is shown by display screen 52 through the data that processing obtains.
Figure 6 shows that the principle of work of single crystal probe measurement audiogage, wherein, give processing unit 61 by keyboard 63 input instructions, extremely pop one's head in by processing unit control radiating circuit 64 output electric pulses, the excitation piezoelectric chip produces pulse ultrasonic wave, ultrasound wave forms repeatedly reflection between the testee upper and lower surface, reflection wave is transformed into electric signal through piezoelectric chip, after receiving circuit 66 amplifies integer, be sent to logical circuit 67, read and be sent to processing unit after the measurement data in the logical circuit 67 and handle, and export end product to LCDs 62.
In the prior art, when relying on two cover radiating circuits to realize single double crystal probe metering system on same audiogage, single crystal probe can only be inserted in the receiver socket of double crystal probe, referring to the audiogage of existing pair probe measurement patterns shown in Figure 7.Wherein, give processing unit 71 by keyboard 73 input instructions, extremely popped one's head in by processing unit control radiating circuit 74 output electric pulses under the double crystal probe metering system, the excitation piezoelectric chip produces pulse ultrasonic wave; Extremely popped one's head in by processing unit control radiating circuit 78 output electric pulses under the single crystal probe metering system, the excitation piezoelectric chip produces pulse ultrasonic wave.Ultrasound wave forms repeatedly reflection between the testee upper and lower surface, reflection wave is transformed into electric signal through piezoelectric chip, after receiving circuit 76 amplifies integer, be sent to logical circuit 77, read and be sent to processing unit after the measurement data in the logical circuit 77 and handle, and export end product to LCDs 72.
Because the restriction that single crystal probe is assigned, during use or by the artificial type of setting probe, incured loss through delay the time of measuring like this, perhaps the intelligent probe of the special use of the store information by having identification form double crystal probe type, probe cost costliness like this, and use and have limitation.And, use two cover radiating circuits on same the audiogage, increased the manufacturing cost of instrument, make complete machine structure become complicated.
Summary of the invention
The object of the present invention is to provide a kind of single crystal probe and double crystal probe recognition methods of audiogage, can on same audiogage, realize single crystal probe metering system or double crystal probe metering system, improve testing efficiency.
To achieve these goals, the invention provides a kind of single crystal probe and double crystal probe recognition methods of audiogage, this method comprises the following steps:
Radiating circuit and receiving circuit are connected with first probe socket simultaneously,, judged whether connect ultrasonic wafer on the probe socket according to whether receiving reflection wave signal;
Radiating circuit and receiving circuit are connected with second probe socket simultaneously,, judged whether connect ultrasonic wafer on the probe socket according to whether receiving reflection wave signal; And
According to above-mentioned judged result, judge that the probe that connects is single crystal probe or double crystal probe, and circuit is switched to the application state of such probe.
To achieve these goals, the embodiment of the invention also provides a kind of audiogage, can realize the identification of single crystal probe and double crystal probe, this audiogage comprises display, keyboard, processing unit, control logic circuit, radiating circuit, receiving circuit, two probe sockets and probe, wherein processing unit connects display and control logic circuit, logical circuit connects radiating circuit and receiving circuit, and probe is connected with probe socket, it is characterized in that:
This audiogage also comprises the path commutation circuit, is arranged between radiating circuit and receiving circuit and the probe socket, and this path commutation circuit receives the control signal of processing unit, radiating circuit is connected with probe socket with receiving circuit or disconnects.
The beneficial effect of the embodiment of the invention is, the present invention with respect to traditional single crystal probe metering system or double crystal probe metering system respectively with the mode that realizes on two audiogages, on same audiogage, realize single crystal probe metering system or double crystal probe metering system, improved testing efficiency; With respect to reading the type that the probe store information comes the identification form double crystal probe, must adopt special intelligent probe, enlarged the type and the scope of probe; With respect to relying on two cover radiating circuits on same audiogage, to realize single double crystal probe metering system, reduced cost, simplified machine system.
