CN100386898C - 导电和绝缘准氧化锌衬底及垂直结构的半导体发光二极管 - Google Patents
导电和绝缘准氧化锌衬底及垂直结构的半导体发光二极管 Download PDFInfo
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- CN100386898C CN100386898C CNB2005100797077A CN200510079707A CN100386898C CN 100386898 C CN100386898 C CN 100386898C CN B2005100797077 A CNB2005100797077 A CN B2005100797077A CN 200510079707 A CN200510079707 A CN 200510079707A CN 100386898 C CN100386898 C CN 100386898C
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- zinc oxide
- conductive
- growth substrate
- intermediate medium
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- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 title claims abstract description 457
- 239000011787 zinc oxide Substances 0.000 title claims abstract description 268
- 239000004065 semiconductor Substances 0.000 title abstract description 15
- 239000000758 substrate Substances 0.000 claims abstract description 188
- 238000000034 method Methods 0.000 claims abstract description 107
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 101
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 99
- 239000010703 silicon Substances 0.000 claims abstract description 99
- 229910002601 GaN Inorganic materials 0.000 claims abstract description 83
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims abstract description 83
- 229910052594 sapphire Inorganic materials 0.000 claims abstract description 52
- 239000010980 sapphire Substances 0.000 claims abstract description 52
- 238000005516 engineering process Methods 0.000 claims abstract description 6
- 229910052751 metal Inorganic materials 0.000 claims description 95
- 239000002184 metal Substances 0.000 claims description 95
- 235000012431 wafers Nutrition 0.000 claims description 91
- 239000005083 Zinc sulfide Substances 0.000 claims description 70
- DRDVZXDWVBGGMH-UHFFFAOYSA-N zinc;sulfide Chemical compound [S-2].[Zn+2] DRDVZXDWVBGGMH-UHFFFAOYSA-N 0.000 claims description 67
- 229910052984 zinc sulfide Inorganic materials 0.000 claims description 58
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 33
- 239000000463 material Substances 0.000 claims description 31
- 238000002844 melting Methods 0.000 claims description 22
- 230000008018 melting Effects 0.000 claims description 21
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 20
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 16
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 16
- 229910052796 boron Inorganic materials 0.000 claims description 16
- 238000010030 laminating Methods 0.000 claims description 16
- 238000004544 sputter deposition Methods 0.000 claims description 14
- -1 boron aluminum nitrogen Chemical compound 0.000 claims description 13
- 229910052760 oxygen Inorganic materials 0.000 claims description 13
- 239000001301 oxygen Substances 0.000 claims description 13
- 229910052757 nitrogen Inorganic materials 0.000 claims description 11
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 10
- 238000005530 etching Methods 0.000 claims description 10
- 238000004519 manufacturing process Methods 0.000 claims description 10
- 229910052725 zinc Inorganic materials 0.000 claims description 10
- 239000011701 zinc Substances 0.000 claims description 10
- 229910052735 hafnium Inorganic materials 0.000 claims description 9
- 238000003475 lamination Methods 0.000 claims description 9
- 150000004767 nitrides Chemical class 0.000 claims description 9
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 8
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 claims description 8
- 229910052719 titanium Inorganic materials 0.000 claims description 8
- 239000010936 titanium Substances 0.000 claims description 8
- 238000007738 vacuum evaporation Methods 0.000 claims description 8
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 7
- 238000005229 chemical vapour deposition Methods 0.000 claims description 7
- 229910052733 gallium Inorganic materials 0.000 claims description 7
- 238000000227 grinding Methods 0.000 claims description 7
