ZA842056B - Radiation scatter apparatus and method - Google Patents

Radiation scatter apparatus and method

Info

Publication number
ZA842056B
ZA842056B ZA842056A ZA842056A ZA842056B ZA 842056 B ZA842056 B ZA 842056B ZA 842056 A ZA842056 A ZA 842056A ZA 842056 A ZA842056 A ZA 842056A ZA 842056 B ZA842056 B ZA 842056B
Authority
ZA
South Africa
Prior art keywords
density
determined
radiation scatter
pavement
radiation
Prior art date
Application number
ZA842056A
Other languages
English (en)
Inventor
John L Molbert
Eddie R Riddle
Original Assignee
Troxler Electronic Lab Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Troxler Electronic Lab Inc filed Critical Troxler Electronic Lab Inc
Publication of ZA842056B publication Critical patent/ZA842056B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Radiation-Therapy Devices (AREA)
  • Measurement Of Radiation (AREA)
  • Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
ZA842056A 1983-03-22 1984-03-20 Radiation scatter apparatus and method ZA842056B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/477,820 US4525854A (en) 1983-03-22 1983-03-22 Radiation scatter apparatus and method

Publications (1)

Publication Number Publication Date
ZA842056B true ZA842056B (en) 1984-10-31

Family

ID=23897498

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA842056A ZA842056B (en) 1983-03-22 1984-03-20 Radiation scatter apparatus and method

Country Status (11)

Country Link
US (1) US4525854A (de)
EP (1) EP0120676B1 (de)
JP (1) JPS59218941A (de)
AT (1) ATE40750T1 (de)
AU (1) AU557007B2 (de)
CA (1) CA1219970A (de)
DE (1) DE3476698D1 (de)
ES (1) ES8607546A1 (de)
IL (1) IL71299A (de)
NZ (1) NZ207628A (de)
ZA (1) ZA842056B (de)

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US6995667B2 (en) * 2002-12-23 2006-02-07 Instrotek, Inc. Systems, methods, and computer program products for automatic tracking and/or remote monitoring of nuclear gauges and/or data communication therewith
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US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
WO2007027760A2 (en) * 2005-08-30 2007-03-08 Troxler Electronic Laboratories, Inc. Methods, systems, and computer program products for determining a property of construction material
US7605366B2 (en) * 2005-09-21 2009-10-20 Troxler Electronic Laboratories, Inc. Nuclear density gauge
JP2009534669A (ja) * 2006-04-21 2009-09-24 アメリカン サイエンス アンド エンジニアリング，インコーポレイテッド 離散供給源のアレイおよび複数の平行ビームを用いた荷物および人間のｘ線画像化
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US10515731B1 (en) 2013-03-14 2019-12-24 Troxler Electronic Laboratories, Inc. Nuclear Gauge
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Also Published As

Publication number Publication date
US4525854A (en) 1985-06-25
AU2598684A (en) 1984-09-27
ES531211A0 (es) 1986-06-01
AU557007B2 (en) 1986-11-27
EP0120676A2 (de) 1984-10-03
ATE40750T1 (de) 1989-02-15
IL71299A (en) 1988-11-15
JPH0247697B2 (de) 1990-10-22
EP0120676B1 (de) 1989-02-08
IL71299A0 (en) 1984-06-29
DE3476698D1 (en) 1989-03-16
JPS59218941A (ja) 1984-12-10
EP0120676A3 (en) 1985-06-12
CA1219970A (en) 1987-03-31
NZ207628A (en) 1988-02-29
ES8607546A1 (es) 1986-06-01

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