Description of drawings
Accompanying drawing described herein is used to provide further understanding of the present invention, constitutes the application's a part, does not constitute limitation of the invention.In the accompanying drawings:
Fig. 1 is the synoptic diagram that shows ultrasonic pulse thickness by reflection measuring principle;
Fig. 2 is the structural representation of single crystal probe and double crystal probe;
Fig. 3 is the synoptic diagram of audiogage of the employing double crystal probe metering system of prior art;
Fig. 4 is the fundamental diagram of the audiogage of employing double crystal probe metering system shown in Figure 3;
Fig. 5 is the synoptic diagram of audiogage of the employing single crystal probe metering system of prior art;
Fig. 6 is the fundamental diagram of the audiogage of employing double crystal probe metering system shown in Figure 5;
Fig. 7 is the fundamental diagram that two cover radiating circuits of prior art are realized the audiogage of single twin crystal detection amount pattern;
Fig. 8 is the synoptic diagram that shows ultrasonic signal in single crystal probe metering system and the double crystal probe metering system receiving circuit;
Fig. 9 is the single crystal probe of audiogage according to an embodiment of the invention and the schematic diagram of double crystal probe recognition methods;
But Figure 10 is the process flow diagram that the measurement pattern of the audiogage of single crystal probe and double crystal probe identification is according to an embodiment of the invention selected;
But Figure 11 is the structural representation of the audiogage of single crystal probe and double crystal probe identification according to an embodiment of the invention;
But Figure 12 is the operation chart of path commutation circuit in the audiogage of the single crystal probe of one embodiment of the invention and double crystal probe identification.
Embodiment
For making the purpose, technical solutions and advantages of the present invention clearer,, the present invention is described in further details below in conjunction with embodiment and accompanying drawing.At this, exemplary embodiment of the present invention and explanation thereof are used to explain the present invention, but not as a limitation of the invention.
Present embodiment provides a kind of single double crystal probe recognition methods of audiogage, below in conjunction with accompanying drawing 8 it is elaborated.
With reference to the synoptic diagram of ultrasonic signal in single crystal probe metering system shown in Figure 8 and the double crystal probe metering system receiving circuit, the ultimate principle of single double crystal probe recognition methods of audiogage of the present invention is described.It still is that double crystal probe all has delay block that the present invention utilizes the probe single crystal probe of audiogage, and whether measuring workpieces all is the boundary reflection pulse that has delay block to produce behind test probe in the ultrasonic waves transmitted pulse.Measurement is to transmit and receive to adopt a wafer respectively for double crystal probe, receives only the bottom reflection ultrasonic signal when testing the back receiving circuit when carrying out workpiece calibration, if do not carry out workpiece calibration then do not have reflection ultrasonic signal.And the single crystal probe measurement is to transmit and receive to adopt same wafer, receiving circuit not only receives the bottom reflection ultrasonic signal when measuring, launch ultrasonic signal and delay block Waves Investigation for Interface Echo Signal in addition, do not receive only emission ultrasonic signal and delay block Waves Investigation for Interface Echo Signal if do not carry out the workpiece calibration receiving circuit.Thereby no matter whether measure for single crystal probe, its receiving circuit all can receive emission ultrasonic signal and delay block Waves Investigation for Interface Echo Signal, and no matter whether measure for double crystal probe, its receiving circuit can not receive emission ultrasonic signal and delay block Waves Investigation for Interface Echo Signal.Thereby, can whether receive emission ultrasonic signal and delay block Waves Investigation for Interface Echo Signal according to receiving circuit and just can judge whether pop one's head in is the single crystal probe measuring sonde, also can judge whether that existence transmits and receives test probe with this way for double crystal probe.
Present embodiment provides the measurement pattern system of selection of the audiogage of a kind of single crystal probe and double crystal probe identification and application, below in conjunction with accompanying drawing 9 and Figure 10 it is elaborated.
