CN100435292C - A Non-Selective Etching Method of GaAs/AlGaAs Crystal Material - Google Patents
A Non-Selective Etching Method of GaAs/AlGaAs Crystal Material Download PDFInfo
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- CN100435292C CN100435292C CNB2006101113500A CN200610111350A CN100435292C CN 100435292 C CN100435292 C CN 100435292C CN B2006101113500 A CNB2006101113500 A CN B2006101113500A CN 200610111350 A CN200610111350 A CN 200610111350A CN 100435292 C CN100435292 C CN 100435292C
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- 238000000034 method Methods 0.000 title claims abstract description 23
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 title claims abstract description 17
- 229910001218 Gallium arsenide Inorganic materials 0.000 title claims abstract description 17
- 239000013078 crystal Substances 0.000 title claims abstract description 15
- 238000005530 etching Methods 0.000 title claims description 20
- 239000000463 material Substances 0.000 title description 5
- 238000005260 corrosion Methods 0.000 claims abstract description 20
- 230000007797 corrosion Effects 0.000 claims abstract description 20
- 239000007788 liquid Substances 0.000 claims abstract description 9
- 238000003756 stirring Methods 0.000 claims description 4
- 239000002178 crystalline material Substances 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 abstract description 6
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 abstract description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 abstract 3
- 235000011007 phosphoric acid Nutrition 0.000 abstract 3
- 235000011149 sulphuric acid Nutrition 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000003292 glue Substances 0.000 description 3
- 230000003068 static effect Effects 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000008014 freezing Effects 0.000 description 1
- 238000007710 freezing Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000005457 ice water Substances 0.000 description 1
- 150000003016 phosphoric acids Chemical class 0.000 description 1
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Abstract
Description
技术领域 technical field
本发明是一种腐蚀半导体材料GaAs/AlGaAs的腐蚀方法,属于半导体器件制造技术领域。The invention relates to an etching method for etching semiconductor material GaAs/AlGaAs, which belongs to the technical field of semiconductor device manufacturing.
背景技术 Background technique
现有的采用湿法腐蚀制作半导体器件的方法所使用的腐蚀液主要包括硫酸系列和磷酸系列,前者如H2SO4∶H2O2∶H2O体积比分别为1∶8∶8或者3∶3∶1的腐蚀液,为典型的各向异性腐蚀液,用于脊型波导器件制造;后者如H3PO4∶H2O2∶H2O的体积比分别为1∶1∶10或者1∶1∶5的腐蚀液,也具有明显的各向异性腐蚀特性。通常采用这些腐蚀液腐蚀GaAs/AlGaAs晶体,制作条形半导体器件。腐蚀过程通常是在室温或者冰点温度(0℃)下进行,比如在室温环境下操作,或者将盛有腐蚀液的容器置于冰水中,以得到稳定的腐蚀速率;在腐蚀过程中,腐蚀液是静止的。The etching solution used in the existing wet etching method for manufacturing semiconductor devices mainly includes sulfuric acid series and phosphoric acid series, the former such as H 2 SO 4 : H 2 O 2 : H 2 O volume ratio is 1:8:8 or The 3:3:1 etchant is a typical anisotropic etchant used in the manufacture of ridge waveguide devices; the volume ratio of the latter such as H 3 PO 4 : H 2 O 2 : H 2 O is 1:1 :10 or 1:1:5 etchant also has obvious anisotropic corrosion characteristics. These etching solutions are usually used to etch GaAs/AlGaAs crystals to make strip semiconductor devices. The corrosion process is usually carried out at room temperature or freezing point temperature (0°C), such as operating at room temperature, or placing the container containing the corrosive liquid in ice water to obtain a stable corrosion rate; during the corrosion process, the corrosive liquid is static.
发明内容 Contents of the invention
由于晶向和材料组分以及腐蚀液粘度较低等原因,采用现有腐蚀液制作圆形器件,一般得到的都是近似于菱形的形状。特别是当圆比较小的时候,现有的腐蚀液很难腐蚀出符合要求的圆形形状。较低的腐蚀温度和静止的腐蚀液状态助长了腐蚀在方向上的倾向。概括地说,现有腐蚀方法在腐蚀GaAs/AlGaAs晶体的过程中,表现出腐蚀方向选择性。为了实现GaAs/AlGaAs晶体的非选择腐蚀,本发明提出了一种GaAs/AlGaAs晶体材料的非选择腐蚀方法。Due to the crystal orientation, material composition and low viscosity of the etchant, the shape of circular devices generally obtained by using the existing etchant is similar to that of a rhombus. Especially when the circle is relatively small, it is difficult to corrode a circular shape that meets the requirements with the existing etching solution. The lower corrosion temperature and the static state of the corrosion liquid promote the tendency of corrosion in the direction. In a nutshell, the existing etching methods exhibit etching direction selectivity in the process of etching GaAs/AlGaAs crystals. In order to realize the non-selective etching of GaAs/AlGaAs crystal, the present invention proposes a non-selective etching method of GaAs/AlGaAs crystal material.
本发明是这样实现的,所采用腐蚀液由重量含量为85%的H3PO4和重量含量为30%的H2O2两种组分组成,各组分的体积比为H3PO4∶H2O2=10~25∶1;腐蚀过程在30~60℃之间的某一温度下进行;同时腐蚀液在外力作用下在容器内沿同一方向旋转。The present invention is achieved in this way, the corrosive solution used is composed of two components with a weight content of 85% H 3 PO 4 and a weight content of 30% H 2 O 2 , and the volume ratio of each component is H 3 PO 4 : H 2 O 2 =10~25:1; the corrosion process is carried out at a certain temperature between 30~60°C; at the same time, the corrosion solution rotates in the same direction in the container under the action of external force.
根据上述技术方案进行的腐蚀过程具有非选择性,能够实现腐蚀出圆形GaAs/AlGaAs晶The etching process carried out according to the above technical scheme is non-selective, and can realize the etching of circular GaAs/AlGaAs crystals.
体的目的,可以得到光滑均匀的圆。腐蚀液配制方便,并且可以反复使用。其效果可以从上表看出。For the purpose of the body, a smooth and uniform circle can be obtained. The corrosive solution is easy to prepare and can be used repeatedly. Its effect can be seen from the table above.
具体实施方式 Detailed ways
本发明之腐蚀方法采用重量含量为85%的H3PO4和重量含量为30%的H2O2两种组分配制的腐蚀液,各组分的体积比为H3PO4∶H2O2=10~25∶1。其具体配比视所要达到的腐蚀速率而定,各种实施方式见下表:The corrosion method of the present invention adopts the corrosion solution prepared by two components of H 3 PO 4 with a weight content of 85% and H 2 O 2 with a weight content of 30%, and the volume ratio of each component is H 3 PO 4 : H 2 O 2 =10-25:1. The specific ratio depends on the corrosion rate to be achieved, and the various implementation methods are shown in the table below:
采用本发明之腐蚀方法腐蚀GaAs/AlGaAs晶体的过程为,将GaAs/AlGaAs晶体擦拭干净;然后以5000转/分钟转速甩胶,所用的胶为AZ-5214正性胶;在90℃温度下前烘10分钟;然后对版、曝光、显影和坚膜,制作出所需圆形胶膜。将处理完的待腐蚀GaAs/AlGaAs晶体放入所配制的腐蚀液中,腐蚀在室温或者加热如30~60℃范围内的某一温度下进行,同时以50~200rpm的速率沿同一方向搅拌盛放在容器内的腐蚀液,或者按同样的速率沿同一方向环行摇动盛放腐蚀液及待腐蚀GaAs/AlGaAs晶体的容器,直到完成非选择性湿法腐蚀。本发明之腐蚀方法可应用于采用GaAs/AlGaAs晶体材料制作半导体器件的过程中,如环形腔激光器等,也可以用在制作微透镜等微小元件的过程中。The process of corroding GaAs/AlGaAs crystals using the etching method of the present invention is to wipe the GaAs/AlGaAs crystals clean; then spin the glue at a speed of 5000 rpm, and the glue used is AZ-5214 positive glue; Bake for 10 minutes; then align, expose, develop and harden the film to produce the desired circular film. Put the treated GaAs/AlGaAs crystal to be etched into the prepared etching solution, etch at room temperature or heating at a certain temperature in the range of 30-60°C, while stirring in the same direction at a speed of 50-200rpm The etching solution placed in the container, or the container containing the etching solution and the GaAs/AlGaAs crystal to be etched is circularly shaken in the same direction at the same rate until the non-selective wet etching is completed. The etching method of the present invention can be applied in the process of manufacturing semiconductor devices using GaAs/AlGaAs crystal materials, such as ring cavity lasers, and can also be used in the process of manufacturing micro-elements such as microlenses.
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CN103454703A (en) * | 2013-09-12 | 2013-12-18 | 长春理工大学 | Method of manufacturing GaAs micro lens in wet etching method |
CN105591281B (en) * | 2014-10-21 | 2019-11-29 | 长春理工大学 | A kind of distributed Bragg reflector semiconductor laser grating preparation process |
CN109023531A (en) * | 2018-09-20 | 2018-12-18 | 汉能新材料科技有限公司 | A kind of caustic solution and corrosion liquid formula of arsenide gallium monocrystal dislocation pit |
Citations (3)
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US3972770A (en) * | 1973-07-23 | 1976-08-03 | International Telephone And Telegraph Corporation | Method of preparation of electron emissive materials |
US5790577A (en) * | 1995-10-05 | 1998-08-04 | Nippondenso Co., Ltd. | High output semiconductor laser element having robust electrode structure |
CN1222769A (en) * | 1998-01-06 | 1999-07-14 | 中国科学院半导体研究所 | Efficient LED and its making method |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3972770A (en) * | 1973-07-23 | 1976-08-03 | International Telephone And Telegraph Corporation | Method of preparation of electron emissive materials |
US5790577A (en) * | 1995-10-05 | 1998-08-04 | Nippondenso Co., Ltd. | High output semiconductor laser element having robust electrode structure |
CN1222769A (en) * | 1998-01-06 | 1999-07-14 | 中国科学院半导体研究所 | Efficient LED and its making method |
Non-Patent Citations (4)
Title |
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GaAs背面通孔刻蚀技术研究. 陈震,魏珂,王润梅,刘新宇,刘训春,吴德馨.功能材料与器件学报,第10卷第2期. 2004 |
GaAs背面通孔刻蚀技术研究. 陈震,魏珂,王润梅,刘新宇,刘训春,吴德馨.功能材料与器件学报,第10卷第2期. 2004 * |
由选择腐蚀和选择氧化法相结合研制的GaAs/AlGaAS垂直腔面发射激光器. 康学军,林世鸣,高俊华,高洪海,王启明,王红杰,王立轩,张春晖.半导体学报,第17卷第11期. 1996 |
由选择腐蚀和选择氧化法相结合研制的GaAs/AlGaAS垂直腔面发射激光器. 康学军,林世鸣,高俊华,高洪海,王启明,王红杰,王立轩,张春晖.半导体学报,第17卷第11期. 1996 * |
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