CN100467662C - 具有电弧处理能力的高峰值功率等离子体脉冲电源 - Google Patents
具有电弧处理能力的高峰值功率等离子体脉冲电源 Download PDFInfo
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Abstract
本发明提供了一种新的磁控溅射装置,通常包括一个脉冲电源,该脉冲电源能够提供的峰值功率为0.1兆瓦特到数兆瓦特,峰值功率密度大于1kW/cm2。该电源有一个脉冲电路,该脉冲电路包括一个储能电容和一个通过开关装置串联的电感,检测到电弧现象时,该开关装置将脉冲电路与等离子体断开,并将电感能量循环回到储能电容。储能电容和串联电感提供对等离子体的阻抗匹配,限制有电弧时电流的上升率和峰值幅度,对到等离子体的电压脉冲进行整形。
Description
技术领域
本发明一般涉及用于高离子化、高密度金属等离子体的磁控溅射的装置和方法,尤其涉及具有电弧处理能力、向溅射磁控等离子体负载提供峰值功率为0.1兆瓦特到数兆瓦特、峰值功率密度为1kW/cm2或更高的磁控溅射装置。
背景技术
通过产生金属离子并使用吸引离子的电偏置将离子吸引到加工件从而涂敷基板,是我们所希望的。该方法的效用包括将涂层应用到通过常规溅射无法均匀淀积的不规则表面上,而这实质上需要瞄准线。实际上,可以如同Monteiro在JVST B 17(3)1999年第1094页以及Lu和Kushner在JVST A 19(5)2001年第2652页所叙述的那样,通过偏置晶片吸引离子,从而涂敷甚至填充半导体器件中的高纵横比沟槽。
Kouznetzov等在《表面与涂敷技术(Surface and CoatingsTechnology)》122(1999年)第290页中描述了使用具有高峰值功率和低占空系数的电脉冲驱动传统溅射磁控管,从而产生高离子化、高密度金属等离子体的技术。其他方法可参考Macak等的JVST A 18(4)2000年第1533页、Gudmundsson等的APL第78卷No.22(2001年5月28日)第3427页和Ehiasarian等的Vacuum 65(2002年)第147页以及美国专利6296742 B1(2001年10月2日)。
该技术的优点在于能产生大量离子化物质,通过应用偏置电压将这些离子化物质吸引到加工件。上述关于高峰值功率技术的参考文献需要使用一个通过电感的简单电容放电。但是,这些参考文献描述的方法没有披露任何电弧处理能力,实际上暗示存在无电弧区域。硬件上不可避免的缺陷使得不可能在物理上实现完全无电弧区域,即使理论暗示存在无电弧区域。使用没有电弧处理能力的该技术使得商业应用很不实际。因此,需要提供一种装置,其通过最小化电弧能量,来将高峰值功率脉冲加到磁控管上,从而产生高密度、高离子化的金属等离子体,因此将电弧引起的产品和对象损坏降低到可接受的范围内。
典型情况下,电弧控制和电弧转移装置包括检测电弧并将电源与负载断开的电路或者包括一个有效地将电源短路从而消除电弧的开关电路。这些类型的电弧处理方法成本很高,因为它们会导致工艺的停止,浪费昂贵的库存材料,或者需要消耗电源电路中存储的能量。在高功率应用中,将电源短路会产生极高的电流,导致对电源本身的毁坏,重复消耗存储的能量需要能承受高峰值功率和高平均功率的昂贵的电阻元件以及将其冷却的装置。
我们也希望为高产商业应用提供一种具有电弧处理能力、提供0.1兆瓦特或更高峰值功率的磁控溅射装置和方法。本发明的一个目的是提供一种磁控溅射等离子体系统,其具有检测电弧并采取措施限制传递到电弧的能量的能力。
发明内容
本发明提供了一种具有电弧处理能力的、适用于向高密度磁控等离子体提供高峰值功率的高压脉冲的产生装置和方法。一个脉冲电路包括储能电容,通过与该等离子体串联的一个电感重复充电和放电。该电感和电容的结合可以对脉冲整形,从容为等离子体提供阻抗匹配,以及限制有电弧时的电流上升率和峰值幅度。在脉冲期间,通过放电电压的降低低于预定的电压门限,或者放电电流的升高高于预定的电流门限,可以检测到电弧。当检测到电弧时,将串联电感与储能电容断开,从而阻止电流升高。然后,从等离子体负载断开脉冲电路,电感能量就循环回到储能电容。
根据本发明的一个方面,提供一种以连续工作模式将阴极材料溅射淀积从而在基板上形成涂层的装置,包括:
a)等离子体腔,在该等离子体腔中产生包含离子和电子的等离子体;
