CN2716838Y - One-transmitting four-receiving type double-wafer water film straight probe - Google Patents
One-transmitting four-receiving type double-wafer water film straight probe Download PDFInfo
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- CN2716838Y CN2716838Y CN 200420069955 CN200420069955U CN2716838Y CN 2716838 Y CN2716838 Y CN 2716838Y CN 200420069955 CN200420069955 CN 200420069955 CN 200420069955 U CN200420069955 U CN 200420069955U CN 2716838 Y CN2716838 Y CN 2716838Y
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- probe
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- insulating layer
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- 239000000523 sample Substances 0.000 title claims abstract description 47
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 title claims abstract description 12
- 235000012431 wafers Nutrition 0.000 claims description 27
- 241000446313 Lamella Species 0.000 claims description 11
- 239000003292 glue Substances 0.000 claims description 6
- 238000007789 sealing Methods 0.000 claims description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 239000011889 copper foil Substances 0.000 claims description 3
- 229910000831 Steel Inorganic materials 0.000 abstract description 10
- 239000010959 steel Substances 0.000 abstract description 10
- 238000007689 inspection Methods 0.000 abstract description 6
- 230000008878 coupling Effects 0.000 abstract description 3
- 238000010168 coupling process Methods 0.000 abstract description 3
- 238000005859 coupling reaction Methods 0.000 abstract description 3
- 230000035945 sensitivity Effects 0.000 abstract description 3
- 239000000956 alloy Substances 0.000 abstract 1
- 229910045601 alloy Inorganic materials 0.000 abstract 1
- 238000009413 insulation Methods 0.000 abstract 1
- 230000002035 prolonged effect Effects 0.000 abstract 1
- 238000000034 method Methods 0.000 description 4
- 238000009659 non-destructive testing Methods 0.000 description 3
- 239000013078 crystal Substances 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000000178 monomer Substances 0.000 description 2
- 229910000746 Structural steel Inorganic materials 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
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- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
The utility model relates to an ultrasonic inspection one-shot four-shot type bimorph water film straight probe for steel sheet nondestructive test is by: the probe core is composed of a delay block, a sound insulation layer and a wafer, a back lining is attached to the wafer, the wafer is located on the inclined plane of the delay block, an led-out electrode wire is connected with a probe wire in a wire tube, the universal frame is connected to the middle of the outer shell through a longitudinal shaft, and a transverse shaft hole in the universal frame is connected with a follow-up frame of the flaw detector. The utility model is suitable for a 6 ~ 60 mm's medium plate ultrasonic wave is automatic to be detected a flaw, also can be used for the hand to visit, and the probe core adopts the preferred parameter of one-shot four-shot type back to seal including in the casing, makes the effective acoustic beam width of probe strengthen, and sensitivity homogeneity improves, has improved efficiency and the quantitative precision of detecting a flaw, improves the coupling condition, reduces the wrong report, has improved and has just examined the rate. The wear-resistant disc is embedded with the hard alloy strips, so that the wear resistance is enhanced, and the service life is prolonged.
Description
Technical field
The utility model relates to a kind of UT (Ultrasonic Testing) probe that is used for the steel plate Non-Destructive Testing, the one transmitter and four receivers type twin lamella moisture film normal probe that particularly a kind of medium plate automatic ultrasonic inspection that is used for 6～60mm is used.
Background technology
At present, the steel plate Non-Destructive Testing, as the submarine of bridge structural steel plate, boiler, steel plate of pressure vessel, special purpose with steel plate, used by nuclear reactor steel plate etc., many both at home and abroad with UT (Ultrasonic Testing) as the means that detect inherent quality.Follow China joined WTO and continuous progress in science and technology, producer's increasing day by day of domestic employing automatic ultrasonic inspection Equipment Inspection steel plate inherent quality, the probe that it adopted is the staggered mode of monomer double crystal probe, and this frame mode causes effective beam width of probe to be restricted.The wafer length of monomer double crystal probe is generally more than 20mm, unfavorable to the defective quantitative accuracy, this structure has also caused probe and steel plate contact area bigger than normal, make and keep the difficulty of good coupling state big in the flaw detection process, the sensitivity homogeneity is not good enough on the scanning width, and wear-resisting dish material has limited the increase in probe serviceable life.Abroad have and adopt the symmetric arrangement probe to make it be in the method that state of receipts monitors couple state, but this method there is strict demand to two probe relative positions and sound beam direction, so regulate difficulty, poor effect.
Summary of the invention
The utility model has overcome the defective of above-mentioned existence, and purpose is for solving steel plate Non-Destructive Testing automatic ultrasonic inspection, a kind of one transmitter and four receivers type twin lamella moisture film normal probe being provided.
