CA1106477A - Overflow channel for charge transfer imaging devices - Google Patents

Overflow channel for charge transfer imaging devices

Info

Publication number
CA1106477A
CA1106477A CA161,619A CA161619A CA1106477A CA 1106477 A CA1106477 A CA 1106477A CA 161619 A CA161619 A CA 161619A CA 1106477 A CA1106477 A CA 1106477A
Authority
CA
Canada
Prior art keywords
medium
integration sites
area
region
forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA161,619A
Other languages
English (en)
French (fr)
Other versions
CA161619S (en
Inventor
Carlo H. Sequin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Application granted granted Critical
Publication of CA1106477A publication Critical patent/CA1106477A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/148Charge coupled imagers
    • H01L27/14887Blooming suppression
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/148Charge coupled imagers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/10Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/1025Channel region of field-effect devices
    • H01L29/1062Channel region of field-effect devices of charge coupled devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Electromagnetism (AREA)
  • Ceramic Engineering (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
CA161,619A 1972-07-10 1973-01-19 Overflow channel for charge transfer imaging devices Expired CA1106477A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US27033872A 1972-07-10 1972-07-10
US270,338 1988-11-10

Publications (1)

Publication Number Publication Date
CA1106477A true CA1106477A (en) 1981-08-04

Family

ID=23030921

Family Applications (1)

Application Number Title Priority Date Filing Date
CA161,619A Expired CA1106477A (en) 1972-07-10 1973-01-19 Overflow channel for charge transfer imaging devices

Country Status (9)

Country Link
JP (1) JPS5222495B2 (de)
BE (1) BE802002A (de)
CA (1) CA1106477A (de)
DE (1) DE2334116C3 (de)
FR (1) FR2197287B1 (de)
GB (1) GB1413092A (de)
IT (1) IT991964B (de)
NL (1) NL165607C (de)
SE (1) SE382148B (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49131525A (de) * 1973-04-05 1974-12-17
US3866067A (en) * 1973-05-21 1975-02-11 Fairchild Camera Instr Co Charge coupled device with exposure and antiblooming control
JPS5140790A (de) * 1974-10-04 1976-04-05 Oki Electric Ind Co Ltd
JPS5732547B2 (de) * 1974-12-25 1982-07-12
DE2813254C2 (de) * 1978-03-28 1979-12-06 Siemens Ag, 1000 Berlin Und 8000 Muenchen Eindimensionaler CCD-Sensor mit Überlaufvorrichtung
JPS5847378A (ja) * 1981-09-17 1983-03-19 Canon Inc 撮像素子
JPS60244064A (ja) * 1984-05-18 1985-12-03 Nec Corp 固体撮像装置
JPS60163876U (ja) * 1985-03-06 1985-10-31 富士通株式会社 半導体撮像装置
GB2181012B (en) * 1985-09-20 1989-09-13 Philips Electronic Associated Imaging devices comprising photovoltaic detector elements

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1566558A (de) * 1968-03-20 1969-05-09
IE34899B1 (en) * 1970-02-16 1975-09-17 Western Electric Co Improvements in or relating to semiconductor devices
FR2101023B1 (de) * 1970-08-07 1973-11-23 Thomson Csf

Also Published As

Publication number Publication date
DE2334116C3 (de) 1983-11-10
SE382148B (sv) 1976-01-12
DE2334116B2 (de) 1977-06-30
GB1413092A (en) 1975-11-05
NL165607B (nl) 1980-11-17
FR2197287A1 (de) 1974-03-22
IT991964B (it) 1975-08-30
DE2334116A1 (de) 1974-01-31
NL165607C (nl) 1981-04-15
NL7309340A (de) 1974-01-14
BE802002A (fr) 1973-11-05
JPS4946625A (de) 1974-05-04
JPS5222495B2 (de) 1977-06-17
FR2197287B1 (de) 1976-05-28

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Legal Events

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