CN100561751C - 无负阻ldmos器件结构及其生产方法 - Google Patents
无负阻ldmos器件结构及其生产方法 Download PDFInfo
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- CN100561751C CN100561751C CNB2007101919831A CN200710191983A CN100561751C CN 100561751 C CN100561751 C CN 100561751C CN B2007101919831 A CNB2007101919831 A CN B2007101919831A CN 200710191983 A CN200710191983 A CN 200710191983A CN 100561751 C CN100561751 C CN 100561751C
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 10
- 229910052796 boron Inorganic materials 0.000 claims abstract description 27
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims abstract description 23
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 22
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 22
- 239000010703 silicon Substances 0.000 claims abstract description 22
- 238000005516 engineering process Methods 0.000 claims abstract description 17
- 230000015556 catabolic process Effects 0.000 claims abstract description 13
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 30
- 229920005591 polysilicon Polymers 0.000 claims description 30
- 230000003647 oxidation Effects 0.000 claims description 17
- 238000007254 oxidation reaction Methods 0.000 claims description 17
- 238000002347 injection Methods 0.000 claims description 13
- 239000007924 injection Substances 0.000 claims description 13
- 230000015572 biosynthetic process Effects 0.000 claims description 10
- 238000004518 low pressure chemical vapour deposition Methods 0.000 claims description 10
- 239000002184 metal Substances 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 10
- 238000001259 photo etching Methods 0.000 claims description 10
- 239000000758 substrate Substances 0.000 claims description 10
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 9
- 238000005530 etching Methods 0.000 claims description 9
- 238000012545 processing Methods 0.000 claims description 6
- 238000000137 annealing Methods 0.000 claims description 5
- 239000000126 substance Substances 0.000 claims description 5
- 238000001039 wet etching Methods 0.000 claims description 5
- 238000009792 diffusion process Methods 0.000 claims description 4
- 238000010438 heat treatment Methods 0.000 claims description 4
- 238000000407 epitaxy Methods 0.000 claims 1
- 230000000694 effects Effects 0.000 abstract description 15
- 230000003071 parasitic effect Effects 0.000 abstract description 15
- 238000010586 diagram Methods 0.000 description 12
- 230000005764 inhibitory process Effects 0.000 description 2
- 238000010295 mobile communication Methods 0.000 description 2
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
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Application Number | Priority Date | Filing Date | Title |
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CNB2007101919831A CN100561751C (zh) | 2007-12-28 | 2007-12-28 | 无负阻ldmos器件结构及其生产方法 |
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CNB2007101919831A CN100561751C (zh) | 2007-12-28 | 2007-12-28 | 无负阻ldmos器件结构及其生产方法 |
Publications (2)
Publication Number | Publication Date |
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CN101217161A CN101217161A (zh) | 2008-07-09 |
CN100561751C true CN100561751C (zh) | 2009-11-18 |
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CNB2007101919831A Expired - Fee Related CN100561751C (zh) | 2007-12-28 | 2007-12-28 | 无负阻ldmos器件结构及其生产方法 |
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Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102376634A (zh) * | 2010-08-26 | 2012-03-14 | 上海华虹Nec电子有限公司 | 降低rf ldmos器件源端电阻的接触柱的制备方法 |
CN102376618B (zh) * | 2010-08-26 | 2013-10-23 | 上海华虹Nec电子有限公司 | N型射频ldmos中多晶硅p型沉阱的制造方法 |
CN102916038B (zh) * | 2011-08-04 | 2015-12-16 | 北大方正集团有限公司 | 一种场效应晶体管及其制造方法 |
CN104733527A (zh) * | 2013-12-23 | 2015-06-24 | 上海华虹宏力半导体制造有限公司 | 耐压40伏特以上的ldmos器件的结构 |
CN106876337B (zh) * | 2017-01-04 | 2019-01-29 | 宗仁科技(平潭)有限公司 | Nldmos集成器件及其制备方法 |
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2007
- 2007-12-28 CN CNB2007101919831A patent/CN100561751C/zh not_active Expired - Fee Related
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
EE01 | Entry into force of recordation of patent licensing contract |
Assignee: YANGZHOU GUOYU ELECTRONICS CO., LTD. Assignor: No.55 Inst., China Electronic Science and Technology Group Corp. Contract record no.: 2010320000882 Denomination of invention: A non-negative resistant LDMOS device structure and the corresponding manufacturing method Granted publication date: 20091118 License type: Exclusive License Open date: 20080709 Record date: 20100708 |
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EC01 | Cancellation of recordation of patent licensing contract |
Assignee: YANGZHOU GUOYU ELECTRONICS CO., LTD. Assignor: No.55 Inst., China Electronic Science and Technology Group Corp. Contract record no.: 2010320000882 Date of cancellation: 20151125 |
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LICC | Enforcement, change and cancellation of record of contracts on the licence for exploitation of a patent or utility model | ||
EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20080709 Assignee: YANGZHOU GUOYU ELECTRONICS CO., LTD. Assignor: No.55 Inst., China Electronic Science and Technology Group Corp. Contract record no.: 2015320000653 Denomination of invention: A non-negative resistant LDMOS device structure and the corresponding manufacturing method Granted publication date: 20091118 License type: Exclusive License Record date: 20151217 |
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LICC | Enforcement, change and cancellation of record of contracts on the licence for exploitation of a patent or utility model | ||
EC01 | Cancellation of recordation of patent licensing contract |
Assignee: YANGZHOU GUOYU ELECTRONICS CO., LTD. Assignor: No.55 Inst., China Electronic Science and Technology Group Corp. Contract record no.: 2015320000653 Date of cancellation: 20160922 |
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LICC | Enforcement, change and cancellation of record of contracts on the licence for exploitation of a patent or utility model | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20091118 Termination date: 20181228 |