CA1219970A - Radiation scatter apparatus and method - Google Patents

Radiation scatter apparatus and method

Info

Publication number
CA1219970A
CA1219970A CA000450152A CA450152A CA1219970A CA 1219970 A CA1219970 A CA 1219970A CA 000450152 A CA000450152 A CA 000450152A CA 450152 A CA450152 A CA 450152A CA 1219970 A CA1219970 A CA 1219970A
Authority
CA
Canada
Prior art keywords
radiation
values
density
overlay
source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000450152A
Other languages
English (en)
French (fr)
Inventor
John L. Molbert
Eddie R. Riddle
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Troxler Electronic Laboratories Inc
Original Assignee
Troxler Electronic Laboratories Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Troxler Electronic Laboratories Inc filed Critical Troxler Electronic Laboratories Inc
Application granted granted Critical
Publication of CA1219970A publication Critical patent/CA1219970A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electromagnetism (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Radiation-Therapy Devices (AREA)
  • Measurement Of Radiation (AREA)
  • Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
CA000450152A 1983-03-22 1984-03-21 Radiation scatter apparatus and method Expired CA1219970A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/477,820 US4525854A (en) 1983-03-22 1983-03-22 Radiation scatter apparatus and method
US477,820 1983-03-22

Publications (1)

Publication Number Publication Date
CA1219970A true CA1219970A (en) 1987-03-31

Family

ID=23897498

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000450152A Expired CA1219970A (en) 1983-03-22 1984-03-21 Radiation scatter apparatus and method

Country Status (11)

Country Link
US (1) US4525854A (en:Method)
EP (1) EP0120676B1 (en:Method)
JP (1) JPS59218941A (en:Method)
AT (1) ATE40750T1 (en:Method)
AU (1) AU557007B2 (en:Method)
CA (1) CA1219970A (en:Method)
DE (1) DE3476698D1 (en:Method)
ES (1) ES8607546A1 (en:Method)
IL (1) IL71299A (en:Method)
NZ (1) NZ207628A (en:Method)
ZA (1) ZA842056B (en:Method)

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US6995667B2 (en) * 2002-12-23 2006-02-07 Instrotek, Inc. Systems, methods, and computer program products for automatic tracking and/or remote monitoring of nuclear gauges and/or data communication therewith
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US7809109B2 (en) * 2004-04-09 2010-10-05 American Science And Engineering, Inc. Multiple image collection and synthesis for personnel screening
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US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
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US7605366B2 (en) * 2005-09-21 2009-10-20 Troxler Electronic Laboratories, Inc. Nuclear density gauge
US7526064B2 (en) 2006-05-05 2009-04-28 Rapiscan Security Products, Inc. Multiple pass cargo inspection system
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US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
PL2952068T3 (pl) 2013-01-31 2021-07-26 Rapiscan Systems, Inc. Przenośny system kontroli bezpieczeństwa
US10515731B1 (en) 2013-03-14 2019-12-24 Troxler Electronic Laboratories, Inc. Nuclear Gauge
US11280898B2 (en) 2014-03-07 2022-03-22 Rapiscan Systems, Inc. Radar-based baggage and parcel inspection systems
MX361149B (es) 2014-03-07 2018-11-28 Rapiscan Systems Inc Detectores de banda ultra ancha.
US9885566B2 (en) 2014-07-24 2018-02-06 Johnson Matthey Public Limited Company Apparatus for determining thickness of lining layer
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US3854042A (en) * 1973-05-10 1974-12-10 A Ott Device for measuring the thickness of layers with a radionuclide irradiating the layer
DE2544354A1 (de) * 1975-10-03 1977-04-14 Siemens Ag Verfahren zur bestimmung der dichte von koerpern mittels durchdingender strahlen und geraet zu seiner durchfuehrung
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Also Published As

Publication number Publication date
NZ207628A (en) 1988-02-29
JPH0247697B2 (en:Method) 1990-10-22
JPS59218941A (ja) 1984-12-10
IL71299A0 (en) 1984-06-29
EP0120676A3 (en) 1985-06-12
IL71299A (en) 1988-11-15
AU557007B2 (en) 1986-11-27
ATE40750T1 (de) 1989-02-15
DE3476698D1 (en) 1989-03-16
ES8607546A1 (es) 1986-06-01
EP0120676A2 (en) 1984-10-03
ZA842056B (en) 1984-10-31
EP0120676B1 (en) 1989-02-08
US4525854A (en) 1985-06-25
AU2598684A (en) 1984-09-27
ES531211A0 (es) 1986-06-01

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Legal Events

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MKEX Expiry