CN100432622C - Printing solder detecting device - Google Patents
Printing solder detecting device Download PDFInfo
- Publication number
- CN100432622C CN100432622C CNB2006100831759A CN200610083175A CN100432622C CN 100432622 C CN100432622 C CN 100432622C CN B2006100831759 A CNB2006100831759 A CN B2006100831759A CN 200610083175 A CN200610083175 A CN 200610083175A CN 100432622 C CN100432622 C CN 100432622C
- Authority
- CN
- China
- Prior art keywords
- mentioned
- unit
- value
- lower limit
- scolding tin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30152—Solder
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
The invention provides the technology of judging quantity when displaying solder form distribution, easily designing reference value. The invention uses measuring unit (2) to measure soldering state, according the measured value, uses the histogram calculation unit (5a) to calculate frequency distribution of form value, uses display controlling unit (6) to display the frequency distribution on the display unit (7), and uses recognizable pattern to display variable input distribution range. The NG calculation unit (5b) calculates the fraction defective or percent of pass, and defines the expected distribution range.
Description
Technical field
The present invention is about a kind of print solder checker, and its scolding tin formation state when being printed with cream (Cream) shape scolding tin on the printed panel (Print Circuit Board) that is used for mounted on surface electronic component etc. is measured and checked.Especially about a kind of technology that makes the good benchmark of not judging be easy to set.
Background technology
Before, in the print solder checker, comprised substrate (following printed panel is abbreviated as " substrate ".) surface irradiation laser etc. and accept the catoptrical inductor that substrate surface sends, the measured value that obtains according to the result who measures (triangulation (triangulation)) as this inductor, for example, the measured value of displacement of the print solder position on the substrate (comprising height) or brightness (comprising light quantity, light income (light intensity)) from the substrate reflection, compared with reference data and judged (No. 3537382 communique of Jap.P., prior art) as determinating reference.
In testing fixture (method) so, generally speaking, the benchmark that will become judgement is stored as initial value (default value (defaulting)) at first, in fact, judge that the operator is in order to confirm disqualification rate (leading hereinafter referred to as NG) or qualification rate (leading hereinafter referred to as OK) with the measured value and the default value thereof of a plurality of substrates, as required, default value is changed to suitable reference value, and set, and check.
For example, a plurality of substrates are measured through the scolding tin shape after the identical printing, are calculated the volume of its scolding tin shape of expression, with the mean value of its distribution ± 3 σ are as the OK scope, the part beyond this scope is then as the scope of NG.This value ± 3 σ or other numerical value can constitute by any setting.
As mentioned above, previous, in the print solder checker, according to the data of in fact checking, judging, the operator studies, sets the reference value of judging (allowable value).In fact, have nothing in common with each other in aspects such as the kind of substrate, the shape of scolding tin, design load.Therefore, when as the kind of the substrate of judging object, scolding tin shape more for a long time, even when as the project of judging object more for a long time, in order to obtain reference value (allowable value), need suitable time and experience.Judge in the project of object that for example, the data of expression scolding tin shape are (hereinafter referred to as the shape value.) in, except aforesaid scolding tin volume, also there are skew, scolding tin width and scolding tin height inequality (irregular height irregular height, uneven variation) etc. between the original position of solder area, scolding tin height, scolding tin.
Summary of the invention
The present invention's purpose is to provide a kind of distribution of discerning the shape value of the scolding tin shape that expression measured, and the operator can make easily to set when quantitatively judging the technology of judging with reference value (allowable value (allowable value)) etc.
For reaching above-mentioned purpose, the 1st described invention of the present invention is a kind of print solder checker,
It is for comprising with lower unit person, that is, determination unit (2) is in order to measure the displacement that is printed in a plurality of scolding tin on the printed panel; The number of times distribution of judgement with the shape value obtained as the judgement of one or more kinds of shape shape in histogram calculation unit (5a), the state of obtaining above-mentioned scolding tin at the measured value of being exported according to the said determination unit; NG leads computing unit (5b), according to distribute distribution range with the acceptability limit of the above-mentioned printed scolding tin shape of expression of the above-mentioned number of times of being tried to achieve, calculates the disqualification rate of above-mentioned printed scolding tin shape and at least one in the qualification rate; Operating unit (9); Display unit (7); And indicative control unit (6), disqualification rate or qualification rate that aforementioned calculation is gone out are shown in above-mentioned display unit, and
The aforesaid operations unit can be for indicating with the represented above-mentioned distribution range of higher limit (upper value) and lower limit (lower value),
Above-mentioned indicative control unit can show that above-mentioned number of times distributes, and can be after the Newest Directive that receives the above-mentioned distribution range of sending the aforesaid operations unit, to be shown in above-mentioned higher limit and the lower limit pairing position of above-mentioned number of times on distributing before this Newest Directive, and change to the above-mentioned higher limit of this Newest Directive indication and the pairing position of lower limit and show.
The 2nd described invention of the present invention, the 1st described invention according to the present invention, above-mentioned NG leads computing unit when the Newest Directive that above-mentioned distribution range is arranged, higher limit and lower limit and the distribution of above-mentioned number of times according to this Newest Directive indication, recalculate at least one in disqualification rate and the qualification rate
Above-mentioned indicative control unit will be shown in the disqualification rate of above-mentioned display unit before above-mentioned the Newest Directive and at least one in the qualification rate changed, and shows disqualification rate or qualification rate that this recalculates.
The 3rd described invention of the present invention, the 1st or 2 described invention according to the present invention, the aforesaid operations unit can further change and indicate the disqualification rate that shows in the above-mentioned display unit and at least one in the qualification rate,
Above-mentioned NG leads computing unit when change is arranged from the disqualification rate of aforesaid operations unit and at least one the indication in the qualification rate, go out based on the disqualification rate of this indication and higher limit and lower limit in the qualification rate according to above-mentioned number of times Distribution calculation
Above-mentioned indicative control unit changes higher limit and the lower limit that was shown in above-mentioned display unit before the indication of the above-mentioned change of expression, and above-mentioned higher limit that recalculates and lower limit are shown in the number of times distribution.
