CN100517555C - 多模式电离模式分离器 - Google Patents

多模式电离模式分离器 Download PDF

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Publication number
CN100517555C
CN100517555C CNB2005101142852A CN200510114285A CN100517555C CN 100517555 C CN100517555 C CN 100517555C CN B2005101142852 A CNB2005101142852 A CN B2005101142852A CN 200510114285 A CN200510114285 A CN 200510114285A CN 100517555 C CN100517555 C CN 100517555C
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CN
China
Prior art keywords
ionization source
atmospheric pressure
source
conduit
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB2005101142852A
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English (en)
Chinese (zh)
Other versions
CN1779899A (zh
Inventor
史蒂文·M·费希尔
达雷尔·L·古尔利
帕特里卡·H·考米亚
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Agilent Technologies Inc
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Agilent Technologies Inc
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Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of CN1779899A publication Critical patent/CN1779899A/zh
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Publication of CN100517555C publication Critical patent/CN100517555C/zh
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Expired - Fee Related legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/107—Arrangements for using several ion sources
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CNB2005101142852A 2004-10-22 2005-10-21 多模式电离模式分离器 Expired - Fee Related CN100517555C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/971,658 2004-10-22
US10/971,658 US7034291B1 (en) 2004-10-22 2004-10-22 Multimode ionization mode separator

Publications (2)

Publication Number Publication Date
CN1779899A CN1779899A (zh) 2006-05-31
CN100517555C true CN100517555C (zh) 2009-07-22

Family

ID=35735177

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2005101142852A Expired - Fee Related CN100517555C (zh) 2004-10-22 2005-10-21 多模式电离模式分离器

Country Status (4)

Country Link
US (2) US7034291B1 (https=)
EP (1) EP1650784B1 (https=)
JP (1) JP5215525B2 (https=)
CN (1) CN100517555C (https=)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2840104B2 (ja) 1990-03-02 1998-12-24 本田技研工業株式会社 低圧鋳造装置および低圧鋳造装置への希ガス供給方法
US6653626B2 (en) * 1994-07-11 2003-11-25 Agilent Technologies, Inc. Ion sampling for APPI mass spectrometry
DE10392706B8 (de) * 2002-05-31 2017-02-16 Waters Technologies Corp. (N.D.Ges.D. Staates Delaware) Schnelle Kombinations-Mehrfachmodus-Ionisierungsquelle für Massenspektrometer
US7078681B2 (en) * 2002-09-18 2006-07-18 Agilent Technologies, Inc. Multimode ionization source
US7034291B1 (en) * 2004-10-22 2006-04-25 Agilent Technologies, Inc. Multimode ionization mode separator
US20060255261A1 (en) 2005-04-04 2006-11-16 Craig Whitehouse Atmospheric pressure ion source for mass spectrometry
US20070023677A1 (en) * 2005-06-29 2007-02-01 Perkins Patrick D Multimode ionization source and method for screening molecules
US20070283951A1 (en) * 2006-06-12 2007-12-13 Marc Alan Burk Mask-nebulizer assembly
US7709790B2 (en) * 2008-04-01 2010-05-04 Thermo Finnigan Llc Removable ion source that does not require venting of the vacuum chamber
CA2725612C (en) 2008-05-30 2017-07-11 Perkinelmer Health Sciences, Inc. Single and multiple operating mode ion sources with atmospheric pressure chemical ionization
EP2428796B1 (de) * 2010-09-09 2015-03-18 Airsense Analytics GmbH Verfahren und Vorrichtung zur Ionisierung und Identifizierung von Gasen mittels UV-Strahlung und Elektronen
JP6080311B2 (ja) 2011-04-20 2017-02-15 マイクロマス ユーケー リミテッド 高速スプレーとターゲットとの相互作用による大気圧イオン源
GB2507298B (en) 2012-10-25 2016-07-13 Micromass Ltd Improved reproducibility of impact-based ionization source for low and high organic mobile phase compositions using a mesh target
CA2889028A1 (en) 2012-10-25 2014-05-01 Micromass Uk Limited Piezo-electric vibration on an in-source surface ionization structure to aid secondary droplet reduction
EP2927930B8 (en) * 2012-11-29 2019-08-21 Hitachi High-Technologies Corporation Hybrid ion source, mass spectrometer, and ion mobility device
TWI488216B (zh) * 2013-04-18 2015-06-11 國立中山大學 多游離源的質譜游離裝置及質譜分析系統
CN105431921B (zh) * 2013-08-02 2017-08-25 株式会社岛津制作所 电离装置及质谱仪
CN104851774B (zh) * 2015-05-22 2017-02-01 华中师范大学 一种基于微流控三维聚焦技术的氮气吹扫型高分辨质谱电喷雾电离源及质谱检测方法
GB2563194B (en) * 2016-04-21 2020-08-05 Waters Technologies Corp Dual mode ionization device
JP6106864B1 (ja) * 2016-09-21 2017-04-05 ヒューマン・メタボローム・テクノロジーズ株式会社 イオン源アダプタ
CN108074793B (zh) * 2016-11-17 2019-11-12 中国科学院大连化学物理研究所 一种多组分样品分析的多模式质谱电离源
CN112309823B (zh) * 2020-11-13 2025-04-01 广州禾信仪器股份有限公司 质谱检测系统及离子源装置

