CA3033659A1 - Two-step self-test circuit for microcontroller unit and antenna - Google Patents

Two-step self-test circuit for microcontroller unit and antenna Download PDF

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Publication number
CA3033659A1
CA3033659A1 CA3033659A CA3033659A CA3033659A1 CA 3033659 A1 CA3033659 A1 CA 3033659A1 CA 3033659 A CA3033659 A CA 3033659A CA 3033659 A CA3033659 A CA 3033659A CA 3033659 A1 CA3033659 A1 CA 3033659A1
Authority
CA
Canada
Prior art keywords
antenna
resistor
input port
output port
coupled
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CA3033659A
Other languages
English (en)
French (fr)
Inventor
Richard Allan Duke
John Lawrence Payne
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Southwire Co LLC
Original Assignee
Southwire Co LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Southwire Co LLC filed Critical Southwire Co LLC
Publication of CA3033659A1 publication Critical patent/CA3033659A1/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/145—Indicating the presence of current or voltage
    • G01R19/155—Indicating the presence of voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of antennas
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/145—Indicating the presence of current or voltage

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
CA3033659A 2016-08-16 2017-08-11 Two-step self-test circuit for microcontroller unit and antenna Pending CA3033659A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201662375563P 2016-08-16 2016-08-16
US62/375,563 2016-08-16
PCT/US2017/046591 WO2018034991A1 (en) 2016-08-16 2017-08-11 Two-step self-test circuit for microcontroller unit and antenna

Publications (1)

Publication Number Publication Date
CA3033659A1 true CA3033659A1 (en) 2018-02-22

Family

ID=59799446

Family Applications (1)

Application Number Title Priority Date Filing Date
CA3033659A Pending CA3033659A1 (en) 2016-08-16 2017-08-11 Two-step self-test circuit for microcontroller unit and antenna

Country Status (6)

Country Link
US (2) US10067178B2 (zh)
KR (1) KR102462979B1 (zh)
CN (2) CN109791188B (zh)
CA (1) CA3033659A1 (zh)
TW (1) TWI743168B (zh)
WO (1) WO2018034991A1 (zh)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3543717A1 (de) * 2018-03-22 2019-09-25 Narda Safety Test Solutions GmbH Personenschutz-messgerät
EP3789781B1 (en) * 2019-09-06 2023-09-27 Valeo Comfort and Driving Assistance Antenna assembly
KR20220029950A (ko) * 2020-09-02 2022-03-10 삼성전자주식회사 검출 회로 및 이를 포함하는 전자 장치
WO2023193319A1 (en) * 2022-04-05 2023-10-12 National Instruments Corporation Digital architecture for continuity test

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FR2791493B1 (fr) 1999-03-25 2001-06-08 Inside Technologies Circuit d'emission/reception de donnees par couplage inductif
DE19923729A1 (de) * 1999-05-22 2000-11-23 Nokia Mobile Phones Ltd Schaltungsanordnung zum Prüfen der Funktionsbereitschaft mindestens einer Antenne
KR20010029628A (ko) * 1999-09-24 2001-04-06 가츠노리 이카케 교류 전원 접지측 검출장치
WO2003071293A1 (de) * 2002-02-22 2003-08-28 Daimlerchrysler Ag Verfahren und anordnung zum prüfen mindestens einer antenne
FR2845161B1 (fr) * 2002-09-30 2004-10-29 Siemens Vdo Automotive Procede de diagnostic concernant le branchement d'une antenne
US6928281B2 (en) * 2002-12-12 2005-08-09 Visteon Global Technologies, Inc. Active antenna system with fault detection
JP2005315578A (ja) * 2004-04-26 2005-11-10 Advanced Telecommunication Research Institute International アンテナの検査方法及びアンテナ検査システム
US7224170B2 (en) * 2004-12-27 2007-05-29 P. G. Electronics Fault monitoring in a distributed antenna system
US20060197538A1 (en) * 2005-03-07 2006-09-07 Nokia Corporation Self-test method for antennas
US7372678B2 (en) * 2005-08-24 2008-05-13 Leviton Manufacturing Co., Inc. Circuit interrupting device with automatic test
US7733078B2 (en) 2006-09-05 2010-06-08 Greenlee Textron, Inc. Self-test probe design & method for non-contact voltage detectors
JP5047583B2 (ja) * 2006-10-25 2012-10-10 日本電信電話株式会社 非接触データキャリア読み書き装置
US8085516B1 (en) * 2008-07-11 2011-12-27 Fairchild Semiconductor Corporation Ground fault circuit interrupter with self test
US8362783B2 (en) * 2008-08-27 2013-01-29 Agc Automotive Americas Co. Method for verifying a completeness of an antenna
CN101459477B (zh) * 2008-12-28 2012-07-04 中国电子科技集团公司第四十一研究所 一种手机天线辐射性能自动测试方法
US8581609B2 (en) 2009-06-03 2013-11-12 Fluke Corporation Shielded antenna for system test of a non-contact voltage detector
CN101998452B (zh) * 2009-08-25 2014-07-16 英派尔科技开发有限公司 计算天线性能
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CN102565549A (zh) * 2010-10-05 2012-07-11 索尼公司 天线测量系统和方法
CN102013927B (zh) * 2010-11-16 2014-09-10 意法·爱立信半导体（北京）有限公司 通信设备和天线的测试装置
CN201993430U (zh) * 2011-01-21 2011-09-28 比亚迪股份有限公司 一种天线连接状态检测电路
CN202102073U (zh) * 2011-05-19 2012-01-04 上海工力自动化仪表有限公司 Gps车载终端天线短路及断路的检测装置
EP2570818A1 (en) * 2011-09-16 2013-03-20 ST-Ericsson SA Testing method detecting incorrectly connected antenna contacts
US9287624B2 (en) * 2013-10-21 2016-03-15 Hong Kong Applied Science and Technology Research Institute Company Limited Antenna circuit and a method of optimisation thereof
CN104580629B (zh) * 2013-10-23 2018-08-24 厦门雅迅网络股份有限公司 一种基于信号改进的手机模块天线开路检测装置和方法
CN104714116A (zh) * 2013-12-12 2015-06-17 上海博泰悦臻网络技术服务有限公司 天线检测电路
CN104796205A (zh) * 2014-01-22 2015-07-22 深圳富泰宏精密工业有限公司 天线自检装置
US9728852B2 (en) * 2014-07-31 2017-08-08 Mediatek Inc. Matching circuit for antenna and associated method
TWI549356B (zh) * 2014-09-22 2016-09-11 宏碁股份有限公司 電子裝置
KR20160088152A (ko) * 2015-01-15 2016-07-25 엘지전자 주식회사 이동 단말기의 rf성능 불량 테스트 회로 및 그 방법
CN104535841A (zh) * 2015-01-26 2015-04-22 苏黎 一种天线检测系统及装置

Also Published As

Publication number Publication date
US20190004107A1 (en) 2019-01-03
US10317458B2 (en) 2019-06-11
TWI743168B (zh) 2021-10-21
WO2018034991A1 (en) 2018-02-22
US20180052195A1 (en) 2018-02-22
CN109791188A (zh) 2019-05-21
KR20190039191A (ko) 2019-04-10
CN109791188B (zh) 2022-01-28
KR102462979B1 (ko) 2022-11-03
CN114325539A (zh) 2022-04-12
US10067178B2 (en) 2018-09-04
TW201812314A (zh) 2018-04-01

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Effective date: 20220808

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EEER Examination request

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