b)至少一个靶,其被置于该等离子体腔中并包含原子,响应于来自该等离子体的离子的轰击,所述原子可以自该靶被溅射,从而在邻近该等离子体的至少一个基板的表面上淀积薄膜;
c)直流脉冲电源,其具有连接到置于该等离子体腔中的所述靶的脉冲电路,从而传递电压脉冲给该靶;以及
d)该脉冲电路还包括储能电容,用于通过开关装置将脉冲传递到串联的电感,该开关装置用于将该脉冲电路与该等离子体断开以及在检测到电弧情况时将电感能量循环回到该储能电容。
优选地,其中所述储能电容和所述串联的电感对所述电压脉冲进行整形。
附图简述
图1是将本发明原理具体化的磁控等离子体处理系统的示意图;
图2示出了图1中磁控等离子体处理系统的常规操作的波形图;以及
图3示出了电弧处理操作的波形图。
发明详述
参考图1,其示出了一个磁控等离子体处理系统10。直流电源12经由脉冲电路16连接到磁控等离子体处理腔14。该磁控等离子体处理腔是本领域技术人员公知的传统磁控腔,具有磁控阴极18和阳极20。脉冲电路16是先进能源工业公司(Advanced Energy Industries,Inc.)制造的MegaPulserTM模型,其提供穿过阴极18和阳极20的高压脉冲,从而以本领域技术人员公知的方式,点燃这两个电极之间的等离子体22。与传统等离子体处理腔一样,等离子体作用于阴极18的材料上,从而在位于腔中的基板26上产生涂层。本领域技术人员通常知道并能充分理解:在高压下,随着腔中处理环境的变化,从等离子体22或阴极18到阳极20会发生电弧放电。此外,一个较小的直流电源28连接到该磁控等离子体处理腔,直流电源28从脉冲电路16向磁控管提供使等离子体在高压脉冲之间保持点火的最小电压。该电源也可用于在高脉冲操作开始之前最初点燃等离子体。
为了将高压脉冲加到磁控处理腔,脉冲电路16包括储能电容C1,C1与电感L1通过开关S1串联连接。电感L1通过开关S2连接磁控管的阴极。
图2是该电路常规操作的波形图。在整个序列中,S2闭合,S3打开。直流电源12将电容C1充电到其初始电压。由S1启动放电,电容C1通过电感L1放电到等离子体负载中。控制电路启动开关的计时,从而控制电容C1的充电时间以及到负载的脉冲放电时间。Vc、iinductor、VLoAD和Iload波形的形状由Vc的初始值、C1和L1的值以及等离子体负载和输出电缆的特性唯一确定。
图3是脉冲电路16的脉冲期间发生的电弧的波形图。该序列开始时如图2所示并如上所述,但是当发生电弧时,电流升高,电压降低,直到检测到电弧。可以通过两种方式之一检测电弧。用于实现电弧检测方式的具体电路技术对本领域技术人员是公知的。首先,当负载电流超过预定门限时,可以检测到电弧。实际上,可以通过根据等离子体负载特性和Vc的初始值、C1和L1的值预测输出电流,以及通过增加容限以防止错误检测,来逐个脉冲地更新该门限。根据这些参数预测输出电流,对本领域技术人员来说是公知的。或者,电流门限基于平均峰值电流,可以增加一定容限来防止错误的电弧检测。这种情况下,最好使具有高电弧电流的脉冲不进行平均计算。其次,当负载电流超过第二电流门限而负载电压低于预定门限时,可以检测到电弧,这只用于第二种方法。当检测到电弧时,S1立即打开,在一个短延迟后闭合S3,然后在另一短延迟后打开S2。这样,就将负载与脉冲电路16断开,并开始将能量从电感L1谐振传输到电容C1。结果,当电弧发生时电感L1中的能量被循环回到C1。在发生电弧的情况下,该电弧处理序列将传递到负载的能量最小化。如果没有电弧处理措施,C1中存储的能量和L1中存储的能量将被传递到电弧,这几乎肯定会对对象和加工件造成损害。电弧处理措施使得该工艺可以投入商业应用。
从以上描述不难看出,本发明为脉冲磁控管提供了一种新的高峰值功率等离子体脉冲电源,其具有电弧处理能力,在检测到电弧现象时,通过将脉冲电路与等离子体负载断开以及将为高峰值功率脉冲存储的电感能量循环回到储能电容,从而将电弧导致的危害最小化。
尽管上面描述了具体的结构和操作细节,但应该明白,这只是出于示例性目的,在不脱离本发明精神和范围的情况下,本领域技术人员可以做出各种改变和修改。
Claims (6)
1、一种以连续工作模式将阴极材料溅射淀积从而在基板上形成涂层的装置,包括:
a)等离子体腔,在该等离子体腔中产生包含离子和电子的等离子体;
