CN100334455C - 具有自动范围设定功能的脉冲宽度测量装置 - Google Patents
具有自动范围设定功能的脉冲宽度测量装置 Download PDFInfo
- Publication number
- CN100334455C CN100334455C CNB038242974A CN03824297A CN100334455C CN 100334455 C CN100334455 C CN 100334455C CN B038242974 A CNB038242974 A CN B038242974A CN 03824297 A CN03824297 A CN 03824297A CN 100334455 C CN100334455 C CN 100334455C
- Authority
- CN
- China
- Prior art keywords
- mentioned
- index
- signal
- counter circuit
- pulse width
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000003860 storage Methods 0.000 claims description 20
- 238000001514 detection method Methods 0.000 claims description 13
- 230000000630 rising effect Effects 0.000 claims description 13
- 102100040862 Dual specificity protein kinase CLK1 Human genes 0.000 description 20
- 238000005259 measurement Methods 0.000 description 7
- 101000749294 Homo sapiens Dual specificity protein kinase CLK1 Proteins 0.000 description 4
- 238000012423 maintenance Methods 0.000 description 3
- 230000014759 maintenance of location Effects 0.000 description 3
- 101100328957 Caenorhabditis elegans clk-1 gene Proteins 0.000 description 2
- 102100040844 Dual specificity protein kinase CLK2 Human genes 0.000 description 1
- 101000749291 Homo sapiens Dual specificity protein kinase CLK2 Proteins 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000008676 import Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2882—Testing timing characteristics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manipulation Of Pulses (AREA)
- Measurement Of Unknown Time Intervals (AREA)
Abstract
Description
Claims (7)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2003/004571 WO2004092751A1 (ja) | 2003-04-10 | 2003-04-10 | オートレンジ設定機能つきパルス幅測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1688889A CN1688889A (zh) | 2005-10-26 |
CN100334455C true CN100334455C (zh) | 2007-08-29 |
Family
ID=33193193
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB038242974A Expired - Fee Related CN100334455C (zh) | 2003-04-10 | 2003-04-10 | 具有自动范围设定功能的脉冲宽度测量装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7006936B2 (zh) |
JP (1) | JP4016034B2 (zh) |
CN (1) | CN100334455C (zh) |
WO (1) | WO2004092751A1 (zh) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5666813B2 (ja) * | 2010-03-15 | 2015-02-12 | 株式会社テセック | 時間幅測定装置 |
US8514999B2 (en) | 2011-12-06 | 2013-08-20 | International Business Machines Corporation | Floating-point event counters with automatic prescaling |
US10488449B2 (en) * | 2012-12-20 | 2019-11-26 | Schneider Electric It Corporation | Method and apparatus for determining characteristics of an input signal |
US9419625B2 (en) * | 2014-08-29 | 2016-08-16 | International Business Machines Corporation | Dynamic prescaling for performance counters |
CN104485938A (zh) * | 2015-01-13 | 2015-04-01 | 合肥工业大学 | 一种低功耗电容式传感器接口电路 |
CN107422193B (zh) * | 2017-06-30 | 2023-09-15 | 成都信息工程大学 | 一种测量单粒子翻转瞬态脉冲长度的电路及方法 |
US11022637B2 (en) * | 2019-01-10 | 2021-06-01 | Arm Limited | Detection of pulse width tampering of signals |
US11353496B2 (en) * | 2019-05-08 | 2022-06-07 | Hamilton Sundstrand Corporation | Frequency-based built-in-test for discrete outputs |
CN111693785B (zh) * | 2020-05-14 | 2021-05-07 | 湖南毂梁微电子有限公司 | 一种数字脉冲信号宽度测量电路及测量方法 |
CN114636862B (zh) * | 2022-02-28 | 2023-05-09 | 湖南毂梁微电子有限公司 | 一种高精度脉冲宽度测量电路及测量方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0727804A (ja) * | 1993-07-12 | 1995-01-31 | Fujitsu Ltd | パルス幅測定回路 |
JPH11337600A (ja) * | 1998-05-28 | 1999-12-10 | Anritsu Corp | 時間幅分布測定装置 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5347505A (en) * | 1992-01-20 | 1994-09-13 | Fujitsu Limited | Optical medium recording method and apparatus employing pulse width delay and/or advancement |
JPH09148895A (ja) * | 1995-11-20 | 1997-06-06 | Advantest Corp | 短電気パルス発生装置 |
US6795491B2 (en) * | 1999-07-22 | 2004-09-21 | Aether Wire & Location | Spread spectrum localizers |
KR100919087B1 (ko) * | 2001-10-19 | 2009-09-28 | 가부시키가이샤 어드밴티스트 | 위상 로크 루프 회로, 지연 로크 루프 회로, 타이밍발생기, 반도체 시험 장치 및 반도체 집적 회로 |
-
2003
- 2003-04-10 JP JP2004570844A patent/JP4016034B2/ja not_active Expired - Fee Related
- 2003-04-10 WO PCT/JP2003/004571 patent/WO2004092751A1/ja active Application Filing
- 2003-04-10 CN CNB038242974A patent/CN100334455C/zh not_active Expired - Fee Related
-
2005
- 2005-03-22 US US11/085,138 patent/US7006936B2/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0727804A (ja) * | 1993-07-12 | 1995-01-31 | Fujitsu Ltd | パルス幅測定回路 |
JPH11337600A (ja) * | 1998-05-28 | 1999-12-10 | Anritsu Corp | 時間幅分布測定装置 |
Also Published As
Publication number | Publication date |
---|---|
US20050165569A1 (en) | 2005-07-28 |
JP4016034B2 (ja) | 2007-12-05 |
US7006936B2 (en) | 2006-02-28 |
WO2004092751A1 (ja) | 2004-10-28 |
JPWO2004092751A1 (ja) | 2006-07-06 |
CN1688889A (zh) | 2005-10-26 |
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Legal Events
Date | Code | Title | Description |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: FUJITSU MICROELECTRONICS CO., LTD. Free format text: FORMER OWNER: FUJITSU LIMITED Effective date: 20081017 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20081017 Address after: Tokyo, Japan, Japan Patentee after: Fujitsu Microelectronics Ltd. Address before: Kawasaki, Kanagawa, Japan Patentee before: Fujitsu Ltd. |
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C56 | Change in the name or address of the patentee |
Owner name: FUJITSU SEMICONDUCTOR CO., LTD. Free format text: FORMER NAME: FUJITSU MICROELECTRON CO., LTD. |
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CP03 | Change of name, title or address |
Address after: Kanagawa Patentee after: Fujitsu Semiconductor Co., Ltd. Address before: Tokyo, Japan Patentee before: Fujitsu Microelectronics Ltd. |
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ASS | Succession or assignment of patent right |
Owner name: SPANSION LLC N. D. GES D. STAATES Free format text: FORMER OWNER: FUJITSU SEMICONDUCTOR CO., LTD. Effective date: 20140107 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20140107 Address after: American California Patentee after: Spansion LLC N. D. Ges D. Staates Address before: Kanagawa Patentee before: Fujitsu Semiconductor Co., Ltd. |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20160318 Address after: American California Patentee after: Cypress Semiconductor Corp. Address before: American California Patentee before: Spansion LLC N. D. Ges D. Staates |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20070829 Termination date: 20160410 |
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CF01 | Termination of patent right due to non-payment of annual fee |