CA932880A - Method of producing a plurality of semiconductor components - Google Patents

Method of producing a plurality of semiconductor components

Info

Publication number
CA932880A
CA932880A CA120807A CA120807A CA932880A CA 932880 A CA932880 A CA 932880A CA 120807 A CA120807 A CA 120807A CA 120807 A CA120807 A CA 120807A CA 932880 A CA932880 A CA 932880A
Authority
CA
Canada
Prior art keywords
producing
semiconductor components
semiconductor
components
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA120807A
Other languages
English (en)
Other versions
CA120807S (en
Inventor
Spath Werner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Application granted granted Critical
Publication of CA932880A publication Critical patent/CA932880A/en
Expired legal-status Critical Current

Links

Classifications

    • H10P74/235—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices
    • H10P14/47—
    • H10P14/6309—
    • H10P14/6324—
    • H10P50/613—

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Weting (AREA)
CA120807A 1970-08-18 1971-08-18 Method of producing a plurality of semiconductor components Expired CA932880A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2041035A DE2041035C2 (de) 1970-08-18 1970-08-18 Verfahren zum gleichzeitigen elektrolytischen in bezug auf die Sperrfähigkeit selektiven Behandeln von mehreren in einer gemeinsamen Halbleiterscheibe erzeugten gleichen Halbleiterbauelementen

Publications (1)

Publication Number Publication Date
CA932880A true CA932880A (en) 1973-08-28

Family

ID=5780094

Family Applications (1)

Application Number Title Priority Date Filing Date
CA120807A Expired CA932880A (en) 1970-08-18 1971-08-18 Method of producing a plurality of semiconductor components

Country Status (10)

Country Link
US (1) US3738917A (enExample)
JP (1) JPS579217B1 (enExample)
AT (1) AT337779B (enExample)
CA (1) CA932880A (enExample)
CH (1) CH524827A (enExample)
DE (1) DE2041035C2 (enExample)
FR (1) FR2102327B1 (enExample)
GB (1) GB1332586A (enExample)
NL (1) NL7111385A (enExample)
SE (1) SE376685B (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2207012C2 (de) * 1972-02-15 1985-10-31 Siemens AG, 1000 Berlin und 8000 München Verfahren zur Kontaktierung von Halbleiterbauelementen
US3987538A (en) * 1973-12-26 1976-10-26 Texas Instruments Incorporated Method of making devices having closely spaced electrodes
US4080721A (en) * 1975-06-30 1978-03-28 International Business Machines Corporation Fabrication of semiconductor device
US4125440A (en) * 1977-07-25 1978-11-14 International Business Machines Corporation Method for non-destructive testing of semiconductor articles
US4306951A (en) * 1980-05-30 1981-12-22 International Business Machines Corporation Electrochemical etching process for semiconductors
FR3120569B1 (fr) 2021-03-10 2024-04-26 Psa Automobiles Sa Procédé de gestion du fonctionnement d’une interface homme-machine d’un appareillage de gestion du fonctionnement d’un vitrage adaptatif d’un véhicule automobile, système et véhicule automobile associés

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1432035A (fr) * 1964-03-30 1966-03-18 Gen Electric Perfectionnements aux méthodes de contrôle de semiconducteurs

Also Published As

Publication number Publication date
DE2041035A1 (de) 1972-02-24
US3738917A (en) 1973-06-12
DE2041035C2 (de) 1982-10-28
CH524827A (de) 1972-06-30
FR2102327B1 (enExample) 1977-03-18
JPS579217B1 (enExample) 1982-02-20
FR2102327A1 (enExample) 1972-04-07
SE376685B (enExample) 1975-06-02
NL7111385A (enExample) 1972-02-22
GB1332586A (en) 1973-10-03
ATA658871A (de) 1976-11-15
AT337779B (de) 1977-07-25

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