CA2050435A1 - Dispositif photosensible - Google Patents

Dispositif photosensible

Info

Publication number
CA2050435A1
CA2050435A1 CA2050435A CA2050435A CA2050435A1 CA 2050435 A1 CA2050435 A1 CA 2050435A1 CA 2050435 A CA2050435 A CA 2050435A CA 2050435 A CA2050435 A CA 2050435A CA 2050435 A1 CA2050435 A1 CA 2050435A1
Authority
CA
Canada
Prior art keywords
region
photo
conductivity type
sensing
sensing device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2050435A
Other languages
English (en)
Other versions
CA2050435C (fr
Inventor
Ichiro Tonai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Ichiro Tonai
Sumitomo Electric Industries, Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ichiro Tonai, Sumitomo Electric Industries, Ltd. filed Critical Ichiro Tonai
Publication of CA2050435A1 publication Critical patent/CA2050435A1/fr
Application granted granted Critical
Publication of CA2050435C publication Critical patent/CA2050435C/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0216—Coatings
    • H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02162—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors
    • H01L31/02164—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors for shielding light, e.g. light blocking layers, cold shields for infrared detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
    • H01L31/105—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PIN type

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Light Receiving Elements (AREA)
  • Photovoltaic Devices (AREA)
CA002050435A 1990-08-31 1991-08-30 Dispositif photosensible Expired - Fee Related CA2050435C (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2230206A JPH04111477A (ja) 1990-08-31 1990-08-31 受光素子
JP230206/1990 1990-08-31

Publications (2)

Publication Number Publication Date
CA2050435A1 true CA2050435A1 (fr) 1992-03-01
CA2050435C CA2050435C (fr) 1999-02-02

Family

ID=16904238

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002050435A Expired - Fee Related CA2050435C (fr) 1990-08-31 1991-08-30 Dispositif photosensible

Country Status (6)

Country Link
US (1) US5304824A (fr)
EP (1) EP0473198B1 (fr)
JP (1) JPH04111477A (fr)
KR (1) KR950003950B1 (fr)
CA (1) CA2050435C (fr)
DE (1) DE69128751T2 (fr)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3245838B2 (ja) * 1992-02-03 2002-01-15 住友電気工業株式会社 半導体レーザ装置
US5542018A (en) * 1990-08-31 1996-07-30 Kuhara; Yoshiki Semiconductor laser device making use of photodiode chip
CA2119176C (fr) * 1993-03-19 1998-06-23 Masahiro Kobayashi Detecteur de lumiere a semiconducteur
US5668395A (en) * 1994-11-22 1997-09-16 Northwestern University Composition for InSB and GaAs thin film on silicon substrate for use in photodetectors
JPH08204224A (ja) * 1995-01-23 1996-08-09 Sumitomo Electric Ind Ltd 化合物半導体受光素子及びその製造方法
JPH09289333A (ja) * 1996-04-23 1997-11-04 Mitsubishi Electric Corp 半導体受光素子
JP3436009B2 (ja) * 1996-07-31 2003-08-11 住友電気工業株式会社 光半導体素子
CA2227804C (fr) * 1997-02-03 2002-10-01 Yasushi Fujimura Module a photodiodes et methode pour le fabriquer
US6081020A (en) * 1998-02-20 2000-06-27 Lucent Technologies Inc. Linear PIN photodiode
US6326649B1 (en) * 1999-01-13 2001-12-04 Agere Systems, Inc. Pin photodiode having a wide bandwidth
JP2008066497A (ja) * 2006-09-07 2008-03-21 Sony Corp 受光装置および受光装置の製造方法
JP5560818B2 (ja) * 2010-03-25 2014-07-30 住友電気工業株式会社 受光素子、受光素子アレイ、ハイブリッド型検出装置、光学センサ装置
JP7454917B2 (ja) 2018-12-12 2024-03-25 浜松ホトニクス株式会社 光検出装置
US11901379B2 (en) 2018-12-12 2024-02-13 Hamamatsu Photonics K.K. Photodetector
US11513002B2 (en) 2018-12-12 2022-11-29 Hamamatsu Photonics K.K. Light detection device having temperature compensated gain in avalanche photodiode
WO2020121851A1 (fr) * 2018-12-12 2020-06-18 浜松ホトニクス株式会社 Dispositif de détection optique

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57173276A (en) * 1981-04-17 1982-10-25 Nec Corp Solid-state image pickup device
JPS5833881A (ja) * 1981-08-21 1983-02-28 Mitsubishi Electric Corp 光電変換装置
JPS60171768A (ja) * 1984-02-17 1985-09-05 Internatl Rectifier Corp Japan Ltd プレ−ナ型半導体装置
JPS60182778A (ja) * 1984-02-29 1985-09-18 Fujitsu Ltd 半導体受光装置
JPS6195580A (ja) * 1984-10-17 1986-05-14 Hitachi Ltd 受光素子およびこの受光素子を内臓した光電子装置
JPH0799782B2 (ja) * 1985-06-18 1995-10-25 株式会社ニコン 半導体光検出装置
EP0216572B1 (fr) * 1985-09-24 1995-04-05 Kabushiki Kaisha Toshiba Photodétecteur à semi-conducteur ayant un profil d'impureté à deux échelons
US4819039A (en) * 1986-12-22 1989-04-04 American Telephone And Telegraph Co. At&T Laboratories Devices and device fabrication with borosilicate glass
JPS63187671A (ja) * 1987-01-30 1988-08-03 Furukawa Electric Co Ltd:The １．３μｍ帯半導体受光素子
JPS6428872A (en) * 1987-07-24 1989-01-31 Hitachi Ltd Semiconductor element for detecting radiation
JPS6447081A (en) * 1987-08-18 1989-02-21 Toshiba Corp Semiconductor photodetector
JPH01262672A (ja) * 1988-04-14 1989-10-19 Sanyo Electric Co Ltd Ｐｉｎダイオード
US4901153A (en) * 1988-08-10 1990-02-13 Seiko Instruments Inc. Image sensor with reduced surface reflection interference

Also Published As

Publication number Publication date
JPH04111477A (ja) 1992-04-13
KR920005395A (ko) 1992-03-28
KR950003950B1 (ko) 1995-04-21
CA2050435C (fr) 1999-02-02
DE69128751D1 (de) 1998-02-26
EP0473198B1 (fr) 1998-01-21
US5304824A (en) 1994-04-19
EP0473198A1 (fr) 1992-03-04
DE69128751T2 (de) 1998-08-27

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Legal Events

Date Code Title Description
EEER Examination request
MKLA Lapsed