BR9407818A - Disposição para testar um óxido de gate - Google Patents
Disposição para testar um óxido de gateInfo
- Publication number
- BR9407818A BR9407818A BR9407818A BR9407818A BR9407818A BR 9407818 A BR9407818 A BR 9407818A BR 9407818 A BR9407818 A BR 9407818A BR 9407818 A BR9407818 A BR 9407818A BR 9407818 A BR9407818 A BR 9407818A
- Authority
- BR
- Brazil
- Prior art keywords
- willingness
- test
- gate oxide
- gate
- oxide
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
- G01R31/275—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements for testing individual semiconductor components within integrated circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4334856A DE4334856A1 (de) | 1993-10-13 | 1993-10-13 | Anordnung zum Prüfen eines Gateoxids |
PCT/DE1994/001199 WO1995010785A1 (de) | 1993-10-13 | 1994-10-06 | Anordnung zum prüfen eines gateoxids |
Publications (1)
Publication Number | Publication Date |
---|---|
BR9407818A true BR9407818A (pt) | 1997-05-06 |
Family
ID=6500027
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR9407818A BR9407818A (pt) | 1993-10-13 | 1994-10-06 | Disposição para testar um óxido de gate |
Country Status (6)
Country | Link |
---|---|
US (1) | US5770947A (pt) |
EP (1) | EP0723668B1 (pt) |
BR (1) | BR9407818A (pt) |
CZ (1) | CZ284793B6 (pt) |
DE (2) | DE4334856A1 (pt) |
WO (1) | WO1995010785A1 (pt) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3638715B2 (ja) * | 1996-05-27 | 2005-04-13 | 株式会社ルネサステクノロジ | 半導体装置の評価方法 |
EP0869370B1 (en) | 1997-04-01 | 2003-07-02 | STMicroelectronics S.r.l. | Means for testing a gate oxide |
US6859748B1 (en) * | 2002-07-03 | 2005-02-22 | Advanced Micro Devices, Inc. | Test structure for measuring effect of trench isolation on oxide in a memory device |
DE102004059643B4 (de) * | 2004-12-10 | 2009-11-12 | Infineon Technologies Ag | Gateansteuerschaltung für einen Leistungstransistor mit isoliertem Gate |
DE102005027366A1 (de) * | 2005-06-14 | 2006-12-21 | Robert Bosch Gmbh | Monolithisch integrierte Halbleiteranordnung mit einem Leistungsbauelement und Verfahren zur Herstellung einer monolithisch integrierten Halbleiteranordnung |
ITMI20111139A1 (it) | 2011-06-23 | 2012-12-24 | St Microelectronics Srl | Circuito elettronico e metodo per testare e mantenere spento un transistore mos |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU8963582A (en) * | 1981-10-30 | 1983-05-05 | Honeywell Information Systems Incorp. | Design and testing electronic components |
JPS61265829A (ja) * | 1985-05-20 | 1986-11-25 | Fujitsu Ltd | 半導体集積回路 |
US4853628A (en) * | 1987-09-10 | 1989-08-01 | Gazelle Microcircuits, Inc. | Apparatus for measuring circuit parameters of a packaged semiconductor device |
NL8801835A (nl) * | 1988-07-20 | 1990-02-16 | Philips Nv | Werkwijze en inrichting voor het testen van meervoudige voedingsverbindingen van een geintegreerde schakeling op een printpaneel. |
JP2550703B2 (ja) * | 1989-04-28 | 1996-11-06 | 日本電装株式会社 | 半導体装置 |
US5561373A (en) * | 1990-10-09 | 1996-10-01 | Fujitsu Limited | Method and device for detecting electrostatic stress applied to a product semiconductor device during each production process |
JPH0567661A (ja) * | 1991-09-10 | 1993-03-19 | Nippondenso Co Ltd | 電力用半導体装置 |
DE4426307C2 (de) * | 1994-07-25 | 2003-05-28 | Bosch Gmbh Robert | Integrierte Schaltung mit einem Gate Oxid und Testmöglichkeit für dieses bei der Herstellung |
-
1993
- 1993-10-13 DE DE4334856A patent/DE4334856A1/de not_active Withdrawn
-
1994
- 1994-10-06 CZ CZ961066A patent/CZ284793B6/cs not_active IP Right Cessation
- 1994-10-06 BR BR9407818A patent/BR9407818A/pt not_active IP Right Cessation
- 1994-10-06 US US08/619,755 patent/US5770947A/en not_active Expired - Lifetime
- 1994-10-06 EP EP94928767A patent/EP0723668B1/de not_active Expired - Lifetime
- 1994-10-06 WO PCT/DE1994/001199 patent/WO1995010785A1/de active IP Right Grant
- 1994-10-06 DE DE59403682T patent/DE59403682D1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
CZ284793B6 (cs) | 1999-03-17 |
CZ106696A3 (en) | 1996-09-11 |
EP0723668B1 (de) | 1997-08-06 |
DE59403682D1 (de) | 1997-09-11 |
EP0723668A1 (de) | 1996-07-31 |
DE4334856A1 (de) | 1995-05-18 |
US5770947A (en) | 1998-06-23 |
WO1995010785A1 (de) | 1995-04-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FB36 | Technical and formal requirements: requirement - article 36 of industrial property law | ||
FF | Decision: intention to grant | ||
FG9A | Patent or certificate of addition granted | ||
B24C | Patent annual fee: request for for restoration |
Free format text: REFERENTE 13A., 14A. E 15A. ANUIDADES. |
|
B21F | Lapse acc. art. 78, item iv - on non-payment of the annual fees in time |
Free format text: REFERENTE AO DESPACHO PUBLICADO NA RPI 2059 DE 22/06/2010 E AO NAO RECOLHIMENTO DA 16A, 17A, 18A E 19A ANUIDADES. |