BR9914976A - Determinação de fase de um campo de ondas de radiação - Google Patents
Determinação de fase de um campo de ondas de radiaçãoInfo
- Publication number
- BR9914976A BR9914976A BR9914976-1A BR9914976A BR9914976A BR 9914976 A BR9914976 A BR 9914976A BR 9914976 A BR9914976 A BR 9914976A BR 9914976 A BR9914976 A BR 9914976A
- Authority
- BR
- Brazil
- Prior art keywords
- representation
- integral transform
- produce
- wave field
- radiation wave
- Prior art date
Links
- 230000005855 radiation Effects 0.000 title abstract 5
- 238000005259 measurement Methods 0.000 abstract 2
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02083—Interferometers characterised by particular signal processing and presentation
- G01B9/02084—Processing in the Fourier or frequency domain when not imaged in the frequency domain
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02083—Interferometers characterised by particular signal processing and presentation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/46—Systems using spatial filters
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/10—Image enhancement or restoration using non-spatial domain filtering
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/70—Denoising; Smoothing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
- G01J2003/282—Modified CCD or like
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J2009/0203—Phased array of beams
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20048—Transform domain processing
- G06T2207/20056—Discrete and fast Fourier transform, [DFT, FFT]
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Signal Processing (AREA)
- Theoretical Computer Science (AREA)
- Optics & Photonics (AREA)
- Mathematical Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Power Steering Mechanism (AREA)
- Control Of High-Frequency Heating Circuits (AREA)
- Inorganic Insulating Materials (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Measurement Of Radiation (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
"DETERMINAçãO DE FASE DE UM CAMPO DE ONDAS DE RADIAçãO". Descreve-se um método e aparelho para a determinação quantitativa da fase de um campo de ondas de radiação. Uma medida representativa da velocidade de mudança de intensidade do campo de ondas de radiação sobre uma superfície selecionada que estende-se genericamente através do campo ondulatório é transformada, para produzir uma primeira representação de transformada de integral. Um primeiro filtro é aplicado à primeira representação de transformada de integral, correspondendo à inversão de um primeiro operador diferencial refletido na medida da velocidade de mudança de intensidade, para produzir uma primeira representação modificada de transformada de integral. Uma inversa da primeira transformada de integral é aplicada à primeira representação modificada da transformada de integral, para produzir uma representação não transformada. A representação não transformada é corrigida, baseado em uma medida de intensidade sobre a dita superfície selecionada, e novamente transformada, para produzir uma segunda representação de transformada de integral. Um segundo filtro é aplicado à segunda representação de transformada de integral, correspondendo à inversão de um segundo operador diferencial refletido na representação não transformada corrigida, para produzir uma segunda representação da transformada de integral. Uma inversa da segunda transformada de integral é aplicada à segunda representação modificada da transformada de integral, para produzir uma medida de fase do campo de ondas de radiação através do plano selecionado.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AUPP6900A AUPP690098A0 (en) | 1998-11-02 | 1998-11-02 | Phase determination of a radiation wave field |
PCT/AU1999/000949 WO2000026622A1 (en) | 1998-11-02 | 1999-11-01 | Phase determination of a radiation wave field |
Publications (1)
Publication Number | Publication Date |
---|---|
BR9914976A true BR9914976A (pt) | 2001-07-24 |
Family
ID=3811114
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR9914976-1A BR9914976A (pt) | 1998-11-02 | 1999-11-01 | Determinação de fase de um campo de ondas de radiação |
Country Status (15)
Country | Link |
---|---|
US (2) | US6885442B1 (pt) |
EP (2) | EP1505376B1 (pt) |
JP (1) | JP4391698B2 (pt) |