The 4th described invention of the present invention, the 1st described invention according to the present invention comprises: judge that it accepts the measured value of said determination unit, obtains the judgement shape value of above-mentioned each print solder position with data generation units (3); And
Foregoing invention comprises: judge with data generation units (3), accept the measured value of said determination unit, obtain the judgement shape value of above-mentioned each print solder position; And identifying unit (3), according to based on lead the higher limit that computing unit recalculates and the new allowable value of lower limit by above-mentioned NG, judge whether the judgement that this judgement on above-mentioned each print solder position exported with the data generation unit is qualified with the shape value.
The above-mentioned indicative control unit of foregoing invention constitutes, and makes above-mentioned display unit show the layout of the scolding tin position of the above-mentioned printed base plate of expression, and show that in discernible mode above-mentioned identifying unit is judged to be underproof position on the layout of this demonstration.
According to formation of the present invention, the shape value that can discern the scolding tin state that expression measures (for example, the volume of scolding tin (solder), area, highly, skew, width, highly, unequal) distribution of aspect, and when setting the distribution range of allowing, then can grasp its corresponding NG quantitatively and lead in variable mode.On the contrary, carry out variable setting, then also can grasp leading the distribution range of allowing accordingly with this NG when leading with NG to attach most importance to.Therefore, can discern distribution and can easily set the distribution range of allowing quantitatively.And, at each substrate and corresponding to the kind (kind of scolding tin shape value) of critical item, can obtain distribution, NG leads, and therefore first and last, can shorten the time.
Description of drawings
Fig. 1 is graphic for the function square of the example of explanation among the present invention.
Fig. 2 is the expression example of this example shown in Fig. 1, but and the expression example that NG leads, number of times distributes when specifying measurement range and shape.
Fig. 3 is motion flow graphic of this example in the presentation graphs 1.
Motion flow when Fig. 4 operates for expression and Fig. 3 carry out different use graphic.
Fig. 5 is the functional block diagram of the structure of pairing other examples of example shown in the presentation graphs 1.
Fig. 6 is motion flow graphic of other examples in the presentation graphs 5.
Fig. 7 is expression example graphic of other examples in the presentation graphs 5.
1: substrate (printed panel) 2: identifying unit
3: judge with data generation unit 4: control module
5: arithmetic element 5a: the histogram calculation unit
5b:NG leads computing unit 6: indicative control unit
7: display unit 8: control module
8a: design information mnemon 9: operating unit
10: allowable value change unit 11: layout viewing area
12: shape selector button 13: information memory cell
14: 15:NG position, scolding tin position
16: the scope assigned tags
Embodiment
Utilize and graphic example of the present invention is illustrated.Fig. 1 is the functional block diagram of the formation of expression example of the present invention.Fig. 2 is the expression example of this example of Fig. 1, the expression example that the NG when specifying measurement range and shape leads, number of times distributes.Fig. 3 is the figure of motion flow of this example of presentation graphs 1.Fig. 4 is the figure that operates different motion flows with the use of Fig. 3.Fig. 5 is the functional block diagram of expression with the formation of corresponding other examples of example of Fig. 1.Fig. 6 is the figure of the motion flow in other examples in the presentation graphs 5.Fig. 7 is the figure of the expression example in other examples in the presentation graphs 5.
Among Fig. 1, have portion of travel mechanism (not shown) in the determination unit 2, its accept that control module 8 sends as the printed panel 1 of determination object (hereinafter referred to as substrate 1.) layout information information such as (physical dimension, scolding tin positions) after, inductor relatively moved for substrate 1 and scan, and, measure the displacement on the short transverse of scolding tin position along layout.Also can measure the pairing brightness in scolding tin position in the lump.
Judge that accept the measured value that determination unit 2 measured with data (data) generation unit 3 (is stored in the not shown storage unit temporarily.), discern a plurality of specific image parameters (parameter) value of the sensitivity of very thin pattern according to expressions such as filtrator (filter), scolding tin (solder), bridge joint (bridge) or scolding tin pattern edges (pattern edge), measured value processing is processed into each judgement data through the soldering tin amount of the scolding tin position of printing of expression, that is shape value.And, judge with having with lower unit in the data generation unit 3 etc., its through computing obtain volume, area, highly, width, skew, highly uneven and/or defective (should be in the layout on the position of scolding tin position, check the state of no soldering tin amount) etc., as the judgement data (shape value) of the locational scolding tin shape of expression scolding tin value.In addition, judging when whether substrate 1 is qualified, is not the above-mentioned all images of certain needs.But, indispensable at least volume, area, highly, width, skew, highly uneven and/or in the defective any one.And, judge with the storer in the data generation unit 3 to be used to store each shape value of trying to achieve through computing.
As the judgement shape value that this judgement is exported with data generation unit 3, (1) output with volume that absolute value representation was calculated, area, highly, width, skew, highly uneven and/or the value of defective.Perhaps/and (2) in above-mentioned (1), especially for volume, area, highly, width, also can utilize by the shape value after the design load benchmark (standardization) and export, and as with the volume that designs at each print solder position in advance, area, highly, the design load of width is accordingly than (for example: the bulking value on the bulking value that calculates by actual measurement on certain scolding tin position/locational design load of this scolding tin).Value in the design is (hereinafter referred to as design load.) can be used as reference data (can be used as design load, also can to designed value utilize experienced data proofread and correct and value, therefore as reference data.That is, when carrying out benchmark, be not limited only to design load.) be stored among the design information storage unit 8a in the control module 8 among Fig. 1, therefore accept this value and calculate.
