CA2554226C - Ratiometric stud sensing and apparatus for same - Google Patents

Ratiometric stud sensing and apparatus for same Download PDF

Info

Publication number
CA2554226C
CA2554226C CA2554226A CA2554226A CA2554226C CA 2554226 C CA2554226 C CA 2554226C CA 2554226 A CA2554226 A CA 2554226A CA 2554226 A CA2554226 A CA 2554226A CA 2554226 C CA2554226 C CA 2554226C
Authority
CA
Canada
Prior art keywords
capacitance
plate
ratio
sensor
stud
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CA2554226A
Other languages
English (en)
French (fr)
Other versions
CA2554226A1 (en
Inventor
Lawrence F. Miller
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zircon Corp
Original Assignee
Zircon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=34912249&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=CA2554226(C) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Zircon Corp filed Critical Zircon Corp
Publication of CA2554226A1 publication Critical patent/CA2554226A1/en
Application granted granted Critical
Publication of CA2554226C publication Critical patent/CA2554226C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V3/00—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation
    • G01V3/08—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices
    • G01V3/088—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices operating with electric fields

Landscapes

  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Remote Sensing (AREA)
  • Geology (AREA)
  • Environmental & Geological Engineering (AREA)
  • Electromagnetism (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Geophysics (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
CA2554226A 2004-03-04 2005-02-04 Ratiometric stud sensing and apparatus for same Expired - Lifetime CA2554226C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/794,356 US7116091B2 (en) 2004-03-04 2004-03-04 Ratiometric stud sensing
US10/794,356 2004-03-04
PCT/US2005/003348 WO2005093461A1 (en) 2004-03-04 2005-02-04 Ratiometric stud sensing and apparatus for same

Publications (2)

Publication Number Publication Date
CA2554226A1 CA2554226A1 (en) 2005-10-06
CA2554226C true CA2554226C (en) 2013-11-12

Family

ID=34912249

Family Applications (1)

Application Number Title Priority Date Filing Date
CA2554226A Expired - Lifetime CA2554226C (en) 2004-03-04 2005-02-04 Ratiometric stud sensing and apparatus for same

Country Status (5)

Country Link
US (1) US7116091B2 (enExample)
EP (1) EP1721191B1 (enExample)
JP (2) JP4152361B2 (enExample)
CA (1) CA2554226C (enExample)
WO (1) WO2005093461A1 (enExample)