KR (1) | KR100642388B1 (pt) |
CN (1) | CN100402996C (pt) |
AT (1) | ATE290687T1 (pt) |
AU (1) | AUPP690098A0 (pt) |
BR (1) | BR9914976A (pt) |
CA (1) | CA2348912C (pt) |
DE (1) | DE69924136T2 (pt) |
ES (1) | ES2239854T3 (pt) |
RU (1) | RU2237871C2 (pt) |
TW (1) | TW487810B (pt) |
WO (1) | WO2000026622A1 (pt) |
ZA (1) | ZA200103169B (pt) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AUPR672601A0 (en) * | 2001-07-31 | 2001-08-23 | Iatia Imaging Pty Ltd | Apparatus and method of imaging an object |
AUPR830801A0 (en) * | 2001-10-16 | 2001-11-08 | Iatia Imaging Pty Ltd | Phase determination of a radiation wavefield |
US20070182844A1 (en) * | 2003-03-09 | 2007-08-09 | Latia Imaging Pty Ltd | Optical system for producing differently focused images |
EP1668595A4 (en) * | 2003-09-23 | 2007-01-03 | Iatia Imaging Pty Ltd | METHOD AND DEVICE FOR DETERMINING THE SURFACE OR CONFLUENCE OF A SAMPLE |
EP1721137A1 (en) | 2004-03-01 | 2006-11-15 | Iatia Imaging Pty Ltd. | Method and apparatus for producing an image containing depth information |
GB0409572D0 (en) * | 2004-04-29 | 2004-06-02 | Univ Sheffield | High resolution imaging |
US20080094634A1 (en) * | 2004-10-01 | 2008-04-24 | Jacob Rubinstein | Phase Determination System and Method |
FR2881520B1 (fr) * | 2005-02-03 | 2007-10-12 | Lyuboshenko Igor | Obtention d'une image de phase a partir d'une image d'intensite |
DE102007009661A1 (de) * | 2006-08-31 | 2008-03-13 | Carl Zeiss Sms Gmbh | Verfahren und Vorrichtung zur ortsaufgelösten Bestimmung der Phase und Amplitude des elektromagnetischen Feldes in der Bildebene einer Abbildung eines Objektes |
DE102006061978A1 (de) * | 2006-12-21 | 2008-06-26 | Forschungszentrum Jülich GmbH | Elektronenmikroskop und Verfahren zur Messung der Defokusstreuung |
US7564545B2 (en) * | 2007-03-15 | 2009-07-21 | Kla-Tencor Technologies Corp. | Inspection methods and systems for lithographic masks |
GB2476738B (en) * | 2007-07-18 | 2012-08-15 | Iatia Imaging Pty Ltd | Method and apparatus for determining the surface profile of an object |
ES2369432B2 (es) * | 2007-09-27 | 2012-05-03 | Universidade De Santiago De Compostela | Procedimiento para la optimización de la medida de la derivada direccional de la intensidad de radiación electromagnética y dispositivo para su puesta en pr�?ctica. |
JP2009186679A (ja) * | 2008-02-05 | 2009-08-20 | Olympus Corp | 観察装置 |
DE102009019514A1 (de) * | 2009-04-30 | 2010-11-11 | Siemens Aktiengesellschaft | CT-System und Verfahren zur Phasenkontrast- und Absorptionsbildgebung |
GB2495537B (en) | 2011-10-14 | 2017-02-15 | Solentim Ltd | Method of and apparatus for analysis of a sample of biological tissue cells |
US9423307B2 (en) | 2013-02-20 | 2016-08-23 | Mesa Photonics, LLC | Method and apparatus for determining wave characteristics using interaction with a known wave |
DE102016203275B4 (de) * | 2016-02-29 | 2019-07-18 | Carl Zeiss Industrielle Messtechnik Gmbh | Verfahren und Vorrichtung zur Bestimmung eines Defokussierungswerts und Verfahren und Vorrichtung zur bildbasierten Bestimmung einer dimensionellen Größe |
DE102016114375A1 (de) | 2016-08-03 | 2018-02-08 | Humboldt-Universität Zu Berlin | Vorrichtung zur Erzeugung einer Bildserie |
JP2018180296A (ja) * | 2017-04-13 | 2018-11-15 | 横河電機株式会社 | 顕微鏡システム、顕微鏡、処理装置、及び顕微鏡用カメラ |
CN107942147B (zh) * | 2017-11-15 | 2019-09-20 | 北京邮电大学 | 一种天线的远场方向图的测量方法和装置 |
US10274378B1 (en) | 2018-04-26 | 2019-04-30 | Mesa Photonics, LLC | Method and apparatus for determining wave characteristics using constrained interactions of waves |
FR3091347B1 (fr) | 2018-12-26 | 2021-11-05 | Commissariat Energie Atomique | Procédé de caractérisation d'un échantillon par imagerie de phase |
US11501420B2 (en) | 2019-09-26 | 2022-11-15 | Perkinelmer Cellular Technologies Germany Gmbh | Reconstructing phase images with deep learning |
US11362481B2 (en) | 2020-05-01 | 2022-06-14 | Mesa Photonics, LLC | Method and apparatus for measuring optical pulses |
US11237059B1 (en) * | 2020-12-14 | 2022-02-01 | Gerchberg Ophthalmic Dispensing, PLLC | Totagraphy: Coherent diffractive/digital information reconstruction by iterative phase recovery using special masks |
CN112540460A (zh) * | 2020-12-29 | 2021-03-23 | 华东交通大学 | 基于tir与微透镜阵列组合的光学系统设计方法 |
CN113376448B (zh) * | 2021-04-29 | 2023-02-28 | 北京邮电大学 | 一种用于紧缩场测试中静区相位恢复的方法及装置 |