In addition, when in the number of times of absolute value distributes, obtaining following number of times and distributing, from viewpoint relatively, must select design upward identical scolding tin shape the position and (for example obtain the number of times distribution, when obtaining the number of times distribution between a plurality of substrates 1, the number of times of same scolding tin position distributes).When the shape value of utilizing benchmark is obtained the number of times distribution, need not to only limit to same shape.But, when the tendency that distributes when number of times can be affected because of shape, it is desirable to, obtain and still have the locational number of times of each identical shaped scolding tin and distribute.Herein, for judge the value exported with data generation unit 3 according to the attribute of shape value and for volume, area, highly, value after the width output referenceization, and for skew, highly uneven (=average height/maximum height) situation of exporting absolute value describes.
In addition, judge with data generation unit 3 it is to be used for unit that the scolding tin state is scaled the area represented as amount or volume and estimates, for example, merely when highly estimating, also can need not this judgement usefulness data generation unit 3.But at this moment, following reference data is the design load (reference data) of relevant height, and whether identifying unit 4 is judged for the height of scolding tin state qualified, and arithmetic element 5 only distributes for highly obtaining number of times.
The expression example that Fig. 2 distributes for the number of times of in fact representing volume.Utilize operating unit 9 to select to be positioned among Fig. 2 " the scope appointment " of " measurement range " in left side, further in Fig. 2, be positioned at the layout viewing area on right side, utilize the scolding tin position range (dotted line in Fig. 2 in) of operating unit 9, the determination block of substrate 1 is counted the histogram graph representation of the relevant distribution of N with the histogram viewing area with the specified scope of scope assigned tags.Among Fig. 2, transverse axis represents that with 16 equal portions the longitudinal axis is represented its number of degrees as the volume ratio (volume of the volume/design load of=actual measurement) through the shape value of benchmark.For the selector button that is used for the selected shape value shown in the hypomere (part of operating unit 9) among Fig. 2, utilize operating unit 9 to click " volume " and select, this is the example of Fig. 2.If click other area, skew, width, highly uneven, then histogram calculation unit 5a calculates the number of times distribution of this shape value, and indicative control unit 6 shows display unit 7.Among Fig. 2, histogram calculation unit 5a further carries out following control, and indicative control unit 6 is shown in a wire tag and calculates ± 3 σ (σ: standard deviation value) on the position of pairing transverse axis.It is to become the standard of observing the tendency that distributes.
In addition, the solid line (post) of " lower limit " of histogram viewing area and " upper limit " is labeled as, be judged to be between the lower limit and the upper limit in the qualified distribution range, expression is judged to be the mark of the distribution range of defective (defective) above the scope of the lower limit and the upper limit.Among Fig. 2, the mark of " lower limit " and " upper limit " is represented and the corresponding position of numerical value of the lower limit 80% and the higher limit 110% of picture central authorities (utilizing operating unit 9 to make numerical value variable, then also interlock and variable of the position of post mark).Higher limit, the lower limit of representing the distribution range of these number of degrees is to carry out shape value or corresponding ratio (number percent) expression of reference data (design load) (as unit, identical with above-mentioned shape value scope) after the benchmark with reference data (design load).
The calculating that NG computing unit 5b accepts histogram calculation unit 5a distribute and from the distribution range of the desired number of degrees of operating unit 9 (for example, the output of numerical value button or scrambler) as higher limit, lower limit (independent separately the setting.As described below, become the value of allowable value when having determined.) represented NG data, above-mentioned both sides are compared, in distributing for the calculating of histogram calculation unit 5a, do not belong to the scope between lower limit and the higher limit, calculate NG and lead (disqualification rate) (in also can distributing for the calculating of histogram calculation unit 5a, be positioned at the scope between lower limit and higher limit, calculate OK and lead).Be positioned at the hypomere on right hurdle among Fig. 2, expression operating unit 9 higher limit, the lower limit imported, show in epimere that NG leads that computing unit 5b is calculated, exceed higher limit+NG lead and be lower than lower limit-NG leads.And during the number of times of Fig. 2 distributed, indicative control unit 6 used with the solid marks of discerning and is shown on the position by the higher limit of operating unit 9 inputs, the corresponding transverse axis of lower limit.
The operator attempts changing each higher limit, lower limit, finally be defined as (after utilizing operating unit 9 to click confirming buttons among Fig. 2) after suitable higher limit, the lower limit, to higher limit, is the good new allowable value of not judging (allowing distribution range) about certain locational scolding tin shape this shape value, this scolding tin shape from that time lower limit.That is, the distribute distribution of expression and the corresponding measured value of design load of number of times, therefore when with this higher limit, lower limit as determinating reference, then it directly becomes allowable value.
And, NG computing unit 5b also can constitute, after the number of times that calculates histogram calculation unit 5a distributes, based on calculate to distribute and lead when being transfused at desired NG from operating unit 9, lead and the number of times distribution based on this desired NG, seize back confiscated property out and desired NG leads corresponding distribution range (higher limit, lower limit), can import its result and solid line (post) mark into indicative control unit 6 and show.Like this, the operator can change lower limit and higher limit (distribution range) and know that NG leads, and also can change NG lead know lower limit and higher limit (but, be not to carry out above-mentioned seizing back confiscated property on the surface.That is, can change when paying close attention to lower limit and read NG after lower limit and the higher limit and lead with higher limit, perhaps, change lower limit and higher limit reads lower limit afterwards and higher limit realizes when leading by paying close attention to NG.)。Therefore, according to the present invention, but the process of the thinking mistake when the up operation person sets allowable value distribution range (lower limit, higher limit).
