CN100353188C - 用于施加光学梯度力的改进的设备、系统和方法 - Google Patents

用于施加光学梯度力的改进的设备、系统和方法 Download PDF

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Publication number
CN100353188C
CN100353188C CNB028099915A CN02809991A CN100353188C CN 100353188 C CN100353188 C CN 100353188C CN B028099915 A CNB028099915 A CN B028099915A CN 02809991 A CN02809991 A CN 02809991A CN 100353188 C CN100353188 C CN 100353188C
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China
Prior art keywords
optical element
optical
phase pattern
lens
optics
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Expired - Fee Related
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CNB028099915A
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English (en)
Chinese (zh)
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CN1509415A (zh
Inventor
戴维·格里尔
沃德·洛佩斯
埃里克·迪弗雷纳
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Arryx Inc
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Arryx Inc
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/32—Micromanipulators structurally combined with microscopes

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
  • Manipulator (AREA)
  • Micromachines (AREA)
  • Microscoopes, Condenser (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
CNB028099915A 2001-05-14 2002-05-14 用于施加光学梯度力的改进的设备、系统和方法 Expired - Fee Related CN100353188C (zh)

Applications Claiming Priority (2)

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US85599501A 2001-05-14 2001-05-14
US09/855,995 2001-05-14

Publications (2)

Publication Number Publication Date
CN1509415A CN1509415A (zh) 2004-06-30
CN100353188C true CN100353188C (zh) 2007-12-05

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CNB028099915A Expired - Fee Related CN100353188C (zh) 2001-05-14 2002-05-14 用于施加光学梯度力的改进的设备、系统和方法

Country Status (5)

Country Link
EP (1) EP1395856A4 (fr)
JP (2) JP2004534661A (fr)
CN (1) CN100353188C (fr)
CA (1) CA2447472A1 (fr)
WO (1) WO2002093202A2 (fr)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2481927A1 (fr) * 2002-04-10 2003-10-23 Arryx, Inc. Dispositif et procede destines a produire et commander des pieges optiques pour la manipulation de petites particules
JP5046645B2 (ja) * 2003-09-04 2012-10-10 アリックス インコーポレイテッド 血液や細胞等の液体混合物を構成成分に分離する方法、装置およびシステム。
GB0416498D0 (en) 2004-07-23 2004-08-25 Council Cent Lab Res Councils Optically controllable device
WO2007038260A2 (fr) * 2005-09-23 2007-04-05 Massachusetts Institute Of Technology Systemes et procedes de microscopie a force atomique et fluorescence
JP5686408B2 (ja) * 2011-01-31 2015-03-18 独立行政法人産業技術総合研究所 微粒子のアレイ化法および装置
CN102240848B (zh) * 2011-06-15 2013-10-23 中科中涵激光设备（福建）股份有限公司 一种调节激光束产生动态横向位移的方法
JP2013098262A (ja) * 2011-10-28 2013-05-20 Canon Inc 光学装置、位置検出装置及び顕微鏡装置
JP5979536B2 (ja) * 2012-05-09 2016-08-24 国立研究開発法人産業技術総合研究所 微小物の３次元操作装置
JP6881600B2 (ja) 2017-12-15 2021-06-02 日本電気株式会社 投射装置、インターフェース装置および投射方法
CN110471187B (zh) * 2019-08-20 2021-07-30 济南大学 产生呈六角密排分布的三维阵列瓶状光束的装置与方法
CN117111163B (zh) * 2023-08-07 2024-08-02 之江实验室 重力测量装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5445011A (en) * 1993-09-21 1995-08-29 Ghislain; Lucien P. Scanning force microscope using an optical trap
US5717667A (en) * 1993-11-11 1998-02-10 Sony Corporation Optical pickup apparatus including an optical rotation device
US5939716A (en) * 1997-04-02 1999-08-17 Sandia Corporation Three-dimensional light trap for reflective particles
US6055106A (en) * 1998-02-03 2000-04-25 Arch Development Corporation Apparatus for applying optical gradient forces

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4487324B2 (ja) * 1998-08-31 2010-06-23 株式会社ニコン 顕微鏡装置
JP3102523B2 (ja) * 1992-10-12 2000-10-23 日本電信電話株式会社 微粒子の配列制御方法
JPH06160728A (ja) * 1992-11-17 1994-06-07 Nikon Corp マイクロレーザ装置
JP3311083B2 (ja) * 1993-05-26 2002-08-05 オリンパス光学工業株式会社 顕微鏡観察のための微調整装置
JP3489646B2 (ja) * 1996-05-21 2004-01-26 日本電信電話株式会社 光放射圧による微粒子の変位測定方法
JP3346374B2 (ja) * 1999-06-23 2002-11-18 住友電気工業株式会社 レーザ穴開け加工装置
US6416190B1 (en) * 2001-04-27 2002-07-09 University Of Chicago Apparatus for using optical tweezers to manipulate materials

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5445011A (en) * 1993-09-21 1995-08-29 Ghislain; Lucien P. Scanning force microscope using an optical trap
US5717667A (en) * 1993-11-11 1998-02-10 Sony Corporation Optical pickup apparatus including an optical rotation device
US5939716A (en) * 1997-04-02 1999-08-17 Sandia Corporation Three-dimensional light trap for reflective particles
US6055106A (en) * 1998-02-03 2000-04-25 Arch Development Corporation Apparatus for applying optical gradient forces

Also Published As

Publication number Publication date
CN1509415A (zh) 2004-06-30
WO2002093202A2 (fr) 2002-11-21
JP2008229837A (ja) 2008-10-02
WO2002093202A3 (fr) 2003-02-27
JP5134389B2 (ja) 2013-01-30
EP1395856A2 (fr) 2004-03-10
CA2447472A1 (fr) 2002-11-21
JP2004534661A (ja) 2004-11-18
EP1395856A4 (fr) 2006-01-18

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