CN101320065A - Simulation test method of space flight optical remote sensor imaging circuit - Google Patents
Simulation test method of space flight optical remote sensor imaging circuit Download PDFInfo
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- CN101320065A CN101320065A CNA2008100510102A CN200810051010A CN101320065A CN 101320065 A CN101320065 A CN 101320065A CN A2008100510102 A CNA2008100510102 A CN A2008100510102A CN 200810051010 A CN200810051010 A CN 200810051010A CN 101320065 A CN101320065 A CN 101320065A
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Abstract
The invention relates to a method for detecting and debugging the imaging circuit of a space optical remote sensor, in particular to a simulation test method of the imaging circuit of a space optical remote sensor under the condition that the imaging circuit is lack of multispectral TDI CCD devices. Under the integral control of a timing circuit, the amplitudes, frequencies and interrelation detected real time and analyzed by a detecting system can be identified to be correct or wrong; if correct, a signal stimulation output system can be informed to generate required TDI CCD signals; if wrong, a central computer can be informed to alarm and show by network. Output video signals come from image data, which is simulated by computers, and transmitted to the memory of the signal stimulation output system through a high-speed image transmission channel; the contents of output image can be updated by the double buffer mechanism, thereby continuously delivering stimulated TDI CCD image signals. The method provided by the invention can avoid the shortening of the service lives of chips which is caused by long-term testing.
Description
Technical field
The present invention relates to space flight optical remote sensor imaging circuit is detected the method for debugging, under particularly a kind of condition that in imaging circuit system, lacks multispectral time delay integration photoelectric coupled device (multispectral TDICCD), finish the method for the imaging processing circuit being carried out emulation testing.
Background technology
Ccd imaging sensor is the important use device in image sensing field, and has become the core devices of imaging (shooting, photograph) system.High speed development along with integrated circuit technology, ccd imaging sensor had developed into the essential product of imaging field in recent years, and in image sensing, signal Processing and stored digital three big fields, be used widely, fully demonstrate its great potential, be regarded as the most important a kind of device that has occurred since the seventies.
The basic structure of CCD comprises photosensitive area, three major parts of transition range and charge detection unit.Ccd imaging sensor is that the optical imagery that the photoelectric converting function that utilizes CCD to have will be incident upon in the photosensitive unit of CCD is converted to electric signal " image ", i.e. the roughly directly proportional charge packet space distribution that differs in size of the quantity of electric charge and incident illumination.Utilize shift-register functions that these charge packets are transferred to the output of charge detection end, the real-time pulse sequence that the formation amplitude does not wait then.
Multispectral TDI CCD chip is better than general CCD chip on performance, function and reliability, the core devices that belongs to hiperspace remote optical sensing field, its complex structure, superior performance, the fiduciary level height, but long because of this multispectral TDI CCD chip production cycle, means of testing is difficult and characteristics such as complex manufacturing, price is very expensive.
Multispectral TDI CCD chip is the special chip that is used in the space optical remote field, in the process of development space optical remote sensor, need under ground and vacuum condition, do a large amount of system debugs and test, will inevitably reduce performance index, mission life and the fiduciary level of TDI CCD chip, even can defective chip.
Summary of the invention
The object of the present invention is to provide a kind of emulation test method of space flight optical remote sensor imaging circuit, adopt the inventive method can be implemented under the condition that lacks multispectral time delay integration photoelectric coupled device (multispectral TDI CCD) in the imaging circuit system, the emulation of finishing the imaging processing Circuits System detects.
The present invention is that a kind of core electrooptical device in the space flight optical remote sensor (multispectral TDI CCD) that can replace is finished the method for the imaging processing circuit being carried out emulation testing.The means that adopt computer technology to combine with electronics, the effect of simulating TDI CCD device in imaging circuit, control timing output and the consistent vision signal of TDI CCD device in strict accordance with imaging circuit, reach under the situation that does not have TDI CCD device, equally debug the purpose of imaging processing circuit.
