CH639192A5 - Geraet zur ausmessung von oberflaechenunregelmaessigkeiten und der oberflaechenstruktur einer elektrisch leitenden oberflaeche, und verwendung des geraetes. - Google Patents
Geraet zur ausmessung von oberflaechenunregelmaessigkeiten und der oberflaechenstruktur einer elektrisch leitenden oberflaeche, und verwendung des geraetes. Download PDFInfo
- Publication number
- CH639192A5 CH639192A5 CH1250178A CH1250178A CH639192A5 CH 639192 A5 CH639192 A5 CH 639192A5 CH 1250178 A CH1250178 A CH 1250178A CH 1250178 A CH1250178 A CH 1250178A CH 639192 A5 CH639192 A5 CH 639192A5
- Authority
- CH
- Switzerland
- Prior art keywords
- measuring
- workpiece
- electrodes
- capacitance
- load
- Prior art date
Links
- 239000003990 capacitor Substances 0.000 claims description 22
- 238000009826 distribution Methods 0.000 claims description 12
- 238000004519 manufacturing process Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 3
- 238000000926 separation method Methods 0.000 claims description 2
- 230000013011 mating Effects 0.000 claims 2
- 239000000523 sample Substances 0.000 claims 2
- 239000004020 conductor Substances 0.000 claims 1
- 230000000694 effects Effects 0.000 claims 1
- 229920001971 elastomer Polymers 0.000 claims 1
- 239000000806 elastomer Substances 0.000 claims 1
- 238000002474 experimental method Methods 0.000 claims 1
- 230000001788 irregular Effects 0.000 claims 1
- 230000000737 periodic effect Effects 0.000 claims 1
- 230000001105 regulatory effect Effects 0.000 claims 1
- 230000010355 oscillation Effects 0.000 description 3
- 229910001361 White metal Inorganic materials 0.000 description 2
- 239000010969 white metal Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- -1 polyethylene terephthalate Polymers 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/14—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring distance or clearance between spaced objects or spaced apertures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/858,861 US4182981A (en) | 1977-12-08 | 1977-12-08 | Apparatus for gauging the shape of a conducting surface |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CH639192A5 true CH639192A5 (de) | 1983-10-31 |
Family
ID=25329387
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CH1250178A CH639192A5 (de) | 1977-12-08 | 1978-12-07 | Geraet zur ausmessung von oberflaechenunregelmaessigkeiten und der oberflaechenstruktur einer elektrisch leitenden oberflaeche, und verwendung des geraetes. |
Country Status (4)
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE411392B (sv) * | 1977-12-09 | 1979-12-17 | Inst Mikrovagsteknik Vid Tekni | Metanordning for kapacitiv bestemning av det inbordes leget hos tva relativt varandra rorliga delar |
| US4422035A (en) * | 1981-12-11 | 1983-12-20 | Extrude Hone Corporation | Capacitance measurement probe |
| US4677578A (en) * | 1982-04-05 | 1987-06-30 | Armco Inc. | Non-contact sensing system for determining the relative elongation in a moving flat steel strip |
| US4646009A (en) * | 1982-05-18 | 1987-02-24 | Ade Corporation | Contacts for conductivity-type sensors |
| US4446432A (en) * | 1982-05-27 | 1984-05-01 | Motorola Inc. | Method for determining surface contour of piezoelectric wafers |
| JPS5914007U (ja) * | 1982-07-20 | 1984-01-27 | イ−グル工業株式会社 | 表面粗さ計 |
| JPS5926002A (ja) * | 1982-08-04 | 1984-02-10 | Seikosha Co Ltd | 棒状回転体の偏心自動測定装置 |
| JPS6022603A (ja) * | 1983-07-18 | 1985-02-05 | Mitsubishi Electric Corp | 表示制御装置 |
| JPS60237304A (ja) * | 1984-05-10 | 1985-11-26 | Yukio Saito | 形状測定用センサ |