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims description 6
- 229910052782 aluminium Inorganic materials 0.000 claims description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 6
- 150000002739 metals Chemical class 0.000 claims description 6
- 229910052726 zirconium Inorganic materials 0.000 claims description 6
- ZVWKZXLXHLZXLS-UHFFFAOYSA-N zirconium nitride Chemical compound [Zr]#N ZVWKZXLXHLZXLS-UHFFFAOYSA-N 0.000 claims description 6
- 239000000919 ceramic Substances 0.000 claims description 5
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical group [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 claims description 5
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 4
- 229910002056 binary alloy Inorganic materials 0.000 claims description 4
- 229910052804 chromium Inorganic materials 0.000 claims description 4
- 239000011651 chromium Substances 0.000 claims description 4
- 238000009713 electroplating Methods 0.000 claims description 4
- 229910052706 scandium Inorganic materials 0.000 claims description 4
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 claims description 4
- 229910052716 thallium Inorganic materials 0.000 claims description 4
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 claims description 4
- 229910052720 vanadium Inorganic materials 0.000 claims description 4
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 claims description 4
- 229910052727 yttrium Inorganic materials 0.000 claims description 4
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 claims description 4
- 238000005498 polishing Methods 0.000 claims description 3
- 229910052755 nonmetal Inorganic materials 0.000 claims description 2
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims 1
- 229910000831 Steel Inorganic materials 0.000 claims 1
- 229910052749 magnesium Inorganic materials 0.000 claims 1
- 239000011777 magnesium Substances 0.000 claims 1
- 238000007747 plating Methods 0.000 claims 1
- 238000000926 separation method Methods 0.000 claims 1
- 239000010959 steel Substances 0.000 claims 1
- 239000000126 substance Substances 0.000 claims 1
- 230000007547 defect Effects 0.000 abstract description 3
- 239000010410 layer Substances 0.000 description 427
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 16
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 14
- 239000010931 gold Substances 0.000 description 13
- HQWPLXHWEZZGKY-UHFFFAOYSA-N diethylzinc Chemical compound CC[Zn]CC HQWPLXHWEZZGKY-UHFFFAOYSA-N 0.000 description 10
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 9
- 229910052737 gold Inorganic materials 0.000 description 9
- 238000009826 distribution Methods 0.000 description 8
- 239000002344 surface layer Substances 0.000 description 7
- 239000010409 thin film Substances 0.000 description 7
- 239000013078 crystal Substances 0.000 description 6
- 238000009792 diffusion process Methods 0.000 description 6
- 238000010438 heat treatment Methods 0.000 description 6
- 229910052759 nickel Inorganic materials 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 229910052763 palladium Inorganic materials 0.000 description 5
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 5
- 239000010408 film Substances 0.000 description 4
- 229910052738 indium Inorganic materials 0.000 description 4
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 238000004549 pulsed laser deposition Methods 0.000 description 4
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 3
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 3
- FGUJWQZQKHUJMW-UHFFFAOYSA-N [AlH3].[B] Chemical compound [AlH3].[B] FGUJWQZQKHUJMW-UHFFFAOYSA-N 0.000 description 3
- 238000000231 atomic layer deposition Methods 0.000 description 3
- 238000001312 dry etching Methods 0.000 description 3
- 238000007772 electroless plating Methods 0.000 description 3
- 238000001451 molecular beam epitaxy Methods 0.000 description 3
- 239000002096 quantum dot Substances 0.000 description 3
- 229910052717 sulfur Inorganic materials 0.000 description 3
- 239000011593 sulfur Substances 0.000 description 3
- 229910052718 tin Inorganic materials 0.000 description 3
- JLTRXTDYQLMHGR-UHFFFAOYSA-N trimethylaluminium Chemical compound C[Al](C)C JLTRXTDYQLMHGR-UHFFFAOYSA-N 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 230000017525 heat dissipation Effects 0.000 description 2
- 238000001755 magnetron sputter deposition Methods 0.000 description 2
- 239000000155 melt Substances 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 238000002310 reflectometry Methods 0.000 description 2
- 239000003870 refractory metal Substances 0.000 description 2
- 229910052703 rhodium Inorganic materials 0.000 description 2
- 239000010948 rhodium Substances 0.000 description 2
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 2
- PMTRSEDNJGMXLN-UHFFFAOYSA-N titanium zirconium Chemical compound [Ti].[Zr] PMTRSEDNJGMXLN-UHFFFAOYSA-N 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000010923 batch production Methods 0.000 description 1
- 239000013590 bulk material Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000001017 electron-beam sputter deposition Methods 0.000 description 1
- 238000000313 electron-beam-induced deposition Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000007669 thermal treatment Methods 0.000 description 1
- 238000003631 wet chemical etching Methods 0.000 description 1
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- Led Devices (AREA)
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CNB2005100797077A CN100386898C (zh) | 2005-06-27 | 2005-06-27 | 导电和绝缘准氧化锌衬底及垂直结构的半导体发光二极管 |
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CNB2005100797077A CN100386898C (zh) | 2005-06-27 | 2005-06-27 | 导电和绝缘准氧化锌衬底及垂直结构的半导体发光二极管 |
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CN1722482A CN1722482A (zh) | 2006-01-18 |
CN100386898C true CN100386898C (zh) | 2008-05-07 |
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Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
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EP2016614A4 (en) * | 2006-04-25 | 2014-04-09 | Univ Singapore | METHOD OF A ZINC OXIDE FILM GROWN ON THE EPITAXIAL LATERAL AGGREGATE GALLIUM NITRIDE ORIGIN |
CN100546017C (zh) * | 2006-12-28 | 2009-09-30 | 中国科学院半导体研究所 | 一种用于氧化锌外延薄膜生长的硅基可协变衬底材料 |
CN101299448B (zh) * | 2008-06-20 | 2010-10-06 | 华南师范大学 | 一种垂直栅极结构的发光晶体管及其制备方法 |
CN102456721A (zh) * | 2010-10-17 | 2012-05-16 | 金木子 | 陶瓷衬底的氮化镓基芯片及制造方法 |
CN102208502B (zh) * | 2011-06-09 | 2012-12-12 | 中国科学院半导体研究所 | 氮化镓基垂直结构发光二极管隐形电极的制作方法 |
CN102664224A (zh) * | 2012-05-25 | 2012-09-12 | 厦门乾照光电股份有限公司 | 一种具有双外延结构的AlGaInP系的发光二极管 |
CN113394306B (zh) * | 2021-05-18 | 2022-09-27 | 浙江大学 | 一种基于石墨烯的可重复使用ZnO单晶衬底及制备ZnO薄膜的方法 |
CN115663020A (zh) * | 2022-12-19 | 2023-01-31 | 徐州金沙江半导体有限公司 | 一种基于硅衬底的GaN HEMT外延结构 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000091628A (ja) * | 1998-09-09 | 2000-03-31 | Murata Mfg Co Ltd | 半導体発光素子 |
US6045626A (en) * | 1997-07-11 | 2000-04-04 | Tdk Corporation | Substrate structures for electronic devices |
WO2004077579A1 (ja) * | 2003-02-28 | 2004-09-10 | Shin-Etsu Handotai Co.,Ltd. | 発光素子及び発光素子の製造方法 |
JP2004342732A (ja) * | 2003-05-14 | 2004-12-02 | Sharp Corp | 酸化物半導体発光素子 |
JP2004349584A (ja) * | 2003-05-23 | 2004-12-09 | Sharp Corp | 酸化物半導体発光素子 |
CN1630111A (zh) * | 2004-06-05 | 2005-06-22 | 金芃 | 垂直结构的半导体芯片或器件(包括高亮度led)及其批量生产方法 |
-
2005
- 2005-06-27 CN CNB2005100797077A patent/CN100386898C/zh not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6045626A (en) * | 1997-07-11 | 2000-04-04 | Tdk Corporation | Substrate structures for electronic devices |
JP2000091628A (ja) * | 1998-09-09 | 2000-03-31 | Murata Mfg Co Ltd | 半導体発光素子 |
WO2004077579A1 (ja) * | 2003-02-28 | 2004-09-10 | Shin-Etsu Handotai Co.,Ltd. | 発光素子及び発光素子の製造方法 |
JP2004342732A (ja) * | 2003-05-14 | 2004-12-02 | Sharp Corp | 酸化物半導体発光素子 |
JP2004349584A (ja) * | 2003-05-23 | 2004-12-09 | Sharp Corp | 酸化物半導体発光素子 |
CN1630111A (zh) * | 2004-06-05 | 2005-06-22 | 金芃 | 垂直结构的半导体芯片或器件(包括高亮度led)及其批量生产方法 |
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