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0830695B2 (ja) * 1988-12-27 1996-03-27 株式会社島津製作所 液体クロマトグラフ・質量分析装置
US4960991A (en) * 1989-10-17 1990-10-02 Hewlett-Packard Company Multimode ionization source
JP3087548B2 (ja) * 1993-12-09 2000-09-11 株式会社日立製作所 液体クロマトグラフ結合型質量分析装置
JP3274302B2 (ja) * 1994-11-28 2002-04-15 株式会社日立製作所 質量分析計
US6410915B1 (en) * 1998-06-18 2002-06-25 Micromass Limited Multi-inlet mass spectrometer for analysis of liquid samples by electrospray or atmospheric pressure ionization
US6646987B1 (en) * 1998-10-05 2003-11-11 Nortel Networks Limited Method and system for transmission control protocol (TCP) packet loss recovery over a wireless link
JP3694598B2 (ja) * 1998-10-14 2005-09-14 株式会社日立製作所 大気圧イオン化質量分析装置
JP2001043826A (ja) * 1999-07-28 2001-02-16 Shimadzu Corp 質量分析装置における大気圧化学イオン化方法
JP2003215101A (ja) * 2002-01-23 2003-07-30 Shimadzu Corp 液体クロマトグラフ質量分析計
DE10392706B8 (de) * 2002-05-31 2017-02-16 Waters Technologies Corp. (N.D.Ges.D. Staates Delaware) Schnelle Kombinations-Mehrfachmodus-Ionisierungsquelle für Massenspektrometer
US20030224529A1 (en) * 2002-05-31 2003-12-04 Romaine Maiefski Dual ion source assembly
US7091483B2 (en) * 2002-09-18 2006-08-15 Agilent Technologies, Inc. Apparatus and method for sensor control and feedback
US7078681B2 (en) 2002-09-18 2006-07-18 Agilent Technologies, Inc. Multimode ionization source
US6646257B1 (en) 2002-09-18 2003-11-11 Agilent Technologies, Inc. Multimode ionization source
JP3787549B2 (ja) * 2002-10-25 2006-06-21 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法
JP3846417B2 (ja) * 2002-12-02 2006-11-15 株式会社島津製作所 大気圧イオン化質量分析装置
US6943346B2 (en) * 2003-08-13 2005-09-13 Science & Engineering Services, Inc. Method and apparatus for mass spectrometry analysis of aerosol particles at atmospheric pressure
US7034291B1 (en) * 2004-10-22 2006-04-25 Agilent Technologies, Inc. Multimode ionization mode separator

Also Published As

Publication number Publication date
CN1779899A (zh) 2006-05-31
EP1650784B1 (en) 2013-02-13
US7223968B2 (en) 2007-05-29
EP1650784A2 (en) 2006-04-26
JP2006120642A (ja) 2006-05-11
US20060124859A1 (en) 2006-06-15
US7034291B1 (en) 2006-04-25
US20060086908A1 (en) 2006-04-27
EP1650784A3 (en) 2006-09-13
JP5215525B2 (ja) 2013-06-19

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Granted publication date: 20090722

Termination date: 20201021

CF01 Termination of patent right due to non-payment of annual fee