Identifying unit 4, accept to judge and actual measurement that produced with data generation unit 3 the corresponding scolding tin in scolding tin position the shape value and control unit 8 certainly and accept the default value of corresponding allowable value therewith or acceptance by operating unit 9 determined allowable values, wherein any one compared, when in allowable value then the shape value for its scolding tin position be judged to be " qualified ", defective when outside allowable value, then being judged to be, to this, scolding tin position for substrate 1 integral body is judged, thereby is carried out final good not judgement.Allowable value change unit 10 is used for selecting the default value of allowable value or any of fixed allowable value, originally as default value, can preferentially should fixed allowable value send into identifying unit 4 after determining.In addition, identifying unit 4 can constitute one with arithmetic element 5.Whether whether in the arithmetic element 5, be that the identical judgement of carrying out is identical for belonging in higher limit and the represented distribution range of lower limit, difference is that computing unit 5 further carries out statistical treatment and distributes to obtain number of times.
And whether identifying unit 4 is judged from judging with the corresponding scolding tin shape value in the actual measurement scolding tin position (scolding tin position) of data generation unit 3 qualified, can specify therefore that to be judged to be negate to be underproof position.Therefore, indicative control unit 6 is accepted the layout of expression scolding tin positions from controlling unit 8, can show this layout, and can indicate and be judged to be underproof scolding tin position on this layout.In addition, the result of determination of identifying unit 4 also can change in case the permissible range of lower limit, higher limit changes to some extent, this is judged to be underproof scolding tin position and also can changes, so the operator can interrelate the defective position of lower limit, higher limit and scolding tin and discern.
Indicative control unit 6 has demonstration form as shown in Figure 2 as mentioned above, and will divide and serve as a mark on the transverse axis coordinate that number of times distributes from the NG data of the higher limit of operating unit 9, lower limit and show.Equally, according to indication, control unit 8 certainly and accept the layout of the substrate 1 that will measure and show size, the position of the scope assigned tags of the expression measurement range of display operation unit 9 indications in zone (dotted line among Fig. 2) from operating unit 9.In addition, transmission information between operating unit 9 and control module 8.And, (detailed content is as follows) as shown in Figure 7, the layout (configuration of substrate 1, size, scolding tin position) that is stored among the design information storage unit 8a with the result of determination of the NG of each scolding tin position of identifying unit 4 indications correspondingly makes display unit 7 show.The part of blacking is represented NG in the layout of Fig. 7.
And indicative control unit 6 is after comprising the combinations such as user interface, arithmetic element 5 and identifying unit 4 of operating unit 9 with display unit 7 it to be connected.That is, have following connection effect: accept to lead or allowable value distribution range (higher limit, lower limit) from the NG of above-mentioned operating unit 9 inputs (change), to arithmetic element 5 transmission, and the allowable value that will as a result of calculate or NG lead and are shown in display unit 7.Equally, in utilizing operating unit 9 to carry out the result of determination of the identifying unit 4 in variable when input, in the layout of bad position shows, also can bring into play the connection effect based on NG is led.
Part in the summary of the content of being stored among the design information storage unit 8a is illustrated in above-mentioned, below describes for unaccounted part.Design information storage unit 8a will be the design load of identical type with the shape value with above-mentioned judgement, promptly, with the volume of scolding tin position, area, highly, relevant design load such as width, the corresponding scolding tin of skew position is as reference data, and correspondingly store with scolding tin position (position).In the practical application, design information storage unit 8a is at the various types of storage layout (arrangement plan of substrate 1, size, scolding tin position etc.) as the substrate 1 of checking object, when beginning to check, the tabulation of the kind of substrate 1 is shown in display unit 7, and can selects by operating unit 9.
About operating unit 9, utilized the explanation of above-mentioned each one that a part is illustrated, through the arrangement after then for to carry out following (1) to the operation shown in (4).(1) specific, the measurement range shown in Fig. 2 as the substrate 1 of determination object specify for the part scope or comprehensively select in any, when measurement range is specified for the part scope, move setting range assigned tags 16 (, specify the position of the scolding tin position 14 of Fig. 2, the scope of scolding tin position), the input of the piece number of substrate 1, (2) obtain the selection (with reference to the hypomere of Fig. 2) of the shape value of distribution, (3) setting of the mark of the lower limit of indication distribution, higher limit (promptly, the setting of NG data), in addition, the change input that leads of (4) NG.
The part of determination unit 2 in the above-mentioned formation, judge with data generation unit 3, arithmetic element 5, identifying unit 4, control module 8 and indicative control unit 6 be by CPU, with will with so that the procedure stores that above-mentioned illustrated function is moved in this CPU storer (ROM) and in the above-mentioned functions course of action, store memory of data formations such as (RAM).
Secondly, utilize Fig. 3 that a series of flow processs of the main action in the example among Fig. 1 are described.S numbering among Fig. 3 is identical with following step S numbering.
Step S1 (preparation process): stored configuration is stored in the title (distinguished symbol) of checking locational state substrate 1 down and as its layout and is comprised the appearance information of size, the positional information of scolding tin position on the substrate 1 in advance in design information storage unit 13, (will have the identical a plurality of substrates 1 of substrate 1 of a plurality of scolding tin position or kind as object).In addition, the corresponding reference data of shape value of storage and the locational scolding tin of each scolding tin of substrate 1 (height of scolding tin, area, volume, skew, highly design loads such as inequality, defective).And, also can store default value with the corresponding allowable value of the locational scolding tin shape of each scolding tin value (higher limit, lower limit) of substrate 1.
Step S2 (input operation step): after the energized, indicative control unit 6 expression is for example in the histogram distribution of displayed map 2 not and the setting picture under the state of display layout not.The operator utilizes operating unit 9 to specify title, measurement range, the piece number of checking position upper substrate 1.After selecting " scope appointment " as " measurement range " among Fig. 2, show the layout of this substrate 1, utilize scope assigned tags 16 (dotted line of Fig. 2) to specify scope, the position of the scolding tin position that will measure distribution on the layout of this demonstration, and utilize shape selector button 12 (with reference to the hypomere of Fig. 2) to click shape (for example " volume ") and specify.