With reference to the single crystal probe of audiogage of the present invention shown in Figure 9 and the schematic diagram of double crystal probe identification and methods for using them, processing unit d1 is set to the single crystal probe measurement pattern with measurement pattern, control logic circuit d7 radiating circuit d4 output electric pulse through path commutation circuit d5 to probe socket d8, if there is probe to exist, then encourage piezoelectric chip to produce pulse ultrasonic wave, ultrasound wave forms repeatedly reflection between probe delay piece upper and lower surface, reflection wave is transformed into electric signal through piezoelectric chip, after receiving circuit d6 amplifies integer, be sent to logical circuit d7, read and be sent to processing unit after the measurement data among the logical circuit d7 and handle, illustrate that probe socket d8 has probe to exist; In like manner processing unit d1 is provided with the single crystal probe measurement pattern, control logic circuit d7 radiating circuit d4 output electric pulse through path commutation circuit d5 to probe socket d9, if there is probe to exist, then encourage piezoelectric chip to produce pulse ultrasonic wave, ultrasound wave forms repeatedly reflection between probe delay piece upper and lower surface, reflection wave is transformed into electric signal through piezoelectric chip, after receiving circuit d6 amplifies integer, be sent to logical circuit d7, read and be sent to processing unit after the measurement data among the logical circuit d7 and handle, illustrate that probe socket d9 has probe to exist.If probe socket d8 and probe socket d9 have probe to exist, and are the double crystal probe measurement pattern then,, then be the single crystal probe measurement pattern if having only probe socket d8 or probe socket d9 probe to exist.
The process flow diagram of the method for operating of the audiogage of the single crystal probe of the present invention that reference is shown in Figure 10 and double crystal probe identification and application illustrates single double crystal probe recognition methods of audiogage of the present invention.This method may further comprise the steps: at first will transmit and receive circuit and receive probe socket A jointly and judge whether to exist emission or receiving transducer (S101), to transmit and receive circuit then receives probe socket B jointly and judges whether to exist emission or receiving transducer (S102), judge the type (S103) of test probe on the socket, according to this judged result the situation (S104) that transceiver circuit connects is set, if be single crystal probe on the socket A then will transmit and receive circuit and receive probe socket A jointly; If be that single crystal probe then will transmit and receive circuit and receive probe socket B jointly on the socket B; If what be connected on probe socket A and the B is double crystal probe, radiating circuit is received among probe socket A and the B, the probe that connects on this probe socket is a transmitting probe, and receiving circuit is received another among probe socket A and the B, and what connect on this probe socket is receiving transducer.
Embodiment 3
Present embodiment provides the audiogage of a kind of single crystal probe and double crystal probe identification and application, below in conjunction with accompanying drawing 11, Figure 12 it is elaborated.
With reference to the audiogage of single crystal probe of the present invention shown in Figure 11 and double crystal probe identification and application, it includes fuselage c1, liquid crystal display c2, keyboard c3, monocrystalline or double crystal probe c4, socket c5, socket c6.Its ultimate principle probe c4 emission ultrasonic pulse of serving as reasons arrives testee by delay block and propagates in object, be reflected back toward probe by delay block when arriving material interface, determine the thickness of measured material by the accurate travel-time of measurement ultrasound wave in material.The double crystal probe mode is by keyboard c3 input instruction, transmit to visiting first by socket c6 or c5, feed back to processing unit by probe emission ultrasonic pulse and with the ultrasonic pulse reflected signal by socket c5 or c6, signal is shown by liquid crystal display c2 through handling the data that obtain.The single crystal probe mode is by keyboard c3 input instruction, transmit to visiting first by socket c6 or c5, feed back to processing unit by probe emission ultrasonic pulse and with the ultrasonic pulse reflected signal by socket c6 or c5, signal is shown by liquid crystal display c2 through handling the data that obtain.Wherein, audiogage of the present invention also comprises processor and the path commutation circuit of being made up of two relays, as shown in figure 12, by processor control path commutation circuit realize emission ultrasound wave or reflection supersonic wave and the path of two socket c6 and c5 between switch, thereby the type of the single double crystal probe of Intelligent Recognition realizes single crystal probe metering system or double crystal probe metering system on same audiogage.