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7495455B2 (en) * 2002-06-28 2009-02-24 Solar Wide Industrial Limited Stud sensing device
DE102004007314A1 (de) * 2004-02-14 2005-08-25 Robert Bosch Gmbh Verfahren und Messgerät zur Ortung von in einem Medium eingeschlossenen Objekten
US8253619B2 (en) 2005-02-15 2012-08-28 Techtronic Power Tools Technology Limited Electromagnetic scanning imager
US7569762B2 (en) * 2006-02-02 2009-08-04 Xpresense Llc RF-based dynamic remote control for audio effects devices or the like
US7449892B2 (en) * 2006-06-02 2008-11-11 Cal-Tek 2000, Inc. Stray voltage detecting
GB0623432D0 (en) * 2006-11-24 2007-01-03 Trw Ltd Capacitance sensing apparatus
US7504817B2 (en) * 2007-03-28 2009-03-17 Solar Wide Industrial Limited Stud sensor
US8428293B2 (en) * 2007-05-21 2013-04-23 Panasonic Corporation Speaker device
US7982450B2 (en) * 2008-02-13 2011-07-19 Lanny S Smoot Device and method allowing the detection and display of objects located behind an obscuring surface
US7671576B2 (en) * 2008-03-06 2010-03-02 Zircon Corporation Ratiometric AC wire tracer
EP3591796B1 (en) 2008-03-07 2020-09-30 Milwaukee Electric Tool Corporation Battery pack for use with a power tool and a non-motorized sensing tool
GB2464279B (en) * 2008-10-07 2012-10-24 Thales Holdings Uk Plc Detection of a buried electric wire
JP5646496B2 (ja) * 2008-10-16 2014-12-24 ジルコン・コーポレイションＺｉｒｃｏｎ Ｃｏｒｐｏｒａｔｉｏｎ 手持ち式のセンサ機器および手持ち式のセンサ機器を用いた視覚的な指標を投影する方法
DE102008054460A1 (de) 2008-12-10 2010-06-17 Robert Bosch Gmbh Ortungsvorrichtung
DE102008054445A1 (de) * 2008-12-10 2010-06-17 Robert Bosch Gmbh Ortungsgerät
WO2010095393A1 (ja) 2009-02-20 2010-08-26 パナソニック株式会社 ファイルシステム管理方法および記録媒体
US9664808B2 (en) 2009-03-06 2017-05-30 Milwaukee Electric Tool Corporation Wall scanner
DE102009057439B4 (de) * 2009-10-27 2012-09-27 Gerd Reime Vorrichtung und Verfahren zur fehlerfreien kapazitiven Messwerterfassung
WO2011109736A2 (en) * 2010-03-04 2011-09-09 Dorrough David M Obscured feature detector
US8476912B2 (en) * 2010-03-04 2013-07-02 Franklin Sensors, Inc. Obscured feature detector and method
US8593163B2 (en) * 2010-03-04 2013-11-26 Franklin Sensors, Inc. Surface-conforming obscured feature detector
US8791708B2 (en) * 2010-03-04 2014-07-29 Franklin Sensors Inc. Obscured feature detector with advanced trace properties
DE102010039953A1 (de) * 2010-08-30 2012-03-01 Robert Bosch Gmbh Verfahren zur Lokalisierung von in einem Medium eingeschlossenen Objekten, sowie Messgerät zur Durchführung des Verfahrens
US9354033B2 (en) * 2011-11-18 2016-05-31 Fluke Corporation Smart electromagnetic sensor array
DE102012205126B4 (de) * 2012-03-29 2024-12-12 Robert Bosch Gmbh Kapazitives Ortungsgerät
WO2014164964A1 (en) * 2013-03-12 2014-10-09 Robert Bosch Gmbh Workpiece material detector for a power tool
US10203424B2 (en) * 2014-07-17 2019-02-12 Hangzhou Great Star Tools Co., Ltd. Stud sensor
US9835575B2 (en) * 2014-10-16 2017-12-05 Ams International Ag Ratiometric device
US10663613B2 (en) * 2015-06-23 2020-05-26 Franklin Sensors, Inc. Apparatus and methods for detecting obscured features
US10613243B2 (en) * 2017-04-27 2020-04-07 Franklin Sensors Inc. Apparatus and methods for obscured feature detection
US10261208B2 (en) 2015-06-23 2019-04-16 David M. Dorrough Apparatus and methods for detecting obscured features
US10895657B2 (en) 2017-01-13 2021-01-19 Franklin Sensors Inc. Apparatus and methods for obscured feature detection with uniform electric fields
US10524592B2 (en) * 2015-12-01 2020-01-07 Black & Decker Inc. Picture hanging device
CN105589107A (zh) * 2016-02-15 2016-05-18 晁蕾 屋顶渗漏探测装置
CN105785447A (zh) * 2016-02-29 2016-07-20 杭州立方控股股份有限公司 一种介质感应式通道目标检测方法
US9903975B1 (en) 2016-11-16 2018-02-27 Lanny Starkes Smoot Device and method to detect and display objects behind an obscuring surface
DE102020104789A1 (de) * 2019-02-26 2020-08-27 Makita Corporation Suchvorrichtung für ein eingebettetes objekt
WO2020191235A1 (en) * 2019-03-21 2020-09-24 Franklin Sensors, Inc. Apparatus and methods for detecting obscured features
US11257257B1 (en) * 2021-03-13 2022-02-22 Michael H. Panosian Multi-mode obscured object detector
US12117319B2 (en) 2022-03-10 2024-10-15 Franklin Sensors Inc. Display methods, techniques, and apparatus for obscured feature detectors
US12174333B2 (en) 2022-10-12 2024-12-24 Franklin Sensors Inc. Display methods, techniques, and apparatus for indicating a centerline of an obscured feature
CN115940570B (zh) * 2023-02-13 2024-06-04 基合半导体（宁波）有限公司 对焦马达、对焦马达的闭环控制方法及摄像设备
US12493131B2 (en) * 2024-04-02 2025-12-09 Zircon Corporation System and method for detecting objects behind an opaque surface
US12493132B2 (en) * 2024-04-02 2025-12-09 Zircon Corporation System and method for dynamic gain switching in detecting objects behind an opaque surface

Family Cites Families (55)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3278843A (en) 1962-10-01 1966-10-11 Hughes Aircraft Co Thickness rate monitoring system for depositing dielectric films
US3662258A (en) 1969-09-16 1972-05-09 Brunswick Corp Device for locating nails beneath the surface of a bowling lane
US3704413A (en) 1970-01-07 1972-11-28 Maurice E Blevins Method of translating the location of a predetermined position on one side of a substantially nonferrous structural barrier of a building to an opposite side of said barrier
US3836848A (en) 1970-01-07 1974-09-17 M Blevins Method of translating the location of a predetermined position on one side of a substantially nonferrous structural barrier of a building to an opposite side of said barrier
US3893025A (en) * 1974-02-01 1975-07-01 Plosser George G Apparatus for determining the distance to a concealed conductive structure
US4086528A (en) 1975-09-17 1978-04-25 United Kingdom Atomic Energy Authority Capacitive transducers
US4041382A (en) 1976-08-16 1977-08-09 The Sippican Corporation Calibrating a measurement system including bridge circuit
US4067225A (en) 1977-03-21 1978-01-10 Mechanical Technology Incorporated Capacitance type non-contact displacement and vibration measuring device and method of maintaining calibration
US4099118A (en) 1977-07-25 1978-07-04 Franklin Robert C Electronic wall stud sensor
US4130796A (en) 1977-12-07 1978-12-19 Westinghouse Electric Corp. Calibrating and measuring circuit for a capacitive probe-type instrument
US4322678A (en) 1978-10-30 1982-03-30 Capots Larry H Identification of materials using their complex dielectric response
US4464622A (en) 1982-03-11 1984-08-07 Franklin Robert C Electronic wall stud sensor
JPS5945585U (ja) * 1982-09-20 1984-03-26 ホーチキ株式会社 桟検出器
JPS59214702A (ja) * 1983-05-20 1984-12-04 Maki Seisakusho:Kk 金属体のエツジ検出装置
US4639666A (en) 1984-08-27 1987-01-27 New Holland, Inc. Metal detector sensitivity adjustment and test assembly
DE3433148C2 (de) 1984-09-10 1987-01-22 Endress U. Hauser Gmbh U. Co, 7867 Maulburg Anordnung zur Erfassung räumlicher Inhomogenitäten in einem Dielektrikum
US4676100A (en) 1984-10-31 1987-06-30 Berwind Corporation Capacitance-type material level indicator
GB8607747D0 (en) * 1986-03-27 1986-04-30 Duracell Int Device
JPH0515116Y2 (enExample) * 1986-09-25 1993-04-21
JP2681040B2 (ja) * 1987-03-16 1997-11-19 株式会社マイゾックス 非金属・金属部材探知器
US4847552A (en) 1987-07-07 1989-07-11 The Boeing Company Detection of electrically conductive materials beneath surface coatings employing eddy currents
US4868910A (en) 1988-02-16 1989-09-19 White's Electronics, Inc. Metal detector with microprocessor control and analysis
US4947116A (en) 1988-09-02 1990-08-07 Hamilton Standard Controls, Inc. Inductive speed sensor employing phase shift
US4939455A (en) 1988-09-02 1990-07-03 Hamilton Standard Controls, Inc. Sensor having two-wire connection to load
US5023494A (en) 1989-10-20 1991-06-11 Raytheon Company High isolation passive switch
CA2027225A1 (en) * 1989-10-27 1991-04-28 Donald James Macleod Spindle motor assembly for disc drives
JPH04152361A (ja) * 1990-10-16 1992-05-26 Mita Ind Co Ltd 画像形成装置
DE4107366C1 (enExample) * 1991-03-08 1992-04-23 Leica Heerbrugg Ag, Heerbrugg, Ch
WO1993003403A1 (en) * 1991-08-01 1993-02-18 Gabriel Fortin Method and device for electrostatically investigating surface and sub-surface structures
US5425367A (en) 1991-09-04 1995-06-20 Navion Biomedical Corporation Catheter depth, position and orientation location system
JPH0566102A (ja) * 1991-09-06 1993-03-19 Komatsu Ltd 位置検出装置
US5352974A (en) 1992-08-14 1994-10-04 Zircon Corporation Stud sensor with digital averager and dual sensitivity
US5457394A (en) * 1993-04-12 1995-10-10 The Regents Of The University Of California Impulse radar studfinder
GB9404416D0 (en) * 1994-03-08 1994-04-20 Turner Intellect Property Ltd Device for finding concealed studs
US5594353A (en) * 1995-05-11 1997-01-14 Elsag International N.V. Method and apparatus for measuring the change in capacitance values in dual capacitors
US5617031A (en) * 1996-05-16 1997-04-01 The United States Of America As Represented By The Secretary Of The Army Buried pipe locator utilizing a change in ground capacitance
US5917314A (en) 1996-08-08 1999-06-29 Zircon Corporation Electronic wall-stud sensor with three capacitive elements
US6211662B1 (en) * 1998-08-07 2001-04-03 The Stanley Works Hand-held hidden object sensor for sensing a location of objects hidden behind a surface of an architectural structure
JP2000097736A (ja) * 1998-09-22 2000-04-07 Reideikku:Kk 変位測定装置
WO2001004578A1 (de) 1999-07-13 2001-01-18 Maximilian Indihar Elektrischer sensor zur messung einer kapazitätsänderung und umsetzung in ein spannungssignal
JP2001091205A (ja) * 1999-07-22 2001-04-06 Sumitomo Metal Ind Ltd 物体搭載装置
US6587093B1 (en) 1999-11-04 2003-07-01 Synaptics Incorporated Capacitive mouse
JP2001133207A (ja) * 1999-11-08 2001-05-18 Nireco Corp 位置検出器
US6804262B1 (en) 2000-04-28 2004-10-12 3Com Corporation Method and apparatus for channel determination through power measurements
EP1162564B1 (en) * 2000-06-08 2006-12-13 Nippon Telegraph and Telephone Corporation Small shape recognizing capacitive sensor device
DE10035192C1 (de) 2000-07-20 2001-10-11 Carl Mahr Holding Gmbh Kapazitiver Wegaufnehmer für stromsparende Messgeräte
US6501284B1 (en) 2000-08-28 2002-12-31 Stmicroelectronics, Inc. Capacitive finger detection for fingerprint sensor
RU2286603C2 (ru) * 2001-02-07 2006-10-27 Геренрэйч Фэмили Траст Система емкостного датчика (варианты)
US6552677B2 (en) 2001-02-26 2003-04-22 Time Domain Corporation Method of envelope detection and image generation
JP2002341938A (ja) * 2001-05-21 2002-11-29 Toyota Industries Corp ガイドセンサ装置及び走行体
FR2826723B1 (fr) * 2001-06-28 2004-01-30 Hitachi Comp Products Europ Sa Systeme de mesure capacitif
JP4035418B2 (ja) * 2001-10-31 2008-01-23 株式会社本田電子技研 近接スイッチおよび物体検出装置
US20030218469A1 (en) 2002-02-27 2003-11-27 Brazell Kenneth M. Multifunctional object sensor
US6894508B2 (en) 2002-06-28 2005-05-17 Solar Wide Industrial Ltd. Apparatus and method for locating objects behind a wall lining
US7148703B2 (en) 2004-05-14 2006-12-12 Zircon Corporation Auto-deep scan for capacitive sensing

