CA1289267C - Structure de protection contre les effets de verrouillage et les decharges electrostatiques - Google Patents
Structure de protection contre les effets de verrouillage et les decharges electrostatiquesInfo
- Publication number
- CA1289267C CA1289267C CA000547801A CA547801A CA1289267C CA 1289267 C CA1289267 C CA 1289267C CA 000547801 A CA000547801 A CA 000547801A CA 547801 A CA547801 A CA 547801A CA 1289267 C CA1289267 C CA 1289267C
- Authority
- CA
- Canada
- Prior art keywords
- region
- substrate
- well
- doped
- polarity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000758 substrate Substances 0.000 claims abstract description 55
- 230000003071 parasitic effect Effects 0.000 claims abstract description 15
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 8
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 8
- 239000010703 silicon Substances 0.000 claims abstract description 8
- 238000010586 diagram Methods 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000002800 charge carrier Substances 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005669 field effect Effects 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 231100001261 hazardous Toxicity 0.000 description 1
- 230000036039 immunity Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
- H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
- H01L27/092—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors
- H01L27/0921—Means for preventing a bipolar, e.g. thyristor, action between the different transistor regions, e.g. Latchup prevention
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA000547801A CA1289267C (fr) | 1987-09-24 | 1987-09-24 | Structure de protection contre les effets de verrouillage et les decharges electrostatiques |
GB8816796A GB2210197B (en) | 1987-09-24 | 1988-07-14 | Latchup and electrostatic discharge protection structure |
JP63229696A JP2873008B2 (ja) | 1987-09-24 | 1988-09-13 | ラッチアップ防止および,静電放電保護装置 |
DE19883832253 DE3832253C2 (de) | 1987-09-24 | 1988-09-22 | Latchup- und Entladungsschutzeinrichtung für einen integrierten CMOS Schaltkreis |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA000547801A CA1289267C (fr) | 1987-09-24 | 1987-09-24 | Structure de protection contre les effets de verrouillage et les decharges electrostatiques |
Publications (1)
Publication Number | Publication Date |
---|---|
CA1289267C true CA1289267C (fr) | 1991-09-17 |
Family
ID=4136515
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA000547801A Expired - Lifetime CA1289267C (fr) | 1987-09-24 | 1987-09-24 | Structure de protection contre les effets de verrouillage et les decharges electrostatiques |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2873008B2 (fr) |
CA (1) | CA1289267C (fr) |
DE (1) | DE3832253C2 (fr) |
GB (1) | GB2210197B (fr) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH039502U (fr) * | 1989-06-12 | 1991-01-29 | ||
FR2649830B1 (fr) * | 1989-07-13 | 1994-05-27 | Sgs Thomson Microelectronics | Structure de circuit integre cmos protege contre les decharges electrostatiques |
US5212618A (en) * | 1990-05-03 | 1993-05-18 | Linear Technology Corporation | Electrostatic discharge clamp using vertical NPN transistor |
DE10026742B4 (de) * | 2000-05-30 | 2007-11-22 | Infineon Technologies Ag | In beide Richtungen sperrendes Halbleiterschaltelement |
US6583476B1 (en) * | 2002-06-28 | 2003-06-24 | Micrel, Inc. | Electrostatic discharge protection for integrated semiconductor devices using channel stop field plates |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5869124A (ja) * | 1981-10-20 | 1983-04-25 | Toshiba Corp | 半導体集積回路 |
-
1987
- 1987-09-24 CA CA000547801A patent/CA1289267C/fr not_active Expired - Lifetime
-
1988
- 1988-07-14 GB GB8816796A patent/GB2210197B/en not_active Expired
- 1988-09-13 JP JP63229696A patent/JP2873008B2/ja not_active Expired - Fee Related
- 1988-09-22 DE DE19883832253 patent/DE3832253C2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE3832253A1 (de) | 1989-04-27 |
GB2210197B (en) | 1990-12-19 |
GB2210197A (en) | 1989-06-01 |
GB8816796D0 (en) | 1988-08-17 |
DE3832253C2 (de) | 2000-07-13 |
JP2873008B2 (ja) | 1999-03-24 |
JPH01106464A (ja) | 1989-04-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6667500B2 (en) | Semiconductor device and method for protecting such device from a reversed drain voltage | |
US4300152A (en) | Complementary field-effect transistor integrated circuit device | |
US5465189A (en) | Low voltage triggering semiconductor controlled rectifiers | |
US4626882A (en) | Twin diode overvoltage protection structure | |
US5895940A (en) | Integrated circuit buffer devices having built-in electrostatic discharge protection thyristors | |
US5077591A (en) | Electrostatic discharge protection for semiconductor input devices | |
US6804095B2 (en) | Drain-extended MOS ESD protection structure | |
US4476476A (en) | CMOS Input and output protection circuit | |
JPS5943827B2 (ja) | 保護回路 | |
US6365940B1 (en) | High voltage trigger remote-cathode SCR | |
KR20060006036A (ko) | 실리콘-온-인슐레이터 기술에서의 정전기 방전(esd)보호를 위한 저전압 실리콘제어정류기(scr) | |
US4609931A (en) | Input protection MOS semiconductor device with zener breakdown mechanism | |
EP0242383B1 (fr) | Protection de circuits integres igfet contre les decharges electrostatiques | |
US6215135B1 (en) | Integrated circuit provided with ESD protection means | |
US4543593A (en) | Semiconductor protective device | |
US6348724B1 (en) | Semiconductor device with ESD protection | |
KR19990030302A (ko) | 정전 방전으로부터 보호하기 위한 구조물을 가진 집적 반도체회로 | |
US5949094A (en) | ESD protection for high density DRAMs using triple-well technology | |
US4622573A (en) | CMOS contacting structure having degeneratively doped regions for the prevention of latch-up | |
US5412527A (en) | Electrostatic discharge protection circuit | |
US5148250A (en) | Bipolar transistor as protective element for integrated circuits | |
EP0257774A1 (fr) | Circuit de protection pour circuit intégré à grande échelle | |
EP0822596A2 (fr) | Circuit de protection ESD | |
US5414292A (en) | Junction-isolated floating diode | |
CA1289267C (fr) | Structure de protection contre les effets de verrouillage et les decharges electrostatiques |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MKLA | Lapsed |