The emulation testing closed-loop system that this method is formed identification and testing circuit (comprising voltage modulate circuit, analog to digital conversion-A/D circuit, logic comparator circuit and parallel processing system (PPS)), multispectral TDI ccd signal emulation output circuit (comprising digital-to-analog conversion-D/A circuit, amplification and filtering circuit), the synchronous clock circuit of the control signal of central computer turn-key system, image data source generation and transmission system, the output of imaging processing circuit is connected on the TDI-CCD imaging processing circuit, and its emulation and trace routine are:
A. according to designed multispectral TDI ccd output signal feature, selected coloured image is carried out pre-service, be prefabricated into the multispectral digital picture of emulation, figure place in accordance with regulations, width and height image data storage in the computer disk array;
B. central computer sends the system works startup command, after synchronous clock circuit receives, begin to export clock signal and work enabling signal that whole Circuits System need, trigger identification and testing circuit, multispectral TDI ccd signal emulation output circuit simultaneously, the image data transmission circuit is started working;
C. identification is at first carried out the voltage conditioning by the voltage modulate circuit to the control signal (comprising drive signal and direct current biasing signal) of imaging processing circuit output with testing circuit, makes its output signal voltage adjust to analog to digital conversion (A/D) circuit and the acceptable voltage range of comparator circuit by fixed proportion.Signal after the voltage conditioning detects and logic analysis according to amplitude, frequency and the mutual relationship (as phase delay) of given multispectral TDI ccd signal standard to signal, if find that the drive signal and the dc offset voltage signal in this cycle are correct after testing with after the logic analysis, then send the multispectral TDI ccd signal of detection accurate indication signalisation emulation output circuit and begin outputting video signal, proceed next cycle analysis testing simultaneously; Otherwise stop immediately detecting and video image generation work, the result that will make mistakes notifies central computer by Ethernet;
D. multispectral TDI ccd signal emulation output circuit is after receiving the enabling signal of synchronizing circuit, start working, go to judge the testing result of identification and testing circuit in real time, after receiving detection accurate indication signal, Digital Image Data in the DDR SDRAM private memory is read, through digital-to-analogue (D/A) conversion, amplification and Filtering Processing, be output as the vision signal of simulation by multispectral TDI ccd signal form, finish the picture signal output of one-period, continue monitoring, up to the arrival that detects the accurate indication signal next time;
E. under the control of central computer, in order view data prefabricated in the disk array is taken out, adopt the method for DMA, send in the DDR SDRAM storer of multispectral TDI ccd signal emulation output circuit through PCI-X and LVDS bus, view data in the update signal emulation output circuit, adopt two buffer memory controlling mechanisms, finishing data overlapping formula with two DDR SDRAM storeies upgrades, when promptly DDR SDRAM is responsible for that the d realtime graphic is read set by step, another finishes the real-time reception of new image data, after upgrade finishing, the two role's exchange is carried out the reception of a new round and is read;
F. when sending system works, central computer ceases and desist order, after synchronous clock circuit receives, stop to export the concurrent work stop signal of the needed clock signal of whole Circuits System, stop to discern work with testing circuit, multispectral TDI ccd signal emulation output circuit, image data transmission circuit.
The advantage of the inventive method is:
1. the application of emulation of multispectral TDI ccd signal and detection method can replace multispectral TDI CCD chip to do early stage emulation output video image signal test, prevent because of on top of not multispectral TDI CCD chip characteristics meets accident, and damage multispectral TDI CCD product.
2. can avoid making the problem in the reduction chip life-span that test of long duration causes of expensive multispectral TDI CCD space flight chip.
3. the present invention's multispectral TDI CCD of emulation chip not only, and can emulation and the closely-related optical imagery function of CCD, directly output and the same video signal of multispectral TDI CCD in real time, even solved multispectral TDI CCD chip, but, also can not drop into the problem of experiment work immediately because first-class test condition of optical frames and environment are difficult to possess.
4. can finish the camera electrical system operation situation real-time monitoring relevant with multispectral TDI CCD chip.
Description of drawings
Fig. 1 is emulation of multispectral TDI ccd signal and testing circuit design concept synoptic diagram;
Fig. 2 is control signal identification and testing circuit principle schematic;
Fig. 3 is a ccd signal emulation output circuit principle schematic;
Fig. 4 is the image data transmission access diagram;
Fig. 5 is that signal frequency detects synoptic diagram;
Fig. 6 is that the same frequency signal phase postpones to detect synoptic diagram.
Embodiment
The present invention is described in detail below in conjunction with example, so that purpose of the present invention, feature and advantage are carried out more deep understanding.
With reference to Fig. 1, the inventive method is central computer turn-key system 1, image data source to be generated and the emulation testing closed-loop system of the identification of the control signal of transmission system 2, the output of imaging processing circuit and testing circuit 3, multispectral TDICCD signal simulation output circuit 4 and synchronous clock circuit 5 compositions is connected on the TDI-CCD imaging processing circuit 6.
Below introducing each several part in detail forms.
1) central computer turn-key system
The central computer turn-key system is finished the relation of coordinating between a plurality of Circuits System of control.Groundwork comprise when control system circuit unlatching, close, the problem information that receives identification and testing circuit also is presented at computer screen; Control chart is as selection of source data, transmission.
2) image data source generation system, with existing view data, or the special test pattern that computing machine generates is converted to the signal that meets multispectral TDI CCD vision signal outputting standard through digital conversion, and be stored in the disk array, it is prefabricated that this process is referred to as image.The multispectral TDICCD of institute's emulation comprises red, green, blue and monochrome information in this example, constitute by panchromatic and colored two kinds of pixels, pixel diameter colour is panchromatic 4 times, the pixel output frequency is panchromatic to be colored 2 times, panchromatic 4096 pixels of number of picture elements/OK, colored 1024 pixels/OK, colored R, G, the B triple channel of dividing exported simultaneously, and gold point 8 passages are exported simultaneously.
The image source production method: utilizing a fabric width degree is the coloured image of 1024 pixels, isolate R, G, the B component is stored separately, adopting the method for the image interpolation of cubic spline interpolation simultaneously, is 4096 pixels/OK with image augmentation, with the brightness of image after the interpolation as the full-colour image data storage.
With reference to Fig. 4, the image data source transmission channel, prefabricated image data storage is at disk array 7, read in calculator memory 9 by PCI-E bus 8, be transferred in the FPGA development board 11 by PCI-X bus 10 with dma mode again, development board is the main control chip with the Cyclone2 chip of altera corp, and the read-write of control PCI-X bus data is transferred to ccd signal emulation output circuit with the data of receiving with LVDS transmission mode 12 simultaneously.
3) with reference to Fig. 2, identification and testing circuit, constitute by following subsystem: voltage modulate circuit (making drive signal and direct current biasing voltage of signals adjust to A/D change-over circuit and the acceptable voltage range of comparator circuit) by fixed proportion, the A/D of panchromatic coherent signal conversion and logic comparator circuit (A/D conversion be mainly used to the to sample amplitude of direct current biasing signal of input, so that carry out the judgement of amplitude legitimacy, it is digitized 0 that comparator circuit quantizes drive level, 1, so that carry out between the measurement of signal frequency and signal logical relation relatively), the A/D conversion and the logic comparator circuit of colored coherent signal, the main control chip circuit---adopt the Virtex4 chip of Xilinx company, finish acquisition controlling to A/D and comparer, data analysis is judged, data communication with central computer, with the communication of signal simulation output circuit, tasks such as time system reception.
The measurement of frequency and logic method relatively:
Adopt the method in survey cycle to measure frequency input signal.As shown in Figure 5, the drive signal of input becomes square wave through behind the comparer, has only two kinds of level of height.The given frequency fs signal of selecting a standard is (for sampling fully, this frequency should be more than or equal to by 2 times of measured frequencies, and we select fs to treat more than 10 times of measured frequency here), in the one-period Tx of measured signal, the periodicity Ns of record standard signal, then the frequency f x of measured signal is
f
x=f
s/ N
s, the cycle is T
x=N
s/ f
s
On the basis of frequency measurement, further can measure the phase delay time of two same frequency signals, will with the fs frequency collection to two signals carry out phase and computing, poor with one of them waveform again, the high level of the new square wave as shown in Figure 6 that obtains is phase differential, adopt a signal fs ' than fs higher frequency, in the inside counting of phase differential time is Ns ', and then the phase delay time of two signals is N
S '/ f
S '
4) with reference to Fig. 3, the emulation output circuit of TDI-CCD signal, be made of following subsystem: (the 8 tunnel is panchromatic for 11 road D/A change-over circuits, 3 road colours), 11 the tunnel amplify and filtering circuit, DDR SDRAM data storage circuitry (adopts 2 DDR SDRAM, with the storage of ping-pong buffer mechanism), LVDS interface circuit (receiving data) from image data source, the main control chip circuit---adopt the Virtex4 chip of Xilinx company to finish and the communication of central computer image data source equally, the table tennis access control of DDR SDRAM, D/A exports control, with identification testing circuit communication with tasks such as timely system receptions.
The table tennis controlling mechanism:
Utilize the parallel work-flow characteristics of FPGA, the renewal of data and signal generate and carry out synchronously.When view data when the DDR SDRAM-A stored, signal generates desired data and obtains from DDR SDRAM-B, if the speed of the two is inconsistent, the speed that generates with signal is as the criterion, the speed of image storage should be not less than the speed of reading, when DDR SDRAM-A is filled with, when the data of DDR SDRAM-B have not also been exported, then stop Data Update, wait for that data output finishes among the DDR SDRAM-B.When the DDRSDRAM-B data read finish after, two storer roles exchange, DDR SDRAM-B begins to receive Data Update, DDR SDRAM-A begins data and reads.
5) synchronous clock circuit has been finished the synchro control to whole electronic systems, and the signal that the clock signal of all circuit, work start and stops is circuit transmission thus all, is connected with central computer by serial ports simultaneously, can be by the central computer Long-distance Control.Adopted the FPGA of Xilinx company in this example---Spartan2 is as the main control chip of time system circuit, finish clock unified management and with the task of central computer communication.
The detailed operation process is as follows:
A. according to designed multispectral TDI ccd output signal feature, selected coloured image is carried out pre-service, be prefabricated into the multispectral digital picture of emulation, figure place in accordance with regulations, width and height image data storage in the computer disk array;
B. central computer sends the system works startup command, after synchronous clock circuit receives, begin to export clock signal and work enabling signal that whole Circuits System need, trigger identification and testing circuit, multispectral TDI ccd signal emulation output circuit simultaneously, the image data transmission circuit is started working;
C. identification is at first passed through the voltage modulate circuit with testing circuit, the control signal (comprising drive signal and direct current biasing signal) of imaging processing circuit output is carried out the voltage conditioning, make its output signal voltage adjust to analog to digital conversion (A/D) circuit and the acceptable voltage range of comparator circuit by fixed proportion.Signal after the voltage conditioning detects and logic analysis according to amplitude, frequency and the mutual relationship (as phase delay) of given multispectral TDI ccd signal standard to signal, if find that the drive signal and the dc offset voltage signal in this cycle are correct after testing with after the logic analysis, then send and detect the accurate indication signal, notify multispectral TDI ccd signal, the emulation output circuit begins outputting video signal, proceeds next cycle analysis testing simultaneously; Otherwise stop immediately detecting and video image generation work, the result that will make mistakes notifies central computer by Ethernet;
D. multispectral TDI ccd signal emulation output circuit is started working after receiving the enabling signal of synchronizing circuit.The testing result of real-time judge identification and testing circuit, after receiving detection accurate indication signal, Digital Image Data in the DDR SDRAM private memory is read, through digital-to-analogue (D/A) conversion and amplification and Filtering Processing, be output as the vision signal of simulation by multispectral TDI ccd signal form, finish the picture signal output of one-period, continue monitoring, up to the arrival that detects the accurate indication signal next time.
E. under the control of central computer, in order view data prefabricated in the disk array is taken out, adopt the method for DMA, send in the DDR SDRAM storer of multispectral TDI ccd signal emulation output circuit the view data in the update signal emulation output circuit to through PCI-X and LVDS bus.Adopt two buffer memory controlling mechanisms, finishing data overlapping formula with two DDR SDRAM storeies upgrades, when promptly DDR SDRAM is responsible for that the d realtime graphic is read set by step, another finishes the real-time reception of new image data, after upgrading end, the two role exchange is carried out the reception of a new round and is read.