The utility model one transmitter and four receivers type twin lamella moisture film normal probe content Description:
The utility model one transmitter and four receivers type twin lamella moisture film normal probe, be by: the probe core, inner housing, shell body, loam cake, wear-resisting dish, water nozzle and universal framework are formed, it is characterized in that: the probe core is by delay block, sound insulating layer, wafer combines, has backing on the wafer, inner chamber is filled with sealing glue, in the middle of two delay blocks, be provided with sound insulating layer, wafer is positioned on the inclined-plane of delay block, the electrode wires of drawing links to each other with probe wire in the conduit, the probe core is fixed in the inner housing with sealing glue, inner housing is connected on the shell body with gib screw with after loam cake is connected with screw again; Wear-resisting dish is screwed the bottom at shell body, is inlaid with the wimet bar on the bottom surface of wear-resisting dish, leaves the gap of 0.3 ± 0.1mm below its lower surface and the shell body, by water nozzle water filling in it, forms moisture film; Universal framework is connected the middle part of shell body by the longitudinal axis, and the transverse axis hole on it is connected with the arbitrary-movement articulator of defectoscope; Equal and opposite in direction, ridge angle that direction is opposite are made in the top of two delay blocks of probe in-core, a long rectangle wafer is housed on the one inclined-plane, four short rectangle wafers are housed on another inclined-plane, word order, be respectively applied for emission and acceptance, in the middle of two delay blocks, be provided with sound insulating layer, on sound insulating layer, be inlaid with Copper Foil.
After adopting one transmitter and four receivers type preferred parameter, the utility model probe core is locked in the inner housing, the effective beam width of probe is strengthened, the sensitivity homogeneity improves, flaw detection efficient and quantitative accuracy have been improved, improve coupling condition, probe is little with the steel plate contact area, reduces wrong report, has improved just inspection rate.On wear-resisting dish, be inlaid with the wimet bar, strengthen wearing quality, increase the service life.
Description of drawings
Fig. 1 is an one transmitter and four receivers type twin lamella moisture film normal probe structural representation
Among the figure: 1 be wear-resisting dish, 2 for delay block, 3 for wafer, 4 for sound insulating layer, 5 for the longitudinal axis, 6 for universal framework, 7 for shell body, 8 for inner housing, 9 for gib screw, 10 for loam cake, 11 for conduit, 12 for probe wire, 13 for the probe core, 14 for backing, 15 for water nozzle.
Specific implementation method
The utility model one transmitter and four receivers type twin lamella moisture film normal probe is to realize like this.Be described further in conjunction with the accompanying drawings, see Fig. 1, one transmitter and four receivers type twin lamella moisture film normal probe be by: the probe core 13, inner housing 8, shell body 7, loam cake 10, wear-resisting dish 1, water nozzle 15 and universal framework 6 are formed, probe core 13 is by delay block 2, sound insulating layer 4, the backing of having on wafer 3 and the wafer 3 combines, wafer 3 is positioned on the inclined-plane of delay block 2, probe wire 12 in the electrode wires of drawing and the conduit 11 links to each other, equal and opposite in direction is made at the top of two delay blocks 2 in the probe core 13, the ridge angle that direction is opposite, a long rectangle wafer 3 is housed on the one inclined-plane is the emission wafer, the emission wafer is 5P 5 * 50, four short rectangle wafers 3 are housed for receiving wafer on another inclined-plane, receiving wafer is 5P 5 * 12.5, four receive the wafer word order, be respectively applied for emission and acceptance, inner chamber is filled with sealing glue, is provided with sound insulating layer 4 in the middle of two delay blocks 2; Be inlaid with Copper Foil on sound insulating layer 4, the thickness of sound insulating layer 4 is 0.8～1.5mm.Probe core 13 usefulness sealing glue are fixed in the inner housing 8, and inner housing 8 is connected on the shell body 7 with gib screw 9 with after loam cake 10 usefulness screws are connected again; Wear-resisting dish 1 is screwed in the bottom of shell body 7, is inlaid with the wimet bar on the bottom surface of wear-resisting dish 1, leaves the gap of 0.3 ± 0.1mm below its lower surface and the shell body 7, by water nozzle 15 water filling in it, forms moisture film; Universal framework 6 is connected the middle part of shell body 7 by the longitudinal axis 5, and the transverse axis hole on it is used for being connected with the arbitrary-movement articulator of defectoscope.
