AU578501B2 - Method of determining thickness and composition of alloy film - Google Patents
Method of determining thickness and composition of alloy filmInfo
- Publication number
- AU578501B2 AU578501B2 AU49637/85A AU4963785A AU578501B2 AU 578501 B2 AU578501 B2 AU 578501B2 AU 49637/85 A AU49637/85 A AU 49637/85A AU 4963785 A AU4963785 A AU 4963785A AU 578501 B2 AU578501 B2 AU 578501B2
- Authority
- AU
- Australia
- Prior art keywords
- composition
- alloy film
- determining thickness
- determining
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59020909A JPS59186753A (en) | 1983-02-18 | 1984-02-09 | Journal structure for seat-belt draw-in instrument |
JP59-209097 | 1984-10-05 | ||
JP59-209098 | 1984-10-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
AU4963785A AU4963785A (en) | 1986-04-17 |
AU578501B2 true AU578501B2 (en) | 1988-10-27 |
Family
ID=12040350
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU49637/85A Ceased AU578501B2 (en) | 1984-02-09 | 1985-10-03 | Method of determining thickness and composition of alloy film |
Country Status (1)
Country | Link |
---|---|
AU (1) | AU578501B2 (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1984002190A1 (en) * | 1982-12-01 | 1984-06-07 | Valtion Teknillinen | Procedure and means for measuring with the aid of a radiosotope source the distribution of fillers in a web |
AU557007B2 (en) * | 1983-03-20 | 1986-11-27 | Troxler Electronic Laboratories, Inc. | Radiation scatter testing |
AU8133287A (en) * | 1986-11-24 | 1988-05-26 | Refina Instruments A.B. | Method of controlling and/or measuring layer thickness such as the thickness of surface layers |
-
1985
- 1985-10-03 AU AU49637/85A patent/AU578501B2/en not_active Ceased
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1984002190A1 (en) * | 1982-12-01 | 1984-06-07 | Valtion Teknillinen | Procedure and means for measuring with the aid of a radiosotope source the distribution of fillers in a web |
AU557007B2 (en) * | 1983-03-20 | 1986-11-27 | Troxler Electronic Laboratories, Inc. | Radiation scatter testing |
AU8133287A (en) * | 1986-11-24 | 1988-05-26 | Refina Instruments A.B. | Method of controlling and/or measuring layer thickness such as the thickness of surface layers |
Also Published As
Publication number | Publication date |
---|---|
AU4963785A (en) | 1986-04-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK14 | Patent ceased section 143(a) (annual fees not paid) or expired |