CA3059139A1 - Wavefront sensor and method of using it - Google Patents

Wavefront sensor and method of using it Download PDF

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Publication number
CA3059139A1
CA3059139A1 CA3059139A CA3059139A CA3059139A1 CA 3059139 A1 CA3059139 A1 CA 3059139A1 CA 3059139 A CA3059139 A CA 3059139A CA 3059139 A CA3059139 A CA 3059139A CA 3059139 A1 CA3059139 A1 CA 3059139A1
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CA
Canada
Prior art keywords
encoder
array
cells
light
detection system
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CA3059139A
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English (en)
French (fr)
Inventor
Yoav Berlatzky
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PXE Computational Imaging Ltd
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PXE Computational Imaging Ltd
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Publication of CA3059139A1 publication Critical patent/CA3059139A1/en
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J2009/002—Wavefront phase distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0211—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods for measuring coherence

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
CA3059139A 2017-04-06 2018-02-07 Wavefront sensor and method of using it Pending CA3059139A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
IL251636A IL251636B (en) 2017-04-06 2017-04-06 Coherence camera system and method thereof
IL251636 2017-04-06
PCT/IL2018/050135 WO2018185740A1 (en) 2017-04-06 2018-02-07 Wavefront sensor and method of using it

Publications (1)

Publication Number Publication Date
CA3059139A1 true CA3059139A1 (en) 2018-10-11

Family

ID=61274025

Family Applications (1)

Application Number Title Priority Date Filing Date
CA3059139A Pending CA3059139A1 (en) 2017-04-06 2018-02-07 Wavefront sensor and method of using it

Country Status (8)

Country Link
US (1) US11293806B2 (https=)
EP (1) EP3607286B1 (https=)
JP (1) JP7246093B2 (https=)
KR (1) KR102537284B1 (https=)
CN (1) CN110494723B (https=)
CA (1) CA3059139A1 (https=)
IL (1) IL251636B (https=)
WO (1) WO2018185740A1 (https=)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3535554A1 (en) 2016-11-01 2019-09-11 King Abdullah University Of Science And Technology Wavefront sensor and method of reconstructing distorted wavefronts
WO2020170465A1 (ja) * 2019-02-22 2020-08-27 日本電信電話株式会社 画像処理装置、画像処理方法及びプログラム
CN113050101B (zh) * 2019-12-26 2024-11-05 宁波飞芯电子科技有限公司 相干信号接收装置、方法以及相干探测系统
IL294563B1 (en) 2020-01-14 2026-04-01 Pxe Computational Imaging Ltd System and method for optical imaging and measurement of objects
IL276922B1 (en) * 2020-08-25 2026-04-01 Pxe Computational Imaging Ltd Systems and methods for digital correction of optical distortions and spectral imaging
KR20230027012A (ko) * 2020-05-12 2023-02-27 피엑스이 컴퓨테이셔널 이미징 엘티디 디지털 광학 수차 보정 및 스펙트럼 이미징을 위한 시스템 및 방법
EP4160294A4 (en) * 2020-07-14 2024-06-26 National Institute of Information and Communications Technology Optical aberration correction program and optical wavefront estimation program
DE102020209580B3 (de) * 2020-07-30 2021-09-23 Carl Zeiss Smt Gmbh Verfahren zum Bestimmen einer mittels eines diffraktiven optischen Elements erzeugten Wellenfront, Verfahren zur Herstellung eines diffraktiven optischen Elements sowie Messvorrichtung zur interferometrischen Formvermessung einer Oberfläche eines Testobjekts
US12140774B2 (en) * 2020-12-02 2024-11-12 University Of Maryland, College Park Light field-based beam correction systems and methods
US11237059B1 (en) * 2020-12-14 2022-02-01 Gerchberg Ophthalmic Dispensing, PLLC Totagraphy: Coherent diffractive/digital information reconstruction by iterative phase recovery using special masks
JP7780319B2 (ja) * 2021-12-17 2025-12-04 浜松ホトニクス株式会社 波面計測装置及び波面計測方法
CN117880653A (zh) * 2021-12-22 2024-04-12 荣耀终端有限公司 多光谱传感器以及电子设备
JP2025540911A (ja) 2022-11-15 2025-12-17 シーネラ テクノロジーズ リミテッド イメージングシステムおよび方法
WO2024246894A1 (en) 2023-05-31 2024-12-05 Pxe Computational Imaging Ltd Flat holographic camera
WO2025146678A1 (en) * 2024-01-04 2025-07-10 Pxe Computational Imaging Ltd Holographic camera and encoder mask thereof
CN117969677B (zh) * 2024-03-28 2024-07-26 之江实验室 基于编码相位成像的声场探测方法、系统、设备、介质
WO2026078693A1 (en) * 2024-10-09 2026-04-16 Pxe Computational Imaging Ltd Holographic camera and encoder mask thereof

Family Cites Families (79)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4141652A (en) * 1977-11-25 1979-02-27 Adaptive Optics Associates, Inc. Sensor system for detecting wavefront distortion in a return beam of light
US4682888A (en) * 1984-12-26 1987-07-28 Hughes Aircraft Company Spectral analyzer and direction indicator
US4737621A (en) * 1985-12-06 1988-04-12 Adaptive Optics Assoc., Inc. Integrated adaptive optical wavefront sensing and compensating system
US4950878A (en) * 1989-04-12 1990-08-21 Kaman Aerospace Corporation Wavefront control system using optical coarse/fine gradient sensor
US5486927A (en) 1991-08-19 1996-01-23 Konica Corporation Digital image forming apparatus using subdivided pixels
US5604417A (en) 1991-12-19 1997-02-18 Hitachi, Ltd. Semiconductor integrated circuit device
JPH05268059A (ja) * 1992-03-19 1993-10-15 Hitachi Ltd 半導体集積回路装置
US5410397A (en) * 1993-02-16 1995-04-25 The United States Of America As Represented By The United States Department Of Energy Method and apparatus for holographic wavefront diagnostics
US5412200A (en) * 1993-03-01 1995-05-02 Rhoads; Geoffrey B. Wide field distortion-compensating imaging system and methods
FR2712978B1 (fr) 1993-11-24 1996-02-02 Onera (Off Nat Aerospatiale) Interféromètre optique achromatique, du type à décalage trilatéral.
DE19800844A1 (de) * 1998-01-13 1999-07-15 Johannes Prof Dr Schwider Shack-Hartmann-Sensor mit orts-varianter Linsenanordnung
FR2795175B1 (fr) 1999-06-17 2001-07-27 Onera (Off Nat Aerospatiale) Interferometre optique achromatique, du type a sensibilite continument reglable
US6565209B2 (en) * 2000-04-25 2003-05-20 Alcon Universal Ltd. Range-extending system and spatial filter for enhancing Hartmann-Shack images and associated methods
US6382793B1 (en) * 2000-05-20 2002-05-07 Carl Zeiss, Inc. Method and apparatus for measuring a wavefront
US20040042094A1 (en) * 2000-12-28 2004-03-04 Tomoyuki Matsuyama Projection optical system and production method therefor, exposure system and production method therefor, and production method for microdevice
CN1582407A (zh) * 2001-09-12 2005-02-16 麦克罗尼克激光系统公司 使用空间光调制器的改进方法和装置
US6639201B2 (en) * 2001-11-07 2003-10-28 Applied Materials, Inc. Spot grid array imaging system
US20040227932A1 (en) * 2003-02-13 2004-11-18 Geunyoung Yoon Large dynamic range shack-hartmann wavefront sensor
US7414712B2 (en) * 2003-02-13 2008-08-19 University Of Rochester Large dynamic range Shack-Hartmann wavefront sensor
JP2008523383A (ja) * 2004-12-10 2008-07-03 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ マルチスポット調査装置
US7777790B2 (en) * 2005-01-27 2010-08-17 Technion Research & Development Foundation Ltd. Acquisition of image sequences with enhanced resolution
JP2006300876A (ja) 2005-04-25 2006-11-02 Nikon Corp 干渉測定方法
EP1941314A4 (en) * 2005-10-07 2010-04-14 Univ Leland Stanford Junior ARRANGEMENTS AND APPROACHES FOR MICROSCOPY
FR2896583B1 (fr) 2006-01-20 2008-10-17 Onera (Off Nat Aerospatiale) Interferometre optique achromatique et compact, du type a decalage trilateral
US8777413B2 (en) * 2006-01-20 2014-07-15 Clarity Medical Systems, Inc. Ophthalmic wavefront sensor operating in parallel sampling and lock-in detection mode
US7445335B2 (en) * 2006-01-20 2008-11-04 Clarity Medical Systems, Inc. Sequential wavefront sensor
US8243157B2 (en) 2006-02-07 2012-08-14 The Board Of Trustees Of The Leland Stanford Junior University Correction of optical aberrations
US8822894B2 (en) * 2011-01-07 2014-09-02 California Institute Of Technology Light-field pixel for detecting a wavefront based on a first intensity normalized by a second intensity
US7792423B2 (en) * 2007-02-06 2010-09-07 Mitsubishi Electric Research Laboratories, Inc. 4D light field cameras
US8118429B2 (en) * 2007-10-29 2012-02-21 Amo Wavefront Sciences, Llc. Systems and methods of phase diversity wavefront sensing
FR2930336B1 (fr) 2008-04-22 2010-05-14 Onera (Off Nat Aerospatiale) Procede, reseau de phase et dispositif d'analyse de surface d'onde d'un faisceau de lumiere
US7780364B2 (en) * 2008-05-01 2010-08-24 Mitsubishi Electric Research Laboratories, Inc. Apparatus and method for reducing glare in images
KR101629044B1 (ko) 2008-07-25 2016-06-09 코넬 유니버시티 광 필드 이미지 센서, 방법 및 적용
NL2004942A (en) * 2009-07-30 2011-01-31 Asml Netherlands Bv Lithographic apparatus and monitoring method.
EP2354840A1 (en) 2010-02-05 2011-08-10 Siemens Aktiengesellschaft An apparatus and a method for performing a difference measurement of an object image
JP5586986B2 (ja) 2010-02-23 2014-09-10 キヤノン株式会社 Ｘ線撮像装置
KR102009126B1 (ko) * 2010-03-19 2019-08-08 인비사지 테크놀로지스, 인크. 감지성 반도체 다이오드를 채용한 이미지 센서
US20110298912A1 (en) * 2010-06-02 2011-12-08 Honeywell International Inc. Wavefront sensing for biometric imaging
FR2962536B1 (fr) * 2010-07-06 2019-12-27 Commissariat A L'energie Atomique Et Aux Energies Alternatives Analyseur de front d'ondes a microlentilles a cristal liquide
US8405763B2 (en) * 2010-12-23 2013-03-26 Mitsubishi Electric Research Laboratories, Inc. Video camera for reconstructing varying spatio-temporal resolution videos
GB201112537D0 (en) 2011-07-21 2011-08-31 Ucl Business Plc X-ray imaging
US9182289B2 (en) * 2011-10-14 2015-11-10 Canon Kabushiki Kaisha Apparatus and method for estimating wavefront parameters
WO2014018584A1 (en) * 2012-07-24 2014-01-30 Trustees Of Boston University Partitioned aperture wavefront imaging method and system
WO2014050141A1 (ja) 2012-09-27 2014-04-03 国立大学法人北海道大学 光位相測定方法、光位相測定装置および光通信装置
US9200887B2 (en) * 2012-10-12 2015-12-01 Thorlabs, Inc. Compact, low dispersion, and low aberration adaptive optics scanning system
RU2012154657A (ru) 2012-12-17 2014-06-27 ЭлЭсАй Корпорейшн Способы и устройство для объединения изображений с глубиной, генерированных с использованием разных способов формирования изображений с глубиной
WO2014102341A1 (en) * 2012-12-31 2014-07-03 Iee International Electronics & Engineering S.A. Optical system generating a structured light field from an array of light sources by meand of a refracting or reflecting light structuring element
DE102013205406A1 (de) * 2013-03-27 2014-10-16 Siemens Aktiengesellschaft Röntgenaufnahmesystem zur Röntgenbildgebung bei hohen Bildfrequenzen eines Untersuchungsobjekts mittels direkter Messung des Interferenzmusters
CN203163728U (zh) * 2013-04-07 2013-08-28 南京理工大学 多光谱光场相机
US10001405B2 (en) 2013-04-16 2018-06-19 National University Corporation Kyoto Institute Of Technology Measurement device for obtaining amplitude information of an object
US9679360B2 (en) * 2013-05-10 2017-06-13 Trustees Of Princeton University High-resolution light-field imaging
US9927608B2 (en) 2013-06-06 2018-03-27 Hamamatsu Photonics K.K. Correspondence relation specifying method for adaptive optics system, wavefront distortion compensation method, adaptive optics system, and storage medium storing program for adaptive optics system
DE112014002681T5 (de) 2013-06-06 2016-03-17 Hamamatsu Photonics K.K. Verfahren zur Erfassung eines Winkelversatzes für adaptives Optiksystem, Verfahren zur Erfassung einer Abbildungsvergrößerung für adaptives Optiksystem und adaptives Optiksystem
