CN100435292C - A Non-Selective Etching Method of GaAs/AlGaAs Crystal Material - Google Patents

A Non-Selective Etching Method of GaAs/AlGaAs Crystal Material Download PDF

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CN100435292C
CN100435292C CNB2006101113500A CN200610111350A CN100435292C CN 100435292 C CN100435292 C CN 100435292C CN B2006101113500 A CNB2006101113500 A CN B2006101113500A CN 200610111350 A CN200610111350 A CN 200610111350A CN 100435292 C CN100435292 C CN 100435292C
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gaas
corrosion
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algaas
etching method
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CN1909192A (en
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张晶
高欣
姜立国
李辉
曲轶
刘国军
薄报学
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Changchun University of Science and Technology
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Abstract

The invention relates to a non-selective corrosion method of GaAs/AlGaAs crystal, wherein the present corrosion liquids main are H2SO4:H2O2:H2O as 1:8:8 or 3:3:1 in volume percentage; and the volume ratio between H3PO4:H2O2:H2O is 1:1:10 or 1:1:5, to corrode at room temperate or ice point, which can produce bar semi-conductor but not round. And the inventive corrosion method uses H3PO4 and H2O2, whose volume ratio is H3PO4:H2O2 as 10:25:1, to corrode under 30-60Deg. C, while it mixing the corrosion liquid at the same time.

Description

一种GaAs/AlGaAs晶体材料的非选择腐蚀方法 A Non-Selective Etching Method of GaAs/AlGaAs Crystal Material

技术领域 technical field

本发明是一种腐蚀半导体材料GaAs/AlGaAs的腐蚀方法,属于半导体器件制造技术领域。The invention relates to an etching method for etching semiconductor material GaAs/AlGaAs, which belongs to the technical field of semiconductor device manufacturing.

背景技术 Background technique

现有的采用湿法腐蚀制作半导体器件的方法所使用的腐蚀液主要包括硫酸系列和磷酸系列,前者如H2SO4∶H2O2∶H2O体积比分别为1∶8∶8或者3∶3∶1的腐蚀液,为典型的各向异性腐蚀液,用于脊型波导器件制造;后者如H3PO4∶H2O2∶H2O的体积比分别为1∶1∶10或者1∶1∶5的腐蚀液,也具有明显的各向异性腐蚀特性。通常采用这些腐蚀液腐蚀GaAs/AlGaAs晶体,制作条形半导体器件。腐蚀过程通常是在室温或者冰点温度(0℃)下进行,比如在室温环境下操作,或者将盛有腐蚀液的容器置于冰水中,以得到稳定的腐蚀速率;在腐蚀过程中,腐蚀液是静止的。The etching solution used in the existing wet etching method for manufacturing semiconductor devices mainly includes sulfuric acid series and phosphoric acid series, the former such as H 2 SO 4 : H 2 O 2 : H 2 O volume ratio is 1:8:8 or The 3:3:1 etchant is a typical anisotropic etchant used in the manufacture of ridge waveguide devices; the volume ratio of the latter such as H 3 PO 4 : H 2 O 2 : H 2 O is 1:1 :10 or 1:1:5 etchant also has obvious anisotropic corrosion characteristics. These etching solutions are usually used to etch GaAs/AlGaAs crystals to make strip semiconductor devices. The corrosion process is usually carried out at room temperature or freezing point temperature (0°C), such as operating at room temperature, or placing the container containing the corrosive liquid in ice water to obtain a stable corrosion rate; during the corrosion process, the corrosive liquid is static.

