CA2002344A1 - Commande d'un systeme de mesure au moyen d'horloges a temps reel et de tampons de donnees - Google Patents

Commande d'un systeme de mesure au moyen d'horloges a temps reel et de tampons de donnees

Info

Publication number
CA2002344A1
CA2002344A1 CA 2002344 CA2002344A CA2002344A1 CA 2002344 A1 CA2002344 A1 CA 2002344A1 CA 2002344 CA2002344 CA 2002344 CA 2002344 A CA2002344 A CA 2002344A CA 2002344 A1 CA2002344 A1 CA 2002344A1
Authority
CA
Canada
Prior art keywords
instrument
stimulus
under test
device under
real
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA 2002344
Other languages
English (en)
Other versions
CA2002344C (fr
Inventor
John C. Eidson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of CA2002344A1 publication Critical patent/CA2002344A1/fr
Application granted granted Critical
Publication of CA2002344C publication Critical patent/CA2002344C/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
CA 2002344 1989-03-29 1989-11-06 Commande d'un systeme de mesure au moyen d'horloges a temps reel et de tampons de donnees Expired - Lifetime CA2002344C (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US33141989A 1989-03-29 1989-03-29
US331,419 1989-03-29

Publications (2)

Publication Number Publication Date
CA2002344A1 true CA2002344A1 (fr) 1990-09-29
CA2002344C CA2002344C (fr) 2000-03-28

Family

ID=23293888

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 2002344 Expired - Lifetime CA2002344C (fr) 1989-03-29 1989-11-06 Commande d'un systeme de mesure au moyen d'horloges a temps reel et de tampons de donnees

Country Status (4)

Country Link
EP (1) EP0389683B1 (fr)
JP (1) JPH02285215A (fr)
CA (1) CA2002344C (fr)
DE (1) DE68920992T2 (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994002861A1 (fr) * 1992-07-27 1994-02-03 Credence Systems Corporation Appareil d'essai automatique de dispositifs complexes
US6028439A (en) * 1997-10-31 2000-02-22 Credence Systems Corporation Modular integrated circuit tester with distributed synchronization and control
EP0924899B1 (fr) * 1997-12-16 2008-08-06 LITEF GmbH Agencement de circuit pour l'échange de données entre différentes sources de signal localement dédiées
EP1315358A1 (fr) 2002-09-12 2003-05-28 Agilent Technologies Inc. a Delaware Corporation Système de gestion transparent de données pour contrôler des instruments de mesure
EP1447672B1 (fr) 2003-02-13 2006-10-18 Matsushita Electric Industrial Co., Ltd. Ensemble de test pour LSI
US7319936B2 (en) 2004-11-22 2008-01-15 Teradyne, Inc. Instrument with interface for synchronization in automatic test equipment
US7454681B2 (en) 2004-11-22 2008-11-18 Teradyne, Inc. Automatic test system with synchronized instruments
US7437265B2 (en) 2005-04-29 2008-10-14 Agilent Technologies, Inc. Designing time-based measurement/control system
RU2537954C2 (ru) * 2013-04-26 2015-01-10 Федеральное государственное унитарное предприятие "Центральный научно-исследовательский институт связи" (ФГУП ЦНИИС ) Способ поверки системы измерения длительности телефонных соединений (сидс) и устройство для его осуществления

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS589077A (ja) * 1981-07-09 1983-01-19 Toshiba Corp 電車性能測定器
EP0296884A3 (fr) * 1987-06-24 1991-01-16 Schlumberger Technologies, Inc. Procédé pour tester in-circuit un dispositif électronique

Also Published As

Publication number Publication date
EP0389683B1 (fr) 1995-02-01
EP0389683A2 (fr) 1990-10-03
DE68920992T2 (de) 1995-09-07
EP0389683A3 (fr) 1991-10-16
CA2002344C (fr) 2000-03-28
DE68920992D1 (de) 1995-03-16
JPH02285215A (ja) 1990-11-22

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Legal Events

Date Code Title Description
EEER Examination request
MKLA Lapsed
MKEC Expiry (correction)

Effective date: 20121202