JP6040103B2 (ja) 2013-06-06 2016-12-07 浜松ホトニクス株式会社 補償光学システムの対応関係特定方法、補償光学システム、および補償光学システム用プログラム
US9594245B2 (en) * 2013-06-06 2017-03-14 Hamamatsu Photonics K.K. Adjustment method for adaptive optics system, adaptive optics system, and storage medium storing program for adaptive optics system
JP6494205B2 (ja) * 2013-07-31 2019-04-03 キヤノン株式会社 波面計測方法、形状計測方法、光学素子の製造方法、光学機器の製造方法、プログラム、波面計測装置
JP2015055544A (ja) * 2013-09-11 2015-03-23 キヤノン株式会社 波面計測装置、波面計測方法、光学素子の製造方法、および、光学システムの組み立て調整装置
US10203399B2 (en) * 2013-11-12 2019-02-12 Big Sky Financial Corporation Methods and apparatus for array based LiDAR systems with reduced interference
US9423306B2 (en) * 2014-01-03 2016-08-23 Ram Photonics, LLC Method and apparatus for wavefront sensing
US9360554B2 (en) 2014-04-11 2016-06-07 Facet Technology Corp. Methods and apparatus for object detection and identification in a multiple detector lidar array
WO2015191594A1 (en) 2014-06-10 2015-12-17 Hui Tian Layout and operation of pixels for image sensors
WO2015198331A1 (en) * 2014-06-25 2015-12-30 Ramot At Tel-Aviv University Ltd. System and method for light-field imaging
JP6508896B2 (ja) * 2014-08-08 2019-05-08 キヤノン株式会社 光波面センサにおける光スポット重心位置取得方法、光波面計測方法およびプログラム
US9689740B2 (en) * 2014-10-15 2017-06-27 The Boeing Company Diagnostic for spectrally combined laser
US9945718B2 (en) 2015-01-07 2018-04-17 Semiconductor Components Industries, Llc Image sensors with multi-functional pixel clusters
US9455285B2 (en) 2015-02-04 2016-09-27 Semiconductors Components Industries, Llc Image sensors with phase detection pixels
US9787889B2 (en) 2015-02-12 2017-10-10 Semiconductor Components Industries, Llc Dynamic auto focus zones for auto focus pixel systems
US9749556B2 (en) 2015-03-24 2017-08-29 Semiconductor Components Industries, Llc Imaging systems having image sensor pixel arrays with phase detection capabilities
US10145942B2 (en) * 2015-03-27 2018-12-04 Intel Corporation Techniques for spatio-temporal compressed time of flight imaging
US20160377414A1 (en) * 2015-06-23 2016-12-29 Hand Held Products, Inc. Optical pattern projector
CN105115417B (zh) * 2015-07-09 2018-03-20 中国科学院上海光学精密机械研究所 波前传感器及波前测量方法
JP6622515B2 (ja) * 2015-08-26 2019-12-18 キヤノン株式会社 レンズアレイ、波面センサ、波面計測装置、形状計測装置、収差計測装置、光学素子の製造方法及び光学機器の製造方法
US9420164B1 (en) 2015-09-24 2016-08-16 Qualcomm Incorporated Phase detection autofocus noise reduction
CN115242304B (zh) * 2015-12-30 2024-09-13 艾伦神火公司 用于光学窄播的系统和方法
WO2017210781A1 (en) 2016-06-07 2017-12-14 Airy3D Inc. Light field imaging device and method for depth acquisition and three-dimensional imaging
US10451890B2 (en) * 2017-01-16 2019-10-22 Cymer, Llc Reducing speckle in an excimer light source
EP3721621B1 (en) 2017-12-05 2025-07-23 Airy3d Inc. Light field image processing method for depth acquisition
BR112020023571A8 (pt) 2018-05-23 2023-02-07 Mediatek Inc Método e aparelho de codificação de vídeo usando ponderação de cu bidirecional
US10989595B2 (en) * 2018-08-01 2021-04-27 Qcell Pc Hybrid spectral imager

Also Published As

Publication number Publication date
EP3607286A1 (en) 2020-02-12
US20200278257A1 (en) 2020-09-03
IL251636A0 (en) 2017-06-29
WO2018185740A1 (en) 2018-10-11
JP7246093B2 (ja) 2023-03-27
IL251636B (en) 2018-02-28
CN110494723B (zh) 2022-06-03
CN110494723A (zh) 2019-11-22
US11293806B2 (en) 2022-04-05
EP3607286B1 (en) 2025-11-12
KR20190137104A (ko) 2019-12-10
KR102537284B1 (ko) 2023-05-26
JP2020515831A (ja) 2020-05-28
EP3607286C0 (en) 2025-11-12

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