发明内容 Contents of the invention

由于晶向和材料组分以及腐蚀液粘度较低等原因,采用现有腐蚀液制作圆形器件,一般得到的都是近似于菱形的形状。特别是当圆比较小的时候,现有的腐蚀液很难腐蚀出符合要求的圆形形状。较低的腐蚀温度和静止的腐蚀液状态助长了腐蚀在方向上的倾向。概括地说,现有腐蚀方法在腐蚀GaAs/AlGaAs晶体的过程中,表现出腐蚀方向选择性。为了实现GaAs/AlGaAs晶体的非选择腐蚀,本发明提出了一种GaAs/AlGaAs晶体材料的非选择腐蚀方法。Due to the crystal orientation, material composition and low viscosity of the etchant, the shape of circular devices generally obtained by using the existing etchant is similar to that of a rhombus. Especially when the circle is relatively small, it is difficult to corrode a circular shape that meets the requirements with the existing etching solution. The lower corrosion temperature and the static state of the corrosion liquid promote the tendency of corrosion in the direction. In a nutshell, the existing etching methods exhibit etching direction selectivity in the process of etching GaAs/AlGaAs crystals. In order to realize the non-selective etching of GaAs/AlGaAs crystal, the present invention proposes a non-selective etching method of GaAs/AlGaAs crystal material.

本发明是这样实现的,所采用腐蚀液由重量含量为85%的H3PO4和重量含量为30%的H2O2两种组分组成,各组分的体积比为H3PO4∶H2O2=10~25∶1;腐蚀过程在30~60℃之间的某一温度下进行;同时腐蚀液在外力作用下在容器内沿同一方向旋转。The present invention is achieved in this way, the corrosive solution used is composed of two components with a weight content of 85% H 3 PO 4 and a weight content of 30% H 2 O 2 , and the volume ratio of each component is H 3 PO 4 : H 2 O 2 =10~25:1; the corrosion process is carried out at a certain temperature between 30~60°C; at the same time, the corrosion solution rotates in the same direction in the container under the action of external force.

根据上述技术方案进行的腐蚀过程具有非选择性,能够实现腐蚀出圆形GaAs/AlGaAs晶The etching process carried out according to the above technical scheme is non-selective, and can realize the etching of circular GaAs/AlGaAs crystals.

  腐蚀液及配比(体积) Corrosive solution and ratio (volume) 被腐蚀晶体 corroded crystal 需腐蚀形状 Shape to be corroded 腐蚀液温度(℃) Corrosive solution temperature (°C)   搅拌速率(rpm) Stirring rate (rpm) 腐蚀结果 Corrosion result   H<sub>3</sub>PO<sub>4</sub>∶H<sub>2</sub>O<sub>2</sub>∶H<sub>2</sub>O1∶1∶10 H<sub>3</sub>PO<sub>4</sub>: H<sub>2</sub>O<sub>2</sub>: H<sub>2</sub>O1:1 : 10 GaAs/AlGaAs GaAs/AlGaAs 圆形 round 0 0   0 0 菱形 diamond   H<sub>3</sub>PO<sub>4</sub>∶H<sub>2</sub>O<sub>2</sub>20∶1 H<sub>3</sub>PO<sub>4</sub>: H<sub>2</sub>O<sub>2</sub>20:1 GaAs/AlGaAs GaAs/AlGaAs 圆形 round 40 40   100 100 圆形 round

体的目的,可以得到光滑均匀的圆。腐蚀液配制方便,并且可以反复使用。其效果可以从上表看出。For the purpose of the body, a smooth and uniform circle can be obtained. The corrosive solution is easy to prepare and can be used repeatedly. Its effect can be seen from the table above.

具体实施方式 Detailed ways

本发明之腐蚀方法采用重量含量为85%的H3PO4和重量含量为30%的H2O2两种组分配制的腐蚀液,各组分的体积比为H3PO4∶H2O2=10~25∶1。其具体配比视所要达到的腐蚀速率而定,各种实施方式见下表:The corrosion method of the present invention adopts the corrosion solution prepared by two components of H 3 PO 4 with a weight content of 85% and H 2 O 2 with a weight content of 30%, and the volume ratio of each component is H 3 PO 4 : H 2 O 2 =10-25:1. The specific ratio depends on the corrosion rate to be achieved, and the various implementation methods are shown in the table below:

  序号 serial number H<sub>3</sub>PO<sub>4</sub>和H<sub>2</sub>O<sub>2</sub>的配比(体积比) The ratio of H<sub>3</sub>PO<sub>4</sub> and H<sub>2</sub>O<sub>2</sub> (volume ratio)     腐蚀液温度(℃)   Corrosive solution temperature (°C)     搅拌速率(rpm)   Stirring rate (rpm)   腐蚀速率(μm/min) Corrosion rate (μm/min)   1 1 10∶1 10:1     60 60     200 200   3.2 3.2   2 2 15∶1 15:1     50 50     150 150   2.5 2.5   3 3 20∶1 20:1     40 40     100 100   2.0 2.0   4 4 25∶1 25:1     30 30     50 50   1.4 1.4

采用本发明之腐蚀方法腐蚀GaAs/AlGaAs晶体的过程为,将GaAs/AlGaAs晶体擦拭干净;然后以5000转/分钟转速甩胶,所用的胶为AZ-5214正性胶;在90℃温度下前烘10分钟;然后对版、曝光、显影和坚膜,制作出所需圆形胶膜。将处理完的待腐蚀GaAs/AlGaAs晶体放入所配制的腐蚀液中,腐蚀在室温或者加热如30~60℃范围内的某一温度下进行,同时以50~200rpm的速率沿同一方向搅拌盛放在容器内的腐蚀液,或者按同样的速率沿同一方向环行摇动盛放腐蚀液及待腐蚀GaAs/AlGaAs晶体的容器,直到完成非选择性湿法腐蚀。本发明之腐蚀方法可应用于采用GaAs/AlGaAs晶体材料制作半导体器件的过程中,如环形腔激光器等,也可以用在制作微透镜等微小元件的过程中。The process of corroding GaAs/AlGaAs crystals using the etching method of the present invention is to wipe the GaAs/AlGaAs crystals clean; then spin the glue at a speed of 5000 rpm, and the glue used is AZ-5214 positive glue; Bake for 10 minutes; then align, expose, develop and harden the film to produce the desired circular film. Put the treated GaAs/AlGaAs crystal to be etched into the prepared etching solution, etch at room temperature or heating at a certain temperature in the range of 30-60°C, while stirring in the same direction at a speed of 50-200rpm The etching solution placed in the container, or the container containing the etching solution and the GaAs/AlGaAs crystal to be etched is circularly shaken in the same direction at the same rate until the non-selective wet etching is completed. The etching method of the present invention can be applied in the process of manufacturing semiconductor devices using GaAs/AlGaAs crystal materials, such as ring cavity lasers, and can also be used in the process of manufacturing micro-elements such as microlenses.

Claims (2)

1, a kind of non-selective etching method of GaAs/AlGaAs crystalline material is characterized in that, the corrosive liquid that adopts be 85% H by weight content 3PO 4With weight content be 30% H 2O 2Two kinds of components are formed, and the volume ratio of each component is H 3PO 4: H 2O 2==10~25: 1; Corrosion process is carried out under a certain temperature between 30~60 ℃; Corrosive liquid rotates along same direction in container under external force simultaneously.
2, according to the described non-selective etching method of claim 1, it is characterized in that, speed with 50~200rpm stirs the corrosive liquid that is contained in the container along same direction, perhaps go in ring along same direction and shake the container that holds corrosive liquid and wait to corrode the GaAs/AlGaAs crystal, up to finishing non-selective corrosion by same speed.
CNB2006101113500A 2006-08-24 2006-08-24 A Non-Selective Etching Method of GaAs/AlGaAs Crystal Material Expired - Fee Related CN100435292C (en)

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CN103454703A (en) * 2013-09-12 2013-12-18 长春理工大学 Method of manufacturing GaAs micro lens in wet etching method
CN105591281B (en) * 2014-10-21 2019-11-29 长春理工大学 A kind of distributed Bragg reflector semiconductor laser grating preparation process
CN109023531A (en) * 2018-09-20 2018-12-18 汉能新材料科技有限公司 A kind of caustic solution and corrosion liquid formula of arsenide gallium monocrystal dislocation pit

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