CA2119507C - Method and apparatus for all code testing - Google Patents

Method and apparatus for all code testing

Info

Publication number
CA2119507C
CA2119507C CA002119507A CA2119507A CA2119507C CA 2119507 C CA2119507 C CA 2119507C CA 002119507 A CA002119507 A CA 002119507A CA 2119507 A CA2119507 A CA 2119507A CA 2119507 C CA2119507 C CA 2119507C
Authority
CA
Canada
Prior art keywords
counter
converter
voltage
count
codes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CA002119507A
Other languages
English (en)
French (fr)
Other versions
CA2119507A1 (en
Inventor
Miroslaw Guzinski
James Louis Lewandowski
Victor Julian Velasco
Shianling Wu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
American Telephone and Telegraph Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Telephone and Telegraph Co Inc filed Critical American Telephone and Telegraph Co Inc
Publication of CA2119507A1 publication Critical patent/CA2119507A1/en
Application granted granted Critical
Publication of CA2119507C publication Critical patent/CA2119507C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/109—Measuring or testing for DC performance, i.e. static testing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
CA002119507A 1993-06-30 1994-03-21 Method and apparatus for all code testing Expired - Fee Related CA2119507C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/084,855 US5332996A (en) 1993-06-30 1993-06-30 Method and apparatus for all code testing
US084,855 1993-06-30

Publications (2)

Publication Number Publication Date
CA2119507A1 CA2119507A1 (en) 1994-12-31
CA2119507C true CA2119507C (en) 1998-10-13

Family

ID=22187649

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002119507A Expired - Fee Related CA2119507C (en) 1993-06-30 1994-03-21 Method and apparatus for all code testing

Country Status (6)

Country Link
US (1) US5332996A (OSRAM)
EP (1) EP0633666A3 (OSRAM)
JP (1) JPH07154258A (OSRAM)
KR (1) KR950002246A (OSRAM)
CA (1) CA2119507C (OSRAM)
TW (1) TW248623B (OSRAM)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5644309A (en) * 1995-04-10 1997-07-01 Harris Corporation Digital comonent testing apparatus and method
KR100489144B1 (ko) * 1996-06-17 2005-09-30 코닌클리케 필립스 일렉트로닉스 엔.브이. 아날로그-디지탈컨버터테스트방법및집적회로
US6320528B1 (en) 1999-10-15 2001-11-20 Koninklijke Philips Electronics Nv Built-in self test for integrated digital-to-analog converters
US6828779B2 (en) * 2000-07-24 2004-12-07 Microstrain, Inc. Circuit for compensating for time variation of temperature in an inductive sensor
JP2003338756A (ja) * 2002-05-21 2003-11-28 Mitsubishi Electric Corp 試験方法および試験回路
KR101388477B1 (ko) 2011-12-30 2014-04-23 한국항공우주연구원 신호 처리 장치 및 방법

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3154738A (en) * 1961-11-09 1964-10-27 Bell Telephone Labor Inc Automatic encoder test set for pcm encoders
US3603772A (en) * 1969-09-09 1971-09-07 Nasa Analog-to-digital converter analyzing system
US3816813A (en) * 1972-01-24 1974-06-11 Spacetac Inc Automatic converter tester
IT7923478A0 (it) * 1979-06-12 1979-06-12 Sits Soc It Telecom Siemens Disposizione circuitale per il collaudo di un convertitore analogico-digitale di un sistema di telecomunicazioni.
JPS56126319A (en) * 1980-03-10 1981-10-03 Hitachi Ltd Self-correcting analog-digital converter
US4616329A (en) * 1983-08-26 1986-10-07 Bio-Rad Laboratories, Inc. Self-calibrating adaptive ranging apparatus and method
JPS61137429A (ja) * 1984-12-07 1986-06-25 Matsushita Electric Ind Co Ltd Ａｄ変換器試験回路
US4897650A (en) * 1988-04-05 1990-01-30 General Electric Company Self-characterizing analog-to-digital converter
DE69124709T2 (de) * 1990-03-15 1997-05-28 At & T Corp Eingebaute Selbstprüfung für Analog-Digitalumsetzer

Also Published As

Publication number Publication date
EP0633666A2 (en) 1995-01-11
JPH07154258A (ja) 1995-06-16
TW248623B (OSRAM) 1995-06-01
KR950002246A (ko) 1995-01-04
CA2119507A1 (en) 1994-12-31
US5332996A (en) 1994-07-26
EP0633666A3 (en) 1995-08-30

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