DE68920992D1 - Apparat und Verfahren zur Regelung einer Messanordnung. - Google Patents

Apparat und Verfahren zur Regelung einer Messanordnung.

Info

Publication number
DE68920992D1
DE68920992D1 DE68920992T DE68920992T DE68920992D1 DE 68920992 D1 DE68920992 D1 DE 68920992D1 DE 68920992 T DE68920992 T DE 68920992T DE 68920992 T DE68920992 T DE 68920992T DE 68920992 D1 DE68920992 D1 DE 68920992D1
Authority
DE
Germany
Prior art keywords
regulating
measuring arrangement
measuring
arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE68920992T
Other languages
English (en)
Other versions
DE68920992T2 (de
Inventor
John C Eidson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of DE68920992D1 publication Critical patent/DE68920992D1/de
Application granted granted Critical
Publication of DE68920992T2 publication Critical patent/DE68920992T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
DE1989620992 1989-03-29 1989-12-04 Apparat und Verfahren zur Regelung einer Messanordnung. Expired - Lifetime DE68920992T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US33141989A 1989-03-29 1989-03-29

Publications (2)

Publication Number Publication Date
DE68920992D1 true DE68920992D1 (de) 1995-03-16
DE68920992T2 DE68920992T2 (de) 1995-09-07

Family

ID=23293888

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1989620992 Expired - Lifetime DE68920992T2 (de) 1989-03-29 1989-12-04 Apparat und Verfahren zur Regelung einer Messanordnung.

Country Status (4)

Country Link
EP (1) EP0389683B1 (de)
JP (1) JPH02285215A (de)
CA (1) CA2002344C (de)
DE (1) DE68920992T2 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69333571T2 (de) * 1992-07-27 2005-08-04 Credence Systems Corp., Fremont Gerät zur automatischen prüfung von komplexen vorrichtungen
US6028439A (en) * 1997-10-31 2000-02-22 Credence Systems Corporation Modular integrated circuit tester with distributed synchronization and control
DE69738886D1 (de) * 1997-12-16 2008-09-18 Litef Gmbh Schaltungsanordnung zum synchronen Austausch von Daten zwischen verschiedenen lokal zugeordneten Signalquellen
EP1315358A1 (de) 2002-09-12 2003-05-28 Agilent Technologies Inc. a Delaware Corporation Datentransparentes Verwaltungssystem zur Steuerung von Messinstrumenten
DE60309128T2 (de) 2003-02-13 2007-02-01 Matsushita Electric Industrial Co., Ltd., Kadoma LSI-Testanordnung
US7319936B2 (en) 2004-11-22 2008-01-15 Teradyne, Inc. Instrument with interface for synchronization in automatic test equipment
US7454681B2 (en) 2004-11-22 2008-11-18 Teradyne, Inc. Automatic test system with synchronized instruments
US7437265B2 (en) * 2005-04-29 2008-10-14 Agilent Technologies, Inc. Designing time-based measurement/control system
RU2537954C2 (ru) * 2013-04-26 2015-01-10 Федеральное государственное унитарное предприятие "Центральный научно-исследовательский институт связи" (ФГУП ЦНИИС ) Способ поверки системы измерения длительности телефонных соединений (сидс) и устройство для его осуществления

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS589077A (ja) * 1981-07-09 1983-01-19 Toshiba Corp 電車性能測定器
EP0296884A3 (de) * 1987-06-24 1991-01-16 Schlumberger Technologies, Inc. Methode zur In-Circuit-Prüfung von elektronischen Geräten

Also Published As

Publication number Publication date
CA2002344C (en) 2000-03-28
EP0389683B1 (de) 1995-02-01
EP0389683A2 (de) 1990-10-03
EP0389683A3 (de) 1991-10-16
DE68920992T2 (de) 1995-09-07
CA2002344A1 (en) 1990-09-29
JPH02285215A (ja) 1990-11-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US