Step S3 (measurements determination step): control module 8 is from operating unit 9, for example after receiving " NG setting " such order, scope (scope of position: hereinafter referred to as measurement range) for the scolding tin position of specifying mensuration in the determination unit 2 begins to measure, and import reference data into judgement data generation unit 3, in addition with shape value, specified scope, determination block number (mensuration number of times), and NG data etc. be sent in the arithmetic element 5, and for the substrate 1 collection frequence required data when forming that distribute.At this moment, determination unit 2 utilizes the indication of control module 8 to be determined as follows, for example, above-mentioned c) a substrate 1 on the number of same shape value be N1, in addition, this mensuration is belonged to the N2 piece substrate 1 of same kind, and measures the data of this N=N1 * N2.
Measure with data generation unit 3 accept from determination unit 2 determination data, and specified measurement range in the reference data of scolding tin position, output and the specified corresponding shape value of shape.For example, if appointment be shaped as volume, area, highly, in the width any one, then calculate the shape value of the absolute value that calculates according to measured value and the ratio between design load, and its shape value after as benchmark is exported, when for skew, highly then export shape value during any one in the inequality with its absolute value representation.
Step S4 (histogram calculation step): histogram calculation unit 5a accepts to judge the shape value that produces with data generation unit 3 that accept the mensuration number of times from this shape value of control module 8 then, the number of times that calculates same shape value distributes.At this moment, the whole number of times that can obtain mensuration times N=N1 * N2 distribute or a certain substrate 1 on the number of times of mensuration times N 1 distribute or the number of times of the mensuration times N 2 of a scolding tin position distribute in any one, perhaps also can obtain all.And, for obtaining the shape value that number of times distributes, also can be for volume, area, highly, in width (above be shape value), skew, highly uneven (above be shape value) as absolute value through benchmark any one or all obtain.
Step S5 (distribution step display): the NG data of input higher limit, lower limit, and indicative control unit 6 is in the given shape value scope of selected shape value, about measuring number of times (number of samples of the shape value of actual measurement), the number of times distribution of (for example shape value scope is 60%～140%, measures number of times to be N time), as shown in Figure 2, be shown in the histogram viewing area 10 (distribution step display) of display unit 7 with pre-prepd form.
Step S6 (upper limit value and lower limit value change (input) step): the operator discerns for higher limit, the lower limit of number of times distribution, mark and the numerical value of volume as shown in Figure 2, and input is from this higher limit, the lower limit of operating unit 9.Also use same procedure for other shape values.
Step S7 (NG leads calculation procedure): NG computing unit 5b, the number of times that is calculated for histogram calculation unit 5a distributes, and after the higher limit imported from operating unit 9 or lower limit compare, distribute for the number of times that is distributed in the zone that exceeds lower limit and higher limit, calculate NG and lead (disqualification rate), utilize indicative control unit 6, as shown in Figure 2 the NG rate score is shown in (NG leads calculation procedure) in the display unit 7.
Step S8, S6, S7, S9 (determining step): the operator for shown NG lead, higher limit, lower limit and number of times distribute and discern, and utilize operating unit 9 pairs of higher limits, lower limits to be changed and carry out above-mentioned steps S6, S7 repeatedly, after becoming suitable higher limit, lower limit, click confirming button (with reference to Fig. 2) and determine.At this moment, above-mentioned steps S6, S7 are almost integratedly and carry out in real time, therefore, the operator can pay close attention to higher limit, lower limit and make its change, thereby know the variation that NG leads, and, directly pay close attention to NG and lead and change higher limit, lower limit (a glance can be understood and whether changes NG and lead.), when becoming suitable NG and lead, read higher limit, lower limit (allowable value distribution range), lead according to NG and obtain upper limit value and lower limit value.
Step S10 (inspection determination step): based on higher limit, the lower limit of fixed allowable value distribution range, utilize allowable value change unit 10, kind, scolding tin position, the shape of setting the substrate that becomes the number of times distribute objects when determining on identifying unit 4 are worth pairing new allowable value.Therefore, after this, identifying unit 4 is after implement measuring again, and on the substrate 1 of the kind of this object, whether after the shape value of this object of the scolding tin position of this object is measured, it is qualified to judge with this new allowable value of determining.
In the above-mentioned explanation, to determining new allowable value and judge that for new mensuration (mensuration that for example is used for this test) this aspect is illustrated based on the number of times distribution of this shape value after the measurements determination according to this allowable value, for example, utilized default value to judge measuring (mensuration of this test) as the inspection object.And, after investigating for 1 group of the substrate of being judged, hope leads (rate that identifying unit 4 is judged to be NG) when more specifically investigating for the specific NG of certain shape value, calculate and show that this number of times distributes, visual its tendency changes higher limit, lower limit and discussion NG and leads, thereby sets suitable allowable value (higher limit, lower limit) once more in the N/R scope on quality, the result of determination that the substrate of to measure, judging in order to revise is 1 group can be used this example.
Utilize Fig. 4 that its example is described.The effect of step S3～S9 among step S24 among Fig. 4～S30 and Fig. 3 is identical, therefore omits explanation.Below, according to Fig. 4, with Fig. 3 difference be that the center describes.
Step S21: for example,, originally measure with original inspection purpose for the substrate that will test.And with the judgement data of trying to achieve after mensuration, the computing, that is, each shape value is stored in the storer, utilizes identifying unit 4 to judge, and display result.
Step S22: the operator investigates whether there is the query point in the result of determination, when need not that details is investigated, when studying, then in time finished to check, if then enter step S24 when being necessary to investigate.
Step S24～S30: the operator specifies and reads in storer with the shape value for the scolding tin position range (measurement range) of hope investigation, shows its histogram, and NG led is obtained suitable higher limit, lower limit after changing.
Step S31: after the investigation, when determining new higher limit, lower limit, judge again by the operation indication, thereby, straight, the lower limit of the upper limit of the shape value of scolding tin position has been specified with identifying unit 4 in allowable value change unit 10 in the specified scope in step S24, change setting is higher limit, the lower limit in the fixed allowable value distribution range.And identifying unit 4 is specified through the scolding tin position in the scope of this appointment from receiving the storer of judging indication again, and accept the shape value, and to comparing through new higher limit, the lower limit of change setting, judge whether qualified after, show and export.
Below, according to Fig. 5 and Fig. 6, other examples (comprising that other make use-case) are described.Lead with allowable value changes except that constituting NG, constitute in other examples, the NG position also changes.Fig. 5 further emphasizes the function square that the part of Fig. 1 constitutes when being other examples of explanation.The content that this is emphasized is for being provided with the NG position specifying unit, reaching the indication for the scolding tin position range that has in judging with memory of data from operating unit 9 in identifying unit 4.Fig. 6 represents its motion flow.Among Fig. 6 with Fig. 3 in the step shown in the identical numbering represent same action.Fig. 7 is the expression example of other examples under the formation of Fig. 5.With Fig. 6 is the center, and based on Fig. 3 difference, below describe for action.
Step S2a (input operation step): for example, specify scolding tin position, the piece number of comprehensive (also can be a part of scope) of substrate 1, and specify a plurality of shape values.
Step S3a (determination step): after the mensuration, judgement is carried out computing with the shape value of 3 pairs of specified locational appointments of scolding tin of data generation unit and is obtained, and is stored in the storer.Identifying unit 4, is judged, is exported as allowable value, and result of determination is shown in indicative control unit 6 for higher limit, the lower limit of acquiescence at each shape value in each scolding tin position.
Step S3b: the scolding tin position (scope) and the shape of specifying the desire investigation to distribute.
Step S4～S7: for specified measurement range and shape value compute histograms and show and distribute, and for higher limit, the lower limit of acquiescence or higher limit, lower limit after changing input, calculate NG and lead and show.
Step S8a: when hope change NG leads, be back to step S6, the operator observes the distribution of display frame, and each mark for expression higher limit, lower limit changes and sets simultaneously.And the NG that obtains the higher limit that changed, lower limit leads and shows.
Step S11: read in the specified scope shape value of appointment in storer, identifying unit 4 will determined higher limit, lower limit be judged to be new allowable value once more in step S8a.
Step 12: identifying unit 4 utilizes the NG position specifying unit, specifies from the scolding tin position of controlling the NG position on the layout of accepting unit 8.Make display unit 9 show above-mentioned specified message by indicative control unit 6.At this moment, indicative control unit 6 can be as shown in the layout ribbon of the layout viewing area 11 of Fig. 7, and the NG position for example, is represented that non-NG represents with white the position in the position (qualified scolding tin position) of identification NG position 15 and non-NG with black.Also can be identified as NG position 15-the NG position or+the NG position, thereby divide into red and yellow respectively and show.
Step S13: the operator when lead with reference to shown NG, when NG position 15 desires of layout change NG and lead (YES), turning back to step S6 changes once more, the then action of implementation step S6～S12 repeatedly, thus can know through after changing the NG of higher limit, lower limit once more lead and layout on the NG position.
Step S14: secondly, when hope leads for different measurement ranges or different shape value investigation NG, turning back to step S3a sets once more, and implementation step S3a～S13 repeatedly, thereby, can obtain through the NG under the condition of the measurement range set once more or shape value etc. lead, NG position on the layout.
Its expression example of expression among Fig. 7.Fig. 7 represent measurement range be gamut, be shaped as volume number of times distribution, higher limit and lower limit, and and this higher limit and lower limit corresponding N G leads and layout on the NG position.As shown in Figure 2, when with measurement range during, can show the NG position in the scope (in the dotted line of Fig. 2) of this appointment as " scope appointment ".
Claims (5)
1. print solder checker comprises: determination unit (2), in order to the displacement that is printed in a plurality of scolding tin on the printed panel is measured; Histogram calculation unit (5a) is obtained it at the judgement of one or more kind of trying to achieve as shape according to the measured value of said determination unit output and with the state of above-mentioned scolding tin with in the shape each and is judged number of times distribution with the shape value; NG leads computing unit (5b), according to distribute distribution range with the acceptable ranges of the above-mentioned printed scolding tin shape of expression of the above-mentioned number of times of being tried to achieve, and calculates the disqualification rate of above-mentioned printed scolding tin shape and at least one in the qualification rate; Operating unit (9); Display unit (7); And indicative control unit (6), disqualification rate or qualification rate that aforementioned calculation is gone out are shown in above-mentioned display unit, it is characterized in that:
Indicate for the above-mentioned distribution range of representing with higher limit and lower limit the aforesaid operations unit,
Above-mentioned NG leads computing unit when the Newest Directive that above-mentioned distribution range is arranged, and higher limit and lower limit and the distribution of above-mentioned number of times according to this Newest Directive indication recalculate at least one in disqualification rate and the qualification rate,
Above-mentioned indicative control unit shows that above-mentioned number of times distributes, and, will be in the above-mentioned higher limit and the pairing position of lower limit that are shown in before this Newest Directive in the above-mentioned number of times distribution, change to by the position corresponding of this Newest Directive indication and show with above-mentioned higher limit and lower limit, and will be shown in the disqualification rate of above-mentioned display unit before the above-mentioned the Newest Directive and at least one in the qualification rate changes, and show disqualification rate or the qualification rate that recalculates.
