CA2474836C - Mass spectrometer - Google Patents

Mass spectrometer Download PDF

Info

Publication number
CA2474836C
CA2474836C CA2474836A CA2474836A CA2474836C CA 2474836 C CA2474836 C CA 2474836C CA 2474836 A CA2474836 A CA 2474836A CA 2474836 A CA2474836 A CA 2474836A CA 2474836 C CA2474836 C CA 2474836C
Authority
CA
Canada
Prior art keywords
region
ion source
ions
discharge
analyte
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CA2474836A
Other languages
English (en)
French (fr)
Other versions
CA2474836A1 (en
Inventor
Stevan Bajic
Robert Harold Bateman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micromass UK Ltd
Original Assignee
Micromass UK Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micromass UK Ltd filed Critical Micromass UK Ltd
Publication of CA2474836A1 publication Critical patent/CA2474836A1/en
Application granted granted Critical
Publication of CA2474836C publication Critical patent/CA2474836C/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/168—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CA2474836A 2003-07-16 2004-07-16 Mass spectrometer Expired - Fee Related CA2474836C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0316628.7 2003-07-16
GB0316628A GB0316628D0 (en) 2003-07-16 2003-07-16 Mass spectrometer

Publications (2)

Publication Number Publication Date
CA2474836A1 CA2474836A1 (en) 2005-01-16
CA2474836C true CA2474836C (en) 2013-05-14

Family

ID=27763920

Family Applications (1)

Application Number Title Priority Date Filing Date
CA2474836A Expired - Fee Related CA2474836C (en) 2003-07-16 2004-07-16 Mass spectrometer

Country Status (4)

Country Link
JP (1) JP4812070B2 (de)
CA (1) CA2474836C (de)
DE (3) DE102004033993B4 (de)
GB (2) GB0316628D0 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005041655B4 (de) 2005-09-02 2010-05-20 Bruker Daltonik Gmbh Erzeugung mehrfach geladener Ionen für die Tandem Massenspektrometrie
JP5711372B2 (ja) * 2010-08-19 2015-04-30 レコ コーポレイションＬｅｃｏ Ｃｏｒｐｏｒａｔｉｏｎ ソフトイオン化グロー放電及び調整器を備える質量分析計
TWI488216B (zh) * 2013-04-18 2015-06-11 Univ Nat Sun Yat Sen 多游離源的質譜游離裝置及質譜分析系統
JP2013254752A (ja) * 2013-09-25 2013-12-19 Shimadzu Corp 液体クロマトグラフ質量分析装置
EP3963622A4 (de) * 2019-04-29 2023-05-31 Ohio State Innovation Foundation Massenspektrometrieverfahren und -vorrichtung

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA928199A (en) * 1971-06-25 1973-06-12 I. Schiff Harold Method of gas analysis
JPH077660B2 (ja) * 1984-05-16 1995-01-30 株式会社日立製作所 大気圧イオン化質量分析計
JPS63193454A (ja) * 1987-02-03 1988-08-10 Hitachi Ltd 質量分析装置
JP2834136B2 (ja) * 1988-04-27 1998-12-09 株式会社日立製作所 質量分析計
GB8826966D0 (en) * 1988-11-18 1988-12-21 Vg Instr Group Plc Gas analyzer
JP2902197B2 (ja) * 1992-02-04 1999-06-07 株式会社日立製作所 大気圧イオン化質量分析装置
JPH06302295A (ja) * 1993-04-14 1994-10-28 Hitachi Ltd 質量分析装置および差動排気装置
JPH06310091A (ja) * 1993-04-26 1994-11-04 Hitachi Ltd 大気圧イオン化質量分析計
DE19608963C2 (de) * 1995-03-28 2001-03-22 Bruker Daltonik Gmbh Verfahren zur Ionisierung schwerer Moleküle bei Atmosphärendruck
CA2366625C (en) * 1999-03-22 2008-01-22 Analytica Of Branford, Inc. Direct flow injection analysis nebulization electrospray and apci mass spectrometry
US6573510B1 (en) * 1999-06-18 2003-06-03 The Regents Of The University Of California Charge exchange molecular ion source
US6545419B2 (en) * 2001-03-07 2003-04-08 Advanced Technology Materials, Inc. Double chamber ion implantation system
GB0107311D0 (en) * 2001-03-23 2001-05-16 Secr Defence Corona ionisation source
JP3660279B2 (ja) * 2001-07-23 2005-06-15 株式会社日立製作所 試料イオン化装置及び質量分析計

Also Published As

Publication number Publication date
DE202004011017U1 (de) 2004-11-18
GB2406703A (en) 2005-04-06
GB2406703B (en) 2005-11-30
DE102004064078B4 (de) 2010-12-02
GB0316628D0 (en) 2003-08-20
CA2474836A1 (en) 2005-01-16
DE102004033993B4 (de) 2010-11-25
GB0415777D0 (en) 2004-08-18
DE102004033993A1 (de) 2005-02-24
JP4812070B2 (ja) 2011-11-09
JP2005135897A (ja) 2005-05-26

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Legal Events

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EEER Examination request
MKLA Lapsed

Effective date: 20220301

MKLA Lapsed

Effective date: 20200831