b)至少一个靶,其被置于该等离子体腔中并包含原子,响应于来自该等离子体的离子的轰击,所述原子可以自该靶被溅射,从而在邻近该等离子体的至少一个基板的表面上淀积薄膜;
c)直流脉冲电源,其具有连接到置于该等离子体腔中的所述靶的脉冲电路,从而传递电压脉冲给该靶;以及
d)该脉冲电路还包括储能电容,用于通过开关装置将脉冲传递到串联的电感,该开关装置用于将该脉冲电路与该等离子体断开以及在检测到电弧情况时将电感能量循环回到该储能电容。
2、如权利要求1所述的以连续工作模式将阴极材料溅射淀积从而在基板上形成涂层的装置,其中,所述储能电容和所述串联的电感提供对所述等离子体的阻抗匹配。
3、如权利要求2所述的以连续工作模式将阴极材料溅射淀积从而在基板上形成涂层的装置,其中,在电弧发生时,所述储能电容和所述串联的电感限制电流的上升率和峰值幅度。
4、如权利要求3所述的以连续工作模式将阴极材料溅射淀积从而在基板上形成涂层的装置,其中,所述储能电容和所述串联的电感对所述电压脉冲进行整形。
5、如权利要求4所述的以连续工作模式将阴极材料溅射淀积从而在基板上形成涂层的装置,其中,所述直流脉冲电源提供的功率为0.1兆瓦特至数兆瓦特,峰值功率密度大于1kW/cm2。
6、如权利要求1所述的以连续工作模式将阴极材料溅射淀积从而在基板上形成涂层的装置,其中,所述脉冲电路根据所述储能电容放电开始时的初始充电电压、所述电感和电容的值以及所述等离子体负载特性,来更新电弧电流门限。
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US10/254,158 US6808607B2 (en) | 2002-09-25 | 2002-09-25 | High peak power plasma pulsed supply with arc handling |
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US7663319B2 (en) * | 2004-02-22 | 2010-02-16 | Zond, Inc. | Methods and apparatus for generating strongly-ionized plasmas with ionizational instabilities |
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US7095179B2 (en) * | 2004-02-22 | 2006-08-22 | Zond, Inc. | Methods and apparatus for generating strongly-ionized plasmas with ionizational instabilities |
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- 2003-09-23 TW TW092126173A patent/TW200409826A/zh unknown
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CN1688737A (zh) | 2005-10-26 |
EP1543175B1 (en) | 2013-05-08 |
TW200409826A (en) | 2004-06-16 |
JP2006500473A (ja) | 2006-01-05 |
EP1543175A4 (en) | 2007-07-04 |
WO2004029322A1 (en) | 2004-04-08 |
WO2005010228A2 (en) | 2005-02-03 |
WO2005010228A3 (en) | 2005-12-01 |
US20040055881A1 (en) | 2004-03-25 |
US6808607B2 (en) | 2004-10-26 |
US20040124077A1 (en) | 2004-07-01 |
EP1543175A1 (en) | 2005-06-22 |
JP4578242B2 (ja) | 2010-11-10 |
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