CN117957575A (zh) * | 2021-09-14 | 2024-04-30 | 深圳帧观德芯科技有限公司 | 扩展显微镜中的x射线成像 |
WO2023165667A1 (en) * | 2022-03-01 | 2023-09-07 | Danmarks Tekniske Universitet | Light-field imaging based on tilt-aberration |
CN116399551B (zh) * | 2023-06-06 | 2023-08-04 | 中国航空工业集团公司沈阳空气动力研究所 | 一种用于高超声速风洞的模型三维密度场测量方法 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
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US4309602A (en) * | 1979-11-01 | 1982-01-05 | Eikonix Corportation | Wavefront sensing by phase retrieval |
US4690555A (en) * | 1985-11-01 | 1987-09-01 | Hughes Aircraft Company | Solid-state wavefront slope determination |
CH678663A5 (pt) | 1988-06-09 | 1991-10-15 | Zeiss Carl Fa | |
JP2563134B2 (ja) | 1989-01-25 | 1996-12-11 | 日本電子株式会社 | 走査透過型位相差電子顕微鏡 |
JP3039563B2 (ja) | 1990-11-29 | 2000-05-08 | 株式会社日立製作所 | 走査電子顕微鏡及び走査電子顕微方法 |
US5367375A (en) * | 1992-02-07 | 1994-11-22 | Hughes Aircraft Company | Spatial wavefront evaluation by intensity relationship |
KR960019415A (ko) * | 1994-11-23 | 1996-06-17 | 윤종용 | 플라즈마 표시 패널 |
US5633714A (en) * | 1994-12-19 | 1997-05-27 | International Business Machines Corporation | Preprocessing of image amplitude and phase data for CD and OL measurement |
AUPN201295A0 (en) | 1995-03-28 | 1995-04-27 | Commonwealth Scientific And Industrial Research Organisation | Simplified conditions and configurations for phase-contrast imaging with hard x-rays |
JPH09187455A (ja) | 1996-01-10 | 1997-07-22 | Hitachi Ltd | 位相型x線ct装置 |
DE69739243D1 (de) * | 1996-12-24 | 2009-03-19 | Xrt Ltd | Phasenbestimmung in einem phasenabbildungsverfahren |
US5841125A (en) * | 1997-06-06 | 1998-11-24 | Trw Inc. | High energy laser focal sensor (HELFS) |
US6219142B1 (en) * | 1997-10-17 | 2001-04-17 | Southwest Sciences Incorporated | Method and apparatus for determining wave characteristics from wave phenomena |
-
1998
- 1998-11-02 AU AUPP6900A patent/AUPP690098A0/en not_active Abandoned
-
1999
- 1999-11-01 AT AT99957223T patent/ATE290687T1/de not_active IP Right Cessation
- 1999-11-01 EP EP04027179.3A patent/EP1505376B1/en not_active Expired - Lifetime
- 1999-11-01 CA CA002348912A patent/CA2348912C/en not_active Expired - Fee Related
- 1999-11-01 EP EP99957223A patent/EP1127252B1/en not_active Expired - Lifetime
- 1999-11-01 BR BR9914976-1A patent/BR9914976A/pt not_active IP Right Cessation
- 1999-11-01 JP JP2000579955A patent/JP4391698B2/ja not_active Expired - Fee Related
- 1999-11-01 RU RU2001115107A patent/RU2237871C2/ru not_active IP Right Cessation
- 1999-11-01 WO PCT/AU1999/000949 patent/WO2000026622A1/en active IP Right Grant
- 1999-11-01 KR KR1020017005491A patent/KR100642388B1/ko not_active IP Right Cessation
- 1999-11-01 US US09/830,393 patent/US6885442B1/en not_active Expired - Lifetime
- 1999-11-01 ES ES99957223T patent/ES2239854T3/es not_active Expired - Lifetime
- 1999-11-01 CN CNB99812916XA patent/CN100402996C/zh not_active Expired - Fee Related
- 1999-11-01 DE DE69924136T patent/DE69924136T2/de not_active Expired - Lifetime
- 1999-11-02 TW TW088119033A patent/TW487810B/zh not_active IP Right Cessation
-
2001
- 2001-04-18 ZA ZA200103169A patent/ZA200103169B/en unknown
-
2004
- 2004-11-02 US US10/979,554 patent/US7039553B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1505376A1 (en) | 2005-02-09 |
EP1127252A4 (en) | 2002-03-13 |
ATE290687T1 (de) | 2005-03-15 |
EP1127252A1 (en) | 2001-08-29 |
DE69924136D1 (de) | 2005-04-14 |
JP4391698B2 (ja) | 2009-12-24 |
US6885442B1 (en) | 2005-04-26 |
US20050062957A1 (en) | 2005-03-24 |
KR100642388B1 (ko) | 2006-11-03 |
ZA200103169B (en) | 2002-08-19 |
WO2000026622A1 (en) | 2000-05-11 |
JP2002529689A (ja) | 2002-09-10 |
KR20010080375A (ko) | 2001-08-22 |
AUPP690098A0 (en) | 1998-11-26 |
US7039553B2 (en) | 2006-05-02 |
CA2348912A1 (en) | 2000-05-11 |
RU2237871C2 (ru) | 2004-10-10 |
ES2239854T3 (es) | 2005-10-01 |
TW487810B (en) | 2002-05-21 |
CN100402996C (zh) | 2008-07-16 |
DE69924136T2 (de) | 2006-04-13 |
EP1505376B1 (en) | 2015-05-27 |
CN1334916A (zh) | 2002-02-06 |
EP1127252B1 (en) | 2005-03-09 |
CA2348912C (en) | 2008-01-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B08F | Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette] |
Free format text: REFERENTE A 5A, 6A, 7A E 8A ANUIDADES. |
|
B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] |
Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 1913 DE 04/09/2007. |