ATE40750T1 - Streustrahlungsverfahren und -apparat. - Google Patents

Streustrahlungsverfahren und -apparat.

Info

Publication number
ATE40750T1
ATE40750T1 AT84301920T AT84301920T ATE40750T1 AT E40750 T1 ATE40750 T1 AT E40750T1 AT 84301920 T AT84301920 T AT 84301920T AT 84301920 T AT84301920 T AT 84301920T AT E40750 T1 ATE40750 T1 AT E40750T1
Authority
AT
Austria
Prior art keywords
density
determined
scattered radiation
pavement
radiation method
Prior art date
Application number
AT84301920T
Other languages
English (en)
Inventor
John L Molbert
Eddie R Riddle
Original Assignee
Troxler Electronic Lab Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Troxler Electronic Lab Inc filed Critical Troxler Electronic Lab Inc
Application granted granted Critical
Publication of ATE40750T1 publication Critical patent/ATE40750T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Radiation-Therapy Devices (AREA)
  • Measurement Of Radiation (AREA)
  • Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
AT84301920T 1983-03-22 1984-03-21 Streustrahlungsverfahren und -apparat. ATE40750T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/477,820 US4525854A (en) 1983-03-22 1983-03-22 Radiation scatter apparatus and method
EP84301920A EP0120676B1 (de) 1983-03-22 1984-03-21 Streustrahlungsverfahren und -apparat

Publications (1)

Publication Number Publication Date
ATE40750T1 true ATE40750T1 (de) 1989-02-15

Family

ID=23897498

Family Applications (1)

Application Number Title Priority Date Filing Date
AT84301920T ATE40750T1 (de) 1983-03-22 1984-03-21 Streustrahlungsverfahren und -apparat.

Country Status (11)

Country Link
US (1) US4525854A (de)
EP (1) EP0120676B1 (de)
JP (1) JPS59218941A (de)
AT (1) ATE40750T1 (de)
AU (1) AU557007B2 (de)
CA (1) CA1219970A (de)
DE (1) DE3476698D1 (de)
ES (1) ES8607546A1 (de)
IL (1) IL71299A (de)
NZ (1) NZ207628A (de)
ZA (1) ZA842056B (de)

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US6207462B1 (en) 1998-03-20 2001-03-27 Cem Corporation Microwave apparatus and method for analysis of asphalt-aggregate compositions
US6190917B1 (en) 1998-03-20 2001-02-20 Cem Corporation Microwave apparatus and method for analysis of asphalt-aggregate compositions
US6320933B1 (en) * 1998-11-30 2001-11-20 American Science And Engineering, Inc. Multiple scatter system for threat identification
US6310936B1 (en) 1999-03-03 2001-10-30 Troxler Electronic Laboratories, Inc. Thin layer nuclear density guage
US6284986B1 (en) * 1999-03-15 2001-09-04 Seh America, Inc. Method of determining the thickness of a layer on a silicon substrate
US6492641B1 (en) * 2000-06-29 2002-12-10 Troxler Electronic Laboratories, Inc. Apparatus and method for gamma-ray determination of bulk density of samples
US6567498B1 (en) * 2002-01-10 2003-05-20 Troxler Electronic Laboratories, Inc. Low activity nuclear density gauge
EP1357382A1 (de) * 2002-04-26 2003-10-29 Rijksuniversiteit te Groningen Verfahren und System zur Bestimmung der Eigenschaft eines Strassenbelags durch Messung der natürlichen Gammastrahlung
US8503605B2 (en) 2002-07-23 2013-08-06 Rapiscan Systems, Inc. Four sided imaging system and method for detection of contraband
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US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US6995667B2 (en) * 2002-12-23 2006-02-07 Instrotek, Inc. Systems, methods, and computer program products for automatic tracking and/or remote monitoring of nuclear gauges and/or data communication therewith
US6928141B2 (en) 2003-06-20 2005-08-09 Rapiscan, Inc. Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers
US7809109B2 (en) * 2004-04-09 2010-10-05 American Science And Engineering, Inc. Multiple image collection and synthesis for personnel screening
DE602005019552D1 (de) * 2004-04-09 2010-04-08 American Science & Eng Inc Eliminierung von cross-talk in einem mehrere quellen umfassenden rückstreuungs-inspektionsportal durch sicherstellen, dass zu einem zeitpunkt jeweils nur eine quelle strahlung emittiert
US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
WO2007027797A2 (en) * 2005-08-30 2007-03-08 Troxler Electronic Laboratories, Inc. Methods, systems, and computer program products for measuring the density of material
US7605366B2 (en) * 2005-09-21 2009-10-20 Troxler Electronic Laboratories, Inc. Nuclear density gauge
EP2010943A2 (de) * 2006-04-21 2009-01-07 American Science & Engineering, Inc. Röntgenabbildung von gepäck und personen mithilfe von arrays aus diskreten quellen und mehrfach kollimierten strahlen
US7526064B2 (en) 2006-05-05 2009-04-28 Rapiscan Security Products, Inc. Multiple pass cargo inspection system
SG165402A1 (en) 2006-08-11 2010-10-28 American Science & Eng Inc X-ray inspection with contemporaneous and proximal transmission and backscatter imaging
US8576982B2 (en) 2008-02-01 2013-11-05 Rapiscan Systems, Inc. Personnel screening system
US8638904B2 (en) 2010-03-14 2014-01-28 Rapiscan Systems, Inc. Personnel screening system
US8995619B2 (en) 2010-03-14 2015-03-31 Rapiscan Systems, Inc. Personnel screening system
WO2009089172A2 (en) 2008-01-04 2009-07-16 Troxler Electronic Laboratories, Inc. Nuclear gauges and methods of configuration and calibration of nuclear gauges
GB0809110D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Gantry scanner systems
PL2459991T3 (pl) * 2009-07-29 2020-01-31 American Science & Engineering, Inc. Przyczepa do odgórnej kontroli rentgenowskiej
US8824632B2 (en) 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
CA2793221A1 (en) 2010-03-14 2011-09-22 Rapiscan Systems, Inc. Beam forming apparatus
EP2673660B1 (de) 2011-02-08 2017-08-30 Rapiscan Systems, Inc. Verdeckte überwachung unter verwendung multimodaler erfassung
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
KR102065318B1 (ko) 2012-02-03 2020-01-10 라피스캔 시스템스, 인코포레이티드 조합형 산란 및 투과 멀티-뷰 이미징 시스템
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
PL2952068T3 (pl) 2013-01-31 2021-07-26 Rapiscan Systems, Inc. Przenośny system kontroli bezpieczeństwa
US10515731B1 (en) 2013-03-14 2019-12-24 Troxler Electronic Laboratories, Inc. Nuclear Gauge
US11280898B2 (en) 2014-03-07 2022-03-22 Rapiscan Systems, Inc. Radar-based baggage and parcel inspection systems
GB2538921B (en) 2014-03-07 2020-06-03 Rapiscan Systems Inc Ultra wide band detectors
GB2530394B (en) 2014-07-24 2017-11-22 Johnson Matthey Plc Apparatus for determining thickness of lining layer
BR112017011068A2 (pt) 2014-11-25 2018-07-10 Rapiscan Systems, Inc. sistema de gerenciamento de segurança inteligente
CN107615052A (zh) 2015-03-20 2018-01-19 拉皮斯坎系统股份有限公司 手持式便携反向散射检查系统
US10720300B2 (en) 2016-09-30 2020-07-21 American Science And Engineering, Inc. X-ray source for 2D scanning beam imaging
SK8449Y1 (sk) * 2018-05-11 2019-05-06 Fulop Marko Zariadenie na odhaľovanie nelegálnych úkrytov v náklade železnej rudy
US10830911B2 (en) 2018-06-20 2020-11-10 American Science And Engineering, Inc. Wavelength-shifting sheet-coupled scintillation detectors
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US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
JP2022137873A (ja) * 2021-03-09 2022-09-22 東芝Ｉｔコントロールシステム株式会社 放射線検査装置
CN118235216A (zh) 2021-10-01 2024-06-21 拉皮斯坎控股公司 用于并发产生多个基本相似的x射线束的方法和系统
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US3202822A (en) * 1961-11-13 1965-08-24 Phillips Petroleum Co Method of determining density utilizing a gamma ray source and a pair of detectors
US3497691A (en) * 1967-06-30 1970-02-24 Ohmart Corp Dual mode fluorescence and backscatter coating thickness measuring gauge
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US3854042A (en) * 1973-05-10 1974-12-10 A Ott Device for measuring the thickness of layers with a radionuclide irradiating the layer
DE2544354A1 (de) * 1975-10-03 1977-04-14 Siemens Ag Verfahren zur bestimmung der dichte von koerpern mittels durchdingender strahlen und geraet zu seiner durchfuehrung
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Also Published As

Publication number Publication date
EP0120676A2 (de) 1984-10-03
EP0120676A3 (en) 1985-06-12
IL71299A0 (en) 1984-06-29
NZ207628A (en) 1988-02-29
AU557007B2 (en) 1986-11-27
IL71299A (en) 1988-11-15
DE3476698D1 (en) 1989-03-16
ZA842056B (en) 1984-10-31
ES8607546A1 (es) 1986-06-01
ES531211A0 (es) 1986-06-01
EP0120676B1 (de) 1989-02-08
CA1219970A (en) 1987-03-31
JPS59218941A (ja) 1984-12-10
JPH0247697B2 (de) 1990-10-22
AU2598684A (en) 1984-09-27
US4525854A (en) 1985-06-25

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Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee