CA2604685C - Diagnosis and calibration system for icp-ms apparatus - Google Patents
Diagnosis and calibration system for icp-ms apparatus Download PDFInfo
- Publication number
- CA2604685C CA2604685C CA2604685A CA2604685A CA2604685C CA 2604685 C CA2604685 C CA 2604685C CA 2604685 A CA2604685 A CA 2604685A CA 2604685 A CA2604685 A CA 2604685A CA 2604685 C CA2604685 C CA 2604685C
- Authority
- CA
- Canada
- Prior art keywords
- parameter
- sensitivity
- aggregate
- measurement
- plasma
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000003745 diagnosis Methods 0.000 title claims description 28
- 238000005259 measurement Methods 0.000 claims abstract description 151
- 239000000443 aerosol Substances 0.000 claims abstract description 46
- 239000012159 carrier gas Substances 0.000 claims abstract description 34
- 230000035945 sensitivity Effects 0.000 claims description 70
- 239000007788 liquid Substances 0.000 claims description 53
- 150000002500 ions Chemical class 0.000 claims description 43
- 238000004458 analytical method Methods 0.000 claims description 25
- 238000009616 inductively coupled plasma Methods 0.000 claims description 10
- AHKZTVQIVOEVFO-UHFFFAOYSA-N oxide(2-) Chemical compound [O-2] AHKZTVQIVOEVFO-UHFFFAOYSA-N 0.000 claims description 8
- 238000012986 modification Methods 0.000 claims description 3
- 230000004048 modification Effects 0.000 claims description 3
- 239000000523 sample Substances 0.000 description 57
- 239000007789 gas Substances 0.000 description 50
- 238000012937 correction Methods 0.000 description 32
- 238000000034 method Methods 0.000 description 29
- 230000000875 corresponding effect Effects 0.000 description 20
- 239000011159 matrix material Substances 0.000 description 19
- 238000007865 diluting Methods 0.000 description 15
- 239000012895 dilution Substances 0.000 description 15
- 238000010790 dilution Methods 0.000 description 15
- 230000008859 change Effects 0.000 description 10
- 230000001276 controlling effect Effects 0.000 description 10
- 238000005070 sampling Methods 0.000 description 9
- 239000006199 nebulizer Substances 0.000 description 6
- 239000007921 spray Substances 0.000 description 6
- 238000007435 diagnostic evaluation Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 238000010884 ion-beam technique Methods 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 238000012423 maintenance Methods 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 229910021645 metal ion Inorganic materials 0.000 description 4
- 230000002572 peristaltic effect Effects 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000032258 transport Effects 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 1
- 230000006399 behavior Effects 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- ZMIGMASIKSOYAM-UHFFFAOYSA-N cerium Chemical compound [Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce] ZMIGMASIKSOYAM-UHFFFAOYSA-N 0.000 description 1
- 239000012468 concentrated sample Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000002405 diagnostic procedure Methods 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 1
- 238000001819 mass spectrum Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 238000002663 nebulization Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 239000013535 sea water Substances 0.000 description 1
- 238000010206 sensitivity analysis Methods 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/26—Plasma torches
- H05H1/30—Plasma torches using applied electromagnetic fields, e.g. high frequency or microwave energy
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Electromagnetism (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006295462A JP4822346B2 (ja) | 2006-10-31 | 2006-10-31 | 誘導結合プラズマ質量分析装置のための診断及び較正システム |
| JP2006-295462 | 2006-10-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2604685A1 CA2604685A1 (en) | 2008-04-30 |
| CA2604685C true CA2604685C (en) | 2016-06-28 |
Family
ID=39277834
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA2604685A Active CA2604685C (en) | 2006-10-31 | 2007-09-27 | Diagnosis and calibration system for icp-ms apparatus |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7869968B2 (de) |
| JP (1) | JP4822346B2 (de) |
| CA (1) | CA2604685C (de) |
| DE (1) | DE102007046367B4 (de) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200817931A (en) * | 2006-07-10 | 2008-04-16 | Asterion Inc | System and method for performing processing in a testing system |
| JP4903515B2 (ja) * | 2006-08-11 | 2012-03-28 | アジレント・テクノロジーズ・インク | 誘導結合プラズマ質量分析装置 |
| KR101364645B1 (ko) * | 2012-01-30 | 2014-02-20 | 한국원자력연구원 | 플라즈마 검출장치, 이를 구비하는 유도결합플라즈마 질량분석기 및 플라즈마와 이온신호의 상관관계 분석방법 |
| JP6345934B2 (ja) * | 2013-12-27 | 2018-06-20 | アジレント・テクノロジーズ・インクＡｇｉｌｅｎｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｉｎｃ． | 質量分析メソッドの自動生成方法 |
| CN106463329B (zh) | 2014-02-14 | 2019-09-24 | 珀金埃尔默健康科学公司 | 用于多模式电感耦合等离子体质谱仪的自动化优化的系统及方法 |
| CN103996890B (zh) | 2014-05-26 | 2016-02-10 | 唐山轨道客车有限责任公司 | 用于有轨电车的热控制系统 |
| GB2548071B (en) * | 2015-12-18 | 2018-05-02 | Thermo Fisher Scient Bremen Gmbh | Liquid sample introduction system and method, for analytical plasma spectrometer |
| JP6734061B2 (ja) * | 2016-01-29 | 2020-08-05 | アジレント・テクノロジーズ・インクＡｇｉｌｅｎｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｉｎｃ． | プラズマ分光分析装置 |
| JP6870406B2 (ja) * | 2017-03-21 | 2021-05-12 | 株式会社島津製作所 | タンデム四重極型質量分析装置および該装置の制御パラメータ最適化方法 |
| EP3654739A4 (de) * | 2017-07-13 | 2021-04-07 | Shimadzu Corporation | Plasmaerzeugungsvorrichtung, lichtemissionsanalysevorrichtung und massenanalysevorrichtung mit der plasmaerzeugungsvorrichtung und vorrichtungsstatusauswertungsverfahren |
| US11961727B2 (en) * | 2019-08-07 | 2024-04-16 | Shimadzu Corporation | Mass spectrometer and program for mass spectrometer |
| CN112823282B (zh) * | 2019-08-29 | 2022-02-15 | 埃耶士株式会社 | 金属微粒的分析方法及感应耦合等离子体质量分析方法 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07123035B2 (ja) | 1987-06-29 | 1995-12-25 | 横河電機株式会社 | 高周波誘導結合プラズマ・質量分析装置 |
| JP2593587B2 (ja) * | 1991-03-12 | 1997-03-26 | 株式会社日立製作所 | プラズマイオン源極微量元素質量分析装置 |
| JP3215487B2 (ja) * | 1992-04-13 | 2001-10-09 | セイコーインスツルメンツ株式会社 | 誘導結合プラズマ質量分析装置 |
| JP3578518B2 (ja) * | 1995-06-21 | 2004-10-20 | 横河アナリティカルシステムズ株式会社 | 質量分析装置におけるレンズパラメータの最適化方法及び最適化装置 |
| JPH09129174A (ja) * | 1995-10-31 | 1997-05-16 | Hitachi Ltd | 質量分析装置 |
| JPH116788A (ja) | 1997-06-17 | 1999-01-12 | Yokogawa Analytical Syst Kk | 溶液の自動調製方法及び自動調製装置 |
| JP2000340168A (ja) * | 1999-05-28 | 2000-12-08 | Hitachi Ltd | プラズマイオン源質量分析装置及びイオン源位置調整方法 |
| US7119330B2 (en) * | 2002-03-08 | 2006-10-10 | Varian Australia Pty Ltd | Plasma mass spectrometer |
| JP4903515B2 (ja) | 2006-08-11 | 2012-03-28 | アジレント・テクノロジーズ・インク | 誘導結合プラズマ質量分析装置 |
-
2006
- 2006-10-31 JP JP2006295462A patent/JP4822346B2/ja active Active
-
2007
- 2007-09-25 US US11/903,912 patent/US7869968B2/en active Active
- 2007-09-27 CA CA2604685A patent/CA2604685C/en active Active
- 2007-09-27 DE DE102007046367.9A patent/DE102007046367B4/de active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP4822346B2 (ja) | 2011-11-24 |
| US20080099671A1 (en) | 2008-05-01 |
| CA2604685A1 (en) | 2008-04-30 |
| US7869968B2 (en) | 2011-01-11 |
| JP2008111744A (ja) | 2008-05-15 |
| DE102007046367A1 (de) | 2008-05-15 |
| DE102007046367B4 (de) | 2014-05-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request |