CN100474444C - 一种分级温度补偿刷新方法及其电路 - Google Patents
一种分级温度补偿刷新方法及其电路 Download PDFInfo
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- CN100474444C CN100474444C CNB2006100762797A CN200610076279A CN100474444C CN 100474444 C CN100474444 C CN 100474444C CN B2006100762797 A CNB2006100762797 A CN B2006100762797A CN 200610076279 A CN200610076279 A CN 200610076279A CN 100474444 C CN100474444 C CN 100474444C
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CNB2006100762797A CN100474444C (zh) | 2006-04-21 | 2006-04-21 | 一种分级温度补偿刷新方法及其电路 |
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CNB2006100762797A CN100474444C (zh) | 2006-04-21 | 2006-04-21 | 一种分级温度补偿刷新方法及其电路 |
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CN1838315A CN1838315A (zh) | 2006-09-27 |
CN100474444C true CN100474444C (zh) | 2009-04-01 |
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Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN103544987B (zh) * | 2012-07-09 | 2016-04-27 | 晶豪科技股份有限公司 | 具有自我更新时序电路的半导体存储器元件 |
CN103426465B (zh) * | 2013-08-26 | 2016-09-07 | 郑君 | 存储器比较刷新电路模块 |
CN103618524B (zh) * | 2013-11-27 | 2016-02-24 | 中国航空工业集团公司第六三一研究所 | 一种通用离散量的处理电路及方法 |
CN103853695B (zh) * | 2013-12-10 | 2016-11-02 | 中国航空工业集团公司第六三一研究所 | 一种离散量的上电自检电路 |
CN103745743A (zh) * | 2013-12-25 | 2014-04-23 | 苏州宽温电子科技有限公司 | 一种基于温度补偿的sram灵敏放大器 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6281760B1 (en) * | 1998-07-23 | 2001-08-28 | Texas Instruments Incorporated | On-chip temperature sensor and oscillator for reduced self-refresh current for dynamic random access memory |
US20050036380A1 (en) * | 2003-08-14 | 2005-02-17 | Yuan-Mou Su | Method and system of adjusting DRAM refresh interval |
US6865136B2 (en) * | 2003-06-24 | 2005-03-08 | International Business Machines Corporation | Timing circuit and method of changing clock period |
US20050162215A1 (en) * | 2004-01-22 | 2005-07-28 | Winbond Electronics Corporation | Temperature sensing variable frequency generator |
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- 2006-04-21 CN CNB2006100762797A patent/CN100474444C/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6281760B1 (en) * | 1998-07-23 | 2001-08-28 | Texas Instruments Incorporated | On-chip temperature sensor and oscillator for reduced self-refresh current for dynamic random access memory |
US6865136B2 (en) * | 2003-06-24 | 2005-03-08 | International Business Machines Corporation | Timing circuit and method of changing clock period |
US20050036380A1 (en) * | 2003-08-14 | 2005-02-17 | Yuan-Mou Su | Method and system of adjusting DRAM refresh interval |
US20050162215A1 (en) * | 2004-01-22 | 2005-07-28 | Winbond Electronics Corporation | Temperature sensing variable frequency generator |
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Address after: Room 101, Floor 1-5, Building 8, Yard 9, Fenghao East Road, Haidian District, Beijing 100094 Patentee after: Zhaoyi Innovation Technology Group Co.,Ltd. Address before: 100083 12 Floors, Block A, Tiangong Building, Science and Technology University, 30 College Road, Haidian District, Beijing Patentee before: GIGADEVICE SEMICONDUCTOR(BEIJING) Inc. |
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