CA2849330C - Slide scanner with a tilted image - Google Patents

Slide scanner with a tilted image Download PDF

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Publication number
CA2849330C
CA2849330C CA2849330A CA2849330A CA2849330C CA 2849330 C CA2849330 C CA 2849330C CA 2849330 A CA2849330 A CA 2849330A CA 2849330 A CA2849330 A CA 2849330A CA 2849330 C CA2849330 C CA 2849330C
Authority
CA
Canada
Prior art keywords
specimen
scan
detector array
instrument
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CA2849330A
Other languages
English (en)
French (fr)
Other versions
CA2849330A1 (en
Inventor
Savvas Damaskinos (Nmi)
Arthur Edward Dixon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Huron Technologies International Inc
Original Assignee
Huron Technologies International Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Huron Technologies International Inc filed Critical Huron Technologies International Inc
Publication of CA2849330A1 publication Critical patent/CA2849330A1/en
Application granted granted Critical
Publication of CA2849330C publication Critical patent/CA2849330C/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/34—Microscope slides, e.g. mounting specimens on microscope slides
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Multimedia (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)
CA2849330A 2011-09-21 2012-09-21 Slide scanner with a tilted image Active CA2849330C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161537460P 2011-09-21 2011-09-21
US61/537,460 2011-09-21
PCT/CA2012/000868 WO2013040686A1 (en) 2011-09-21 2012-09-21 Slide scanner with a tilted image plane

Publications (2)

Publication Number Publication Date
CA2849330A1 CA2849330A1 (en) 2013-03-28
CA2849330C true CA2849330C (en) 2020-11-03

Family

ID=47913706

Family Applications (1)

Application Number Title Priority Date Filing Date
CA2849330A Active CA2849330C (en) 2011-09-21 2012-09-21 Slide scanner with a tilted image

Country Status (5)

Country Link
US (1) US9632301B2 (enExample)
EP (1) EP2758825B1 (enExample)
CA (1) CA2849330C (enExample)
IN (1) IN2014DN03134A (enExample)
WO (1) WO2013040686A1 (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013138911A1 (en) * 2012-03-23 2013-09-26 Huron Technologies International Inc. Slide scanner with dynamic focus and specimen tilt and method of operation
EP2845045B1 (en) 2012-05-02 2023-07-12 Leica Biosystems Imaging, Inc. Real-time focusing in line scan imaging
JP6027875B2 (ja) * 2012-12-07 2016-11-16 オリンパス株式会社 撮像装置及び顕微鏡システム
EP3019905B1 (en) * 2013-04-30 2020-06-03 Molecular Devices, LLC Apparatus and method for generating in-focus images using parallel imaging in a microscopy system
WO2015091300A1 (en) * 2013-12-16 2015-06-25 Koninklijke Philips N.V. Scanning imaging system with a novel imaging sensor with gaps for electronic circuitry
US10877255B2 (en) * 2015-04-02 2020-12-29 Huron Technologies International Inc. High resolution pathology scanner with improved signal to noise ratio
US10244149B2 (en) 2015-06-09 2019-03-26 Lockheed Martin Corporation Imaging system with scan line titled off focal plane
US10634894B2 (en) 2015-09-24 2020-04-28 Leica Biosystems Imaging, Inc. Real-time focusing in line scan imaging
JP6901484B2 (ja) * 2015-12-09 2021-07-14 ベンタナ メディカル システムズ， インコーポレイテッド 画像スキャン装置および画像スキャン装置の動作方法
CN118962955A (zh) 2016-02-22 2024-11-15 皇家飞利浦有限公司 用于生成生物样本的具有增强景深的合成2d图像的系统
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees
DE102017107348B4 (de) * 2017-04-05 2019-03-14 Olympus Soft Imaging Solutions Gmbh Verfahren zur zytometrischen Analyse von Zellproben
US11106026B2 (en) * 2017-04-24 2021-08-31 Huron Technologies International Inc. Scanning microscope for 3D imaging using MSIA
US10823952B2 (en) * 2017-06-22 2020-11-03 Huron Technologies International Inc. MSIA scanning instrument with increased dynamic range
CN111133359B (zh) * 2017-09-29 2022-12-13 徕卡生物系统成像股份有限公司 二维和三维固定z扫描
EP3798711A1 (en) * 2019-09-27 2021-03-31 Leica Microsystems CMS GmbH Imaging device and method for imaging an object using a microscope
EP4264231A4 (en) * 2020-12-16 2024-11-13 Singular Genomics Systems, Inc. Kinematic imaging system
WO2025072582A1 (en) * 2023-09-27 2025-04-03 Leica Biosystems Imaging, Inc. Automatic tilt compensation in a digital scanning system
US12452530B2 (en) 2023-12-20 2025-10-21 Illumina, Inc. Intelligent sample tilt adjustment with zones having variable size

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0843059A (ja) * 1994-07-27 1996-02-16 Nikon Corp 近接場走査型顕微鏡
US7095032B2 (en) * 1998-03-20 2006-08-22 Montagu Jean I Focusing of microscopes and reading of microarrays
US7518652B2 (en) * 2000-05-03 2009-04-14 Aperio Technologies, Inc. Method and apparatus for pre-focus in a linear array based slide scanner
US6583865B2 (en) * 2000-08-25 2003-06-24 Amnis Corporation Alternative detector configuration and mode of operation of a time delay integration particle analyzer
DE10234756B3 (de) * 2002-07-30 2004-02-12 Leica Microsystems Semiconductor Gmbh Autofokusmodul für mikroskopbasierte Systeme
US20050089208A1 (en) * 2003-07-22 2005-04-28 Rui-Tao Dong System and method for generating digital images of a microscope slide
JP4759277B2 (ja) * 2005-01-21 2011-08-31 オリンパス株式会社 観察方法および観察補助具
WO2008137746A1 (en) * 2007-05-04 2008-11-13 Aperio Technologies, Inc. Rapid microscope scanner for volume image acquisition
EP2720076B1 (en) * 2009-12-30 2019-04-03 Koninklijke Philips N.V. Self autofocus sensor

Also Published As

Publication number Publication date
IN2014DN03134A (enExample) 2015-05-22
US20140231638A1 (en) 2014-08-21
EP2758825B1 (en) 2016-05-18
WO2013040686A1 (en) 2013-03-28
CA2849330A1 (en) 2013-03-28
US9632301B2 (en) 2017-04-25
EP2758825A4 (en) 2015-04-15
EP2758825A1 (en) 2014-07-30

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Effective date: 20170921