CN201191179Y - Thickness measurer having probe recognition function - Google Patents
Thickness measurer having probe recognition function Download PDFInfo
- Publication number
- CN201191179Y CN201191179Y CNU2008200793709U CN200820079370U CN201191179Y CN 201191179 Y CN201191179 Y CN 201191179Y CN U2008200793709 U CNU2008200793709 U CN U2008200793709U CN 200820079370 U CN200820079370 U CN 200820079370U CN 201191179 Y CN201191179 Y CN 201191179Y
- Authority
- CN
- China
- Prior art keywords
- probe
- thicknessmeter
- recognition function
- storage chip
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Abstract
The utility model provides a thickness gauge with a probe recognition function, belonging to the industry nondestructive test technical field, for resolving the defects of the prior art which can not obtain accurate nonlinear data of different probes and can not realize accurate measurement. The thickness gauge comprises a probe and a calculation end, which is characterized in that the probe comprises a memory chip whose data pin is connected with a data input of the calculation end for transmitting the probe data stored in the memory chip to the calculation end. The thickness gauge has the advantages that when the probe measures the thickness of an object, the thickness gauge can directly obtain nonlinear calibration data and ID from the memory chip of the probe for correcting the measurement result, to obtain accurate measurement value. The thickness gauge has simple structure and more accurate measurement value than the prior art.
Description
Technical field
The utility model relates to the industrial nondestructive testing field, is a kind of thicknessmeter with probe recognition function specifically.
Background technology
Supersonic thickness meter carries out thickness measure according to the ultrasonic pulse principle of reflection, when the pulse of probe ultrasonic waves transmitted arrives material interface by testee, pulse is reflected back toward probe, and the time of propagating in material by accurate measurement ultrasound wave is determined the thickness of measured material.All ultrasound waves that can make all can adopt this principle to measure with the various materials of constant speed portion's propagation within it.Can do accurately to measure to various sheet materials and various processing parts by the thicknessmeter of this principle design, also can monitor, monitor their attenuate degree after in use being corroded various pipelines and pressure vessel in the production equipment.Can be widely used in every field such as oil, chemical industry, metallurgy, shipbuilding, Aeronautics and Astronautics.
Be illustrated in figure 1 as the structural representation of thicknessmeter in the prior art, comprise probe 1, thicknessmeter calculates end 2, transmission piezoelectric wafer 3, receive piezoelectric chip 4, the line 5 that transmits, received signal line 6, emission delay block 7, receive delay piece 8, sound insulating layer 9, probe interface 10; Described probe 1 is placed the testee surface, and transmission piezoelectric wafer 3 calculates end 2 by the line 5 that transmits from thicknessmeter and receives the transponder pulse signal, produces ultrasound wave by transmission piezoelectric wafer 3, and passes through emission delay block 7 to testee emission ultrasound wave; Receive piezoelectric chip 4 and receive the ultrasound wave that testee reflects by receive delay piece 8, and calculating end 2 return echo signals to thicknessmeter by received signal line 6, thicknessmeter calculates end 2 and calculates testee thickness the two-way time in testee according to ultrasound wave.Because existing probe has a variety of, and each different probe all has different detection characteristics, for example piezoelectric chip is to the distance between the testee, parameters such as the setting angle of piezoelectric chip, when calculated thickness, these parameters need be taken into account, otherwise can cause the coarse problem of testing result; The piezoelectric modulus of piezoelectric chip is inequality simultaneously, and the electromechanical conversion efficiency of probe is also inequality.So the identification of probe becomes a bigger problem for detecting instruments such as thickness measurings.
Be illustrated in figure 2 as the embodiment synoptic diagram that utilizes resistance identification probe type in the prior art, existing probe identification is by a built-in resistance R in the interface 10 of probe, this resistance R is also calculated end 2 with thicknessmeter and is connected when the identification signal line of probe interface 10 is connected to thicknessmeter and calculates end 2, thicknessmeter calculates the inner current source of end and provides power supply to resistance R, gather the voltage of resistance R by A/D converter, and should the collection value data pins of input CPU, described CPU adopts the process chip of P87C52, CPU distinguishes the kind of probe by the voltage swing on the measuring resistance, for example when voltage is certain interval, probe is 1MHz, is directed to the configuration parameter of different probes with use.Wherein, transmit line 5 and received signal line 6 all calculate end 2 by probe interface 10 and thicknessmeter and are connected, and thicknessmeter calculates end 2 and sends pulse signal by radiating circuit and receiving circuit to described probe, perhaps receives echoed signal.
