DE3476698D1 - Radiation scatter apparatus and method - Google Patents

Radiation scatter apparatus and method

Info

Publication number
DE3476698D1
DE3476698D1 DE8484301920T DE3476698T DE3476698D1 DE 3476698 D1 DE3476698 D1 DE 3476698D1 DE 8484301920 T DE8484301920 T DE 8484301920T DE 3476698 T DE3476698 T DE 3476698T DE 3476698 D1 DE3476698 D1 DE 3476698D1
Authority
DE
Germany
Prior art keywords
density
determined
radiation scatter
pavement
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8484301920T
Other languages
English (en)
Inventor
John L Molbert
Eddie R Riddle
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Troxler Electronic Laboratories Inc
Original Assignee
Troxler Electronic Laboratories Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Troxler Electronic Laboratories Inc filed Critical Troxler Electronic Laboratories Inc
Application granted granted Critical
Publication of DE3476698D1 publication Critical patent/DE3476698D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Radiation-Therapy Devices (AREA)
  • Measurement Of Radiation (AREA)
  • Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
DE8484301920T 1983-03-22 1984-03-21 Radiation scatter apparatus and method Expired DE3476698D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/477,820 US4525854A (en) 1983-03-22 1983-03-22 Radiation scatter apparatus and method

Publications (1)

Publication Number Publication Date
DE3476698D1 true DE3476698D1 (en) 1989-03-16

Family

ID=23897498

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484301920T Expired DE3476698D1 (en) 1983-03-22 1984-03-21 Radiation scatter apparatus and method

Country Status (11)

Country Link
US (1) US4525854A (de)
EP (1) EP0120676B1 (de)
JP (1) JPS59218941A (de)
AT (1) ATE40750T1 (de)
AU (1) AU557007B2 (de)
CA (1) CA1219970A (de)
DE (1) DE3476698D1 (de)
ES (1) ES8607546A1 (de)
IL (1) IL71299A (de)
NZ (1) NZ207628A (de)
ZA (1) ZA842056B (de)

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US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
WO2007027760A2 (en) * 2005-08-30 2007-03-08 Troxler Electronic Laboratories, Inc. Methods, systems, and computer program products for determining a property of construction material
US7605366B2 (en) * 2005-09-21 2009-10-20 Troxler Electronic Laboratories, Inc. Nuclear density gauge
JP2009534669A (ja) * 2006-04-21 2009-09-24 アメリカン サイエンス アンド エンジニアリング，インコーポレイテッド 離散供給源のアレイおよび複数の平行ビームを用いた荷物および人間のｘ線画像化
US7526064B2 (en) 2006-05-05 2009-04-28 Rapiscan Security Products, Inc. Multiple pass cargo inspection system
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EP2459991B1 (de) * 2009-07-29 2019-09-11 American Science & Engineering, Inc. Anhänger für röntgenstrahleninspektion von oben nach unten
US8824632B2 (en) 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
BR112012023117A2 (pt) 2010-03-14 2016-05-24 Rapiscan Systems Inc equipamento de formação de feixe
EP3252506B1 (de) 2011-02-08 2020-11-18 Rapiscan Systems, Inc. Verdeckte überwachung unter verwendung multimodaler erfassung
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
EP2810296A4 (de) 2012-02-03 2015-12-30 Rapiscan Systems Inc Kombiniertes streu- und übertragungssystem mit mehrfachansicht
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
KR102167245B1 (ko) 2013-01-31 2020-10-19 라피스캔 시스템스, 인코포레이티드 이동식 보안검사시스템
US10515731B1 (en) 2013-03-14 2019-12-24 Troxler Electronic Laboratories, Inc. Nuclear Gauge
US11280898B2 (en) 2014-03-07 2022-03-22 Rapiscan Systems, Inc. Radar-based baggage and parcel inspection systems
MX361149B (es) 2014-03-07 2018-11-28 Rapiscan Systems Inc Detectores de banda ultra ancha.
GB2530394B (en) 2014-07-24 2017-11-22 Johnson Matthey Plc Apparatus for determining thickness of lining layer
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US10720300B2 (en) 2016-09-30 2020-07-21 American Science And Engineering, Inc. X-ray source for 2D scanning beam imaging
SK8449Y1 (sk) * 2018-05-11 2019-05-06 Fulop Marko Zariadenie na odhaľovanie nelegálnych úkrytov v náklade železnej rudy
WO2019245636A1 (en) 2018-06-20 2019-12-26 American Science And Engineering, Inc. Wavelength-shifting sheet-coupled scintillation detectors
WO2020160106A1 (en) * 2019-01-30 2020-08-06 Ndc Technologies Inc. Radiation-based thickness gauge
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US3840746A (en) * 1971-12-13 1974-10-08 Applied Invention Corp Gamma ray density probe utilizing a pair of gamma ray sources and a gamma ray detector
JPS5222553B2 (de) * 1973-02-20 1977-06-17
US3854042A (en) * 1973-05-10 1974-12-10 A Ott Device for measuring the thickness of layers with a radionuclide irradiating the layer
DE2544354A1 (de) * 1975-10-03 1977-04-14 Siemens Ag Verfahren zur bestimmung der dichte von koerpern mittels durchdingender strahlen und geraet zu seiner durchfuehrung
US4297575A (en) * 1979-08-13 1981-10-27 Halliburton Company Simultaneous gamma ray measurement of formation bulk density and casing thickness

Also Published As

Publication number Publication date
US4525854A (en) 1985-06-25
AU2598684A (en) 1984-09-27
ES531211A0 (es) 1986-06-01
AU557007B2 (en) 1986-11-27
EP0120676A2 (de) 1984-10-03
ATE40750T1 (de) 1989-02-15
IL71299A (en) 1988-11-15
JPH0247697B2 (de) 1990-10-22
EP0120676B1 (de) 1989-02-08
ZA842056B (en) 1984-10-31
IL71299A0 (en) 1984-06-29
JPS59218941A (ja) 1984-12-10
EP0120676A3 (en) 1985-06-12
CA1219970A (en) 1987-03-31
NZ207628A (en) 1988-02-29
ES8607546A1 (es) 1986-06-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Free format text: WILCKEN, H., DR. WILCKEN, T., DIPL.-ING., PAT.-ANWAELTE, 2400 LUEBECK

8339 Ceased/non-payment of the annual fee