KR900018655A - 광택 측정장치 - Google Patents

광택 측정장치 Download PDF

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Publication number
KR900018655A
KR900018655A KR1019890007086A KR890007086A KR900018655A KR 900018655 A KR900018655 A KR 900018655A KR 1019890007086 A KR1019890007086 A KR 1019890007086A KR 890007086 A KR890007086 A KR 890007086A KR 900018655 A KR900018655 A KR 900018655A
Authority
KR
South Korea
Prior art keywords
measuring device
gloss measuring
light
light source
gloss
Prior art date
Application number
KR1019890007086A
Other languages
English (en)
Other versions
KR920003041B1 (ko
Inventor
도시유끼 소우야
히로후미 하꾸다
Original Assignee
오오우라 마사히로
가부시기가이샤 호리바세이사구쇼
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오오우라 마사히로, 가부시기가이샤 호리바세이사구쇼 filed Critical 오오우라 마사히로
Publication of KR900018655A publication Critical patent/KR900018655A/ko
Application granted granted Critical
Publication of KR920003041B1 publication Critical patent/KR920003041B1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4413—Type
    • G01J2001/4433—Peak sensing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/446—Photodiode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

내용 없음

Description

광택 측정장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 관한 광택측정장치의 일구성예를 도시한 블록도, 제2도는 일반적인 광택측정장치의 광학계 부분을 도시한 설명도.

Claims (1)

  1. 광원으로부터 광을 피측정면에 대하여 조사하고, 그때의 반사광을 검출기에서 검출하도록한 광택측정장치에 있어서, 상기 광원으로부터 근적외광을 간헐적으로 발광시키도록한 것을 특징으로하는 광택측정장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019890007086A 1988-05-27 1989-05-26 광택 측정장치 KR920003041B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP63-129561 1988-05-27
JP12956188A JP2996300B2 (ja) 1988-05-27 1988-05-27 携帯用光沢測定装置
JP88-129561 1988-05-27

Publications (2)

Publication Number Publication Date
KR900018655A true KR900018655A (ko) 1990-12-22
KR920003041B1 KR920003041B1 (ko) 1992-04-13

Family

ID=15012536

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890007086A KR920003041B1 (ko) 1988-05-27 1989-05-26 광택 측정장치

Country Status (3)

Country Link
JP (1) JP2996300B2 (ko)
KR (1) KR920003041B1 (ko)
DE (1) DE3916184A1 (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU7275200A (en) 1999-09-06 2001-04-10 Universite De Liege Photometer
DE10010839C2 (de) * 2000-03-09 2003-12-04 Fraunhofer Ges Forschung Vorrichtung und Verfahren zum Ermitteln des Verschmutzungsgrades von zu prüfenden Oberflächen
JP2002032406A (ja) 2000-05-09 2002-01-31 Toshiba Corp サービス情報提供方法及びサービス情報提供装置とこのシステム
JP5652938B2 (ja) * 2010-06-30 2015-01-14 テルモ株式会社 血液成分分析装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5850398B2 (ja) * 1976-04-30 1983-11-10 日立造船株式会社 検出信号処理回路
EP0001178B1 (en) * 1977-09-09 1981-03-18 The Rank Organisation Limited An optical sensing instrument
AT351295B (de) * 1977-12-09 1979-07-10 Vianova Kunstharz Ag Anordnung zur messung des glanzvermoegens von oberflaechen, insbesondere organischer ueberzuege
US4286327A (en) * 1979-09-10 1981-08-25 Trebor Industries, Inc. Apparatus for near infrared quantitative analysis
DD208670A1 (de) * 1982-06-29 1984-04-04 Pentacon Dresden Veb Vorrichtung zur schnellen messung des glanzes beliebiger oberflaechen
HU190892B (en) * 1983-04-13 1986-12-28 Mta Mueszaki Fizikai Kutato Intezete,Hu Aparatus for measuring reflection of the planar surfaces, in particular fluckering meter
DE3444104A1 (de) * 1984-12-04 1986-06-05 Alvaro Dr. 6380 Bad Homburg Affonso Vorrichtung zum messen/speichern/koppeln lichtenergie
JPS61145436A (ja) * 1984-12-19 1986-07-03 Nippon Paint Co Ltd 塗膜外観性状評価方法および装置
JPS62127033A (ja) * 1985-11-26 1987-06-09 住友電気工業株式会社 生体計測装置

Also Published As

Publication number Publication date
JP2996300B2 (ja) 1999-12-27
KR920003041B1 (ko) 1992-04-13
JPH01299442A (ja) 1989-12-04
DE3916184A1 (de) 1989-11-30

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