But the method for detection probe built-in resistor can not be distinguished probe accurately, can only identify the general kind of probe, is 1MHz probe, 5MHz probe or 10MHz probe.
China's utility model patent, Granted publication CN2802440Y, denomination of invention is " measurer for thickness ", discloses a kind of measurer for thickness, the probe of this device can be surveyed object thickness everywhere perpendicular to the to-and-fro movement of object under test direction of motion.But this scheme such as above-mentioned deficiency are not very accurate for the detection of popping one's head in.
In the introducing mode above-mentioned technology contents is incorporated in the application.
The utility model content
The purpose of this utility model is to provide a kind of thicknessmeter with probe recognition function, is used for solving prior art and can't obtains the difference nonlinear data accurately of popping one's head in, and measures not accurate enough deficiency.
A kind of thicknessmeter with probe recognition function, comprise that probe and thicknessmeter calculate end, it is characterized in that described probe also comprises a storage chip, the data pin of this storage chip is connected with the Data Input Interface that described thicknessmeter calculates end, sends the probe related data of storing in the described storage chip to described thicknessmeter and calculates end.
According to a kind of further aspect of thicknessmeter with probe recognition function described in the utility model, it is inner that described storage chip is arranged at described probe.
According to a kind of another further aspect of thicknessmeter with probe recognition function described in the utility model, described storage chip comprises: the storage chip with one-line connected mode.For example, DS2431AP.
According to a kind of another further aspect of thicknessmeter with probe recognition function described in the utility model, described thicknessmeter calculates the end processor adopting and comprises: AT91R40008.
According to a kind of another further aspect of thicknessmeter with probe recognition function described in the utility model, it is the P2.3 pin of processor that described thicknessmeter calculates the end data input interface.
According to a kind of another further aspect of thicknessmeter with probe recognition function described in the utility model, described probe related data comprises: the ID of probe, the gamma correction data of this probe.
The beneficial effect of the utility model embodiment is, when thicknessmeter uses this probe measurement testee thickness, can from the storage chip of probe, directly obtain gamma correction data and ID and be used to revise measurement result, to obtain measured value more accurately, the utility model is simple in structure, and the measured value of Huo Deing is more accurate than existing product at last.
Description of drawings
Accompanying drawing described herein is used to provide further understanding of the present utility model, constitutes the application's a part, does not constitute qualification of the present utility model.In the accompanying drawings:
Fig. 1 is a thicknessmeter synoptic diagram in the prior art;
Fig. 2 is the circuit connection diagram that thickness meter probe and thicknessmeter calculate end in the prior art;
Fig. 3 is the utility model thicknessmeter synoptic diagram;
Fig. 4 is the coordinate system synoptic diagram of the utility model sound path and thickness relationship;
Fig. 5 is the circuit connection diagram that the utility model probe storage chip and thicknessmeter calculate end.
Embodiment
For making the purpose of this utility model, technical scheme and advantage clearer,, the utility model is described in further details below in conjunction with embodiment and accompanying drawing.At this, exemplary embodiment of the present utility model and explanation thereof are used to explain the utility model, but not as to qualification of the present utility model.
The utility model embodiment provides a kind of thicknessmeter with probe recognition function.Below in conjunction with accompanying drawing the utility model is elaborated.