F. when sending system works, central computer ceases and desist order, after synchronous clock circuit receives, stop to export the concurrent work stop signal of the needed clock signal of whole Circuits System, stop to discern work with testing circuit, multispectral TDI ccd signal emulation output circuit, image data transmission circuit.
The mathematical modeling of this example:
If the input X=x of identification and testing circuit
1, x
2... x
79, x wherein
iBe TDI CCD drive signal and direct current biasing signal; Image data source (being stored in the prefabricated view data in the disk array) D=d
1, d
2, d
3, The output Y=y of ccd signal generation system
1, y
2, y
3, y
11, y wherein
iA certain road for colored and complete colour signal; Time system output T
i, T
iRepresent the clock output in i cycle.CCD emulation testing mathematical model is:
Y＝F(f(X，T
i-1)，D，T
i)
Wherein (X, T) expression is under time system control to f, qualified after testing X.
Claims (1)
1. the emulation test method of a space flight optical remote sensor imaging circuit, be that the emulation testing closed-loop system that the identification of the control signal of central computer turn-key system, image data source generation and transmission system, imaging processing circuit output and testing circuit, multispectral TDI ccd signal emulation output circuit and synchronous clock circuit are formed is connected on the TDI-CCD imaging processing circuit, carry out the emulation detection of optical remote sensor imaging circuit by following program:
A. according to designed multispectral TDI ccd output signal feature, selected coloured image is carried out pre-service, be prefabricated into the multispectral digital picture of emulation, figure place in accordance with regulations, width and height image data storage in the computer disk array;
B. central computer sends the system works startup command, after synchronous clock circuit receives, begin to export clock signal and work enabling signal that whole Circuits System need, trigger identification and testing circuit, multispectral TDI ccd signal emulation output circuit simultaneously, the image data transmission circuit is started working;
C. identification is at first passed through the voltage modulate circuit with testing circuit, the control signal of imaging processing circuit output is carried out the voltage conditioning, make its output signal voltage adjust to analog to digital conversion circuit and the acceptable voltage range of comparator circuit by fixed proportion, signal after the voltage conditioning is according to given multispectral TDI ccd signal standard, amplitude to signal, frequency and mutual relationship detect and logic analysis, if after testing with logic analysis after, the drive signal in this cycle of discovery and dc offset voltage signal are correct, then send and detect the accurate indication signal, notify multispectral TDI ccd signal emulation output circuit, the beginning outputting video signal, proceed next cycle analysis testing simultaneously, otherwise stop immediately detecting and video image generation work, the result that will make mistakes notifies central computer by Ethernet;
D. multispectral TDI ccd signal emulation output circuit is being received the enabling signal of synchronizing circuit, start working, the testing result of real-time judge identification and testing circuit, after receiving detection accurate indication signal, Digital Image Data in the DDR SDRAM private memory is read, through digital-to-analog conversion, amplification and Filtering Processing, be output as the vision signal of simulation by multispectral TDI ccd signal form, finish the picture signal output of one-period, and continue monitoring, up to the arrival that detects the accurate indication signal next time;
E. under the control of central computer, in order view data prefabricated in the disk array is taken out, adopt the method for DMA, send among the DDR SDRAM of multispectral TDI ccd signal emulation output circuit through PCI-X and LVDS bus, view data in the update signal emulation output circuit, adopt two buffer memory controlling mechanisms, finishing data overlapping formula with two DDR SDRAM storeies upgrades, when promptly DDR SDRAM is responsible for that the d realtime graphic is read set by step, another finishes the real-time reception of new image data, after upgrade finishing, the two role's exchange is carried out the reception of a new round and is read;
F. when sending system works, central computer ceases and desist order, after synchronous clock circuit receives, stop to export the concurrent work stop signal of the needed clock signal of whole Circuits System, stop to discern work with testing circuit, multispectral TDI ccd signal emulation output circuit, image data transmission circuit.
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Family Cites Families (3)
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2008
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