2. print solder checker according to claim 1 is characterized in that:
The aforesaid operations unit further changes and indicates the disqualification rate that shows in the above-mentioned display unit and at least one in the qualification rate,
Above-mentioned NG leads computing unit when having from the change disqualification rate of aforesaid operations unit and at least one the indication in the qualification rate, go out based on the disqualification rate of this indication and at least one higher limit and the lower limit in the qualification rate according to above-mentioned number of times Distribution calculation
Above-mentioned indicative control unit will be shown in above-mentioned display unit before above-mentioned change indication higher limit and lower limit change to above-mentioned higher limit that recalculates and lower limit, and above-mentioned distribution range is shown in the position of the number of times corresponding with above-mentioned higher limit that recalculates and lower limit on distributing.
3. print solder checker according to claim 1 is characterized in that comprising:
Judge with data generation units (3), accept the measured value of said determination unit, and obtain the locational judgement of each above-mentioned print solder shape value; And
Identifying unit (4) according to based on the higher limit of this Newest Directive indication and the new allowable value of lower limit, judges whether the judgement that this judgement on above-mentioned each print solder position exported with the data generation unit is qualified with the shape value.
4. print solder checker according to claim 2 is characterized in that comprising:
Judge with data generation units (3), accept the measured value of said determination unit, and obtain the locational judgement of each above-mentioned print solder shape value; And
Identifying unit (4) according to based on led the higher limit that computing unit calculates again and the new allowable value of lower limit by above-mentioned NG, judges whether the judgement that this judgement on above-mentioned each print solder position exported with the data generation unit is qualified with the shape value.
5. according to claim 3 or 4 described print solder checkers, it is characterized in that: above-mentioned indicative control unit makes above-mentioned display unit show the layout of the scolding tin position of the above-mentioned printed base plate of expression, and shows that in discernible mode above-mentioned identifying unit is judged to be underproof position on the layout of this demonstration.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005167287A JP4694272B2 (en) | 2005-06-07 | 2005-06-07 | Printed solder inspection apparatus and printed solder inspection method |
| JP2005167287 | 2005-06-07 | ||
| JP2005-167287 | 2005-06-07 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1877251A CN1877251A (en) | 2006-12-13 |
| CN100432622C true CN100432622C (en) | 2008-11-12 |
Family
ID=37509750
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2006100831759A Expired - Fee Related CN100432622C (en) | 2005-06-07 | 2006-06-07 | Printing solder detecting device |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP4694272B2 (en) |
| KR (1) | KR100728457B1 (en) |
| CN (1) | CN100432622C (en) |
| HK (1) | HK1097901A1 (en) |
| TW (1) | TWI320098B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI465715B (en) * | 2012-01-03 | 2014-12-21 | Zhen Ding Technology Co Ltd | Method for testing the solder in through hole of printed circuit board |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5411439B2 (en) * | 2008-03-19 | 2014-02-12 | アンリツ株式会社 | Printed solder inspection equipment |
| CN101583249A (en) * | 2008-05-15 | 2009-11-18 | 松下电器产业株式会社 | Method of inspecting solder paste for printing and a device thereof |
| JP5182122B2 (en) | 2009-01-27 | 2013-04-10 | オムロン株式会社 | Information display system and information display method for quality control of component mounting board |
| JP5353790B2 (en) * | 2010-03-30 | 2013-11-27 | コニカミノルタ株式会社 | Biological information measuring apparatus and method |
| EP2573508B1 (en) * | 2011-03-14 | 2014-01-29 | Panasonic Corporation | Solder height detection method and solder height detection device |
| JP5418542B2 (en) * | 2011-06-14 | 2014-02-19 | パナソニック株式会社 | Display device and display method of print state measurement result |
| JP5907429B2 (en) * | 2012-07-24 | 2016-04-26 | 日本電気硝子株式会社 | Plate-like warpage inspection apparatus and warpage inspection method thereof |
| KR20180054063A (en) * | 2016-11-14 | 2018-05-24 | 주식회사 고영테크놀러지 | Method and apparatus for adjusting condition of quality decision for inspection target |
| JP2018112533A (en) * | 2017-01-13 | 2018-07-19 | キヤノン株式会社 | Measuring device, information processing apparatus, information processing method, and program |
| JP2019152486A (en) * | 2018-03-01 | 2019-09-12 | 株式会社東京精密 | Method and device for correcting design tolerance |
| CN109000560B (en) * | 2018-06-11 | 2021-07-06 | 广东工业大学 | Method, device and equipment for detecting package size based on three-dimensional camera |
| CN109444587B (en) * | 2018-11-15 | 2020-10-16 | 国网江苏省电力有限公司电力科学研究院 | Method and system for calculating reliability of uninterrupted power supply detection technology based on frequency distribution |
| CN111421954B (en) * | 2019-01-10 | 2022-02-18 | 鸿富锦精密电子(天津)有限公司 | Intelligent judgment feedback method and device |
| US20230204352A1 (en) * | 2020-05-04 | 2023-06-29 | Asml Netherlands B.V. | System and method for generating level data for a surface of a substrate |
| CN111660674A (en) * | 2020-06-15 | 2020-09-15 | 蔡怀峰 | Ink box head plate-matching device |
| CN111645424A (en) * | 2020-06-15 | 2020-09-11 | 蔡怀峰 | Method for assembling ink box head |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1055997A (en) * | 1990-04-25 | 1991-11-06 | 哈尔滨工业大学 | Printed circuit board solder joint laser hologram detection method and device |
| US5178965A (en) * | 1992-02-14 | 1993-01-12 | Rockwell International Corporation | Uniform solder coating on roughened substrate |
| JPH0658736A (en) * | 1992-08-07 | 1994-03-04 | Matsushita Electric Ind Co Ltd | Method and device for three dimensional shape inspection |
| JP2002368412A (en) * | 2001-06-04 | 2002-12-20 | Ibiden Co Ltd | Method for inspecting printed wiring board |