Be illustrated in figure 3 as the utility model thicknessmeter structural drawing, comprise probe 1, thicknessmeter calculates end 2, transmission piezoelectric wafer 3, receive piezoelectric chip 4, the line 5 that transmits, received signal line 6, emission delay block 7, receive delay piece 8, sound insulating layer 9, probe interface 10, the data line 12 of storage chip 11 and storage chip; Described probe 1 is placed the testee surface, transmission piezoelectric wafer 3 calculates end 2 by the line 5 that transmits from thicknessmeter and receives transponder pulse, launch ultrasound wave by emission delay block 7 to testee, receive piezoelectric chip 4 and receive the ultrasound wave that testee reflects by receive delay piece 8, and calculating end 2 return echo signals to thicknessmeter by received signal line 6, thicknessmeter calculates end 2 and calculates testee thickness the two-way time in testee according to ultrasound wave.The storage chip 11 of in described probe interface 10, packing into, DS2431AP chip for example, in this storage chip, store ID number and the gamma correction data of this probe of probe, because at probe piezoelectric chip and delay block between the detected material is different and different along with probe, and for the probe of on production line, producing, the product of same production line is not just the same, so each probe all has the characteristic of oneself, described gamma correction data are meant, in the coordinate system of sound path and thickness, as shown in Figure 4, sound path is the time interval of sending ultrasound wave and receiving reflection supersonic wave, this sound path in theory should be linear with the detected material body thickness, but in actual measurement, because the characteristic difference of probe (existing as described in the background art probe piezoelectric chip, electromechanical efficiency, problems such as the setting angle of piezoelectric chip), can produce sound path and the nonlinear problem of thickness, thicknessmeter calculates end 2 obtains probe 1 from described storage chip 11 by data line 12 ID and gamma correction data, described ID is used for determining the type of probe, described gamma correction data are used to revise testing result, after when object to be detected is detected, receiving the ultrasonic signal that reflects, calculate sound path, calculate the detected material body thickness then, the nonlinear problem that occurs when utilizing gamma correction compensation data calculated thickness after calculated thickness finally obtains thickness measuring data accurately.
Fig. 5 is the cpu circuit figure that the utility model storage chip 11 and thicknessmeter calculate end 2, thicknessmeter calculates the CPU employing AT91R40008 chip of end 2 in the present embodiment, storage chip 11 adopts the DS2431AP chip, the data pins of described storage chip 11 is connected with the P2.3 pin of CPU, adopt one-line mode to connect, described one-line mode connects, promptly this storage chip is connected with CPU, data line, power lead, clock line all uses a heart yearn to realize, this P2.3 pin and storage chip data pins connecting line also are connected with pull-up resistor R and power Vcc, and preferred described Vcc is+3.3V.The needed power supply of read-write operation can be from 1-Wire
Transmission line obtains.
In the housing of existing probe interface 10, insert a storage chip, described storage chip is fixed in the described probe interface 10, perhaps described storage chip can be fixed in probe 1 end, and in the ID and the gamma correction data of the different probes 1 of each probe storage.
The beneficial effects of the utility model are, by the probe an embedded storage chip, storage in advance is through the probe nonlinear data and the ID of calibration in storage chip, when thicknessmeter uses this probe measurement testee thickness, can from the storage chip of probe, directly obtain gamma correction data and ID and be used to revise measurement result, to obtain measured value more accurately, the utility model is simple in structure, and the measured value of Huo Deing is more accurate than existing product at last.
Above-described embodiment; the purpose of this utility model, technical scheme and beneficial effect are further described; institute is understood that; the above only is an embodiment of the present utility model; and be not used in and limit protection domain of the present utility model; all within spirit of the present utility model and principle, any modification of being made, be equal to replacement, improvement etc., all should be included within the protection domain of the present utility model.
Claims (7)
- One kind have the probe recognition function thicknessmeter, comprise that probe and thicknessmeter calculate end, it is characterized in that described probe also comprises a storage chip, the data pin of this storage chip is connected with the Data Input Interface that described thicknessmeter calculates end, sends the probe related data of storing in the described storage chip to described thicknessmeter and calculates end.
- 2. a kind of thicknessmeter with probe recognition function according to claim 1 is characterized in that described storage chip is arranged at the interface hull inside of described probe.
- 3. a kind of thicknessmeter with probe recognition function according to claim 1 is characterized in that, described storage chip calculates end with described thicknessmeter and adopts one-line mode to be connected.
- 4. a kind of thicknessmeter with probe recognition function according to claim 1 is characterized in that described storage chip comprises: DS2431AP.
- 5. a kind of thicknessmeter with probe recognition function according to claim 1 is characterized in that, described thicknessmeter calculates the end processor adopting and comprises: AT91R40008.
- 6. a kind of thicknessmeter with probe recognition function according to claim 4 is characterized in that it is the P2.3 pin of processor that described thicknessmeter calculates the end data input interface.
