CN100426479C - 搭接方法及其搭接装置 - Google Patents
搭接方法及其搭接装置 Download PDFInfo
- Publication number
- CN100426479C CN100426479C CNB2004100858875A CN200410085887A CN100426479C CN 100426479 C CN100426479 C CN 100426479C CN B2004100858875 A CNB2004100858875 A CN B2004100858875A CN 200410085887 A CN200410085887 A CN 200410085887A CN 100426479 C CN100426479 C CN 100426479C
- Authority
- CN
- China
- Prior art keywords
- substrate
- resin
- heater
- installation component
- installation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims abstract description 42
- 239000000758 substrate Substances 0.000 claims abstract description 198
- 239000011347 resin Substances 0.000 claims abstract description 68
- 229920005989 resin Polymers 0.000 claims abstract description 68
- 239000011521 glass Substances 0.000 claims description 77
- 238000009434 installation Methods 0.000 claims description 67
- 239000013536 elastomeric material Substances 0.000 claims description 33
- 238000010438 heat treatment Methods 0.000 claims description 27
- 229910052751 metal Inorganic materials 0.000 claims description 24
- 239000002184 metal Substances 0.000 claims description 24
- 238000001816 cooling Methods 0.000 claims description 22
- 230000005855 radiation Effects 0.000 claims description 17
- 230000009477 glass transition Effects 0.000 claims description 9
- 230000008569 process Effects 0.000 claims description 9
- 238000009413 insulation Methods 0.000 claims description 7
- 239000002245 particle Substances 0.000 claims description 7
- 238000012423 maintenance Methods 0.000 claims description 6
- 239000004411 aluminium Substances 0.000 claims description 5
- 229910052782 aluminium Inorganic materials 0.000 claims description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 5
- 238000007664 blowing Methods 0.000 claims description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 4
- 239000010931 gold Substances 0.000 claims description 4
- 229910052737 gold Inorganic materials 0.000 claims description 4
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052804 chromium Inorganic materials 0.000 claims description 3
- 239000011651 chromium Substances 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- 230000003760 hair shine Effects 0.000 claims description 2
- 230000008646 thermal stress Effects 0.000 abstract description 5
- 238000007906 compression Methods 0.000 description 10
- 230000006835 compression Effects 0.000 description 9
- 238000002788 crimping Methods 0.000 description 9
- 238000010276 construction Methods 0.000 description 6
- 238000012546 transfer Methods 0.000 description 6
- 230000007246 mechanism Effects 0.000 description 5
- 230000001105 regulatory effect Effects 0.000 description 4
- 208000034189 Sclerosis Diseases 0.000 description 3
- 238000001704 evaporation Methods 0.000 description 3
- 230000008020 evaporation Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000033228 biological regulation Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 239000002826 coolant Substances 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005401 electroluminescence Methods 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 230000007723 transport mechanism Effects 0.000 description 2
- 229910052727 yttrium Inorganic materials 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000002745 absorbent Effects 0.000 description 1
- 239000002250 absorbent Substances 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000000637 aluminium metallisation Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 230000008719 thickening Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/7525—Means for applying energy, e.g. heating means
- H01L2224/753—Means for applying energy, e.g. heating means by means of pressure
- H01L2224/75301—Bonding head
- H01L2224/75314—Auxiliary members on the pressing surface
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/7525—Means for applying energy, e.g. heating means
- H01L2224/753—Means for applying energy, e.g. heating means by means of pressure
- H01L2224/75301—Bonding head
- H01L2224/75314—Auxiliary members on the pressing surface
- H01L2224/75315—Elastomer inlay
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/7525—Means for applying energy, e.g. heating means
- H01L2224/753—Means for applying energy, e.g. heating means by means of pressure
- H01L2224/75301—Bonding head
- H01L2224/75314—Auxiliary members on the pressing surface
- H01L2224/75317—Removable auxiliary member
