BR9914976A - Determinação de fase de um campo de ondas de radiação - Google Patents

Determinação de fase de um campo de ondas de radiação

Info

Publication number
BR9914976A
BR9914976A BR9914976-1A BR9914976A BR9914976A BR 9914976 A BR9914976 A BR 9914976A BR 9914976 A BR9914976 A BR 9914976A BR 9914976 A BR9914976 A BR 9914976A
Authority
BR
Brazil
Prior art keywords
representation
integral transform
produce
wave field
radiation wave
Prior art date
Application number
BR9914976-1A
Other languages
English (en)
Inventor
Keith Nugent
David Paganin
Anton Barty
Original Assignee
Univ Melbourne
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Melbourne filed Critical Univ Melbourne
Publication of BR9914976A publication Critical patent/BR9914976A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G01B9/02084—Processing in the Fourier or frequency domain when not imaged in the frequency domain
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/46—Systems using spatial filters
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/10—Image enhancement or restoration using non-spatial domain filtering
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/70—Denoising; Smoothing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G01J2003/282—Modified CCD or like
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0203—Phased array of beams
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20048—Transform domain processing
    • G06T2207/20056—Discrete and fast Fourier transform, [DFT, FFT]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Mathematical Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Inorganic Insulating Materials (AREA)
  • Control Of High-Frequency Heating Circuits (AREA)
  • Power Steering Mechanism (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Radiation (AREA)

Abstract

"DETERMINAçãO DE FASE DE UM CAMPO DE ONDAS DE RADIAçãO". Descreve-se um método e aparelho para a determinação quantitativa da fase de um campo de ondas de radiação. Uma medida representativa da velocidade de mudança de intensidade do campo de ondas de radiação sobre uma superfície selecionada que estende-se genericamente através do campo ondulatório é transformada, para produzir uma primeira representação de transformada de integral. Um primeiro filtro é aplicado à primeira representação de transformada de integral, correspondendo à inversão de um primeiro operador diferencial refletido na medida da velocidade de mudança de intensidade, para produzir uma primeira representação modificada de transformada de integral. Uma inversa da primeira transformada de integral é aplicada à primeira representação modificada da transformada de integral, para produzir uma representação não transformada. A representação não transformada é corrigida, baseado em uma medida de intensidade sobre a dita superfície selecionada, e novamente transformada, para produzir uma segunda representação de transformada de integral. Um segundo filtro é aplicado à segunda representação de transformada de integral, correspondendo à inversão de um segundo operador diferencial refletido na representação não transformada corrigida, para produzir uma segunda representação da transformada de integral. Uma inversa da segunda transformada de integral é aplicada à segunda representação modificada da transformada de integral, para produzir uma medida de fase do campo de ondas de radiação através do plano selecionado.
BR9914976-1A 1998-11-02 1999-11-01 Determinação de fase de um campo de ondas de radiação BR9914976A (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AUPP6900A AUPP690098A0 (en) 1998-11-02 1998-11-02 Phase determination of a radiation wave field
PCT/AU1999/000949 WO2000026622A1 (en) 1998-11-02 1999-11-01 Phase determination of a radiation wave field

Publications (1)

Publication Number Publication Date
BR9914976A true BR9914976A (pt) 2001-07-24

Family

ID=3811114

Family Applications (1)

Application Number Title Priority Date Filing Date
BR9914976-1A BR9914976A (pt) 1998-11-02 1999-11-01 Determinação de fase de um campo de ondas de radiação

Country Status (15)

Country Link
US (2) US6885442B1 (pt)
EP (2) EP1127252B1 (pt)
JP (1) JP4391698B2 (pt)
KR (1) KR100642388B1 (pt)
CN (1) CN100402996C (pt)
AT (1) ATE290687T1 (pt)
AU (1) AUPP690098A0 (pt)
BR (1) BR9914976A (pt)
CA (1) CA2348912C (pt)
DE (1) DE69924136T2 (pt)
ES (1) ES2239854T3 (pt)
RU (1) RU2237871C2 (pt)
TW (1) TW487810B (pt)
WO (1) WO2000026622A1 (pt)
ZA (1) ZA200103169B (pt)

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FR2881520B1 (fr) * 2005-02-03 2007-10-12 Lyuboshenko Igor Obtention d'une image de phase a partir d'une image d'intensite
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DE102006061978A1 (de) * 2006-12-21 2008-06-26 Forschungszentrum Jülich GmbH Elektronenmikroskop und Verfahren zur Messung der Defokusstreuung
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US11501420B2 (en) 2019-09-26 2022-11-15 Perkinelmer Cellular Technologies Germany Gmbh Reconstructing phase images with deep learning
US11362481B2 (en) 2020-05-01 2022-06-14 Mesa Photonics, LLC Method and apparatus for measuring optical pulses
US11237059B1 (en) * 2020-12-14 2022-02-01 Gerchberg Ophthalmic Dispensing, PLLC Totagraphy: Coherent diffractive/digital information reconstruction by iterative phase recovery using special masks
CN112540460A (zh) * 2020-12-29 2021-03-23 华东交通大学 基于tir与微透镜阵列组合的光学系统设计方法
CN113376448B (zh) * 2021-04-29 2023-02-28 北京邮电大学 一种用于紧缩场测试中静区相位恢复的方法及装置
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Also Published As

Publication number Publication date
EP1127252A4 (en) 2002-03-13
ATE290687T1 (de) 2005-03-15
ES2239854T3 (es) 2005-10-01
CN100402996C (zh) 2008-07-16
KR20010080375A (ko) 2001-08-22
WO2000026622A1 (en) 2000-05-11
CN1334916A (zh) 2002-02-06
RU2237871C2 (ru) 2004-10-10
CA2348912A1 (en) 2000-05-11
EP1127252A1 (en) 2001-08-29
DE69924136T2 (de) 2006-04-13
EP1505376B1 (en) 2015-05-27
TW487810B (en) 2002-05-21
EP1127252B1 (en) 2005-03-09
DE69924136D1 (de) 2005-04-14
US6885442B1 (en) 2005-04-26
JP2002529689A (ja) 2002-09-10
EP1505376A1 (en) 2005-02-09
US7039553B2 (en) 2006-05-02
CA2348912C (en) 2008-01-08
JP4391698B2 (ja) 2009-12-24
ZA200103169B (en) 2002-08-19
US20050062957A1 (en) 2005-03-24
AUPP690098A0 (en) 1998-11-26
KR100642388B1 (ko) 2006-11-03

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 5A, 6A, 7A E 8A ANUIDADES.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 1913 DE 04/09/2007.