CN100576435C - 用于化学干式蚀刻系统的系统和方法 - Google Patents
用于化学干式蚀刻系统的系统和方法 Download PDFInfo
- Publication number
- CN100576435C CN100576435C CN200710042161A CN200710042161A CN100576435C CN 100576435 C CN100576435 C CN 100576435C CN 200710042161 A CN200710042161 A CN 200710042161A CN 200710042161 A CN200710042161 A CN 200710042161A CN 100576435 C CN100576435 C CN 100576435C
- Authority
- CN
- China
- Prior art keywords
- pressure
- gas extraction
- plasma
- system controller
- pumping equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32357—Generation remote from the workpiece, e.g. down-stream
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32192—Microwave generated discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
- H01J37/32449—Gas control, e.g. control of the gas flow
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32917—Plasma diagnostics
- H01J37/32935—Monitoring and controlling tubes by information coming from the object and/or discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32917—Plasma diagnostics
- H01J37/3299—Feedback systems
Abstract
Description
Claims (25)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200710042161A CN100576435C (zh) | 2007-06-18 | 2007-06-18 | 用于化学干式蚀刻系统的系统和方法 |
US12/135,006 US20080311757A1 (en) | 2007-06-18 | 2008-06-06 | System and method for chemical dry etching system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200710042161A CN100576435C (zh) | 2007-06-18 | 2007-06-18 | 用于化学干式蚀刻系统的系统和方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101329985A CN101329985A (zh) | 2008-12-24 |
CN100576435C true CN100576435C (zh) | 2009-12-30 |
Family
ID=40132749
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200710042161A Expired - Fee Related CN100576435C (zh) | 2007-06-18 | 2007-06-18 | 用于化学干式蚀刻系统的系统和方法 |
Country Status (2)
Country | Link |
---|---|
US (1) | US20080311757A1 (zh) |
CN (1) | CN100576435C (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20200141003A (ko) * | 2019-06-06 | 2020-12-17 | 에이에스엠 아이피 홀딩 비.브이. | 가스 감지기를 포함하는 기상 반응기 시스템 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL9002164A (nl) * | 1990-10-05 | 1992-05-06 | Philips Nv | Werkwijze voor het voorzien van een substraat van een oppervlaktelaag vanuit een damp en een inrichting voor het toepassen van een dergelijke werkwijze. |
JP3284942B2 (ja) * | 1997-09-17 | 2002-05-27 | ヤマハ株式会社 | ガスリーク検査方法と装置及び記録媒体 |
JP3814492B2 (ja) * | 2001-04-12 | 2006-08-30 | 松下電器産業株式会社 | プラズマ処理装置およびプラズマ処理方法 |
GB0413554D0 (en) * | 2004-06-17 | 2004-07-21 | Point 35 Microstructures Ltd | Improved method and apparartus for the etching of microstructures |
-
2007
- 2007-06-18 CN CN200710042161A patent/CN100576435C/zh not_active Expired - Fee Related
-
2008
- 2008-06-06 US US12/135,006 patent/US20080311757A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
US20080311757A1 (en) | 2008-12-18 |
CN101329985A (zh) | 2008-12-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING Effective date: 20111212 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20111212 Address after: 201203 Shanghai City, Pudong New Area Zhangjiang Road No. 18 Co-patentee after: Semiconductor Manufacturing International (Beijing) Corporation Patentee after: Semiconductor Manufacturing International (Shanghai) Corporation Address before: 201203 Shanghai City, Pudong New Area Zhangjiang Road No. 18 Patentee before: Semiconductor Manufacturing International (Shanghai) Corporation |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20091230 Termination date: 20190618 |