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/7598—Apparatus for connecting with bump connectors or layer connectors specially adapted for batch processes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/81001—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector involving a temporary auxiliary member not forming part of the bonding apparatus
- H01L2224/81005—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector involving a temporary auxiliary member not forming part of the bonding apparatus being a temporary or sacrificial substrate
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003-378048 | 2003-11-07 | ||
JP2003378048 | 2003-11-07 | ||
JP2003378048A JP4001341B2 (ja) | 2003-11-07 | 2003-11-07 | ボンディング方法およびその装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1614760A CN1614760A (zh) | 2005-05-11 |
CN100426479C true CN100426479C (zh) | 2008-10-15 |
Family
ID=34688561
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004100858875A Expired - Fee Related CN100426479C (zh) | 2003-11-07 | 2004-11-05 | 搭接方法及其搭接装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4001341B2 (ja) |
KR (1) | KR101189290B1 (ja) |
CN (1) | CN100426479C (ja) |
TW (1) | TWI373078B (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4687273B2 (ja) * | 2005-06-23 | 2011-05-25 | 住友電気工業株式会社 | 電子部品の実装方法 |
JP4872291B2 (ja) * | 2005-09-27 | 2012-02-08 | 住友電気工業株式会社 | 電極接続方法、電極接続装置、および配線板接合体の製造方法 |
KR100691810B1 (ko) | 2006-02-17 | 2007-03-12 | 주식회사 나래나노텍 | 개선된 패턴 전극 본딩 장치 |
KR100734422B1 (ko) * | 2006-03-08 | 2007-07-03 | 삼성전자주식회사 | 엘씨디용 본딩장치 |
CN102057475B (zh) * | 2008-06-05 | 2013-01-02 | 住友电木株式会社 | 半导体装置的制造方法以及半导体装置 |
CN102204419A (zh) * | 2008-10-31 | 2011-09-28 | 东丽株式会社 | 电子部件和挠性薄膜基板的接合方法及接合装置 |
KR101119541B1 (ko) * | 2009-11-30 | 2012-02-22 | (주)멜파스 | Acf본딩을 위한 압착 장치 및 상기 압착 장치의 동작 방법 |
JP2011199184A (ja) * | 2010-03-23 | 2011-10-06 | Fujifilm Corp | 基板実装装置及び基板実装方法 |
US20160059201A1 (en) * | 2013-03-15 | 2016-03-03 | Nikon Corporation | Biochip fixing method, biochip fixing device, and screening method for biomolecule array |
TWI692044B (zh) * | 2017-05-29 | 2020-04-21 | 日商新川股份有限公司 | 封裝裝置以及半導體裝置的製造方法 |
CN108475484B (zh) * | 2017-06-22 | 2022-02-15 | 深圳市柔宇科技股份有限公司 | 承载装置和压合设备 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6444918A (en) * | 1987-08-13 | 1989-02-17 | Konishiroku Photo Ind | Production of liquid crystal display device |
JPH07130795A (ja) * | 1993-11-04 | 1995-05-19 | Matsushita Electric Ind Co Ltd | 半導体素子接続方法および半導体素子接続装置 |
JPH09297318A (ja) * | 1996-03-06 | 1997-11-18 | Seiko Epson Corp | 液晶装置、液晶装置の製造方法および電子機器 |
CN1295265A (zh) * | 1999-11-04 | 2001-05-16 | 精工爱普生株式会社 | 部件安装方法和电光装置的制造方法 |
JP2003303853A (ja) * | 2002-02-05 | 2003-10-24 | Toray Eng Co Ltd | チップ実装方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003303851A (ja) * | 2002-02-05 | 2003-10-24 | Toray Eng Co Ltd | チップ実装方法およびそれを用いた装置 |
-
2003
- 2003-11-07 JP JP2003378048A patent/JP4001341B2/ja not_active Expired - Fee Related
-
2004
- 2004-11-01 TW TW093133160A patent/TWI373078B/zh not_active IP Right Cessation
- 2004-11-04 KR KR1020040089197A patent/KR101189290B1/ko not_active IP Right Cessation
- 2004-11-05 CN CNB2004100858875A patent/CN100426479C/zh not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6444918A (en) * | 1987-08-13 | 1989-02-17 | Konishiroku Photo Ind | Production of liquid crystal display device |
JPH07130795A (ja) * | 1993-11-04 | 1995-05-19 | Matsushita Electric Ind Co Ltd | 半導体素子接続方法および半導体素子接続装置 |
JPH09297318A (ja) * | 1996-03-06 | 1997-11-18 | Seiko Epson Corp | 液晶装置、液晶装置の製造方法および電子機器 |
CN1295265A (zh) * | 1999-11-04 | 2001-05-16 | 精工爱普生株式会社 | 部件安装方法和电光装置的制造方法 |
JP2003303853A (ja) * | 2002-02-05 | 2003-10-24 | Toray Eng Co Ltd | チップ実装方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20050044257A (ko) | 2005-05-12 |
CN1614760A (zh) | 2005-05-11 |
TWI373078B (en) | 2012-09-21 |
KR101189290B1 (ko) | 2012-10-15 |
JP2005142397A (ja) | 2005-06-02 |
JP4001341B2 (ja) | 2007-10-31 |
TW200522238A (en) | 2005-07-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C56 | Change in the name or address of the patentee | ||
CP03 | Change of name, title or address |
Address after: Kanagawa Patentee after: Japanese Innolux Limited by Share Ltd of Japan Patentee after: Tourara Engineering Co., Ltd. Address before: Tokyo, Japan, Japan Patentee before: International Display Technology Co., Ltd. Patentee before: Tourara Engineering Co., Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20081015 Termination date: 20161105 |