Claims (3)
1, a kind of one transmitter and four receivers type twin lamella moisture film normal probe, be by: the probe core (13), inner housing (8), shell body (7), loam cake (10), wear-resisting dish (1), water nozzle (15) and universal frame (6) frame are formed, it is characterized in that: probe core (13) is by delay block (2), sound insulating layer (4), wafer (3) combines, wafer (3) is gone up with backing, inner chamber is filled with sealing glue, in the middle of two delay blocks (2), be provided with sound insulating layer (4), wafer (3) is positioned on the inclined-plane of delay block (2), probe wire (12) in the electrode wires of drawing and the conduit (11) links to each other, probe core (13) is fixed in the inner housing (8) with sealing glue, inner housing (8) uses gib screw (9) to be connected on the shell body (7) with after loam cake (10) is connected with screw again; Wear-resisting dish (1) is screwed in the bottom of shell body (7), is inlaid with the wimet bar on the bottom surface of wear-resisting dish (1), leaves the gap of 0.3 ± 0.1mm below its lower surface and the shell body (7), by water nozzle (15) water filling in it, forms moisture film; Universal framework (6) is connected the middle part of shell body (7) by the longitudinal axis (5).
2, one transmitter and four receivers type twin lamella moisture film normal probe as claimed in claim 1, it is characterized in that: equal and opposite in direction, ridge angle that direction is opposite are made in the top of two delay blocks (2) in probe core (13), one length of a film rectangle wafer (3) is housed on the one inclined-plane is the emission wafer, the emission wafer is 5P 5 * 50, four short rectangle wafers (3) are housed for receiving wafer on another inclined-plane, receiving wafer is 5P 5 * 12.5, and four receive the wafer word order.
3, one transmitter and four receivers type twin lamella moisture film normal probe as claimed in claim 1, it is characterized in that: be inlaid with Copper Foil on the said probe sound insulating layer (4), the thickness of sound insulating layer (4) is 0.8～1.5mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200420069955 CN2716838Y (en) | 2004-07-23 | 2004-07-23 | One-transmitting four-receiving type double-wafer water film straight probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200420069955 CN2716838Y (en) | 2004-07-23 | 2004-07-23 | One-transmitting four-receiving type double-wafer water film straight probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2716838Y true CN2716838Y (en) | 2005-08-10 |
Family
ID=34873816
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200420069955 Expired - Fee Related CN2716838Y (en) | 2004-07-23 | 2004-07-23 | One-transmitting four-receiving type double-wafer water film straight probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2716838Y (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101469979B (en) * | 2007-12-29 | 2011-04-13 | 北京时代之峰科技有限公司 | Ultrasonic thickness gauge and monocrystal probe and double crystal probe recognition method |
| CN101540940B (en) * | 2009-04-20 | 2012-02-15 | 中国计量学院 | Self-screened exciting pick-up integrated device used for audio detection |
| CN103884779A (en) * | 2014-03-25 | 2014-06-25 | 济钢集团有限公司 | Probe bracket for ultrasonic artificial detection of steel plate |
| CN105180854A (en) * | 2015-10-07 | 2015-12-23 | 华北水利水电大学 | Large-power four-crystal integrated ultrasonic transducer |
| CN105445380A (en) * | 2015-11-23 | 2016-03-30 | 南京航空航天大学 | Asymmetrical dual-wafer set ultrasonic wave probe applicable to large complex structure damage detection and operation method thereof |
| RU2811322C1 (en) * | 2023-10-05 | 2024-01-11 | Общество с ограниченной ответственностью "Компания "Нординкрафт" | Ultrasonic separate-combined transducer |
-
2004
- 2004-07-23 CN CN 200420069955 patent/CN2716838Y/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101469979B (en) * | 2007-12-29 | 2011-04-13 | 北京时代之峰科技有限公司 | Ultrasonic thickness gauge and monocrystal probe and double crystal probe recognition method |
| CN101540940B (en) * | 2009-04-20 | 2012-02-15 | 中国计量学院 | Self-screened exciting pick-up integrated device used for audio detection |
| CN103884779A (en) * | 2014-03-25 | 2014-06-25 | 济钢集团有限公司 | Probe bracket for ultrasonic artificial detection of steel plate |
| CN105180854A (en) * | 2015-10-07 | 2015-12-23 | 华北水利水电大学 | Large-power four-crystal integrated ultrasonic transducer |
| CN105445380A (en) * | 2015-11-23 | 2016-03-30 | 南京航空航天大学 | Asymmetrical dual-wafer set ultrasonic wave probe applicable to large complex structure damage detection and operation method thereof |
| RU2811322C1 (en) * | 2023-10-05 | 2024-01-11 | Общество с ограниченной ответственностью "Компания "Нординкрафт" | Ultrasonic separate-combined transducer |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C19 | Lapse of patent right due to non-payment of the annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |