CN100449308C - 检测连续行进的材料卷带中的孔的部件 - Google Patents

检测连续行进的材料卷带中的孔的部件 Download PDF

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Publication number
CN100449308C
CN100449308C CNB2004800064205A CN200480006420A CN100449308C CN 100449308 C CN100449308 C CN 100449308C CN B2004800064205 A CNB2004800064205 A CN B2004800064205A CN 200480006420 A CN200480006420 A CN 200480006420A CN 100449308 C CN100449308 C CN 100449308C
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CN
China
Prior art keywords
strip
light
slot
optical subassembly
photodiodes
Prior art date
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Expired - Lifetime
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CNB2004800064205A
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English (en)
Chinese (zh)
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CN1758967A (zh
Inventor
伯努瓦·穆拉斯
帕斯卡·热尔
马克·布鲁昂
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Arck Sensor
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Arck Sensor
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21C—MANUFACTURE OF METAL SHEETS, WIRE, RODS, TUBES, PROFILES OR LIKE SEMI-MANUFACTURED PRODUCTS OTHERWISE THAN BY ROLLING; AUXILIARY OPERATIONS USED IN CONNECTION WITH METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL
    • B21C51/00—Measuring, gauging, indicating, counting, or marking devices specially adapted for use in the production or manipulation of material in accordance with subclasses B21B - B21F
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/894—Pinholes

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  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Textile Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
CNB2004800064205A 2003-03-20 2004-03-19 检测连续行进的材料卷带中的孔的部件 Expired - Lifetime CN100449308C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR03/03437 2003-03-20
FR0303437A FR2852533B1 (fr) 2003-03-20 2003-03-20 Dispositif de detection de trous dans des materiaux defilant en bandes continues

Publications (2)

Publication Number Publication Date
CN1758967A CN1758967A (zh) 2006-04-12
CN100449308C true CN100449308C (zh) 2009-01-07

Family

ID=32922325

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2004800064205A Expired - Lifetime CN100449308C (zh) 2003-03-20 2004-03-19 检测连续行进的材料卷带中的孔的部件

Country Status (7)

Country Link
US (1) US20060103847A1 (https=)
EP (1) EP1606608B1 (https=)
JP (1) JP2006520894A (https=)
KR (1) KR20050113653A (https=)
CN (1) CN100449308C (https=)
FR (1) FR2852533B1 (https=)
WO (1) WO2004086009A2 (https=)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ZA200901160B (en) * 2006-08-18 2010-05-26 Primus Special Projects Pty Ltd A sorter
CN101349653B (zh) * 2007-07-17 2011-09-14 深圳市比克电池有限公司 电池隔膜纸沙眼的检测方法及装置
CN101413903B (zh) * 2007-10-19 2011-05-18 欣竑科技有限公司 电子组件料带冲孔机的导带异常检测法
CN101644685B (zh) * 2009-09-11 2013-02-13 武汉钢铁(集团)公司 钢板孔洞在线检测装置及孔洞纵向尺寸的计算方法
CN102019297B (zh) * 2009-09-17 2012-11-14 宝山钢铁股份有限公司 薄带材轧制中检测针孔大小等级的装置及方法
CN102371290B (zh) * 2010-08-06 2013-04-03 上海龙阳精密复合铜管有限公司 管线成型加工过程的在线探伤检测工艺
WO2013000570A1 (fr) * 2011-06-30 2013-01-03 Bobst Mex Sa Procede et machine d' enduction d' un substrat en bande continue et dispositif de determination de la qualite d' enduction
EP2726855B1 (fr) 2011-07-01 2019-01-09 Bobst Mex Sa Dispositif de detection et machine d'enduction d'un support plan ainsi equipee
JP6040003B2 (ja) * 2012-11-07 2016-12-07 昭和電線ケーブルシステム株式会社 間欠型光ファイバテープ心線の検査方法、製造方法および検査装置
FR3088723B1 (fr) 2018-11-16 2022-08-26 Arck Sensor Dispositif de detection optique des defauts d’un materiau en feuille, muni d’une chambre d’eclairage
FR3088724B1 (fr) 2018-11-16 2022-05-27 Arck Sensor Dispositif de detection optique des defauts d’un materiau en feuille, muni de deux tetes de detection
FR3089145B1 (fr) 2018-11-30 2021-06-04 Univ Claude Bernard Lyon Procédé de fabrication additive assisté par un milieu contraint granulaire
CN112881305B (zh) * 2021-01-14 2022-11-25 河南天子铝业有限公司 一种用于铝型材的快速检测设备
TR2021016610A2 (tr) * 2021-10-25 2021-11-22 Agteks Oerme Ve Teks Enduestrileri San Ve Tic Ltd Sti Kumaş kali̇te kontrol terti̇bati
CN114527136A (zh) * 2022-02-28 2022-05-24 杜松 一种紫外光带钢针孔检测仪嫁接系统及配套led光源
CN116730056B (zh) * 2023-08-15 2023-10-27 江苏铭丰电子材料科技有限公司 一种可测缺陷的铜箔收卷装置

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3835332A (en) * 1973-06-04 1974-09-10 Eastman Kodak Co Inspection apparatus for detecting defects in a web
US4260899A (en) * 1979-06-14 1981-04-07 Intec Corporation Wide web laser scanner flaw detection method and apparatus
US4265545A (en) * 1979-07-27 1981-05-05 Intec Corporation Multiple source laser scanning inspection system
US4302105A (en) * 1978-02-27 1981-11-24 Erwin Sick Gmbh, Optik-Elektronik Detection apparatus for finding holes in webs
US4728800A (en) * 1985-04-24 1988-03-01 Young Engineering, Inc. Apparatus and method for detecting defects in a moving web
CN1146805A (zh) * 1994-03-21 1997-04-02 泰特拉·勒维尔金融控股公司 包装薄片折缝位置检测的方法和装置
EP1249530A2 (de) * 2001-04-09 2002-10-16 Hubert A. Hergeth Sensorleiste
US20020148985A1 (en) * 2001-04-13 2002-10-17 Fuji Photo Film Co., Ltd. Surface examining apparatus and surface examining method

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1910049A1 (de) * 1968-02-27 1969-09-11 Fuji Photo Film Co Ltd Vorrichtung zum Aufdecken von Maengeln oder Fehlern auf einer Bahn
JPS5034586A (https=) * 1973-07-27 1975-04-02
JPS5065487U (https=) * 1973-10-16 1975-06-12
JPH01197639A (ja) * 1988-02-02 1989-08-09 Dainippon Ink & Chem Inc 塗膜のピンホール検査装置
JPH04125455A (ja) * 1990-09-17 1992-04-24 Fuji Photo Film Co Ltd 表面検査装置
JP3897826B2 (ja) * 1994-08-19 2007-03-28 株式会社半導体エネルギー研究所 アクティブマトリクス型の表示装置
US5798531A (en) * 1996-06-10 1998-08-25 Harris Instrument Corporation System for detecting small holes in moving articles
US5825501A (en) * 1997-03-14 1998-10-20 Lockheed Martin Energy Systems, Inc. Structure and yarn sensor for fabric
US5813753A (en) * 1997-05-27 1998-09-29 Philips Electronics North America Corporation UV/blue led-phosphor device with efficient conversion of UV/blues light to visible light

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3835332A (en) * 1973-06-04 1974-09-10 Eastman Kodak Co Inspection apparatus for detecting defects in a web
US4302105A (en) * 1978-02-27 1981-11-24 Erwin Sick Gmbh, Optik-Elektronik Detection apparatus for finding holes in webs
US4260899A (en) * 1979-06-14 1981-04-07 Intec Corporation Wide web laser scanner flaw detection method and apparatus
US4265545A (en) * 1979-07-27 1981-05-05 Intec Corporation Multiple source laser scanning inspection system
US4728800A (en) * 1985-04-24 1988-03-01 Young Engineering, Inc. Apparatus and method for detecting defects in a moving web
CN1146805A (zh) * 1994-03-21 1997-04-02 泰特拉·勒维尔金融控股公司 包装薄片折缝位置检测的方法和装置
EP1249530A2 (de) * 2001-04-09 2002-10-16 Hubert A. Hergeth Sensorleiste
US20020148985A1 (en) * 2001-04-13 2002-10-17 Fuji Photo Film Co., Ltd. Surface examining apparatus and surface examining method

Also Published As

Publication number Publication date
WO2004086009A2 (fr) 2004-10-07
CN1758967A (zh) 2006-04-12
JP2006520894A (ja) 2006-09-14
FR2852533B1 (fr) 2006-10-06
WO2004086009A3 (fr) 2004-11-04
EP1606608A2 (fr) 2005-12-21
EP1606608B1 (fr) 2014-08-13
KR20050113653A (ko) 2005-12-02
US20060103847A1 (en) 2006-05-18
FR2852533A1 (fr) 2004-09-24

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