CN100442012C - 非接触测量系统和方法 - Google Patents

非接触测量系统和方法 Download PDF

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Publication number
CN100442012C
CN100442012C CNB2004100312616A CN200410031261A CN100442012C CN 100442012 C CN100442012 C CN 100442012C CN B2004100312616 A CNB2004100312616 A CN B2004100312616A CN 200410031261 A CN200410031261 A CN 200410031261A CN 100442012 C CN100442012 C CN 100442012C
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China
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complex parts
intensity level
interest
image
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CNB2004100312616A
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English (en)
Chinese (zh)
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CN1542403A (zh
Inventor
R·科库
G·W·布洛科斯比
P·H·屠
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General Electric Co
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General Electric Co
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Analysis (AREA)
CNB2004100312616A 2003-03-27 2004-03-26 非接触测量系统和方法 Expired - Fee Related CN100442012C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/249,279 US7257248B2 (en) 2003-03-27 2003-03-27 Non-contact measurement system and method
US10/249279 2003-03-27

Publications (2)

Publication Number Publication Date
CN1542403A CN1542403A (zh) 2004-11-03
CN100442012C true CN100442012C (zh) 2008-12-10

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ID=32867824

Family Applications (1)

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CNB2004100312616A Expired - Fee Related CN100442012C (zh) 2003-03-27 2004-03-26 非接触测量系统和方法

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US (1) US7257248B2 (enExample)
EP (1) EP1467318A3 (enExample)
JP (1) JP4619677B2 (enExample)
CN (1) CN100442012C (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7693325B2 (en) 2004-01-14 2010-04-06 Hexagon Metrology, Inc. Transprojection of geometry data
WO2007053973A1 (de) * 2005-11-14 2007-05-18 Precitec Vision Gmbh & Co. Kg, Eschborn (De), Zweigniederlassung Neftenbach Verfahren und vorrichtung zur bewertung von fügestellen von werkstücken
US7383152B1 (en) 2006-01-10 2008-06-03 Alliant Techsystems Inc. Non-contact deviation measurement system
US20090295796A1 (en) * 2008-05-29 2009-12-03 Brown Clayton D Method of updating a model
JP5427896B2 (ja) * 2010-01-06 2014-02-26 パナソニック株式会社 干渉を用いた膜厚計測装置及び干渉を用いた膜厚計測方法
CN103852031B (zh) * 2012-11-28 2018-06-01 联想(北京)有限公司 一种电子设备及测量物体形状的方法
US11989896B2 (en) * 2019-11-27 2024-05-21 Trinamix Gmbh Depth measurement through display
CN115246610B (zh) * 2021-09-10 2023-11-17 菱王电梯有限公司 一种电梯轿厢倾斜检测方法及系统、电梯
US12430847B2 (en) 2023-08-10 2025-09-30 General Electric Company 3D imaging for engine assembly inspection

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US4525858A (en) * 1983-01-03 1985-06-25 General Electric Company Method and apparatus for reconstruction of three-dimensional surfaces from interference fringes
US4593967A (en) * 1984-11-01 1986-06-10 Honeywell Inc. 3-D active vision sensor
US6496262B1 (en) * 1998-07-10 2002-12-17 Kansas State University Research Foundation Holographic particle image velocimetry apparatus and methods
US6512993B2 (en) * 1996-04-24 2003-01-28 Cyra Technologies, Inc. Integrated system for quickly and accurately imaging and modeling three-dimensional objects
US6539106B1 (en) * 1999-01-08 2003-03-25 Applied Materials, Inc. Feature-based defect detection

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JPS5993292A (ja) * 1982-11-17 1984-05-29 エヌ・ティ・ティ・アドバンステクノロジ株式会社 ロボツト用計測ヘツド
JPS61709A (ja) * 1984-06-14 1986-01-06 Toshiba Corp 太陽センサ
JPS62238815A (ja) * 1986-04-03 1987-10-19 Toray Ind Inc 衣料用ポリエステル繊維
US4819197A (en) * 1987-10-01 1989-04-04 Canadian Patents And Development Limited-Societe Canadienne Des Brevets Et D'exploitation Limitee Peak detector and imaging system
FR2685764B1 (fr) * 1991-12-30 1995-03-17 Kreon Ind Capteur optique compact et a haute resolution pour l'analyse de formes tridimensionnelles.
US5565870A (en) * 1993-06-28 1996-10-15 Nissan Motor Co., Ltd. Radar apparatus with determination of presence of target reflections
US5396331A (en) * 1993-08-10 1995-03-07 Sanyo Machine Works, Ltd. Method for executing three-dimensional measurement utilizing correctively computing the absolute positions of CCD cameras when image data vary
US5661667A (en) * 1994-03-14 1997-08-26 Virtek Vision Corp. 3D imaging using a laser projector
CA2144793C (en) * 1994-04-07 1999-01-12 Lawrence Patrick O'gorman Method of thresholding document images
JP3493403B2 (ja) * 1996-06-18 2004-02-03 ミノルタ株式会社 ３次元計測装置
JP3150589B2 (ja) * 1995-11-28 2001-03-26 三菱重工業株式会社 コイル位置・形状認識装置
US6044170A (en) 1996-03-21 2000-03-28 Real-Time Geometry Corporation System and method for rapid shape digitizing and adaptive mesh generation
JP3544820B2 (ja) * 1997-04-03 2004-07-21 株式会社東芝 移動目標検出装置及び検出方法
US6097849A (en) * 1998-08-10 2000-08-01 The United States Of America As Represented By The Secretary Of The Navy Automated image enhancement for laser line scan data
US6556307B1 (en) * 1998-09-11 2003-04-29 Minolta Co., Ltd. Method and apparatus for inputting three-dimensional data
JP2000275024A (ja) * 1999-03-25 2000-10-06 Minolta Co Ltd ３次元入力装置
US6259519B1 (en) * 1999-08-31 2001-07-10 Intelligent Machine Concepts, L.L.C. Method of determining the planar inclination of a surface
US6539330B2 (en) * 2000-07-19 2003-03-25 Pentax Corporation Method and apparatus for measuring 3-D information
JP2003075137A (ja) * 2001-09-04 2003-03-12 Minolta Co Ltd 撮影システム並びにそれに用いられる撮像装置および３次元計測用補助ユニット
FI112279B (fi) * 2001-11-21 2003-11-14 Mapvision Oy Ltd Menetelmä vastinpisteiden määrittämiseksi
JP2005517909A (ja) * 2002-02-14 2005-06-16 ファロ テクノロジーズ インコーポレーテッド 多関節アームを有する可搬式座標測定器

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4525858A (en) * 1983-01-03 1985-06-25 General Electric Company Method and apparatus for reconstruction of three-dimensional surfaces from interference fringes
US4593967A (en) * 1984-11-01 1986-06-10 Honeywell Inc. 3-D active vision sensor
US6512993B2 (en) * 1996-04-24 2003-01-28 Cyra Technologies, Inc. Integrated system for quickly and accurately imaging and modeling three-dimensional objects
US6496262B1 (en) * 1998-07-10 2002-12-17 Kansas State University Research Foundation Holographic particle image velocimetry apparatus and methods
US6539106B1 (en) * 1999-01-08 2003-03-25 Applied Materials, Inc. Feature-based defect detection

Also Published As

Publication number Publication date
JP2004294439A (ja) 2004-10-21
US7257248B2 (en) 2007-08-14
US20040190764A1 (en) 2004-09-30
EP1467318A3 (en) 2008-07-02
CN1542403A (zh) 2004-11-03
JP4619677B2 (ja) 2011-01-26
EP1467318A2 (en) 2004-10-13

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