GB2271683B - Visual inspection support system for printed-circuit board - Google Patents
Visual inspection support system for printed-circuit boardInfo
- Publication number
- GB2271683B GB2271683B GB9304354A GB9304354A GB2271683B GB 2271683 B GB2271683 B GB 2271683B GB 9304354 A GB9304354 A GB 9304354A GB 9304354 A GB9304354 A GB 9304354A GB 2271683 B GB2271683 B GB 2271683B
- Authority
- GB
- United Kingdom
- Prior art keywords
- printed
- circuit board
- support system
- visual inspection
- inspection support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8803—Visual inspection
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Biochemistry (AREA)
- Toxicology (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP024234U JPH0573565U (en) | 1992-03-04 | 1992-03-04 | Visual inspection system |
JP1992039696U JP2573219Y2 (en) | 1992-04-27 | 1992-04-27 | Camera focusing mechanism |
JP04188524A JP3076451B2 (en) | 1992-06-08 | 1992-06-08 | Automatic video display system |
JP4188525A JP2944827B2 (en) | 1992-06-08 | 1992-06-08 | Visual inspection system |
JP7798892U JPH0633060U (en) | 1992-10-02 | 1992-10-02 | Visual inspection system with automatic inspection function |
JP04302805A JP3105365B2 (en) | 1992-10-02 | 1992-10-02 | Visual inspection system with automatic inspection function |
Publications (3)
Publication Number | Publication Date |
---|---|
GB9304354D0 GB9304354D0 (en) | 1993-04-21 |
GB2271683A GB2271683A (en) | 1994-04-20 |
GB2271683B true GB2271683B (en) | 1996-09-18 |
Family
ID=27549159
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9304354A Expired - Fee Related GB2271683B (en) | 1992-03-04 | 1993-03-03 | Visual inspection support system for printed-circuit board |
Country Status (3)
Country | Link |
---|---|
AU (1) | AU648458B2 (en) |
CA (1) | CA2090936C (en) |
GB (1) | GB2271683B (en) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19650234C1 (en) * | 1996-12-04 | 1998-04-30 | Duerkopp Adler Ag | Object for marking a selection area in a work piece, in particular an animal skin |
AU4975497A (en) * | 1997-09-30 | 1999-04-23 | Siemens Aktiengesellschaft | A method of and apparatus for inspecting printed information |
US8894259B2 (en) | 2009-09-22 | 2014-11-25 | Cyberoptics Corporation | Dark field illuminator with large working area |
US8670031B2 (en) | 2009-09-22 | 2014-03-11 | Cyberoptics Corporation | High speed optical inspection system with camera array and compact, integrated illuminator |
US8388204B2 (en) | 2009-09-22 | 2013-03-05 | Cyberoptics Corporation | High speed, high resolution, three dimensional solar cell inspection system |
US8872912B2 (en) | 2009-09-22 | 2014-10-28 | Cyberoptics Corporation | High speed distributed optical sensor inspection system |
US8681211B2 (en) | 2009-09-22 | 2014-03-25 | Cyberoptics Corporation | High speed optical inspection system with adaptive focusing |
CN102639989B (en) * | 2009-11-06 | 2014-12-10 | 赛博光学公司 | High speed optical inspection system with adaptive focusing |
CN102879395A (en) * | 2011-07-11 | 2013-01-16 | 昆山华扬电子有限公司 | PCB auxiliary contraposition inspection device |
JP5948797B2 (en) * | 2011-11-07 | 2016-07-06 | オムロン株式会社 | System, apparatus and method for supporting visual confirmation of inspection results |
DE102016201803A1 (en) * | 2016-02-05 | 2017-08-10 | Baum Retec Ag | Screen reader |
CN110567988A (en) * | 2019-10-16 | 2019-12-13 | 东莞市科纯电子有限公司 | Method and device for visually detecting quality of circuit board |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4672437A (en) * | 1985-07-08 | 1987-06-09 | Honeywell Inc. | Fiber optic inspection system |
WO1991007683A1 (en) * | 1989-11-09 | 1991-05-30 | Insystems, Inc. | Specimen review station |
US5046113A (en) * | 1988-01-12 | 1991-09-03 | Dainippon Screen Mfg. Co. Ltd | Method of and apparatus for detecting pattern defects by means of a plurality of inspecting units each operating in accordance with a respective inspecting principle |
EP0458199A2 (en) * | 1990-05-21 | 1991-11-27 | Ntn Corporation | Laser processing device and laser processing method |
WO1992011541A1 (en) * | 1990-12-21 | 1992-07-09 | Huntron Instruments, Inc. | Image acquisition system for use with a printed circuit board test apparatus |
-
1993
- 1993-03-03 GB GB9304354A patent/GB2271683B/en not_active Expired - Fee Related
- 1993-03-03 CA CA 2090936 patent/CA2090936C/en not_active Expired - Fee Related
- 1993-03-04 AU AU33992/93A patent/AU648458B2/en not_active Ceased
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4672437A (en) * | 1985-07-08 | 1987-06-09 | Honeywell Inc. | Fiber optic inspection system |
US5046113A (en) * | 1988-01-12 | 1991-09-03 | Dainippon Screen Mfg. Co. Ltd | Method of and apparatus for detecting pattern defects by means of a plurality of inspecting units each operating in accordance with a respective inspecting principle |
WO1991007683A1 (en) * | 1989-11-09 | 1991-05-30 | Insystems, Inc. | Specimen review station |
EP0458199A2 (en) * | 1990-05-21 | 1991-11-27 | Ntn Corporation | Laser processing device and laser processing method |
WO1992011541A1 (en) * | 1990-12-21 | 1992-07-09 | Huntron Instruments, Inc. | Image acquisition system for use with a printed circuit board test apparatus |
Also Published As
Publication number | Publication date |
---|---|
AU3399293A (en) | 1993-09-23 |
AU648458B2 (en) | 1994-04-21 |
CA2090936A1 (en) | 1993-09-05 |
GB9304354D0 (en) | 1993-04-21 |
CA2090936C (en) | 1998-12-01 |
GB2271683A (en) | 1994-04-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |