CA2720776C - X-ray generator with polycapillary optic - Google Patents

X-ray generator with polycapillary optic Download PDF

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Publication number
CA2720776C
CA2720776C CA2720776A CA2720776A CA2720776C CA 2720776 C CA2720776 C CA 2720776C CA 2720776 A CA2720776 A CA 2720776A CA 2720776 A CA2720776 A CA 2720776A CA 2720776 C CA2720776 C CA 2720776C
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CA
Canada
Prior art keywords
optic
ray
graded
baez
focusing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CA2720776A
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English (en)
French (fr)
Other versions
CA2720776A1 (en
Inventor
Boris Verman
Licai Jiang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Innovative Technologies Inc
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Rigaku Innovative Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
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Publication of CA2720776A1 publication Critical patent/CA2720776A1/en
Application granted granted Critical
Publication of CA2720776C publication Critical patent/CA2720776C/en
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Classifications

    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/061Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements characterised by a multilayer structure

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CA2720776A 2008-04-11 2009-04-10 X-ray generator with polycapillary optic Active CA2720776C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US4414808P 2008-04-11 2008-04-11
US61/044,148 2008-04-11
PCT/US2009/040178 WO2009126868A1 (en) 2008-04-11 2009-04-10 X-ray generator with polycapillary optic

Publications (2)

Publication Number Publication Date
CA2720776A1 CA2720776A1 (en) 2009-10-15
CA2720776C true CA2720776C (en) 2013-07-02

Family

ID=40834348

Family Applications (1)

Application Number Title Priority Date Filing Date
CA2720776A Active CA2720776C (en) 2008-04-11 2009-04-10 X-ray generator with polycapillary optic

Country Status (5)

Country Link
US (2) US7933383B2 (enExample)
EP (1) EP2263238B1 (enExample)
JP (1) JP5531009B2 (enExample)
CA (1) CA2720776C (enExample)
WO (1) WO2009126868A1 (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2263238B1 (en) * 2008-04-11 2012-06-20 Rigaku Innovative Technologies, Inc. X-ray generator with polycapillary optic
FR2958858B1 (fr) * 2010-04-15 2012-06-29 Joel Kerjean Dispositif de guidage de photons pour appareil de radiotherapie
US8831175B2 (en) * 2010-05-19 2014-09-09 Eric H. Silver Hybrid X-ray optic apparatus and methods
CN102543243B (zh) * 2010-12-28 2016-07-13 Ge医疗系统环球技术有限公司 集成毛细管式平行x射线聚焦透镜
EP2740127B1 (en) * 2011-08-06 2017-11-29 Rigaku Innovative Technologies, Inc. Nanotube based device for guiding x-ray photons and neutrons
US20130182827A1 (en) * 2011-12-02 2013-07-18 Canon Kabushiki Kaisha X-ray waveguide and x-ray waveguide system
JP6016386B2 (ja) * 2012-03-09 2016-10-26 キヤノン株式会社 X線光学装置
JP5964705B2 (ja) * 2012-09-14 2016-08-03 浜松ホトニクス株式会社 ポリキャピラリレンズ
EP2898361A4 (en) 2012-09-24 2016-06-01 Convergent R N R Ltd X-RAY REFLECTIVE LENS ARRANGEMENT
CN202905197U (zh) * 2012-10-09 2013-04-24 北京师范大学 用于聚焦同步辐射光源的光学器件
US20140161233A1 (en) 2012-12-06 2014-06-12 Bruker Axs Gmbh X-ray apparatus with deflectable electron beam
US9846132B2 (en) 2013-10-21 2017-12-19 Kla-Tencor Corporation Small-angle scattering X-ray metrology systems and methods
US9885962B2 (en) * 2013-10-28 2018-02-06 Kla-Tencor Corporation Methods and apparatus for measuring semiconductor device overlay using X-ray metrology
JP6069609B2 (ja) * 2015-03-26 2017-02-01 株式会社リガク 二重湾曲x線集光素子およびその構成体、二重湾曲x線分光素子およびその構成体の製造方法
US11189392B2 (en) * 2015-09-25 2021-11-30 Osaka University X-ray microscope
US10677744B1 (en) * 2016-06-03 2020-06-09 U.S. Department Of Energy Multi-cone x-ray imaging Bragg crystal spectrometer
DE112017003580T5 (de) * 2016-07-15 2019-05-09 Rigaku Corporation Röntgeninspektionsvorrichtung, Röntgendünnfilminspektionsverfahren und Verfahren zum Messen einer Rocking-Kurve
JP6857400B2 (ja) * 2018-03-01 2021-04-14 株式会社リガク X線発生装置、及びx線分析装置
US12209978B2 (en) 2020-07-15 2025-01-28 Danmarks Tekniske Universitet Laboratory-based 3D scanning X-ray Laue micro-diffraction system and method (Lab3DμXRD)

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Publication number Priority date Publication date Assignee Title
US5497008A (en) 1990-10-31 1996-03-05 X-Ray Optical Systems, Inc. Use of a Kumakhov lens in analytic instruments
US5175755A (en) 1990-10-31 1992-12-29 X-Ray Optical System, Inc. Use of a kumakhov lens for x-ray lithography
US5192869A (en) 1990-10-31 1993-03-09 X-Ray Optical Systems, Inc. Device for controlling beams of particles, X-ray and gamma quanta
EP0723272B1 (en) * 1994-07-08 2001-04-25 Muradin Abubekirovich Kumakhov Method of guiding beams of neutral and charged particles and a device for implementing said method
US5570408A (en) 1995-02-28 1996-10-29 X-Ray Optical Systems, Inc. High intensity, small diameter x-ray beam, capillary optic system
US5604353A (en) 1995-06-12 1997-02-18 X-Ray Optical Systems, Inc. Multiple-channel, total-reflection optic with controllable divergence
US5745547A (en) 1995-08-04 1998-04-28 X-Ray Optical Systems, Inc. Multiple channel optic
US6041099A (en) 1998-02-19 2000-03-21 Osmic, Inc. Single corner kirkpatrick-baez beam conditioning optic assembly
GB9815968D0 (en) 1998-07-23 1998-09-23 Bede Scient Instr Ltd X-ray focusing apparatus
US6333966B1 (en) * 1998-08-18 2001-12-25 Neil Charles Schoen Laser accelerator femtosecond X-ray source
WO2000060610A1 (en) * 1999-04-01 2000-10-12 Mamea Imaging Ab Method and apparatus for simplified alignment in x-ray imaging
US6704389B1 (en) 1999-07-16 2004-03-09 X-Ray Optical Systems, Inc. Support device for a polycapillary optic
US6317483B1 (en) * 1999-11-29 2001-11-13 X-Ray Optical Systems, Inc. Doubly curved optical device with graded atomic planes
US6697454B1 (en) 2000-06-29 2004-02-24 X-Ray Optical Systems, Inc. X-ray analytical techniques applied to combinatorial library screening
DE10112928C1 (de) 2001-03-12 2002-08-22 Ifg Inst Fuer Geraetebau Gmbh Kapillaroptisches Element bestehend aus Kanäle bildenden Kapillaren und Verfahren zu dessen Herstellung
ES2271277T3 (es) 2001-06-19 2007-04-16 X-Ray Optical Systems, Inc. Sistema xrf dispersivo de longitud de onda que usa optica de enfoque para la excitacion y un monocromador de enfoque para la recogida.
WO2003012797A1 (en) 2001-07-27 2003-02-13 X-Ray Optical Systems, Inc. Methods and devices for aligning and determining the focusing characteristics of x-ray optics
WO2003049510A2 (en) 2001-12-04 2003-06-12 X-Ray Optical Systems, Inc. X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof
US7382856B2 (en) 2001-12-04 2008-06-03 X-Ray Optical Systems, Inc. X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof
US6781060B2 (en) 2002-07-26 2004-08-24 X-Ray Optical Systems Incorporated Electrical connector, a cable sleeve, and a method for fabricating an electrical connection
US7372880B2 (en) * 2002-12-20 2008-05-13 Alnair Labs Corporation Optical pulse lasers
JP2007501503A (ja) 2003-08-04 2007-01-25 エックス−レイ オプティカル システムズ インコーポレーテッド 管電力調節および遠隔較正を使用して出力安定性が向上したx線源アセンブリ
US7023955B2 (en) 2003-08-12 2006-04-04 X-Ray Optical System, Inc. X-ray fluorescence system with apertured mask for analyzing patterned surfaces
US7991116B2 (en) * 2005-08-04 2011-08-02 X-Ray Optical Systems, Inc. Monochromatic x-ray micro beam for trace element mapping
WO2008097345A2 (en) 2006-08-10 2008-08-14 X-Ray Optical Systems, Inc. Wide parallel beam diffraction imaging method and system
JP4860418B2 (ja) * 2006-10-10 2012-01-25 株式会社リガク X線光学系
EP2263238B1 (en) * 2008-04-11 2012-06-20 Rigaku Innovative Technologies, Inc. X-ray generator with polycapillary optic

Also Published As

Publication number Publication date
US7933383B2 (en) 2011-04-26
CA2720776A1 (en) 2009-10-15
WO2009126868A1 (en) 2009-10-15
EP2263238A1 (en) 2010-12-22
US20110280530A1 (en) 2011-11-17
EP2263238B1 (en) 2012-06-20
JP2011516892A (ja) 2011-05-26
US20090279670A1 (en) 2009-11-12
JP5531009B2 (ja) 2014-06-25

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