- 7. a kind of thicknessmeter with probe recognition function according to claim 4 is characterized in that described probe related data comprises: the ID of probe, the gamma correction data of this probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008200793709U CN201191179Y (en) | 2008-03-13 | 2008-03-13 | Thickness measurer having probe recognition function |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008200793709U CN201191179Y (en) | 2008-03-13 | 2008-03-13 | Thickness measurer having probe recognition function |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201191179Y true CN201191179Y (en) | 2009-02-04 |
Family
ID=40335341
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2008200793709U Expired - Fee Related CN201191179Y (en) | 2008-03-13 | 2008-03-13 | Thickness measurer having probe recognition function |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201191179Y (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103791864A (en) * | 2012-10-30 | 2014-05-14 | 中国石油天然气股份有限公司 | Sucker rod length measuring instrument |
| CN115265428A (en) * | 2022-07-05 | 2022-11-01 | 济宁鲁科检测器材有限公司 | Composite ultrasonic thickness gauge and thickness measuring method thereof |
-
2008
- 2008-03-13 CN CNU2008200793709U patent/CN201191179Y/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103791864A (en) * | 2012-10-30 | 2014-05-14 | 中国石油天然气股份有限公司 | Sucker rod length measuring instrument |
| CN115265428A (en) * | 2022-07-05 | 2022-11-01 | 济宁鲁科检测器材有限公司 | Composite ultrasonic thickness gauge and thickness measuring method thereof |
| CN115265428B (en) * | 2022-07-05 | 2023-09-12 | 济宁鲁科检测器材有限公司 | Composite ultrasonic thickness gauge and thickness measuring method thereof |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CA2479119C (en) | Self calibrating apparatus and method for ultrasonic determination of fluid properties | |
| US8192075B2 (en) | Method for performing ultrasonic testing | |
| US10641641B2 (en) | Method for ascertaining a characteristic variable for evaluating a measuring arrangement comprising a clamp-on, ultrasonic, flow measuring device and a pipe and/or for evaluating measurement operation of such a measuring arrangement | |
| EP1943953A3 (en) | Ultrasonic diagnostic apparatus, IMT measurement method, and IMT measurement program | |
| US7240554B2 (en) | Method and device for sizing a crack in a workpiece using the ultrasonic pulse-echo technique | |
| CN106441178A (en) | Ultrasonic thickness measuring technology having self-correcting function | |
| CN101126741B (en) | Critical refraction longitudinal wave detection component inside tangential stress assistant device | |
| US9696282B2 (en) | Method for measuring elastic properties using ultrasound | |
| CN101458074A (en) | Ultrasonic thickness meter with sensor automatic recognition function | |
| CN102564680A (en) | Ultrasound-based measuring device and method | |
| CN112484836B (en) | Ultrasonic probe device and workpiece sound velocity measurement method | |
| CN201191179Y (en) | Thickness measurer having probe recognition function | |
| CN108613644A (en) | A kind of ultrasonic probe that extreme environment wall thickness reduction measures | |
| US9841309B2 (en) | Method for measuring the fill level of a fluid | |
| CN204807054U (en) | Ultrasonic thickness meter | |
| CN207499824U (en) | A kind of slurry tank liquid level detection device | |
| US20110126628A1 (en) | Non-destructive ultrasound inspection with coupling check | |
| CN106885542A (en) | A kind of sonigauge for possessing temperature detecting function | |
| CN111780834B (en) | Calibration method of pressure liquid level meter | |
| CN206683598U (en) | A kind of special sonigauge of flexible material | |
| CN106885544A (en) | A kind of sonigauge based on bluetooth communication | |
| CN106885538A (en) | A kind of ultrasonic thickness measurement instrument system | |
| CN105043311A (en) | Ultrasonic thickness gauge | |
| Yeo et al. | Guided ultrasonic wave inspection of corrosion at ship hull structures | |
| JP2009139188A (en) | Ultrasonic apparatus for measuring surface roughness and method therefor |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| EE01 | Entry into force of recordation of patent licensing contract |
Assignee: Shidai Corp. Group Assignor: Beijing TIME High-technology Ltd. Contract fulfillment period: 2009.6.3 to 2014.6.2 Contract record no.: 2009990000616 Denomination of utility model: Thickness measurer having probe recognition function Granted publication date: 20090204 License type: Exclusive license Record date: 20090605 |
|
| LIC | Patent licence contract for exploitation submitted for record |
Free format text: EXCLUSIVE LICENSE; TIME LIMIT OF IMPLEMENTING CONTACT: 2009.6.3 TO 2014.6.2; CHANGE OF CONTRACT Name of requester: SHIDAI GROUP CO. Effective date: 20090605 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090204 Termination date: 20170313 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |