CN100559204C - 测试装置以及测试方法 - Google Patents

测试装置以及测试方法 Download PDF

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CN100559204C
CN100559204C CNB2005800002843A CN200580000284A CN100559204C CN 100559204 C CN100559204 C CN 100559204C CN B2005800002843 A CNB2005800002843 A CN B2005800002843A CN 200580000284 A CN200580000284 A CN 200580000284A CN 100559204 C CN100559204 C CN 100559204C
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CN1820206A (zh
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大空聡
中川哲郎
角田慎
高岩伸贤
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Advantest Corp
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Advantest Corp
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CNB2005800002843A 2004-06-17 2005-06-14 测试装置以及测试方法 Active CN100559204C (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP179857/2004 2004-06-17
JP2004179857A JP4511880B2 (ja) 2004-06-17 2004-06-17 試験装置及び試験方法
JP183067/2004 2004-06-21
JP192195/2004 2004-06-29
JP212234/2004 2004-07-20

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CN1820206A CN1820206A (zh) 2006-08-16
CN100559204C true CN100559204C (zh) 2009-11-11

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Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7213182B2 (en) 2005-01-19 2007-05-01 Advantest Corporation Test apparatus and test method
JP5113624B2 (ja) 2007-05-24 2013-01-09 株式会社アドバンテスト 試験装置
KR101221081B1 (ko) 2007-07-17 2013-01-11 가부시키가이샤 어드밴티스트 호스트 장치
JP5226014B2 (ja) 2008-01-23 2013-07-03 株式会社アドバンテスト 試験装置
WO2009150695A1 (ja) * 2008-06-09 2009-12-17 株式会社アドバンテスト 試験装置
WO2009150819A1 (ja) 2008-06-10 2009-12-17 株式会社アドバンテスト 試験モジュール、試験装置および試験方法
US8666691B2 (en) 2008-12-08 2014-03-04 Advantest Corporation Test apparatus and test method
US20110184687A1 (en) * 2010-01-25 2011-07-28 Advantest Corporation Test apparatus and test method
US8918686B2 (en) * 2010-08-18 2014-12-23 Kingtiger Technology (Canada) Inc. Determining data valid windows in a system and method for testing an integrated circuit device
CN102288901B (zh) * 2011-09-01 2016-05-11 上海华虹宏力半导体制造有限公司 一种仿真数据的处理方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07225263A (ja) * 1994-02-09 1995-08-22 Advantest Corp ビット誤り測定器
JP3214830B2 (ja) * 1998-02-27 2001-10-02 アジレント・テクノロジー株式会社 Ｉｃテスト用データ処理装置
JP2002139557A (ja) * 2000-11-02 2002-05-17 Mitsubishi Electric Corp 半導体装置

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JP4511880B2 (ja) 2010-07-28
JP2006003216A (ja) 2006-01-05
CN1820206A (zh) 2006-08-16

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