DE3476698D1 - Radiation scatter apparatus and method - Google Patents

Radiation scatter apparatus and method

Info

Publication number
DE3476698D1
DE3476698D1 DE8484301920T DE3476698T DE3476698D1 DE 3476698 D1 DE3476698 D1 DE 3476698D1 DE 8484301920 T DE8484301920 T DE 8484301920T DE 3476698 T DE3476698 T DE 3476698T DE 3476698 D1 DE3476698 D1 DE 3476698D1
Authority
DE
Germany
Prior art keywords
density
determined
radiation scatter
pavement
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8484301920T
Other languages
English (en)
Inventor
John L Molbert
Eddie R Riddle
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Troxler Electronic Laboratories Inc
Original Assignee
Troxler Electronic Laboratories Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Troxler Electronic Laboratories Inc filed Critical Troxler Electronic Laboratories Inc
Application granted granted Critical
Publication of DE3476698D1 publication Critical patent/DE3476698D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Radiation-Therapy Devices (AREA)
  • Measurement Of Radiation (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
DE8484301920T 1983-03-22 1984-03-21 Radiation scatter apparatus and method Expired DE3476698D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/477,820 US4525854A (en) 1983-03-22 1983-03-22 Radiation scatter apparatus and method

Publications (1)

Publication Number Publication Date
DE3476698D1 true DE3476698D1 (en) 1989-03-16

Family

ID=23897498

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484301920T Expired DE3476698D1 (en) 1983-03-22 1984-03-21 Radiation scatter apparatus and method

Country Status (11)

Country Link
US (1) US4525854A (de)
EP (1) EP0120676B1 (de)
JP (1) JPS59218941A (de)
AT (1) ATE40750T1 (de)
AU (1) AU557007B2 (de)
CA (1) CA1219970A (de)
DE (1) DE3476698D1 (de)
ES (1) ES8607546A1 (de)
IL (1) IL71299A (de)
NZ (1) NZ207628A (de)
ZA (1) ZA842056B (de)

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US6207462B1 (en) 1998-03-20 2001-03-27 Cem Corporation Microwave apparatus and method for analysis of asphalt-aggregate compositions
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US6310936B1 (en) 1999-03-03 2001-10-30 Troxler Electronic Laboratories, Inc. Thin layer nuclear density guage
US6284986B1 (en) * 1999-03-15 2001-09-04 Seh America, Inc. Method of determining the thickness of a layer on a silicon substrate
US6492641B1 (en) * 2000-06-29 2002-12-10 Troxler Electronic Laboratories, Inc. Apparatus and method for gamma-ray determination of bulk density of samples
US6567498B1 (en) * 2002-01-10 2003-05-20 Troxler Electronic Laboratories, Inc. Low activity nuclear density gauge
EP1357382A1 (de) * 2002-04-26 2003-10-29 Rijksuniversiteit te Groningen Verfahren und System zur Bestimmung der Eigenschaft eines Strassenbelags durch Messung der natürlichen Gammastrahlung
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US8503605B2 (en) 2002-07-23 2013-08-06 Rapiscan Systems, Inc. Four sided imaging system and method for detection of contraband
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
US6995667B2 (en) * 2002-12-23 2006-02-07 Instrotek, Inc. Systems, methods, and computer program products for automatic tracking and/or remote monitoring of nuclear gauges and/or data communication therewith
US6928141B2 (en) 2003-06-20 2005-08-09 Rapiscan, Inc. Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers
RU2444723C2 (ru) * 2004-04-09 2012-03-10 Эмерикэн Сайэнс Энд Энджиниэринг, Инк. Устройство и способ досмотра объектов
US7809109B2 (en) * 2004-04-09 2010-10-05 American Science And Engineering, Inc. Multiple image collection and synthesis for personnel screening
US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
EP1932020B1 (de) * 2005-08-30 2017-11-15 Troxler Electronic Laboratories, Inc. Verfahren, systeme und computerprogrammprodukte zur bestimmung einer eigenschaft von konstruktionsmaterial
US7605366B2 (en) * 2005-09-21 2009-10-20 Troxler Electronic Laboratories, Inc. Nuclear density gauge
JP2009534669A (ja) * 2006-04-21 2009-09-24 アメリカン サイエンス アンド エンジニアリング，インコーポレイテッド 離散供給源のアレイおよび複数の平行ビームを用いた荷物および人間のｘ線画像化
US7526064B2 (en) 2006-05-05 2009-04-28 Rapiscan Security Products, Inc. Multiple pass cargo inspection system
KR101034753B1 (ko) 2006-08-11 2011-05-17 아메리칸 사이언스 앤 엔지니어링, 인크. 동시에 발생하며 근접한 투과 및 후방 산란 영상화를 이용한 엑스레이 검사
US8576982B2 (en) 2008-02-01 2013-11-05 Rapiscan Systems, Inc. Personnel screening system
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US8995619B2 (en) 2010-03-14 2015-03-31 Rapiscan Systems, Inc. Personnel screening system
WO2009089172A2 (en) * 2008-01-04 2009-07-16 Troxler Electronic Laboratories, Inc. Nuclear gauges and methods of configuration and calibration of nuclear gauges
GB0809110D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Gantry scanner systems
WO2011014445A1 (en) * 2009-07-29 2011-02-03 American Science And Engineering, Inc. Top-down x-ray inspection trailer
US8824632B2 (en) 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
CN107479085A (zh) 2010-03-14 2017-12-15 拉皮斯坎系统股份有限公司 多屏检测系统
EP3252506B1 (de) 2011-02-08 2020-11-18 Rapiscan Systems, Inc. Verdeckte überwachung unter verwendung multimodaler erfassung
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
CN104170051B (zh) 2012-02-03 2017-05-31 拉皮斯坎系统股份有限公司 组合散射和透射的多视图成像系统
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
GB2523942B (en) 2013-01-31 2018-07-04 Rapiscan Systems Inc Portable security inspection system
US10515731B1 (en) 2013-03-14 2019-12-24 Troxler Electronic Laboratories, Inc. Nuclear Gauge
WO2015134802A1 (en) 2014-03-07 2015-09-11 Rapiscan Systems, Inc. Ultra wide band detectors
US11280898B2 (en) 2014-03-07 2022-03-22 Rapiscan Systems, Inc. Radar-based baggage and parcel inspection systems
US9885566B2 (en) 2014-07-24 2018-02-06 Johnson Matthey Public Limited Company Apparatus for determining thickness of lining layer
US10134254B2 (en) 2014-11-25 2018-11-20 Rapiscan Systems, Inc. Intelligent security management system
GB2554566B (en) 2015-03-20 2021-06-02 Rapiscan Systems Inc Hand-held portable backscatter inspection system
US10720300B2 (en) 2016-09-30 2020-07-21 American Science And Engineering, Inc. X-ray source for 2D scanning beam imaging
SK8449Y1 (sk) * 2018-05-11 2019-05-06 Fulop Marko Zariadenie na odhaľovanie nelegálnych úkrytov v náklade železnej rudy
US10830911B2 (en) 2018-06-20 2020-11-10 American Science And Engineering, Inc. Wavelength-shifting sheet-coupled scintillation detectors
JP7461958B2 (ja) * 2019-01-30 2024-04-04 ノードソン コーポレーション 放射線ベースの厚さゲージ
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
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US2781453A (en) * 1953-02-11 1957-02-12 Univ Cornell Methods and apparatus for determination of characteristics of matter in a surface layer
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US2943202A (en) * 1956-01-26 1960-06-28 Curtiss Wright Corp Apparatus for measuring wall thickness or density by radiation detection
US3148279A (en) * 1961-05-04 1964-09-08 Western Electric Co Radiation method of measuring sheath thickness and eccentricity
US3202822A (en) * 1961-11-13 1965-08-24 Phillips Petroleum Co Method of determining density utilizing a gamma ray source and a pair of detectors
US3497691A (en) * 1967-06-30 1970-02-24 Ohmart Corp Dual mode fluorescence and backscatter coating thickness measuring gauge
US3840746A (en) * 1971-12-13 1974-10-08 Applied Invention Corp Gamma ray density probe utilizing a pair of gamma ray sources and a gamma ray detector
JPS5222553B2 (de) * 1973-02-20 1977-06-17
US3854042A (en) * 1973-05-10 1974-12-10 A Ott Device for measuring the thickness of layers with a radionuclide irradiating the layer
DE2544354A1 (de) * 1975-10-03 1977-04-14 Siemens Ag Verfahren zur bestimmung der dichte von koerpern mittels durchdingender strahlen und geraet zu seiner durchfuehrung
US4297575A (en) * 1979-08-13 1981-10-27 Halliburton Company Simultaneous gamma ray measurement of formation bulk density and casing thickness

Also Published As

Publication number Publication date
CA1219970A (en) 1987-03-31
IL71299A (en) 1988-11-15
EP0120676A3 (en) 1985-06-12
IL71299A0 (en) 1984-06-29
AU2598684A (en) 1984-09-27
JPS59218941A (ja) 1984-12-10
NZ207628A (en) 1988-02-29
EP0120676A2 (de) 1984-10-03
ES531211A0 (es) 1986-06-01
EP0120676B1 (de) 1989-02-08
US4525854A (en) 1985-06-25
AU557007B2 (en) 1986-11-27
ATE40750T1 (de) 1989-02-15
ES8607546A1 (es) 1986-06-01
JPH0247697B2 (de) 1990-10-22
ZA842056B (en) 1984-10-31

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Free format text: WILCKEN, H., DR. WILCKEN, T., DIPL.-ING., PAT.-ANWAELTE, 2400 LUEBECK

8339 Ceased/non-payment of the annual fee