Above-described embodiment; purpose of the present invention, technical scheme and beneficial effect are further described; institute is understood that; the above only is the specific embodiment of the present invention; and be not intended to limit the scope of the invention; within the spirit and principles in the present invention all, any modification of being made, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (15)
1. the single crystal probe of an audiogage and double crystal probe recognition methods is characterized in that, this method comprises:
Radiating circuit and receiving circuit are connected with first probe socket simultaneously,, judged on described first probe socket whether be connected with ultrasonic wafer according to whether receiving reflection wave signal;
Radiating circuit and receiving circuit are connected with second probe socket simultaneously,, judged on described second probe socket whether be connected with ultrasonic wafer according to whether receiving reflection wave signal; And
According to above-mentioned judged result, whether audiogage identification has ultrasonic probe, and ultrasonic probe is single crystal probe or double crystal probe, and adopts corresponding measurement pattern.
2. method according to claim 1 is characterized in that: when receiving reflection wave signal, then be connected with ultrasonic wafer on the socket.
3. method according to claim 2 is characterized in that: when judged result is first probe socket and second probe socket when all not connecing ultrasonic wafer, adopt no probe pattern.
4. method according to claim 2 is characterized in that: when judged result is first probe socket and second probe socket when having only 1 ultrasonic wafer, adopt the single crystal probe measurement pattern.
5. method according to claim 2 is characterized in that: when judged result is first probe socket and second probe socket when all being connected with ultrasonic wafer, adopt the double crystal probe measurement pattern.
6. method according to claim 5 is characterized in that: when adopting the double crystal probe measurement pattern, radiating circuit and receiving circuit are connected respectively to described first probe socket and described second probe socket.
7. method according to claim 4 is characterized in that: when adopting the single crystal probe measurement pattern, radiating circuit and receiving circuit are connected on the probe socket that is connected with ultrasonic wafer simultaneously.
8. audiogage, this audiogage comprises display, keyboard, processing unit, control logic circuit, radiating circuit, receiving circuit, two probe sockets and probe, wherein processing unit connects display and control logic circuit, logical circuit connects radiating circuit and receiving circuit, probe is connected with probe socket, it is characterized in that:
This audiogage also comprises the path commutation circuit, is arranged between radiating circuit and receiving circuit and two probe sockets, and this path commutation circuit receives the control signal of processing unit, radiating circuit is connected with two probe sockets with receiving circuit or disconnects.
9. audiogage according to claim 8, it is characterized in that: when identification probe, the path commutation circuit switches to radiating circuit and receiving circuit and is connected same probe socket, when comprising emission ultrasonic signal and delay block Waves Investigation for Interface Echo Signal in the received signal, then be connected to ultrasonic wafer, otherwise do not connect ultrasonic wafer.
10. audiogage according to claim 8, it is characterized in that: when selecting measurement pattern, the path commutation circuit switches to radiating circuit and connects a probe socket, when receiving reflection wave signal, judge that then this probe socket is connected with ultrasonic wafer, otherwise do not have ultrasonic wafer; The path commutation circuit switches to radiating circuit and connects another probe socket, and this probe socket is connected with ultrasonic wafer when receiving reflection bag signal, otherwise does not have ultrasonic wafer; When all being connected with ultrasonic wafer on two probe sockets, the double crystal probe measurement pattern is adopted in processing unit control; When having only one to be connected with ultrasonic wafer on two probe sockets, the single crystal probe measurement pattern is adopted in processing unit control; When not being connected with ultrasonic wafer on two probe sockets, no probe pattern is adopted in processing unit control.
11. audiogage according to claim 10 is characterized in that: when adopting the double crystal probe measurement pattern, processing unit control path commutation circuit is connected to a probe socket with radiating circuit, and receiving circuit is connected to another probe socket.
12. audiogage according to claim 11, it is characterized in that: the keyboard input instruction, transmit to visiting first by a probe socket, feed back to processing unit by probe emission ultrasonic pulse and with the ultrasonic pulse reflected signal by another probe socket, processing unit sends signal to liquid crystal display through the data of handling acquisition and shows.
13. audiogage according to claim 10 is characterized in that: when adopting the single crystal probe measurement pattern, processing unit control path commutation circuit is connected to radiating circuit and receiving circuit on the probe socket of ultrasonic wafer simultaneously.
14. audiogage according to claim 13, it is characterized in that: the keyboard input instruction, transmit to visiting first by the probe socket that is connected with ultrasonic wafer, feed back to processing unit by probe emission ultrasonic pulse and with the ultrasonic pulse reflected signal by the probe socket that is connected with ultrasonic wafer, processing unit sends signal to liquid crystal display through the data of handling acquisition and shows.
15. audiogage according to claim 8 is characterized in that: described path commutation circuit comprises two relays.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007103084653A CN101469979B (en) | 2007-12-29 | 2007-12-29 | Ultrasonic thickness gauge and monocrystal probe and double crystal probe recognition method |
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| Application Number | Priority Date | Filing Date | Title |
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| CN2007103084653A CN101469979B (en) | 2007-12-29 | 2007-12-29 | Ultrasonic thickness gauge and monocrystal probe and double crystal probe recognition method |
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| Publication Number | Publication Date |
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| CN101469979A CN101469979A (en) | 2009-07-01 |
| CN101469979B true CN101469979B (en) | 2011-04-13 |
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| CN2007103084653A Expired - Fee Related CN101469979B (en) | 2007-12-29 | 2007-12-29 | Ultrasonic thickness gauge and monocrystal probe and double crystal probe recognition method |
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Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102636576A (en) * | 2012-05-09 | 2012-08-15 | 河北省电力研究院 | Measuring method for delay and leading edge of sound-transmission-wedge surface wave probe |
| CN103486960B (en) * | 2013-05-07 | 2016-08-03 | 中国人民解放军海军工程大学 | A kind of ultrasound wave, eddy current and EMAT integration nondestructive thickness measuring instrument and method thereof |
| CN105066918A (en) * | 2015-08-10 | 2015-11-18 | 上海应用技术学院 | Ultrasonic underwater target thickness measuring system and thickness measuring method |
| CN106403857A (en) * | 2016-11-08 | 2017-02-15 | 广州兰泰仪器有限公司 | Special ultrasonic thickness gauge for soft materials and measurement method of ultrasonic thickness gauge |
| CN108896659B (en) * | 2017-06-11 | 2021-09-14 | 嘉兴博传科技有限公司 | Method and system for expanding structural health monitoring range |
| CN109827530A (en) * | 2019-01-21 | 2019-05-31 | 广东省特种设备检测研究院珠海检测院 | A kind of intelligent ultrasonics calibrator based on speech recognition technology |
| CN109875512A (en) * | 2019-03-18 | 2019-06-14 | 深圳英美达医疗技术有限公司 | A kind of intravascular double-mode imaging device |
| CN113739729A (en) * | 2021-10-21 | 2021-12-03 | 辽宁工程技术大学 | Coal mine underground reservoir water-proof coal rock pillar thickness nondestructive detection technology test device |
| CN115265428B (en) * | 2022-07-05 | 2023-09-12 | 济宁鲁科检测器材有限公司 | Composite ultrasonic thickness gauge and thickness measuring method thereof |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN2508216Y (en) * | 2001-11-12 | 2002-08-28 | 缪洪生 | Ultrasonic bicrystal thickness measuring feeler |
| CN2676148Y (en) * | 2003-07-28 | 2005-02-02 | 沈阳黎明航空发动机(集团)有限责任公司 | Double crystal ultrasonic thickness measuring probe |
| CN2716838Y (en) * | 2004-07-23 | 2005-08-10 | 赵金玲 | One-transmitting four-receiving type double-wafer water film straight probe |
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2007
- 2007-12-29 CN CN2007103084653A patent/CN101469979B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2508216Y (en) * | 2001-11-12 | 2002-08-28 | 缪洪生 | Ultrasonic bicrystal thickness measuring feeler |
| CN2676148Y (en) * | 2003-07-28 | 2005-02-02 | 沈阳黎明航空发动机(集团)有限责任公司 | Double crystal ultrasonic thickness measuring probe |
| CN2716838Y (en) * | 2004-07-23 | 2005-08-10 | 赵金玲 | One-transmitting four-receiving type double-wafer water film straight probe |
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