CN100593218C - 用于操作闪存装置的方法 - Google Patents
用于操作闪存装置的方法 Download PDFInfo
- Publication number
- CN100593218C CN100593218C CN200610059158A CN200610059158A CN100593218C CN 100593218 C CN100593218 C CN 100593218C CN 200610059158 A CN200610059158 A CN 200610059158A CN 200610059158 A CN200610059158 A CN 200610059158A CN 100593218 C CN100593218 C CN 100593218C
- Authority
- CN
- China
- Prior art keywords
- error
- single position
- correcting code
- erase process
- failure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
- G11C16/16—Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3436—Arrangements for verifying correct programming or erasure
- G11C16/3468—Prevention of overerasure or overprogramming, e.g. by verifying whilst erasing or writing
Landscapes
- Read Only Memory (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Signal Processing For Digital Recording And Reproducing (AREA)
Abstract
Description
Claims (4)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/081,085 US7158416B2 (en) | 2005-03-15 | 2005-03-15 | Method for operating a flash memory device |
US11/081085 | 2005-03-15 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1892910A CN1892910A (zh) | 2007-01-10 |
CN100593218C true CN100593218C (zh) | 2010-03-03 |
Family
ID=36283693
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200610059158A Expired - Fee Related CN100593218C (zh) | 2005-03-15 | 2006-03-15 | 用于操作闪存装置的方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7158416B2 (zh) |
EP (1) | EP1703522A1 (zh) |
JP (1) | JP2006260753A (zh) |
CN (1) | CN100593218C (zh) |
DE (1) | DE102005018789B3 (zh) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100648290B1 (ko) * | 2005-07-26 | 2006-11-23 | 삼성전자주식회사 | 프로그램 속도를 향상시킬 수 있는 불 휘발성 메모리 장치및 그것의 프로그램 방법 |
JP2008287404A (ja) * | 2007-05-16 | 2008-11-27 | Hitachi Ltd | 読み出しによる非アクセスメモリセルのデータ破壊を検出及び回復する装置、及びその方法 |
JP4994112B2 (ja) * | 2007-05-22 | 2012-08-08 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置およびメモリ制御方法 |
JP2009129070A (ja) * | 2007-11-21 | 2009-06-11 | Hitachi Ltd | フラッシュメモリ記憶装置の制御方法、その方法を用いたフラッシュメモリ記憶装置及びストレージシステム |
US8001432B2 (en) * | 2008-11-20 | 2011-08-16 | Lsi Corporation | Uninitialized memory detection using error correction codes and built-in self test |
US8248850B2 (en) * | 2010-01-28 | 2012-08-21 | Sandisk Technologies Inc. | Data recovery for non-volatile memory based on count of data state-specific fails |
US8713406B2 (en) * | 2012-04-30 | 2014-04-29 | Freescale Semiconductor, Inc. | Erasing a non-volatile memory (NVM) system having error correction code (ECC) |
US9225356B2 (en) | 2012-11-12 | 2015-12-29 | Freescale Semiconductor, Inc. | Programming a non-volatile memory (NVM) system having error correction code (ECC) |
CN106898380A (zh) * | 2015-12-17 | 2017-06-27 | 北京兆易创新科技股份有限公司 | 一种Nand Flash的擦除方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5270979A (en) | 1991-03-15 | 1993-12-14 | Sundisk Corporation | Method for optimum erasing of EEPROM |
JP3496285B2 (ja) * | 1994-08-31 | 2004-02-09 | 富士通株式会社 | フラッシュ・メモリ |
KR970005644B1 (ko) * | 1994-09-03 | 1997-04-18 | 삼성전자 주식회사 | 불휘발성 반도체 메모리장치의 멀티블럭 소거 및 검증장치 및 그 방법 |
JP3941149B2 (ja) | 1996-12-03 | 2007-07-04 | ソニー株式会社 | 半導体不揮発性記憶装置 |
US5768192A (en) | 1996-07-23 | 1998-06-16 | Saifun Semiconductors, Ltd. | Non-volatile semiconductor memory cell utilizing asymmetrical charge trapping |
US6768165B1 (en) | 1997-08-01 | 2004-07-27 | Saifun Semiconductors Ltd. | Two bit non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping |
KR100257854B1 (ko) * | 1997-12-10 | 2000-06-01 | 김영환 | 플래쉬 메모리의 소거 방법 |
US6331951B1 (en) * | 2000-11-21 | 2001-12-18 | Advanced Micro Devices, Inc. | Method and system for embedded chip erase verification |
JP2004234545A (ja) | 2003-01-31 | 2004-08-19 | Toshiba Corp | 制御回路及びメモリコントローラ |
JP4220319B2 (ja) | 2003-07-04 | 2009-02-04 | 株式会社東芝 | 不揮発性半導体記憶装置およびそのサブブロック消去方法 |
-
2005
- 2005-03-15 US US11/081,085 patent/US7158416B2/en not_active Expired - Fee Related
- 2005-04-22 DE DE102005018789A patent/DE102005018789B3/de not_active Expired - Fee Related
-
2006
- 2006-03-03 EP EP06004440A patent/EP1703522A1/de not_active Withdrawn
- 2006-03-15 CN CN200610059158A patent/CN100593218C/zh not_active Expired - Fee Related
- 2006-03-15 JP JP2006070471A patent/JP2006260753A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
DE102005018789B3 (de) | 2006-08-31 |
JP2006260753A (ja) | 2006-09-28 |
US20060209609A1 (en) | 2006-09-21 |
CN1892910A (zh) | 2007-01-10 |
US7158416B2 (en) | 2007-01-02 |
EP1703522A1 (de) | 2006-09-20 |
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Legal Events
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: INFINEON TECHNOLOGIES AG Free format text: FORMER OWNER: QIMONDA TECHNOLOGIES FLASH GMBH Effective date: 20110802 |
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C41 | Transfer of patent application or patent right or utility model | ||
C56 | Change in the name or address of the patentee |
Owner name: QIMONDA TECHNOLOGIES FLASH GMBH Free format text: FORMER NAME: INFINEON TECHNOLOGIES FLASH GMBH + CO KG |
|
CP01 | Change in the name or title of a patent holder |
Address after: Dresden, Germany Patentee after: Infineon Technologies Flash GmbH & Co.KG Address before: Dresden, Germany Patentee before: Infineon Technologies Flash GmbH & Co.KG |
|
TR01 | Transfer of patent right |
Effective date of registration: 20110802 Address after: Munich, Germany Patentee after: QIMONDA AG Address before: Dresden, Germany Patentee before: Infineon Technologies Flash GmbH & Co.KG |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20151223 Address after: German Berg, Laura Ibiza Patentee after: Infineon Technologies AG Address before: Munich, Germany Patentee before: QIMONDA AG |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100303 Termination date: 20160315 |
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CF01 | Termination of patent right due to non-payment of annual fee |