Also Published As

Publication number Publication date
JP2008197124A (ja) 2008-08-28
JP2005249771A (ja) 2005-09-15
US7116091B2 (en) 2006-10-03
JP4152361B2 (ja) 2008-09-17
WO2005093461A8 (en) 2007-03-15
EP1721191A1 (en) 2006-11-15
EP1721191B1 (en) 2017-11-15
US20050194959A1 (en) 2005-09-08
WO2005093461A1 (en) 2005-10-06
CA2554226A1 (en) 2005-10-06

Similar Documents

Publication Publication Date Title
CA2554226C (en) Ratiometric stud sensing and apparatus for same
EP1745310B1 (en) Auto-deep scan for capacitive sensing
US8476912B2 (en) Obscured feature detector and method
EP1975647B1 (en) Stud sensing device and corresponding detection method
CA2557197C (en) Sensor auto-recalibration
US7504817B2 (en) Stud sensor
US20110215818A1 (en) Surface-conforming obscured feature detector
WO2008119993A1 (en) Fluid level sensor
EP2542921B1 (en) Obscured feature detector
JP2020505617A (ja) 難視構成を均一の電界で検出する装置及び方法
AU2022209212C1 (en) Capacitive filling level probe without dead zone
JP2013190379A (ja) 液面レベル検出装置
CN112334868A (zh) 用于识别接触的电容传感器系统
WO2018133153A1 (zh) 对隐蔽特征进行定位的装置及定位的方法
CN210833400U (zh) 磁力型接近传感器的距离参数测试器
JP2019203775A (ja) 腐食検出装置、腐食状態判定システム及び腐食検出方法
US20030066762A1 (en) Amperometric probe

Legal Events

Date Code Title Description
EEER Examination request