| CH673172A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1987-06-29 | 1990-02-15 | Weber Hans R | |
| US4879672A (en) * | 1987-08-21 | 1989-11-07 | Control Data Corporation | Method and apparatus for testing runout velocity and acceleration on a surface |
| US4851760A (en) * | 1988-07-21 | 1989-07-25 | Sandvik Special Metals | Method and apparatus for measuring the straightness of tubes |
| CA1332183C (en) * | 1989-06-23 | 1994-09-27 | Richard W. Henderson | Capacitance probe assembly |
| US5025223A (en) * | 1989-07-24 | 1991-06-18 | Tempel Steel Company | Flatness tester |
| US5070302A (en) * | 1989-09-05 | 1991-12-03 | Eastman Kodak Company | Capacitance probe for measuring a width of a clearance between parts |
| US5428355A (en) * | 1992-03-23 | 1995-06-27 | Hewlett-Packard Corporation | Position encoder system |
| US5414420A (en) * | 1992-03-23 | 1995-05-09 | Hewlett-Packard Corporation | Switch interconnect for position encoder system |
| FR2751585B1 (fr) | 1996-07-24 | 2002-08-16 | Support Systems International | Produit multicouches a couche centrale electriquement conductrice utile comme element de capteur inductif |
| US6105422A (en) * | 1998-07-13 | 2000-08-22 | Pollock; Paul | Brake tester and method of using same |
| US6384721B1 (en) * | 2001-01-31 | 2002-05-07 | Dana Corporation | Brake wear sensor |
| US20030080757A1 (en) * | 2001-11-01 | 2003-05-01 | Groover Thomas A. | Proximity sensor |
| US6889557B2 (en) * | 2002-02-11 | 2005-05-10 | Bechtel Bwxt Idaho, Llc | Network and topology for identifying, locating and quantifying physical phenomena, systems and methods for employing same |
| US7334485B2 (en) | 2002-02-11 | 2008-02-26 | Battelle Energy Alliance, Llc | System, method and computer-readable medium for locating physical phenomena |
| JP4874910B2 (ja) * | 2007-09-25 | 2012-02-15 | 株式会社東芝 | センサ装置及び表示装置 |
| CN102203547A (zh) * | 2008-10-31 | 2011-09-28 | 株式会社藤仓 | 静电容量型传感器 |
| DE102010028719A1 (de) * | 2010-05-07 | 2011-11-10 | Robert Bosch Gmbh | Suchgerät |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2417062A (en) * | 1945-03-05 | 1947-03-11 | Senn Corp | System for checking contours |
| US2649579A (en) * | 1950-02-01 | 1953-08-18 | Standard Oil Dev Co | Detector for seismic exploration |
| US2604512A (en) * | 1950-12-06 | 1952-07-22 | Gen Electric | Concentric tester |
| CH399963A (de) * | 1962-05-22 | 1965-09-30 | Bbc Brown Boveri & Cie | Vorrichtung zum Überwachen von Lagern |
| US3191158A (en) * | 1963-10-23 | 1965-06-22 | Weyerhaeuser Co | Capacitor memory device |
| GB1097760A (en) * | 1965-04-27 | 1968-01-03 | Ilford Ltd | Testing material for irregularities of thickness |
| GB1220783A (en) * | 1969-05-14 | 1971-01-27 | Rolls Royce | Inspecting the contour of a workpiece |
| US3771051A (en) * | 1972-06-14 | 1973-11-06 | Ade Corp | Apparatus and method for indicating surface roughness |
-
1977
- 1977-12-08 US US05/858,861 patent/US4182981A/en not_active Expired - Lifetime
-
1978
- 1978-11-30 DE DE19782851792 patent/DE2851792A1/de not_active Withdrawn
- 1978-12-07 CH CH1250178A patent/CH639192A5/de not_active IP Right Cessation
- 1978-12-08 JP JP15118278A patent/JPS5486368A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| DE2851792A1 (de) | 1979-06-28 |
| US4182981A (en) | 1980-01-08 |
| JPS6128281B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1986-06-30 |
| JPS5486368A (en) | 1979-07-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PL | Patent ceased | ||
| PL | Patent ceased |