| JP2005135954A (en) * | 2003-10-28 | 2005-05-26 | Matsushita Electric Ind Co Ltd | Printed circuit board inspection device |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63196980A (en) | 1987-02-10 | 1988-08-15 | Toshiba Corp | Device for inspecting soldering external appearance for printed circuit board |
| JPH0612377A (en) * | 1992-06-29 | 1994-01-21 | Sharp Corp | Small-sized electronic computer with process capacity index calculating function |
| JP3033413B2 (en) * | 1992-12-11 | 2000-04-17 | トヨタ自動車株式会社 | Soldering inspection equipment |
| JP3250309B2 (en) * | 1993-03-02 | 2002-01-28 | オムロン株式会社 | Teaching method of mounted part inspection data |
| JPH0765968B2 (en) * | 1993-04-02 | 1995-07-19 | 日本電気株式会社 | Mounted board inspection device |
| KR100261970B1 (en) * | 1994-04-08 | 2000-07-15 | 이헌일 | Soldering status checking device and its method using x-ray |
| JPH11298200A (en) * | 1998-04-10 | 1999-10-29 | Nagoya Denki Kogyo Kk | Method and apparatus for automatic quality control in process of mounting components on printed board |
| JP2001109733A (en) * | 1999-10-12 | 2001-04-20 | Hitachi Ltd | Method for evaluating identification model and method for adjusting threshold |
-
2005
- 2005-06-07 JP JP2005167287A patent/JP4694272B2/en not_active Expired - Fee Related
-
2006
- 2006-06-01 KR KR1020060049338A patent/KR100728457B1/en not_active IP Right Cessation
- 2006-06-07 CN CNB2006100831759A patent/CN100432622C/en not_active Expired - Fee Related
- 2006-06-07 TW TW095120180A patent/TWI320098B/en not_active IP Right Cessation
-
2007
- 2007-04-20 HK HK07104152.9A patent/HK1097901A1/en not_active IP Right Cessation
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1055997A (en) * | 1990-04-25 | 1991-11-06 | 哈尔滨工业大学 | Printed circuit board solder joint laser hologram detection method and device |
| US5178965A (en) * | 1992-02-14 | 1993-01-12 | Rockwell International Corporation | Uniform solder coating on roughened substrate |
| JPH0658736A (en) * | 1992-08-07 | 1994-03-04 | Matsushita Electric Ind Co Ltd | Method and device for three dimensional shape inspection |
| JP2002368412A (en) * | 2001-06-04 | 2002-12-20 | Ibiden Co Ltd | Method for inspecting printed wiring board |
| JP2005135954A (en) * | 2003-10-28 | 2005-05-26 | Matsushita Electric Ind Co Ltd | Printed circuit board inspection device |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI465715B (en) * | 2012-01-03 | 2014-12-21 | Zhen Ding Technology Co Ltd | Method for testing the solder in through hole of printed circuit board |
Also Published As
| Publication number | Publication date |
|---|---|
| KR100728457B1 (en) | 2007-06-13 |
| HK1097901A1 (en) | 2007-07-06 |
| TW200643405A (en) | 2006-12-16 |
| TWI320098B (en) | 2010-02-01 |
| KR20060127753A (en) | 2006-12-13 |
| JP4694272B2 (en) | 2011-06-08 |
| CN1877251A (en) | 2006-12-13 |
| JP2006343152A (en) | 2006-12-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN100432622C (en) | Printing solder detecting device | |
| KR101189911B1 (en) | Deciding method of the suitability of determining standard values and appropriate value of the same, inspection system of part mounting substrate, simulation method at production line and simulation system | |
| CN1862259B (en) | Inspection standard setting device and method, and process inspection device | |
| CN104685429B (en) | Production line monitoring arrangement | |
| US8421803B2 (en) | Information display system and information display method for quality control of component-mounted substrate | |
| CN103369952B (en) | The analysis Work support information display system of inspecting substrate result and support method | |
| US6026351A (en) | Method and apparatus for measuring the dimensions of sheet metal parts, and a sheet metal processing system which utilizes such measuring method and apparatus | |
| JP2019125694A (en) | Inspection management system, inspection management device, inspection management method | |
| CN102879646B (en) | Base plate inspection device and base plate inspection method | |
| JP4553817B2 (en) | Board inspection equipment | |
| JP5958160B2 (en) | Inspection standard information setting method and inspection standard information creation system for component mounting inspection | |
| JP2004235314A (en) | Measured result display system and measured result display method for printed circuit board | |
| CN110261792A (en) | DC power supply detection method, device, test terminal and readable storage medium storing program for executing | |
| JP3708570B2 (en) | Non-defective product identification method for semiconductor elements | |
| KR200386330Y1 (en) | System for testing a electronic scales using vision system | |
| JPH10315436A (en) | Apparatus for quality control of printed matter | |
| JP6727981B2 (en) | Measurement result notification device, measurement system, and measurement result notification method | |
| JP6679394B2 (en) | Measurement result notification device, measurement system, and measurement result notification method | |
| JP6727888B2 (en) | Measurement result notification device, measurement system, and measurement result notification method | |
| WO2023189220A1 (en) | Inspection management system and inspection management device | |
| WO2022196003A1 (en) | Quality evaluation device and inspection management system | |
| CN116783563A (en) | Inspection management system, inspection management device, inspection management method, and program | |
| JP5418542B2 (en) | Display device and display method of print state measurement result | |
| KR100690180B1 (en) | Method for detecting molding and chip attching state | |
| JP2010039581A (en) | Quality inspection device, quality inspection system, qualification inspection method, computer program and recording medium |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| REG | Reference to a national code |
Ref country code: HK Ref legal event code: DE Ref document number: 1097901 Country of ref document: HK |
|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| REG | Reference to a national code |
Ref country code: HK Ref legal event code: GR Ref document number: 1097901 Country of ref document: HK |
|
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20081112 Termination date: 20150607 |
|
| EXPY | Termination of patent right or utility model |