CA2090936C - Support d'inspection visuelle pour carte de circuit imprime - Google Patents

Support d'inspection visuelle pour carte de circuit imprime

Info

Publication number
CA2090936C
CA2090936C CA 2090936 CA2090936A CA2090936C CA 2090936 C CA2090936 C CA 2090936C CA 2090936 CA2090936 CA 2090936 CA 2090936 A CA2090936 A CA 2090936A CA 2090936 C CA2090936 C CA 2090936C
Authority
CA
Canada
Prior art keywords
drive
camera
display
control unit
real
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CA 2090936
Other languages
English (en)
Other versions
CA2090936A1 (fr
Inventor
Okie Tani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TANI ELECTRONICS INDUSTRY Co Ltd
Original Assignee
TANI ELECTRONICS INDUSTRY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP024234U external-priority patent/JPH0573565U/ja
Priority claimed from JP1992039696U external-priority patent/JP2573219Y2/ja
Priority claimed from JP04188524A external-priority patent/JP3076451B2/ja
Priority claimed from JP4188525A external-priority patent/JP2944827B2/ja
Priority claimed from JP7798892U external-priority patent/JPH0633060U/ja
Priority claimed from JP04302805A external-priority patent/JP3105365B2/ja
Application filed by TANI ELECTRONICS INDUSTRY Co Ltd filed Critical TANI ELECTRONICS INDUSTRY Co Ltd
Publication of CA2090936A1 publication Critical patent/CA2090936A1/fr
Application granted granted Critical
Publication of CA2090936C publication Critical patent/CA2090936C/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Biochemistry (AREA)
  • Toxicology (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
CA 2090936 1992-03-04 1993-03-03 Support d'inspection visuelle pour carte de circuit imprime Expired - Fee Related CA2090936C (fr)

Applications Claiming Priority (12)

Application Number Priority Date Filing Date Title
JPU4-24234 1992-03-04
JP024234U JPH0573565U (ja) 1992-03-04 1992-03-04 目視検査システム
JP1992039696U JP2573219Y2 (ja) 1992-04-27 1992-04-27 カメラ焦点合わせ機構
JPU4-39696 1992-04-27
JP04188524A JP3076451B2 (ja) 1992-06-08 1992-06-08 自動映像表示システム
JPP4-188524 1992-06-08
JPP4-188525 1992-06-08
JP4188525A JP2944827B2 (ja) 1992-06-08 1992-06-08 目視検査システム
JPP4-302805 1992-10-02
JP7798892U JPH0633060U (ja) 1992-10-02 1992-10-02 自動検査機能付き目視検査システム
JPU4-77988 1992-10-02
JP04302805A JP3105365B2 (ja) 1992-10-02 1992-10-02 自動検査機能付き目視検査システム

Publications (2)

Publication Number Publication Date
CA2090936A1 CA2090936A1 (fr) 1993-09-05
CA2090936C true CA2090936C (fr) 1998-12-01

Family

ID=27549159

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 2090936 Expired - Fee Related CA2090936C (fr) 1992-03-04 1993-03-03 Support d'inspection visuelle pour carte de circuit imprime

Country Status (3)

Country Link
AU (1) AU648458B2 (fr)
CA (1) CA2090936C (fr)
GB (1) GB2271683B (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19650234C1 (de) * 1996-12-04 1998-04-30 Duerkopp Adler Ag Gegenstand zur Kennzeichnung einer Auswahlfläche in einem Arbeitsstück, insbesondere einer Tierhaut
AU4975497A (en) * 1997-09-30 1999-04-23 Siemens Aktiengesellschaft A method of and apparatus for inspecting printed information
US8894259B2 (en) 2009-09-22 2014-11-25 Cyberoptics Corporation Dark field illuminator with large working area
US8670031B2 (en) 2009-09-22 2014-03-11 Cyberoptics Corporation High speed optical inspection system with camera array and compact, integrated illuminator
US8388204B2 (en) 2009-09-22 2013-03-05 Cyberoptics Corporation High speed, high resolution, three dimensional solar cell inspection system
US8872912B2 (en) 2009-09-22 2014-10-28 Cyberoptics Corporation High speed distributed optical sensor inspection system
US8681211B2 (en) 2009-09-22 2014-03-25 Cyberoptics Corporation High speed optical inspection system with adaptive focusing
CN102639989B (zh) * 2009-11-06 2014-12-10 赛博光学公司 具有自适应聚焦的高速光学检查系统
CN102879395A (zh) * 2011-07-11 2013-01-16 昆山华扬电子有限公司 Pcb板件辅助对位检查装置
JP5948797B2 (ja) * 2011-11-07 2016-07-06 オムロン株式会社 検査結果の目視確認作業の支援用のシステムおよび装置ならびに方法
DE102016201803A1 (de) * 2016-02-05 2017-08-10 Baum Retec Ag Bildschirmlesegerät
CN110567988A (zh) * 2019-10-16 2019-12-13 东莞市科纯电子有限公司 一种视觉检测电路板品质的方法和装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4672437A (en) * 1985-07-08 1987-06-09 Honeywell Inc. Fiber optic inspection system
JPH0737892B2 (ja) * 1988-01-12 1995-04-26 大日本スクリーン製造株式会社 パターン欠陥検査方法
WO1991007683A1 (fr) * 1989-11-09 1991-05-30 Insystems, Inc. Station de controle de specimens
US5171963A (en) * 1990-05-21 1992-12-15 Ntn Corporation Laser processing device and laser processing method
WO1992011541A1 (fr) * 1990-12-21 1992-07-09 Huntron Instruments, Inc. Systeme d'acquisition d'images utilise avec un appareil de verification de plaquettes de circuits imprimes

Also Published As

Publication number Publication date
AU3399293A (en) 1993-09-23
AU648458B2 (en) 1994-04-21
CA2090936A1 (fr) 1993-09-05
GB9304354D0 (en) 1993-04-21
GB2271683B (en) 1996-09-18
GB2271683A (en) 1994-04-20

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